GB1402998A - Apparatus and process for forming p-n junction semiconductor units - Google Patents
Apparatus and process for forming p-n junction semiconductor unitsInfo
- Publication number
- GB1402998A GB1402998A GB6106571A GB6106571A GB1402998A GB 1402998 A GB1402998 A GB 1402998A GB 6106571 A GB6106571 A GB 6106571A GB 6106571 A GB6106571 A GB 6106571A GB 1402998 A GB1402998 A GB 1402998A
- Authority
- GB
- United Kingdom
- Prior art keywords
- dopant
- ions
- semi
- conductor
- diffusion
- Prior art date
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
- Expired
Links
Classifications
-
- H10P30/204—
-
- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01J—ELECTRIC DISCHARGE TUBES OR DISCHARGE LAMPS
- H01J37/00—Discharge tubes with provision for introducing objects or material to be exposed to the discharge, e.g. for the purpose of examination or processing thereof
- H01J37/30—Electron-beam or ion-beam tubes for localised treatment of objects
- H01J37/317—Electron-beam or ion-beam tubes for localised treatment of objects for changing properties of the objects or for applying thin layers thereon, e.g. for ion implantation
- H01J37/3171—Electron-beam or ion-beam tubes for localised treatment of objects for changing properties of the objects or for applying thin layers thereon, e.g. for ion implantation for ion implantation
-
- H10P30/214—
Landscapes
- Chemical & Material Sciences (AREA)
- Analytical Chemistry (AREA)
- Physical Deposition Of Substances That Are Components Of Semiconductor Devices (AREA)
- Physical Vapour Deposition (AREA)
Abstract
1402998 Semi-conductor device manufacture; ion implantation apparatus ATOMIC ENERGY RESEARCH INSTITUTE 30 June 1972 61065/71 Headings H1K and H1D An apparatus for implanting dopant ions into a semi-conductor body comprises a resistively heated carrier 16 for the dopant-coated silicon body 21 and pairs of electrodes 27, 28; 13, 14; between which an RF and a pulsating direct voltage respectively are applied to cause a discharge in the evacuated chamber 10 providing a beam of positive nitrogen and oxygen ions which pass through the mesh form negative electrode 14, which is attached to a water-cooled heat sink, and bombard the silicon which is held at a temperature of 400-500 C. The ions, by creating lattice vacancies, accelerate the diffusion of dopant ions from the layer and impose a limit on diffusion or depth. The dopant layer, e.g. of antimony where the semi-conductor is P type silicon may lie under or over a patterned ion-impervious metal or silica mask. Ion beam density is greatest when the RMS value of the direct voltage is greater than that of the RF. The influence of variation in the mesh size of electrode 14 is discussed.
Priority Applications (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| GB6106571A GB1402998A (en) | 1972-06-30 | 1972-06-30 | Apparatus and process for forming p-n junction semiconductor units |
Applications Claiming Priority (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| GB6106571A GB1402998A (en) | 1972-06-30 | 1972-06-30 | Apparatus and process for forming p-n junction semiconductor units |
Publications (1)
| Publication Number | Publication Date |
|---|---|
| GB1402998A true GB1402998A (en) | 1975-08-13 |
Family
ID=10486566
Family Applications (1)
| Application Number | Title | Priority Date | Filing Date |
|---|---|---|---|
| GB6106571A Expired GB1402998A (en) | 1972-06-30 | 1972-06-30 | Apparatus and process for forming p-n junction semiconductor units |
Country Status (1)
| Country | Link |
|---|---|
| GB (1) | GB1402998A (en) |
Cited By (5)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| FR2475068A1 (en) * | 1980-02-01 | 1981-08-07 | Commissariat Energie Atomique | METHOD FOR DOPING SEMICONDUCTORS |
| FR2505881A1 (en) * | 1981-05-12 | 1982-11-19 | Siemens Ag | METHOD AND DEVICE FOR DOPING SEMICONDUCTOR MATERIAL |
| FR2506344A2 (en) * | 1980-02-01 | 1982-11-26 | Commissariat Energie Atomique | SEMICONDUCTOR DOPING PROCESS |
| GB2224752A (en) * | 1988-11-10 | 1990-05-16 | Stc Plc | Patterned film deposition from perforated |
| WO2012068088A1 (en) * | 2010-11-15 | 2012-05-24 | Varian Semiconductor Equipment Associates, Inc. | Doping of planar or three-dimensional structures at elevated temperatures |
-
1972
- 1972-06-30 GB GB6106571A patent/GB1402998A/en not_active Expired
Cited By (10)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| FR2475068A1 (en) * | 1980-02-01 | 1981-08-07 | Commissariat Energie Atomique | METHOD FOR DOPING SEMICONDUCTORS |
| FR2506344A2 (en) * | 1980-02-01 | 1982-11-26 | Commissariat Energie Atomique | SEMICONDUCTOR DOPING PROCESS |
| EP0067090A1 (en) * | 1980-02-01 | 1982-12-15 | Commissariat à l'Energie Atomique | Process for doping semiconductors |
| US4368083A (en) | 1980-02-01 | 1983-01-11 | Commissariat A L'energie Atomique | Process for doping semiconductors |
| EP0033696B1 (en) * | 1980-02-01 | 1984-01-18 | COMMISSARIAT A L'ENERGIE ATOMIQUE Etablissement de Caractère Scientifique Technique et Industriel | Process for the doping of semiconductors |
| US4452644A (en) * | 1980-02-01 | 1984-06-05 | Commissariat A L'energie Atomique | Process for doping semiconductors |
| FR2505881A1 (en) * | 1981-05-12 | 1982-11-19 | Siemens Ag | METHOD AND DEVICE FOR DOPING SEMICONDUCTOR MATERIAL |
| GB2224752A (en) * | 1988-11-10 | 1990-05-16 | Stc Plc | Patterned film deposition from perforated |
| GB2224752B (en) * | 1988-11-10 | 1992-08-05 | Stc Plc | Film deposition |
| WO2012068088A1 (en) * | 2010-11-15 | 2012-05-24 | Varian Semiconductor Equipment Associates, Inc. | Doping of planar or three-dimensional structures at elevated temperatures |
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Legal Events
| Date | Code | Title | Description |
|---|---|---|---|
| PS | Patent sealed [section 19, patents act 1949] | ||
| PLNP | Patent lapsed through nonpayment of renewal fees |