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GB2019559A - Determination of a characteristic of metal sheet or strip - Google Patents

Determination of a characteristic of metal sheet or strip

Info

Publication number
GB2019559A
GB2019559A GB7908877A GB7908877A GB2019559A GB 2019559 A GB2019559 A GB 2019559A GB 7908877 A GB7908877 A GB 7908877A GB 7908877 A GB7908877 A GB 7908877A GB 2019559 A GB2019559 A GB 2019559A
Authority
GB
United Kingdom
Prior art keywords
metal sheet
detected
energy
voltage pulses
rays
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Granted
Application number
GB7908877A
Other versions
GB2019559B (en
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
Hoesch Werke AG
Original Assignee
Hoesch Werke AG
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Hoesch Werke AG filed Critical Hoesch Werke AG
Publication of GB2019559A publication Critical patent/GB2019559A/en
Application granted granted Critical
Publication of GB2019559B publication Critical patent/GB2019559B/en
Expired legal-status Critical Current

Links

Classifications

    • GPHYSICS
    • G01MEASURING; TESTING
    • G01NINVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N23/00Investigating or analysing materials by the use of wave or particle radiation, e.g. X-rays or neutrons, not covered by groups G01N3/00 – G01N17/00, G01N21/00 or G01N22/00
    • G01N23/20Investigating or analysing materials by the use of wave or particle radiation, e.g. X-rays or neutrons, not covered by groups G01N3/00 – G01N17/00, G01N21/00 or G01N22/00 by using diffraction of the radiation by the materials, e.g. for investigating crystal structure; by using scattering of the radiation by the materials, e.g. for investigating non-crystalline materials; by using reflection of the radiation by the materials
    • G01N23/20091Measuring the energy-dispersion spectrum [EDS] of diffracted radiation

Landscapes

  • Chemical & Material Sciences (AREA)
  • Dispersion Chemistry (AREA)
  • Crystallography & Structural Chemistry (AREA)
  • Physics & Mathematics (AREA)
  • Health & Medical Sciences (AREA)
  • Life Sciences & Earth Sciences (AREA)
  • Analytical Chemistry (AREA)
  • Biochemistry (AREA)
  • General Health & Medical Sciences (AREA)
  • General Physics & Mathematics (AREA)
  • Immunology (AREA)
  • Pathology (AREA)
  • Analysing Materials By The Use Of Radiation (AREA)

Abstract

The anisotropic value rm of cold rolled, recrystallization annealed thin and very thin metal sheet 2 is determined by employing X-rays 1 for the measurement of the crystallographic texture. The sheets are irradiated with incident primary radiation at an energy of at least 20 keV, the rays diffracted at the crystal lattices are detected 3, and the detected X-ray quanta are converted into voltage pulses proportional to their energy. The voltage pulses are then discriminated in respect of pulse height and the maxima and the frequency distribution of the pulse heights are arranged in accordance with predetermined diffraction reflexes, so that the intensity of the diffraction reflex is measured at fixed values of the latitude angle alpha and the azimuth angle beta . <IMAGE>
GB7908877A 1978-04-22 1979-03-13 Determination of a characteristic of metal sheet or strip Expired GB2019559B (en)

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
DE2817742A DE2817742C2 (en) 1978-04-22 1978-04-22 Method and device for determining technological parameters

Publications (2)

Publication Number Publication Date
GB2019559A true GB2019559A (en) 1979-10-31
GB2019559B GB2019559B (en) 1983-01-06

Family

ID=6037775

Family Applications (1)

Application Number Title Priority Date Filing Date
GB7908877A Expired GB2019559B (en) 1978-04-22 1979-03-13 Determination of a characteristic of metal sheet or strip

Country Status (8)

Country Link
JP (1) JPS54141695A (en)
AT (1) AT381394B (en)
BE (1) BE875722A (en)
DE (1) DE2817742C2 (en)
FR (1) FR2423774A1 (en)
GB (1) GB2019559B (en)
IT (1) IT1114999B (en)
LU (1) LU81170A1 (en)

Cited By (2)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
WO1994019920A1 (en) * 1993-02-23 1994-09-01 THE UNITED STATES OF AMERICA, as represented by T HE SECRETARY OF COMMERCE Method and apparatus for precisely measuring accelerating voltages applied to x-ray sources
FR2833081A1 (en) * 2001-11-30 2003-06-06 Centre Nat Rech Scient METHOD FOR X-RAY VOLUME ANALYSIS OF CRYSTALLOGRAPHIC CHARACTERISTICS OF PARTS

Families Citing this family (3)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
DE3825830A1 (en) * 1988-07-29 1990-02-01 Hoesch Stahl Ag METHOD AND DEVICE FOR TEXTURE ANALYSIS
DE102016222644A1 (en) 2016-03-14 2017-09-28 Sms Group Gmbh Process for rolling and / or heat treating a metallic product
DE102017208576A1 (en) 2016-05-25 2017-11-30 Sms Group Gmbh Apparatus and method for determining a microstructure of a metal product and metallurgical plant

Family Cites Families (2)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
GB1329695A (en) * 1970-09-09 1973-09-12 Nutter J C Diffractometry
JPS5332789A (en) * 1976-09-08 1978-03-28 Hitachi Ltd Method and apparatus for measuring of stress of white color x-ray

Cited By (2)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
WO1994019920A1 (en) * 1993-02-23 1994-09-01 THE UNITED STATES OF AMERICA, as represented by T HE SECRETARY OF COMMERCE Method and apparatus for precisely measuring accelerating voltages applied to x-ray sources
FR2833081A1 (en) * 2001-11-30 2003-06-06 Centre Nat Rech Scient METHOD FOR X-RAY VOLUME ANALYSIS OF CRYSTALLOGRAPHIC CHARACTERISTICS OF PARTS

Also Published As

Publication number Publication date
BE875722A (en) 1979-10-22
JPH0237539B2 (en) 1990-08-24
IT7948613A0 (en) 1979-04-04
ATA149679A (en) 1986-02-15
LU81170A1 (en) 1979-11-07
DE2817742C2 (en) 1980-07-24
GB2019559B (en) 1983-01-06
JPS54141695A (en) 1979-11-05
AT381394B (en) 1986-10-10
FR2423774A1 (en) 1979-11-16
FR2423774B1 (en) 1984-05-04
IT1114999B (en) 1986-02-03
DE2817742B1 (en) 1979-10-31

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Legal Events

Date Code Title Description
PCNP Patent ceased through non-payment of renewal fee

Effective date: 19950313