GB2019559A - Determination of a characteristic of metal sheet or strip - Google Patents
Determination of a characteristic of metal sheet or stripInfo
- Publication number
- GB2019559A GB2019559A GB7908877A GB7908877A GB2019559A GB 2019559 A GB2019559 A GB 2019559A GB 7908877 A GB7908877 A GB 7908877A GB 7908877 A GB7908877 A GB 7908877A GB 2019559 A GB2019559 A GB 2019559A
- Authority
- GB
- United Kingdom
- Prior art keywords
- metal sheet
- detected
- energy
- voltage pulses
- rays
- Prior art date
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
- Granted
Links
- 239000002184 metal Substances 0.000 title abstract 2
- 230000011514 reflex Effects 0.000 abstract 2
- 239000013078 crystal Substances 0.000 abstract 1
- 238000005259 measurement Methods 0.000 abstract 1
- 230000005855 radiation Effects 0.000 abstract 1
- 238000001953 recrystallisation Methods 0.000 abstract 1
Classifications
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
- G01N23/00—Investigating or analysing materials by the use of wave or particle radiation, e.g. X-rays or neutrons, not covered by groups G01N3/00 – G01N17/00, G01N21/00 or G01N22/00
- G01N23/20—Investigating or analysing materials by the use of wave or particle radiation, e.g. X-rays or neutrons, not covered by groups G01N3/00 – G01N17/00, G01N21/00 or G01N22/00 by using diffraction of the radiation by the materials, e.g. for investigating crystal structure; by using scattering of the radiation by the materials, e.g. for investigating non-crystalline materials; by using reflection of the radiation by the materials
- G01N23/20091—Measuring the energy-dispersion spectrum [EDS] of diffracted radiation
Landscapes
- Chemical & Material Sciences (AREA)
- Dispersion Chemistry (AREA)
- Crystallography & Structural Chemistry (AREA)
- Physics & Mathematics (AREA)
- Health & Medical Sciences (AREA)
- Life Sciences & Earth Sciences (AREA)
- Analytical Chemistry (AREA)
- Biochemistry (AREA)
- General Health & Medical Sciences (AREA)
- General Physics & Mathematics (AREA)
- Immunology (AREA)
- Pathology (AREA)
- Analysing Materials By The Use Of Radiation (AREA)
Abstract
The anisotropic value rm of cold rolled, recrystallization annealed thin and very thin metal sheet 2 is determined by employing X-rays 1 for the measurement of the crystallographic texture. The sheets are irradiated with incident primary radiation at an energy of at least 20 keV, the rays diffracted at the crystal lattices are detected 3, and the detected X-ray quanta are converted into voltage pulses proportional to their energy. The voltage pulses are then discriminated in respect of pulse height and the maxima and the frequency distribution of the pulse heights are arranged in accordance with predetermined diffraction reflexes, so that the intensity of the diffraction reflex is measured at fixed values of the latitude angle alpha and the azimuth angle beta . <IMAGE>
Applications Claiming Priority (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| DE2817742A DE2817742C2 (en) | 1978-04-22 | 1978-04-22 | Method and device for determining technological parameters |
Publications (2)
| Publication Number | Publication Date |
|---|---|
| GB2019559A true GB2019559A (en) | 1979-10-31 |
| GB2019559B GB2019559B (en) | 1983-01-06 |
Family
ID=6037775
Family Applications (1)
| Application Number | Title | Priority Date | Filing Date |
|---|---|---|---|
| GB7908877A Expired GB2019559B (en) | 1978-04-22 | 1979-03-13 | Determination of a characteristic of metal sheet or strip |
Country Status (8)
| Country | Link |
|---|---|
| JP (1) | JPS54141695A (en) |
| AT (1) | AT381394B (en) |
| BE (1) | BE875722A (en) |
| DE (1) | DE2817742C2 (en) |
| FR (1) | FR2423774A1 (en) |
| GB (1) | GB2019559B (en) |
| IT (1) | IT1114999B (en) |
| LU (1) | LU81170A1 (en) |
Cited By (2)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| WO1994019920A1 (en) * | 1993-02-23 | 1994-09-01 | THE UNITED STATES OF AMERICA, as represented by T HE SECRETARY OF COMMERCE | Method and apparatus for precisely measuring accelerating voltages applied to x-ray sources |
| FR2833081A1 (en) * | 2001-11-30 | 2003-06-06 | Centre Nat Rech Scient | METHOD FOR X-RAY VOLUME ANALYSIS OF CRYSTALLOGRAPHIC CHARACTERISTICS OF PARTS |
Families Citing this family (3)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| DE3825830A1 (en) * | 1988-07-29 | 1990-02-01 | Hoesch Stahl Ag | METHOD AND DEVICE FOR TEXTURE ANALYSIS |
| DE102016222644A1 (en) | 2016-03-14 | 2017-09-28 | Sms Group Gmbh | Process for rolling and / or heat treating a metallic product |
| DE102017208576A1 (en) | 2016-05-25 | 2017-11-30 | Sms Group Gmbh | Apparatus and method for determining a microstructure of a metal product and metallurgical plant |
Family Cites Families (2)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| GB1329695A (en) * | 1970-09-09 | 1973-09-12 | Nutter J C | Diffractometry |
| JPS5332789A (en) * | 1976-09-08 | 1978-03-28 | Hitachi Ltd | Method and apparatus for measuring of stress of white color x-ray |
-
1978
- 1978-04-22 DE DE2817742A patent/DE2817742C2/en not_active Expired
-
1979
- 1979-02-27 AT AT0149679A patent/AT381394B/en not_active IP Right Cessation
- 1979-03-13 GB GB7908877A patent/GB2019559B/en not_active Expired
- 1979-04-04 IT IT48613/79A patent/IT1114999B/en active
- 1979-04-19 JP JP4731679A patent/JPS54141695A/en active Granted
- 1979-04-20 FR FR7910102A patent/FR2423774A1/en active Granted
- 1979-04-20 LU LU81170A patent/LU81170A1/en unknown
- 1979-04-20 BE BE0/194724A patent/BE875722A/en not_active IP Right Cessation
Cited By (2)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| WO1994019920A1 (en) * | 1993-02-23 | 1994-09-01 | THE UNITED STATES OF AMERICA, as represented by T HE SECRETARY OF COMMERCE | Method and apparatus for precisely measuring accelerating voltages applied to x-ray sources |
| FR2833081A1 (en) * | 2001-11-30 | 2003-06-06 | Centre Nat Rech Scient | METHOD FOR X-RAY VOLUME ANALYSIS OF CRYSTALLOGRAPHIC CHARACTERISTICS OF PARTS |
Also Published As
| Publication number | Publication date |
|---|---|
| BE875722A (en) | 1979-10-22 |
| JPH0237539B2 (en) | 1990-08-24 |
| IT7948613A0 (en) | 1979-04-04 |
| ATA149679A (en) | 1986-02-15 |
| LU81170A1 (en) | 1979-11-07 |
| DE2817742C2 (en) | 1980-07-24 |
| GB2019559B (en) | 1983-01-06 |
| JPS54141695A (en) | 1979-11-05 |
| AT381394B (en) | 1986-10-10 |
| FR2423774A1 (en) | 1979-11-16 |
| FR2423774B1 (en) | 1984-05-04 |
| IT1114999B (en) | 1986-02-03 |
| DE2817742B1 (en) | 1979-10-31 |
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Legal Events
| Date | Code | Title | Description |
|---|---|---|---|
| PCNP | Patent ceased through non-payment of renewal fee |
Effective date: 19950313 |