GB2190241B - Method of making a semiconductor device - Google Patents
Method of making a semiconductor deviceInfo
- Publication number
- GB2190241B GB2190241B GB8710281A GB8710281A GB2190241B GB 2190241 B GB2190241 B GB 2190241B GB 8710281 A GB8710281 A GB 8710281A GB 8710281 A GB8710281 A GB 8710281A GB 2190241 B GB2190241 B GB 2190241B
- Authority
- GB
- United Kingdom
- Prior art keywords
- making
- semiconductor device
- semiconductor
- Prior art date
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
- Expired
Links
Classifications
-
- H10W10/0143—
-
- H10W10/012—
-
- H10W10/0147—
-
- H10W10/0148—
-
- H10W10/13—
-
- H10W10/17—
Applications Claiming Priority (3)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| JP10596586 | 1986-05-09 | ||
| JP22770986 | 1986-09-26 | ||
| JP62053453A JPS63184352A (en) | 1986-05-09 | 1987-03-09 | Manufacturing method of semiconductor device |
Publications (3)
| Publication Number | Publication Date |
|---|---|
| GB8710281D0 GB8710281D0 (en) | 1987-06-03 |
| GB2190241A GB2190241A (en) | 1987-11-11 |
| GB2190241B true GB2190241B (en) | 1989-12-13 |
Family
ID=27294953
Family Applications (1)
| Application Number | Title | Priority Date | Filing Date |
|---|---|---|---|
| GB8710281A Expired GB2190241B (en) | 1986-05-09 | 1987-04-30 | Method of making a semiconductor device |
Country Status (6)
| Country | Link |
|---|---|
| DE (1) | DE3715092A1 (en) |
| FR (1) | FR2598557B1 (en) |
| GB (1) | GB2190241B (en) |
| HK (1) | HK28791A (en) |
| NL (1) | NL190591C (en) |
| SG (1) | SG60090G (en) |
Families Citing this family (7)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| IT1189143B (en) * | 1986-05-16 | 1988-01-28 | Sgs Microelettronica Spa | PROCEDURE FOR THE IMPLEMENTATION OF THE INSULATION OF INTEGRATED CIRCUITS WITH A VERY HIGH INTEGRATION SCALE, IN PARTICULAR IN MOS AND CMOS TECHNOLOGY |
| JPH0442948A (en) * | 1990-06-06 | 1992-02-13 | Mitsubishi Electric Corp | Manufacture of semiconductor device |
| KR920020676A (en) * | 1991-04-09 | 1992-11-21 | 김광호 | Device Separation Method of Semiconductor Device |
| JPH0574927A (en) * | 1991-09-13 | 1993-03-26 | Nec Corp | Method for manufacturing semiconductor device |
| KR0147630B1 (en) * | 1995-04-21 | 1998-11-02 | 김광호 | Device Separation Method of Semiconductor Device |
| KR980006053A (en) * | 1996-06-26 | 1998-03-30 | 문정환 | Method for forming a separation film of a semiconductor device |
| CN102683290A (en) * | 2011-03-08 | 2012-09-19 | 无锡华润上华半导体有限公司 | ROM (read only memory) device and manufacturing method thereof |
Citations (1)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| EP0044082A2 (en) * | 1980-07-16 | 1982-01-20 | Kabushiki Kaisha Toshiba | Method of manufacturing a semiconductor device comprising a dielectric insulating region |
Family Cites Families (8)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| NL170348C (en) * | 1970-07-10 | 1982-10-18 | Philips Nv | METHOD FOR MANUFACTURING A SEMICONDUCTOR DEVICE APPLYING TO A SURFACE OF A SEMICONDUCTOR BODY AGAINST DOTTING AND AGAINST THERMAL OXIDICATION MASK MATERIAL, PRE-FRIENDLY COVERING THE WINDOWS OF THE WINDOWS IN THE MATERIALS The semiconductor body with the mask is subjected to a thermal oxidation treatment to form an oxide pattern that at least partially fills in the recesses. |
| JPS5578540A (en) * | 1978-12-08 | 1980-06-13 | Hitachi Ltd | Manufacture of semiconductor device |
| US4238278A (en) * | 1979-06-14 | 1980-12-09 | International Business Machines Corporation | Polycrystalline silicon oxidation method for making shallow and deep isolation trenches |
| JPS5694646A (en) * | 1979-12-28 | 1981-07-31 | Fujitsu Ltd | Forming method for oxidized film |
| JPS5694647A (en) * | 1979-12-28 | 1981-07-31 | Fujitsu Ltd | Forming method for oxidized film |
| JPS5893342A (en) * | 1981-11-30 | 1983-06-03 | Toshiba Corp | Manufacture of semiconductor device |
| US4435446A (en) * | 1982-11-15 | 1984-03-06 | Hewlett-Packard Company | Edge seal with polysilicon in LOCOS process |
| JPS6054453A (en) * | 1983-09-05 | 1985-03-28 | Oki Electric Ind Co Ltd | Manufacture of semiconductor integrated circuit device |
-
1987
- 1987-04-27 FR FR878705903A patent/FR2598557B1/en not_active Expired - Lifetime
- 1987-04-30 GB GB8710281A patent/GB2190241B/en not_active Expired
- 1987-05-06 DE DE19873715092 patent/DE3715092A1/en active Granted
- 1987-05-08 NL NL8701087A patent/NL190591C/en not_active IP Right Cessation
-
1990
- 1990-07-19 SG SG60090A patent/SG60090G/en unknown
-
1991
- 1991-04-18 HK HK287/91A patent/HK28791A/en not_active IP Right Cessation
Patent Citations (1)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| EP0044082A2 (en) * | 1980-07-16 | 1982-01-20 | Kabushiki Kaisha Toshiba | Method of manufacturing a semiconductor device comprising a dielectric insulating region |
Also Published As
| Publication number | Publication date |
|---|---|
| GB8710281D0 (en) | 1987-06-03 |
| FR2598557A1 (en) | 1987-11-13 |
| SG60090G (en) | 1990-09-07 |
| NL190591C (en) | 1994-05-02 |
| GB2190241A (en) | 1987-11-11 |
| FR2598557B1 (en) | 1990-03-30 |
| DE3715092A1 (en) | 1987-11-12 |
| HK28791A (en) | 1991-04-26 |
| NL8701087A (en) | 1987-12-01 |
| NL190591B (en) | 1993-12-01 |
| DE3715092C2 (en) | 1993-07-29 |
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Legal Events
| Date | Code | Title | Description |
|---|---|---|---|
| PE20 | Patent expired after termination of 20 years |
Effective date: 20070429 |