GB201316121D0 - Inspection apparatus and method - Google Patents
Inspection apparatus and methodInfo
- Publication number
- GB201316121D0 GB201316121D0 GB201316121A GB201316121A GB201316121D0 GB 201316121 D0 GB201316121 D0 GB 201316121D0 GB 201316121 A GB201316121 A GB 201316121A GB 201316121 A GB201316121 A GB 201316121A GB 201316121 D0 GB201316121 D0 GB 201316121D0
- Authority
- GB
- United Kingdom
- Prior art keywords
- inspection apparatus
- inspection
- Prior art date
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
- Ceased
Links
- 238000007689 inspection Methods 0.000 title 1
- 238000000034 method Methods 0.000 title 1
Classifications
-
- H—ELECTRICITY
- H02—GENERATION; CONVERSION OR DISTRIBUTION OF ELECTRIC POWER
- H02S—GENERATION OF ELECTRIC POWER BY CONVERSION OF INFRARED RADIATION, VISIBLE LIGHT OR ULTRAVIOLET LIGHT, e.g. USING PHOTOVOLTAIC [PV] MODULES
- H02S50/00—Monitoring or testing of PV systems, e.g. load balancing or fault identification
- H02S50/10—Testing of PV devices, e.g. of PV modules or single PV cells
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
- G01N21/00—Investigating or analysing materials by the use of optical means, i.e. using sub-millimetre waves, infrared, visible or ultraviolet light
- G01N21/84—Systems specially adapted for particular applications
- G01N21/88—Investigating the presence of flaws or contamination
- G01N21/95—Investigating the presence of flaws or contamination characterised by the material or shape of the object to be examined
- G01N21/9501—Semiconductor wafers
-
- Y—GENERAL TAGGING OF NEW TECHNOLOGICAL DEVELOPMENTS; GENERAL TAGGING OF CROSS-SECTIONAL TECHNOLOGIES SPANNING OVER SEVERAL SECTIONS OF THE IPC; TECHNICAL SUBJECTS COVERED BY FORMER USPC CROSS-REFERENCE ART COLLECTIONS [XRACs] AND DIGESTS
- Y02—TECHNOLOGIES OR APPLICATIONS FOR MITIGATION OR ADAPTATION AGAINST CLIMATE CHANGE
- Y02E—REDUCTION OF GREENHOUSE GAS [GHG] EMISSIONS, RELATED TO ENERGY GENERATION, TRANSMISSION OR DISTRIBUTION
- Y02E10/00—Energy generation through renewable energy sources
- Y02E10/50—Photovoltaic [PV] energy
Landscapes
- Physics & Mathematics (AREA)
- Health & Medical Sciences (AREA)
- Life Sciences & Earth Sciences (AREA)
- Chemical & Material Sciences (AREA)
- Analytical Chemistry (AREA)
- Biochemistry (AREA)
- General Health & Medical Sciences (AREA)
- General Physics & Mathematics (AREA)
- Immunology (AREA)
- Pathology (AREA)
- Investigating Materials By The Use Of Optical Means Adapted For Particular Applications (AREA)
Priority Applications (2)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| GB201316121A GB201316121D0 (en) | 2013-09-10 | 2013-09-10 | Inspection apparatus and method |
| PCT/GB2014/052745 WO2015036754A1 (en) | 2013-09-10 | 2014-09-10 | Inspection apparatus and method |
Applications Claiming Priority (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| GB201316121A GB201316121D0 (en) | 2013-09-10 | 2013-09-10 | Inspection apparatus and method |
Publications (1)
| Publication Number | Publication Date |
|---|---|
| GB201316121D0 true GB201316121D0 (en) | 2013-10-23 |
Family
ID=49487016
Family Applications (1)
| Application Number | Title | Priority Date | Filing Date |
|---|---|---|---|
| GB201316121A Ceased GB201316121D0 (en) | 2013-09-10 | 2013-09-10 | Inspection apparatus and method |
Country Status (2)
| Country | Link |
|---|---|
| GB (1) | GB201316121D0 (en) |
| WO (1) | WO2015036754A1 (en) |
Families Citing this family (2)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| CN108233869A (en) * | 2018-01-05 | 2018-06-29 | 浙江潮城互联网科技有限公司 | Photovoltaic slat production line detection device |
| WO2020223234A1 (en) * | 2019-04-29 | 2020-11-05 | The Regents Of The University Of California | Water reflection analysis of encapsulated photovoltaic modules |
Family Cites Families (5)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| JPH09311109A (en) * | 1996-05-22 | 1997-12-02 | Matsushita Electric Ind Co Ltd | Defect inspection method using light and its apparatus |
| JP4775492B2 (en) * | 1999-02-08 | 2011-09-21 | Jfeスチール株式会社 | Surface inspection device |
| US6433867B1 (en) * | 2000-01-11 | 2002-08-13 | The Aerospace Corporation | Contrast imaging method for inspecting specular surface devices |
| US7705978B2 (en) * | 2006-02-06 | 2010-04-27 | Northrop Grumman Corporation | Method and apparatus for inspection of multi-junction solar cells |
| US7326929B2 (en) * | 2006-02-06 | 2008-02-05 | Northrop Grumman Corporation | Method and apparatus for inspection of semiconductor devices |
-
2013
- 2013-09-10 GB GB201316121A patent/GB201316121D0/en not_active Ceased
-
2014
- 2014-09-10 WO PCT/GB2014/052745 patent/WO2015036754A1/en not_active Ceased
Also Published As
| Publication number | Publication date |
|---|---|
| WO2015036754A1 (en) | 2015-03-19 |
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Legal Events
| Date | Code | Title | Description |
|---|---|---|---|
| AT | Applications terminated before publication under section 16(1) |