GB2010577B - Preparation of materials for examination of transmission electron microscopy techniques - Google Patents
Preparation of materials for examination of transmission electron microscopy techniquesInfo
- Publication number
- GB2010577B GB2010577B GB7844005A GB7844005A GB2010577B GB 2010577 B GB2010577 B GB 2010577B GB 7844005 A GB7844005 A GB 7844005A GB 7844005 A GB7844005 A GB 7844005A GB 2010577 B GB2010577 B GB 2010577B
- Authority
- GB
- United Kingdom
- Prior art keywords
- examination
- preparation
- materials
- transmission electron
- electron microscopy
- Prior art date
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
- Expired
Links
- 238000000034 method Methods 0.000 title 1
- 238000004627 transmission electron microscopy Methods 0.000 title 1
Classifications
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
- G01N1/00—Sampling; Preparing specimens for investigation
- G01N1/28—Preparing specimens for investigation including physical details of (bio-)chemical methods covered elsewhere, e.g. G01N33/50, C12Q
- G01N1/32—Polishing; Etching
-
- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01J—ELECTRIC DISCHARGE TUBES OR DISCHARGE LAMPS
- H01J37/00—Discharge tubes with provision for introducing objects or material to be exposed to the discharge, e.g. for the purpose of examination or processing thereof
- H01J37/30—Electron-beam or ion-beam tubes for localised treatment of objects
- H01J37/304—Controlling tubes by information coming from the objects or from the beam, e.g. correction signals
-
- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01J—ELECTRIC DISCHARGE TUBES OR DISCHARGE LAMPS
- H01J37/00—Discharge tubes with provision for introducing objects or material to be exposed to the discharge, e.g. for the purpose of examination or processing thereof
- H01J37/30—Electron-beam or ion-beam tubes for localised treatment of objects
- H01J37/305—Electron-beam or ion-beam tubes for localised treatment of objects for casting, melting, evaporating, or etching
- H01J37/3053—Electron-beam or ion-beam tubes for localised treatment of objects for casting, melting, evaporating, or etching for evaporating or etching
Landscapes
- Chemical & Material Sciences (AREA)
- Analytical Chemistry (AREA)
- Physics & Mathematics (AREA)
- Life Sciences & Earth Sciences (AREA)
- Plasma & Fusion (AREA)
- Health & Medical Sciences (AREA)
- Engineering & Computer Science (AREA)
- Biochemistry (AREA)
- General Health & Medical Sciences (AREA)
- General Physics & Mathematics (AREA)
- Immunology (AREA)
- Pathology (AREA)
- Sampling And Sample Adjustment (AREA)
Priority Applications (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| GB7844005A GB2010577B (en) | 1977-11-07 | 1978-11-10 | Preparation of materials for examination of transmission electron microscopy techniques |
Applications Claiming Priority (2)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| GB4631177 | 1977-11-07 | ||
| GB7844005A GB2010577B (en) | 1977-11-07 | 1978-11-10 | Preparation of materials for examination of transmission electron microscopy techniques |
Publications (2)
| Publication Number | Publication Date |
|---|---|
| GB2010577A GB2010577A (en) | 1979-06-27 |
| GB2010577B true GB2010577B (en) | 1982-05-06 |
Family
ID=26265789
Family Applications (1)
| Application Number | Title | Priority Date | Filing Date |
|---|---|---|---|
| GB7844005A Expired GB2010577B (en) | 1977-11-07 | 1978-11-10 | Preparation of materials for examination of transmission electron microscopy techniques |
Country Status (1)
| Country | Link |
|---|---|
| GB (1) | GB2010577B (en) |
Families Citing this family (7)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| DE3211022A1 (en) * | 1981-03-31 | 1982-11-11 | Ion Tech Ltd., Teddington, Middlesex | METHOD AND DEVICE FOR PROVIDING A SAMPLE SUITABLE FOR EXAMINATION WITH AN ELECTRONIC MICROSCOPE |
| HU190855B (en) * | 1983-10-12 | 1986-11-28 | Mta Mueszaki Fizikai Kutato Intezete,Hu | Device for working solid samples by ion beam and ion source to the device |
| JP2779414B2 (en) * | 1988-12-01 | 1998-07-23 | セイコーインスツルメンツ株式会社 | Processing and observation method of micro section |
| US5089774A (en) * | 1989-12-26 | 1992-02-18 | Sharp Kabushiki Kaisha | Apparatus and a method for checking a semiconductor |
| JP3221797B2 (en) * | 1994-06-14 | 2001-10-22 | 株式会社日立製作所 | Sample preparation method and apparatus |
| AT509608B1 (en) * | 2010-12-23 | 2011-10-15 | Leica Mikrosysteme Gmbh | DEVICE AND METHOD FOR COOLING SAMPLES DURING ONE ION BEAM PREPARATION |
| CN111208153B (en) * | 2020-01-20 | 2024-02-27 | 航天科工防御技术研究试验中心 | Tin-based lead-free welding spot transmission sample and preparation method thereof |
-
1978
- 1978-11-10 GB GB7844005A patent/GB2010577B/en not_active Expired
Also Published As
| Publication number | Publication date |
|---|---|
| GB2010577A (en) | 1979-06-27 |
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Legal Events
| Date | Code | Title | Description |
|---|---|---|---|
| PCNP | Patent ceased through non-payment of renewal fee |