GB2038490B - Electrical circuit testing - Google Patents
Electrical circuit testingInfo
- Publication number
- GB2038490B GB2038490B GB7941127A GB7941127A GB2038490B GB 2038490 B GB2038490 B GB 2038490B GB 7941127 A GB7941127 A GB 7941127A GB 7941127 A GB7941127 A GB 7941127A GB 2038490 B GB2038490 B GB 2038490B
- Authority
- GB
- United Kingdom
- Prior art keywords
- electrical circuit
- circuit testing
- testing
- electrical
- circuit
- Prior art date
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
- Expired
Links
Classifications
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
- G01R31/00—Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere
- G01R31/28—Testing of electronic circuits, e.g. by signal tracer
- G01R31/2832—Specific tests of electronic circuits not provided for elsewhere
- G01R31/2836—Fault-finding or characterising
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
- G01R27/00—Arrangements for measuring resistance, reactance, impedance, or electric characteristics derived therefrom
- G01R27/02—Measuring real or complex resistance, reactance, impedance, or other two-pole characteristics derived therefrom, e.g. time constant
- G01R27/14—Measuring resistance by measuring current or voltage obtained from a reference source
Landscapes
- Physics & Mathematics (AREA)
- General Physics & Mathematics (AREA)
- Engineering & Computer Science (AREA)
- General Engineering & Computer Science (AREA)
- Testing Of Individual Semiconductor Devices (AREA)
Priority Applications (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| GB7941127A GB2038490B (en) | 1978-12-21 | 1979-11-28 | Electrical circuit testing |
Applications Claiming Priority (2)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| GB7849735 | 1978-12-21 | ||
| GB7941127A GB2038490B (en) | 1978-12-21 | 1979-11-28 | Electrical circuit testing |
Publications (2)
| Publication Number | Publication Date |
|---|---|
| GB2038490A GB2038490A (en) | 1980-07-23 |
| GB2038490B true GB2038490B (en) | 1983-02-09 |
Family
ID=26270072
Family Applications (1)
| Application Number | Title | Priority Date | Filing Date |
|---|---|---|---|
| GB7941127A Expired GB2038490B (en) | 1978-12-21 | 1979-11-28 | Electrical circuit testing |
Country Status (1)
| Country | Link |
|---|---|
| GB (1) | GB2038490B (en) |
Families Citing this family (3)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| US4779041A (en) * | 1987-05-20 | 1988-10-18 | Hewlett-Packard Company | Integrated circuit transfer test device system |
| GB2309316A (en) * | 1996-01-16 | 1997-07-23 | Robert Graham Harris | Method and means of detecting a shunt diode within an encapsulated circuit |
| US11879931B2 (en) * | 2021-08-25 | 2024-01-23 | Hamilton Sundstrand Corporation | Circuit testing and diagnosis |
-
1979
- 1979-11-28 GB GB7941127A patent/GB2038490B/en not_active Expired
Also Published As
| Publication number | Publication date |
|---|---|
| GB2038490A (en) | 1980-07-23 |
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Legal Events
| Date | Code | Title | Description |
|---|---|---|---|
| PCNP | Patent ceased through non-payment of renewal fee |