GB1512950A - Electrical testing apparatus - Google Patents
Electrical testing apparatusInfo
- Publication number
- GB1512950A GB1512950A GB21227/74A GB2122774A GB1512950A GB 1512950 A GB1512950 A GB 1512950A GB 21227/74 A GB21227/74 A GB 21227/74A GB 2122774 A GB2122774 A GB 2122774A GB 1512950 A GB1512950 A GB 1512950A
- Authority
- GB
- United Kingdom
- Prior art keywords
- various
- circuit
- under test
- points
- testing apparatus
- Prior art date
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
- Expired
Links
Classifications
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
- G01R31/00—Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere
- G01R31/50—Testing of electric apparatus, lines, cables or components for short-circuits, continuity, leakage current or incorrect line connections
- G01R31/66—Testing of connections, e.g. of plugs or non-disconnectable joints
- G01R31/67—Testing the correctness of wire connections in electric apparatus or circuits
Landscapes
- Physics & Mathematics (AREA)
- General Physics & Mathematics (AREA)
- Testing Of Individual Semiconductor Devices (AREA)
Abstract
1512950 Testing circuits PLESSEY CO Ltd 28 July 1975 [14 May 1974] 21227/74 Addition to 1386092 Heading G1U The system described in the Parent Specification is modified in that having performed one test cycle in which various inputs to a circuit under test are earthed and earth potential is then looked for at various other circuit points, another cycle is then performed with an appropriate non-zero bias voltage applied to the various points, whereby those short circuit faults within the circuit under test that are shunted by p-n junctions can be detected by the fact that a forward-biased current-carrying p-n junction drops about 0À8 volts.
Priority Applications (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| GB21227/74A GB1512950A (en) | 1975-07-28 | 1975-07-28 | Electrical testing apparatus |
Applications Claiming Priority (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| GB21227/74A GB1512950A (en) | 1975-07-28 | 1975-07-28 | Electrical testing apparatus |
Publications (1)
| Publication Number | Publication Date |
|---|---|
| GB1512950A true GB1512950A (en) | 1978-06-01 |
Family
ID=10159337
Family Applications (1)
| Application Number | Title | Priority Date | Filing Date |
|---|---|---|---|
| GB21227/74A Expired GB1512950A (en) | 1975-07-28 | 1975-07-28 | Electrical testing apparatus |
Country Status (1)
| Country | Link |
|---|---|
| GB (1) | GB1512950A (en) |
Cited By (1)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| EP0305148A1 (en) * | 1987-08-26 | 1989-03-01 | Hewlett-Packard Company | Determining component orientation |
-
1975
- 1975-07-28 GB GB21227/74A patent/GB1512950A/en not_active Expired
Cited By (1)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| EP0305148A1 (en) * | 1987-08-26 | 1989-03-01 | Hewlett-Packard Company | Determining component orientation |
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Legal Events
| Date | Code | Title | Description |
|---|---|---|---|
| PS | Patent sealed | ||
| PCNP | Patent ceased through non-payment of renewal fee |