GB2061630A - Apparatus for testing printed circuit boards - Google Patents
Apparatus for testing printed circuit boards Download PDFInfo
- Publication number
- GB2061630A GB2061630A GB7936042A GB7936042A GB2061630A GB 2061630 A GB2061630 A GB 2061630A GB 7936042 A GB7936042 A GB 7936042A GB 7936042 A GB7936042 A GB 7936042A GB 2061630 A GB2061630 A GB 2061630A
- Authority
- GB
- United Kingdom
- Prior art keywords
- pattern
- probe
- printed circuit
- carrier
- board
- Prior art date
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
- Withdrawn
Links
- 238000012360 testing method Methods 0.000 title claims abstract description 41
- 239000000523 sample Substances 0.000 claims abstract description 45
- 230000005405 multipole Effects 0.000 claims description 13
- 230000000712 assembly Effects 0.000 claims description 5
- 238000000429 assembly Methods 0.000 claims description 5
- 239000000969 carrier Substances 0.000 claims description 4
- 239000011810 insulating material Substances 0.000 claims description 4
- 239000004593 Epoxy Substances 0.000 claims description 3
- 239000011521 glass Substances 0.000 claims description 3
- 239000002184 metal Substances 0.000 claims description 3
- 230000003044 adaptive effect Effects 0.000 claims description 2
- 238000013459 approach Methods 0.000 claims description 2
- 238000001514 detection method Methods 0.000 claims description 2
- 238000011161 development Methods 0.000 claims description 2
- 238000005553 drilling Methods 0.000 claims description 2
- 239000000463 material Substances 0.000 claims description 2
- 230000013011 mating Effects 0.000 claims description 2
- 238000000034 method Methods 0.000 claims description 2
- 238000012856 packing Methods 0.000 claims description 2
- 230000000135 prohibitive effect Effects 0.000 claims description 2
Classifications
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
- G01R31/00—Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere
- G01R31/28—Testing of electronic circuits, e.g. by signal tracer
- G01R31/2801—Testing of printed circuits, backplanes, motherboards, hybrid circuits or carriers for multichip packages [MCP]
- G01R31/2805—Bare printed circuit boards
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
- G01R1/00—Details of instruments or arrangements of the types included in groups G01R5/00 - G01R13/00 and G01R31/00
- G01R1/02—General constructional details
- G01R1/06—Measuring leads; Measuring probes
- G01R1/067—Measuring probes
- G01R1/073—Multiple probes
- G01R1/07307—Multiple probes with individual probe elements, e.g. needles, cantilever beams or bump contacts, fixed in relation to each other, e.g. bed of nails fixture or probe card
- G01R1/07364—Multiple probes with individual probe elements, e.g. needles, cantilever beams or bump contacts, fixed in relation to each other, e.g. bed of nails fixture or probe card with provisions for altering position, number or connection of probe tips; Adapting to differences in pitch
- G01R1/07378—Multiple probes with individual probe elements, e.g. needles, cantilever beams or bump contacts, fixed in relation to each other, e.g. bed of nails fixture or probe card with provisions for altering position, number or connection of probe tips; Adapting to differences in pitch using an intermediate adapter, e.g. space transformers
Landscapes
- Engineering & Computer Science (AREA)
- Physics & Mathematics (AREA)
- General Physics & Mathematics (AREA)
- Computer Hardware Design (AREA)
- Microelectronics & Electronic Packaging (AREA)
- General Engineering & Computer Science (AREA)
- Power Engineering (AREA)
- Testing Of Short-Circuits, Discontinuities, Leakage, Or Incorrect Line Connections (AREA)
Abstract
Apparatus for testing printed circuit boards comprises a probe carrier 1 which is drilled with a pattern of holes 2 corresponding to the pattern of component mounting holes in the printed circuit board. Each hole 2 has fitted therein a removable probe 3, 4 which is connected by a lead 6 to a standard plug 7. The assembled carrier and plug(s) are then plugged into a socket 8 linked to a test controller 10. The probe elements 3, 4 and leads 6 can be disassembled and reused in a new carrier 1 when a different board pattern is to be tested. <IMAGE>
Description
SPECIFICATION
Apparatus for testing printed circuit boards
This invention relates to testing apparatus for printed circuit boards.
The complexity of printed circuits boards has greatly increased in recent years, particularly in respect of the development of multilayer boards and also in the packing densities being achieved. It is an accepted practice in the industry that each and every such board should be subjected to thorough electrical testing to ensure that no faults escape detection. Such testing, although possible manually, is nowadays performed automatically under the control of a programmed electrical switching system.
Such testing equipment must be purpose designed for each circuit board pattern to be tested or else some form of adaptable universal equipment is necessary. In the first case the cost of building new testing equipments for each new pattern can be prohibitive, especially when only short production runs of boards are involved. The adaptive approach on the other hand may require only an initial high cost for the basic equipment with additional costs for each new board pattern.
One form of adaptable test equipment is that in which a basic array of spring loaded test probes is applied to the board to be tested via an apertured mask which allows only selected probes to come into contact with the board. Such an apparatus is disclosed in
British Patent Specification No. 1,263,644.
However, with modern board techniques it may be necessary to provide as the basic array an orthogonal array of probes with a nominalpitch of, say, 2 mm and having a working area of 45 cm by 30 cm, or even more. This would require the permanent provision of 33720 or more probes of which only a minority would be used at any one time.
The cost of making such a basic array would be very high.
According to the present invention there is provided apparatus for testing printed circuit boards including a probe carrier comprising a flat plate of insulating material provided with a pattern of holes therethrough, said pattern being determined in accordance with the printed circuit board to be tested, a plurality of removable spring loaded probe elements located in said holes, a multi-pole connector plug asssembly or assemblies having standardised connection plug arrangements, individual flexible removable electrical connecting leads connecting said probe elements with said multi-probe plug(s) and a test control equipment having multi-pole connection socket means to accept the standardised plug(s).
An embodiment of the invention will now be described with reference to the accompanying drawings, in which:
Figure 1 is a general view of a printed circuit board apparatus according to the invention, and
Figure 2 shows detaiis of part of the apparatus of Fig. 1.
The apparatus shown in Fig. 1 consists of a probe carrier 1 which is connected by leads 6 to one or more standardised connector plug assemblies 7. A test control circuit 10 is linked to a multi-pole connection socket 8 by a cable 9.
The probe carrier 1, (Fig. 2) is machined from dimensionally stable sheet material, such as a glass reinforced epoxy laminate, the carrier is drilled with a pattern of holes 2 corresponding to the pattern of test points on the particular printed circuit board to be tested. In the case of most printed circuit boards this test pattern will correspond to the pattern of holes drilled in the printed circuit board for the mounting of components thereon. Thus it is a simple matter to use the same drilling arrangement for the carrier as is used for fabricating the board. Each of the holes 2 is then fitted with a metal probe tube 3 which is an interference fit in the hole. The tubes 3 are each fitted with a spring loaded probe 4.Each probe element is electrically connected to a standardised plug assembly 7 by means of an individual connecting lead 6 which has at one end a spring clip terminal 5 which engages with the tube 3. The other end of the lead 6 is fitted into an aperture 7a of a standardised multi-pole connector plug 7.
When a new printed circuit board is put into production a new carrier 1 is readily drilled, as explained above, and loaded with probe elements which are connected to the requisite number of multi-pole plugs 7. The plugs 7 are then fitted to the socket 8. The test control circuit 10 is programmed to perform a predetermined sequence of electrical tests on each board which is brought into mating contact with the probe elements in the carrier. When the board pattern is changed it is a simple matter to disassemble the probe elements and the connecting leads which may then be re-used in a new carrier for a new circuit board pattern. Once the new carrier is ready it is plugged into the socket 8 and the re-programmed control circuit 10 is then able to test the new boards. Thus by means of the different carriers the whole apparatus can be readily made into an adaptable apparatus. The cost of the carriers and the assembly of probe elements therein is small in relation to the cost of the complex test control circuit 10 which may be, e.g. computer controlled.
1. Apparatus for testing printed circuit boards including a probe carrier comprising a flat plate of insulating material provided with a pattern of holes therethrough, said pattern
**WARNING** end of DESC field may overlap start of CLMS **.
Claims (5)
1. Apparatus for testing printed circuit boards including a probe carrier comprising a flat plate of insulating material provided with a pattern of holes therethrough, said pattern being determined in accordance with the printed circuit board to be tested, a plurality of removable spring loaded probe elements located in said holes, a multi-pole connector plug assembly or assemblies having a standardised connection plug arrangements, individual flexible removable electrical connecting leads connecting said probe elements with said multi-pole plug(s) and a test control equipment having multi-pole connection socket means to accept the standardised plug(s).
2. Apparatus according to claim 1 wherein said probe elements each comprise a metal tube dimensioned to be an interference fit in a hole in the carrier, one end of the tube having a spring loaded probe located therein and the other end of the tube being adapted to receive a spring clip terminal of a connecting lead.
3. Apparatus according to any preceding claim wherein the probe carrier is made of a glass reinforced epoxy laminate.
4. Apparatus according to any preceding claim wherein the probe carrier is provided with a pattern of holes corresponding to a pattern of holes in the circuit board to be tested.
5. Apparatus for testing printed circuit boards substantially as described with reference to the accompanying drawings.
Priority Applications (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| GB7936042A GB2061630A (en) | 1979-10-17 | 1979-10-17 | Apparatus for testing printed circuit boards |
Applications Claiming Priority (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| GB7936042A GB2061630A (en) | 1979-10-17 | 1979-10-17 | Apparatus for testing printed circuit boards |
Publications (1)
| Publication Number | Publication Date |
|---|---|
| GB2061630A true GB2061630A (en) | 1981-05-13 |
Family
ID=10508571
Family Applications (1)
| Application Number | Title | Priority Date | Filing Date |
|---|---|---|---|
| GB7936042A Withdrawn GB2061630A (en) | 1979-10-17 | 1979-10-17 | Apparatus for testing printed circuit boards |
Country Status (1)
| Country | Link |
|---|---|
| GB (1) | GB2061630A (en) |
Cited By (12)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| GB2146849A (en) * | 1983-09-17 | 1985-04-24 | Marconi Instruments Ltd | Electrical test probe head assembly |
| DE3343274A1 (en) * | 1983-11-30 | 1985-06-05 | Feinmetall Gmbh, 7033 Herrenberg | CONTACT DEVICE |
| US4551673A (en) * | 1980-10-13 | 1985-11-05 | Riba-Pruftechnik Gmbh | Testing arrangement for printed circuit boards |
| EP0305951A1 (en) * | 1987-08-31 | 1989-03-08 | Everett/Charles Contact Products Inc. | Testing of integrated circuit devices on loaded printed circuit boards |
| GB2217929A (en) * | 1988-04-28 | 1989-11-01 | M P L Precision Limited | Modular interface for testing printed circuits |
| GB2236628A (en) * | 1989-09-22 | 1991-04-10 | Multiprobe Limited | Fixture for testing circuit boards |
| US5049813A (en) * | 1987-04-17 | 1991-09-17 | Everett/Charles Contact Products, Inc. | Testing of integrated circuit devices on loaded printed circuit boards |
| US5289117A (en) * | 1987-04-17 | 1994-02-22 | Everett Charles Technologies, Inc. | Testing of integrated circuit devices on loaded printed circuit |
| CN108020770A (en) * | 2017-10-31 | 2018-05-11 | 东莞华贝电子科技有限公司 | System and method for testing circuit board assembly |
| CN112731116A (en) * | 2021-01-06 | 2021-04-30 | 上海华岭集成电路技术股份有限公司 | Method for controlling increasing and decreasing pins of pin card on-line multiplexing |
| CN115236487A (en) * | 2022-07-15 | 2022-10-25 | 联宝(合肥)电子科技有限公司 | A needle implant fixture for circuit board testing |
| WO2023019923A1 (en) * | 2021-08-16 | 2023-02-23 | 南京华脉科技股份有限公司 | Combined power divider convenient to overhaul |
-
1979
- 1979-10-17 GB GB7936042A patent/GB2061630A/en not_active Withdrawn
Cited By (14)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| US4551673A (en) * | 1980-10-13 | 1985-11-05 | Riba-Pruftechnik Gmbh | Testing arrangement for printed circuit boards |
| GB2146849A (en) * | 1983-09-17 | 1985-04-24 | Marconi Instruments Ltd | Electrical test probe head assembly |
| DE3343274A1 (en) * | 1983-11-30 | 1985-06-05 | Feinmetall Gmbh, 7033 Herrenberg | CONTACT DEVICE |
| US5049813A (en) * | 1987-04-17 | 1991-09-17 | Everett/Charles Contact Products, Inc. | Testing of integrated circuit devices on loaded printed circuit boards |
| US5444387A (en) * | 1987-04-17 | 1995-08-22 | Everett Charles Technologies, Inc. | Test module hanger for test fixtures |
| US5289117A (en) * | 1987-04-17 | 1994-02-22 | Everett Charles Technologies, Inc. | Testing of integrated circuit devices on loaded printed circuit |
| EP0305951A1 (en) * | 1987-08-31 | 1989-03-08 | Everett/Charles Contact Products Inc. | Testing of integrated circuit devices on loaded printed circuit boards |
| GB2217929A (en) * | 1988-04-28 | 1989-11-01 | M P L Precision Limited | Modular interface for testing printed circuits |
| GB2236628A (en) * | 1989-09-22 | 1991-04-10 | Multiprobe Limited | Fixture for testing circuit boards |
| CN108020770A (en) * | 2017-10-31 | 2018-05-11 | 东莞华贝电子科技有限公司 | System and method for testing circuit board assembly |
| CN112731116A (en) * | 2021-01-06 | 2021-04-30 | 上海华岭集成电路技术股份有限公司 | Method for controlling increasing and decreasing pins of pin card on-line multiplexing |
| CN112731116B (en) * | 2021-01-06 | 2024-04-05 | 上海华岭集成电路技术股份有限公司 | Method for controlling needle card online multiplexing to increase and decrease needles |
| WO2023019923A1 (en) * | 2021-08-16 | 2023-02-23 | 南京华脉科技股份有限公司 | Combined power divider convenient to overhaul |
| CN115236487A (en) * | 2022-07-15 | 2022-10-25 | 联宝(合肥)电子科技有限公司 | A needle implant fixture for circuit board testing |
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Legal Events
| Date | Code | Title | Description |
|---|---|---|---|
| WAP | Application withdrawn, taken to be withdrawn or refused ** after publication under section 16(1) |