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GB2157521A - Improvements relating to interface circuits - Google Patents

Improvements relating to interface circuits Download PDF

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Publication number
GB2157521A
GB2157521A GB08509637A GB8509637A GB2157521A GB 2157521 A GB2157521 A GB 2157521A GB 08509637 A GB08509637 A GB 08509637A GB 8509637 A GB8509637 A GB 8509637A GB 2157521 A GB2157521 A GB 2157521A
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GB
United Kingdom
Prior art keywords
circuit
voltage
input
logic
capacitors
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Withdrawn
Application number
GB08509637A
Other versions
GB8509637D0 (en
Inventor
Alan Thomas Gower
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
VIDEO INTERACTIVE SYSTEMS Ltd
Original Assignee
VIDEO INTERACTIVE SYSTEMS Ltd
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by VIDEO INTERACTIVE SYSTEMS Ltd filed Critical VIDEO INTERACTIVE SYSTEMS Ltd
Priority to GB08509637A priority Critical patent/GB2157521A/en
Publication of GB8509637D0 publication Critical patent/GB8509637D0/en
Publication of GB2157521A publication Critical patent/GB2157521A/en
Withdrawn legal-status Critical Current

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Classifications

    • HELECTRICITY
    • H03ELECTRONIC CIRCUITRY
    • H03KPULSE TECHNIQUE
    • H03K17/00Electronic switching or gating, i.e. not by contact-making and –breaking
    • H03K17/51Electronic switching or gating, i.e. not by contact-making and –breaking characterised by the components used
    • H03K17/56Electronic switching or gating, i.e. not by contact-making and –breaking characterised by the components used by the use, as active elements, of semiconductor devices
    • H03K17/687Electronic switching or gating, i.e. not by contact-making and –breaking characterised by the components used by the use, as active elements, of semiconductor devices the devices being field-effect transistors
    • H03K17/689Electronic switching or gating, i.e. not by contact-making and –breaking characterised by the components used by the use, as active elements, of semiconductor devices the devices being field-effect transistors with galvanic isolation between the control circuit and the output circuit

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  • Electronic Switches (AREA)
  • Semiconductor Integrated Circuits (AREA)
  • Rectifiers (AREA)

Abstract

A semi-conductor switch (not shown) in a high voltage circuit is operated by low voltage logic and therefore requires some form of isolation in an interface circuit. This is provided by capacitors (3, 4) in each line from the logic circuit so that the output (8, 9) is 'floating' in relation to the input (1, 2). To achieve the necessary size of signal a voltage multiplier may be incorporated in the interface circuit, between the capacitors and the output (Fig. 2). The circuit is conveniently monolithically constructed on a substrate as an integrated circuit. <IMAGE>

Description

SPECIFICATION Improvements relating to interface circuits This invention relates to interface circuits. It is concerned primarily with interfacing high voltage bidirectional signals with low voltage logic control.
Direct control of a bidirectional semiconducting switch from a low voltage requires some form of isolating drive technique. Known solutions to the problem include electro-mechanical relays, whose short-comings are well known, and opto-copled devices, which deteriorate with time, are costly and have limited application.
It is the aim of this invention to provide a more reliable, low cost and versatile alternative.
According to the present invention there is provided an interface circuit with a low voltage input, and capacitive coupling in each line to a high voltage output circuit.
Thus, a switch governed by the output circuit is isolated from control logic at the input using a 'floating' technique.
The circuit will generally incorporate a voltage multiplier between the capacitive coupling and the output circuit and its components can readily be monolithically integrated with the capacitive coupling.
For a better understanding of the invention, some embodiments will now be described, by way of example, with reference to the accompanying drawing, in which: Figure 1 is a diagram of an interface circuit incorporating a voltage doubler, Figure 2 is a diagram of an interface circuit with a voltage quadrupler, and Figure 3 is a perspective view of the circuit of Figure 1 embodied in a wafer.
The circuit of Figure 1 is for driving capacitive loads and has input terminals 1 and 2 to which are applied clock-waveforms of opposite phase. These will pass through DC isolating capacitors 3 and 4to a voltage doubler comprising a bridging diode 5 and diodes 6 and 7 arranged in opposite senses in the lines to output terminals 8 and 9, the latter being bridged by resistor 10. The load across the output terminals is represented by a capacitor 11.
The input may be any form of applied logic, and the circuit is capable of being driven directly from 5 volt and microprocessor outputs. The output can be used to control semiconductor switches which may be operating at 240 volts, but which will be safely isolated from the input logic. These switches may be bidirectional M.O.S. Switches, of either enhancement or depletion type, or junction field effect transistors, for example.
With terminal 1 at logic '1' level and terminal 2 at logic '0', current will flow into the load capacitor 11 through capacitors 3 and 4. These will therefore partly charge in one direction during the applied half cycle to a fraction of the differentially applied input voltage, the charge value being determined by all these capacitances. During the next half cycle, the current path will be in the opposite direction via capacitor 4, diode 5 and capacitor 3. The previous charge on the two isolating capacitors 3 and 4 will therefore practically cancel over this period.
Subsequent cycles will progressively charge up capacitor 11 to a final value.
Figure 2 shows an equivalent circuit for voltage quadrupling, and it will be understood that other, higher multiplication factors can be obtained by different combinations of capacitors and diodes.
Although such a circuit may be built up from discrete components, it will be preferred to construct it monolithically, as shown in Figure 3, where various parts are referenced as in Figure 1.
The circuit is formed on a silicon substitute 12 which provides the necessary mechanical strength.
This has a silicon oxide superstructure 13 with a poly silicon layer 14 in which the diodes and resistors are formed.
This layer 14 is lightly doped with N type impurity and the diodes are formed by implanting P type inpurity into selected regions of it to form semiconductor-functions. The two adjacent regions of each diode are identified by panel N with the association number 5, 6 or 7 as a subscript.
The capacitors 3 and 4 are formed by a thick silicon oxide layer 15 with aluminium depositions 16 and 17 on the upper face, to which the input terminals 1 and 2 are attached, and N+ regions 18 and 19 implanted in the layer 14. The layer 15 provides the necessary isolation between the high voltage in the poly silicon layer and the low voltage logic input. Aluminium depositions 20 and 21 provide the junctions between these capacitors and the diodes.
The resistor 10 is formed by a high sensitivity Npoly silicon region, and the coupling to the output terminals 8 and 9 is by means of further aluminium depositions 22 and 23.
It will be understood that there are alternatives to the materials and components referred to above.
For example, it is contemplated that silicon on sapphire might be an improvement on poly silicon, and that using active components (i.e. transistors) rather than passive ones such as diodes and resistors might lead to a more compact unit.
However, at least in the device described the fabrication entails few mask stages and is consequently high yielding (i.e. low failure rate) and of low cost.
1. An interface circuit with a low voltage input, and capacitive coupling in each line to a high voltage output circuit.
2. An interface circuit as claimed in Claim 1, incorporating a voltage multiplier between the capacitive coupling and the output circuit.
3. A circuit as claimed in Claim 2, wherein the
**WARNING** end of DESC field may overlap start of CLMS **.

Claims (4)

**WARNING** start of CLMS field may overlap end of DESC **. SPECIFICATION Improvements relating to interface circuits This invention relates to interface circuits. It is concerned primarily with interfacing high voltage bidirectional signals with low voltage logic control. Direct control of a bidirectional semiconducting switch from a low voltage requires some form of isolating drive technique. Known solutions to the problem include electro-mechanical relays, whose short-comings are well known, and opto-copled devices, which deteriorate with time, are costly and have limited application. It is the aim of this invention to provide a more reliable, low cost and versatile alternative. According to the present invention there is provided an interface circuit with a low voltage input, and capacitive coupling in each line to a high voltage output circuit. Thus, a switch governed by the output circuit is isolated from control logic at the input using a 'floating' technique. The circuit will generally incorporate a voltage multiplier between the capacitive coupling and the output circuit and its components can readily be monolithically integrated with the capacitive coupling. For a better understanding of the invention, some embodiments will now be described, by way of example, with reference to the accompanying drawing, in which: Figure 1 is a diagram of an interface circuit incorporating a voltage doubler, Figure 2 is a diagram of an interface circuit with a voltage quadrupler, and Figure 3 is a perspective view of the circuit of Figure 1 embodied in a wafer. The circuit of Figure 1 is for driving capacitive loads and has input terminals 1 and 2 to which are applied clock-waveforms of opposite phase. These will pass through DC isolating capacitors 3 and 4to a voltage doubler comprising a bridging diode 5 and diodes 6 and 7 arranged in opposite senses in the lines to output terminals 8 and 9, the latter being bridged by resistor 10. The load across the output terminals is represented by a capacitor 11. The input may be any form of applied logic, and the circuit is capable of being driven directly from 5 volt and microprocessor outputs. The output can be used to control semiconductor switches which may be operating at 240 volts, but which will be safely isolated from the input logic. These switches may be bidirectional M.O.S. Switches, of either enhancement or depletion type, or junction field effect transistors, for example. With terminal 1 at logic '1' level and terminal 2 at logic '0', current will flow into the load capacitor 11 through capacitors 3 and 4. These will therefore partly charge in one direction during the applied half cycle to a fraction of the differentially applied input voltage, the charge value being determined by all these capacitances. During the next half cycle, the current path will be in the opposite direction via capacitor 4, diode 5 and capacitor 3. The previous charge on the two isolating capacitors 3 and 4 will therefore practically cancel over this period. Subsequent cycles will progressively charge up capacitor 11 to a final value. Figure 2 shows an equivalent circuit for voltage quadrupling, and it will be understood that other, higher multiplication factors can be obtained by different combinations of capacitors and diodes. Although such a circuit may be built up from discrete components, it will be preferred to construct it monolithically, as shown in Figure 3, where various parts are referenced as in Figure 1. The circuit is formed on a silicon substitute 12 which provides the necessary mechanical strength. This has a silicon oxide superstructure 13 with a poly silicon layer 14 in which the diodes and resistors are formed. This layer 14 is lightly doped with N type impurity and the diodes are formed by implanting P type inpurity into selected regions of it to form semiconductor-functions. The two adjacent regions of each diode are identified by panel N with the association number 5, 6 or 7 as a subscript. The capacitors 3 and 4 are formed by a thick silicon oxide layer 15 with aluminium depositions 16 and 17 on the upper face, to which the input terminals 1 and 2 are attached, and N+ regions 18 and 19 implanted in the layer 14. The layer 15 provides the necessary isolation between the high voltage in the poly silicon layer and the low voltage logic input. Aluminium depositions 20 and 21 provide the junctions between these capacitors and the diodes. The resistor 10 is formed by a high sensitivity Npoly silicon region, and the coupling to the output terminals 8 and 9 is by means of further aluminium depositions 22 and 23. It will be understood that there are alternatives to the materials and components referred to above. For example, it is contemplated that silicon on sapphire might be an improvement on poly silicon, and that using active components (i.e. transistors) rather than passive ones such as diodes and resistors might lead to a more compact unit. However, at least in the device described the fabrication entails few mask stages and is consequently high yielding (i.e. low failure rate) and of low cost. CLAIMS
1. An interface circuit with a low voltage input, and capacitive coupling in each line to a high voltage output circuit.
2. An interface circuit as claimed in Claim 1, incorporating a voltage multiplier between the capacitive coupling and the output circuit.
3. A circuit as claimed in Claim 2, wherein the components of the multiplier circuit are monolithically integrated with the capacitive coupling.
4. An interface circuit substantially as hereinbefore described with reference to Figure 1, Figures 2 or Figure 3 of the accompanying drawing.
GB08509637A 1984-04-14 1985-04-15 Improvements relating to interface circuits Withdrawn GB2157521A (en)

Priority Applications (1)

Application Number Priority Date Filing Date Title
GB08509637A GB2157521A (en) 1984-04-14 1985-04-15 Improvements relating to interface circuits

Applications Claiming Priority (2)

Application Number Priority Date Filing Date Title
GB8409756 1984-04-14
GB08509637A GB2157521A (en) 1984-04-14 1985-04-15 Improvements relating to interface circuits

Publications (2)

Publication Number Publication Date
GB8509637D0 GB8509637D0 (en) 1985-05-22
GB2157521A true GB2157521A (en) 1985-10-23

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Family Applications (1)

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GB08509637A Withdrawn GB2157521A (en) 1984-04-14 1985-04-15 Improvements relating to interface circuits

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GB (1) GB2157521A (en)

Cited By (3)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
EP0319085A1 (en) * 1987-11-30 1989-06-07 AT&amp;T NETWORK SYSTEMS NEDERLAND B.V. Digital transmission with galvanic separation in video circuits
EP0723337A3 (en) * 1995-01-23 1997-04-23 Sony Corp Switch circuit and compound device
GB2356504A (en) * 1999-10-09 2001-05-23 Bosch Gmbh Robert A high side FET switch with a charge pump driven by a relatively low voltage CMOS inverter

Citations (8)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
GB603579A (en) * 1945-03-14 1948-06-18 Standard Telephones Cables Ltd Improvements in or relating to the use of voltage doubling circuits for alternating electric currents
GB980956A (en) * 1961-02-28 1965-01-20 Standard Telephones Cables Ltd Electrical switching arrangement
GB1140461A (en) * 1965-02-03 1969-01-22 Plessey Uk Ltd Improvements relating to electric switching arrangements
EP0049679A1 (en) * 1980-10-04 1982-04-14 Licentia Patent-Verwaltungs-GmbH Fail-safe logic transmission circuit
GB2100075A (en) * 1981-05-19 1982-12-15 Tokyo Shibaura Electric Co Rectifier circuit
WO1983003724A1 (en) * 1982-04-07 1983-10-27 Hochreutiner, Roger, Maurice Control circuit for an integrated device
GB2122339A (en) * 1982-06-25 1984-01-11 John Anthony Bloice Infra-red intrusion detector system
GB2146303A (en) * 1983-08-20 1985-04-17 Spooner Ind Ltd Device for supporting web on a bed of air

Patent Citations (8)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
GB603579A (en) * 1945-03-14 1948-06-18 Standard Telephones Cables Ltd Improvements in or relating to the use of voltage doubling circuits for alternating electric currents
GB980956A (en) * 1961-02-28 1965-01-20 Standard Telephones Cables Ltd Electrical switching arrangement
GB1140461A (en) * 1965-02-03 1969-01-22 Plessey Uk Ltd Improvements relating to electric switching arrangements
EP0049679A1 (en) * 1980-10-04 1982-04-14 Licentia Patent-Verwaltungs-GmbH Fail-safe logic transmission circuit
GB2100075A (en) * 1981-05-19 1982-12-15 Tokyo Shibaura Electric Co Rectifier circuit
WO1983003724A1 (en) * 1982-04-07 1983-10-27 Hochreutiner, Roger, Maurice Control circuit for an integrated device
GB2122339A (en) * 1982-06-25 1984-01-11 John Anthony Bloice Infra-red intrusion detector system
GB2146303A (en) * 1983-08-20 1985-04-17 Spooner Ind Ltd Device for supporting web on a bed of air

Cited By (5)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
EP0319085A1 (en) * 1987-11-30 1989-06-07 AT&amp;T NETWORK SYSTEMS NEDERLAND B.V. Digital transmission with galvanic separation in video circuits
EP0723337A3 (en) * 1995-01-23 1997-04-23 Sony Corp Switch circuit and compound device
US5717356A (en) * 1995-01-23 1998-02-10 Sony Corporation Low insertion loss switch
GB2356504A (en) * 1999-10-09 2001-05-23 Bosch Gmbh Robert A high side FET switch with a charge pump driven by a relatively low voltage CMOS inverter
GB2356504B (en) * 1999-10-09 2001-12-05 Bosch Gmbh Robert Control device for electronic switching means

Also Published As

Publication number Publication date
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WAP Application withdrawn, taken to be withdrawn or refused ** after publication under section 16(1)