GB1328734A - Method and means for photometrically evaluating light-absorbing zones in a thin layer of light-scattering material - Google Patents
Method and means for photometrically evaluating light-absorbing zones in a thin layer of light-scattering materialInfo
- Publication number
- GB1328734A GB1328734A GB4370071A GB4370071A GB1328734A GB 1328734 A GB1328734 A GB 1328734A GB 4370071 A GB4370071 A GB 4370071A GB 4370071 A GB4370071 A GB 4370071A GB 1328734 A GB1328734 A GB 1328734A
- Authority
- GB
- United Kingdom
- Prior art keywords
- light
- plate
- reflected
- transmitted
- detectors
- Prior art date
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
- Expired
Links
- 238000000149 argon plasma sintering Methods 0.000 title abstract 2
- 239000000463 material Substances 0.000 title abstract 2
- 238000000034 method Methods 0.000 title 1
- 238000005259 measurement Methods 0.000 abstract 3
- 238000011156 evaluation Methods 0.000 abstract 2
- 239000000835 fiber Substances 0.000 abstract 2
- 230000003287 optical effect Effects 0.000 abstract 2
- 238000002310 reflectometry Methods 0.000 abstract 2
- 238000010521 absorption reaction Methods 0.000 abstract 1
- 238000004587 chromatography analysis Methods 0.000 abstract 1
- 238000012544 monitoring process Methods 0.000 abstract 1
Classifications
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
- G01N21/00—Investigating or analysing materials by the use of optical means, i.e. using sub-millimetre waves, infrared, visible or ultraviolet light
- G01N21/17—Systems in which incident light is modified in accordance with the properties of the material investigated
- G01N21/47—Scattering, i.e. diffuse reflection
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
- G01N21/00—Investigating or analysing materials by the use of optical means, i.e. using sub-millimetre waves, infrared, visible or ultraviolet light
- G01N21/17—Systems in which incident light is modified in accordance with the properties of the material investigated
- G01N21/25—Colour; Spectral properties, i.e. comparison of effect of material on the light at two or more different wavelengths or wavelength bands
- G01N21/255—Details, e.g. use of specially adapted sources, lighting or optical systems
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
- G01N21/00—Investigating or analysing materials by the use of optical means, i.e. using sub-millimetre waves, infrared, visible or ultraviolet light
- G01N21/17—Systems in which incident light is modified in accordance with the properties of the material investigated
- G01N21/47—Scattering, i.e. diffuse reflection
- G01N21/4738—Diffuse reflection, e.g. also for testing fluids, fibrous materials
- G01N21/474—Details of optical heads therefor, e.g. using optical fibres
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
- G01N21/00—Investigating or analysing materials by the use of optical means, i.e. using sub-millimetre waves, infrared, visible or ultraviolet light
- G01N21/17—Systems in which incident light is modified in accordance with the properties of the material investigated
- G01N21/59—Transmissivity
- G01N21/5907—Densitometers
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
- G01N30/00—Investigating or analysing materials by separation into components using adsorption, absorption or similar phenomena or using ion-exchange, e.g. chromatography or field flow fractionation
- G01N30/90—Plate chromatography, e.g. thin layer or paper chromatography
- G01N30/95—Detectors specially adapted therefor; Signal analysis
Landscapes
- Physics & Mathematics (AREA)
- Health & Medical Sciences (AREA)
- Life Sciences & Earth Sciences (AREA)
- Chemical & Material Sciences (AREA)
- Analytical Chemistry (AREA)
- Biochemistry (AREA)
- General Health & Medical Sciences (AREA)
- General Physics & Mathematics (AREA)
- Immunology (AREA)
- Pathology (AREA)
- Spectroscopy & Molecular Physics (AREA)
- Investigating Or Analysing Materials By Optical Means (AREA)
Abstract
1328734 Photo-electric evaluation of thinlayer media CARL ZEISS-STIFTUNG (trading as CARL ZEISS) 20 Sept 1971 [30 Sept 1970j 43700/71 Heading G1A In the photo-electric evaluation of thin-layer media e.g. as used in chromatography, both reflectivity and transmissivity measurements are carried out simultaneously in such a way as to obtain measurements of the absorption due to the separated sample free from errors due to variations in the light scattering characteristics of the material of the thin-layer medium (the separating layer) itself, which occur when reflectivity measurements alone are used. In apparatus for reading a chromatogram, Fig.4, the plate 6 is fed through the beam of light from monochromotor 4, which irradiates the plate at normal incidence. The outputs of detectors 7, 8 monitoring diffusely reflected light and transmitted light respectively, are amplified (9 and 10) and summed at 11. The recorder 12 is controlled in synchronism with respective movement of the plate 6 and the optical system. Particular optical arrangements are described. In one, Fig.5 (not shown), integrating spheres with associated detectors are mounted on either side of the plate 6. In another, Fig. 6 (not shown) one fibre optic bundle leads light to the plate surface and two more lead reflected and transmitted light respectively, to respective detectors. The fibre optic arrangement can be modified so that a single detector can be used to sum the transmitted and reflected intensities, the end of the bundle conducting the transmitted intensity being combined at a common location with that conducting the reflected intensity.
Applications Claiming Priority (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| DE2047952A DE2047952C3 (en) | 1970-09-30 | 1970-09-30 | Process for the photometric evaluation of the zones resulting from the separation of substance mixtures in thin layers of light-scattering material |
Publications (1)
| Publication Number | Publication Date |
|---|---|
| GB1328734A true GB1328734A (en) | 1973-08-30 |
Family
ID=5783734
Family Applications (1)
| Application Number | Title | Priority Date | Filing Date |
|---|---|---|---|
| GB4370071A Expired GB1328734A (en) | 1970-09-30 | 1971-09-20 | Method and means for photometrically evaluating light-absorbing zones in a thin layer of light-scattering material |
Country Status (3)
| Country | Link |
|---|---|
| US (1) | US3746869A (en) |
| DE (1) | DE2047952C3 (en) |
| GB (1) | GB1328734A (en) |
Cited By (1)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| GB2119507A (en) * | 1982-04-10 | 1983-11-16 | Bruker Analytische Messtechnik | Infrared spectrometer |
Families Citing this family (19)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| JPS5123795A (en) * | 1974-08-21 | 1976-02-25 | Shimadzu Corp | |
| US4012144A (en) * | 1975-08-07 | 1977-03-15 | Varian Associates | Spectrosorptance measuring system and method |
| US4052615A (en) * | 1976-07-30 | 1977-10-04 | Industrial Nucleonics Corporation | Spherical cavity method and apparatus for measuring a sheet material property using infrared radiation |
| US4120582A (en) * | 1976-10-27 | 1978-10-17 | Donnelly Mirrors, Inc. | Light reflectivity and transmission testing apparatus and method |
| US4171909A (en) * | 1977-03-25 | 1979-10-23 | Miles Laboratories, Inc. | Apparatus for measuring light intensities |
| DE2751365B2 (en) * | 1977-11-17 | 1979-12-06 | Diamant Test Gesellschaft Fuer Edelsteinpruefungen Mbh, 5000 Koeln | Device for measuring the absorption of a sample |
| DE2757196C3 (en) * | 1977-12-22 | 1981-11-26 | Vladimir Dr.-Ing. 5100 Aachen Blazek | Photometric arrangement |
| US4199260A (en) * | 1978-08-21 | 1980-04-22 | Technicon Instruments Corporation | Apparatus and method for determining the concentration in a sample |
| DE3005923A1 (en) * | 1980-02-16 | 1981-09-03 | Compur-Electronic GmbH, 8000 München | PHOTOMETRIC METHOD AND PHOTOMETRIC DEVICE FOR DETERMINING REACTION PROCESSES |
| JPS58162038A (en) * | 1982-03-23 | 1983-09-26 | Canon Inc | Pattern defect detection apparatus |
| US4591271A (en) * | 1983-03-21 | 1986-05-27 | Byers Donald W | Method and apparatus for coating detection and surface evaluation |
| JPS62270079A (en) * | 1986-05-19 | 1987-11-24 | Fuji Photo Film Co Ltd | Case inspection method for floppy disk |
| JPS6332338A (en) * | 1986-07-26 | 1988-02-12 | Hitachi Ltd | Optical property measuring device |
| US4937637A (en) * | 1989-02-10 | 1990-06-26 | Kollmorgen Corporation | Dual reading head transmission/reflection densitometer |
| US5196906A (en) * | 1990-06-29 | 1993-03-23 | Tma Technologies, Inc. | Modular scatterometer with interchangeable scanning heads |
| US5717216A (en) * | 1996-10-16 | 1998-02-10 | Reynolds Metals Company | Thickness gauging using ultraviolet light absorption |
| DE19811150C2 (en) * | 1998-03-14 | 2002-05-02 | Bernd Spangenberg | Thin-layer chromatography |
| DE102011077290A1 (en) | 2011-06-09 | 2012-12-13 | Carl Zeiss Microimaging Gmbh | Measuring method and measuring device for determining transmission and / or reflection properties |
| US10197496B2 (en) * | 2015-06-23 | 2019-02-05 | Empire Technology Development Llc | Real-time monitoring of material composition for quality control |
Family Cites Families (10)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| US2632855A (en) * | 1947-10-07 | 1953-03-24 | Westinghouse Electric Corp | Photoelectric speed control |
| US2718597A (en) * | 1951-11-01 | 1955-09-20 | Exxon Research Engineering Co | Infrared analysis apparatus |
| US2834247A (en) * | 1955-01-26 | 1958-05-13 | Beckman Instruments Inc | Optical density analyzing apparatus |
| US2930898A (en) * | 1956-09-11 | 1960-03-29 | W D Engineering Co Ltd | Cathode ray tube apparatus for the inspection of articles |
| GB1024734A (en) * | 1963-05-06 | 1966-04-06 | British Petroleum Co | Improvements relating to the detection of solid particles suspended in liquid |
| US3504978A (en) * | 1965-02-04 | 1970-04-07 | Shimadzu Corp | Plural beam spectrophotometer with a diffusion plate between each cell and detector |
| US3504983A (en) * | 1966-05-31 | 1970-04-07 | Nasa | Ellipsoidal mirror reflectometer including means for averaging the radiation reflected from the sample |
| US3567328A (en) * | 1966-06-02 | 1971-03-02 | Vernon T Riley | Specimen transport mount for spectrophotometer |
| US3566083A (en) * | 1967-10-16 | 1971-02-23 | Measurement Research Center In | Sensor for punches and marks |
| US3618061A (en) * | 1969-04-30 | 1971-11-02 | Eaton Yale & Towne | Monitoring apparatus for monitoring the density of a material carried by a fluid and the flow of the fluid |
-
1970
- 1970-09-30 DE DE2047952A patent/DE2047952C3/en not_active Expired
-
1971
- 1971-09-20 GB GB4370071A patent/GB1328734A/en not_active Expired
- 1971-09-28 US US00184416A patent/US3746869A/en not_active Expired - Lifetime
Cited By (1)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| GB2119507A (en) * | 1982-04-10 | 1983-11-16 | Bruker Analytische Messtechnik | Infrared spectrometer |
Also Published As
| Publication number | Publication date |
|---|---|
| US3746869A (en) | 1973-07-17 |
| DE2047952C3 (en) | 1973-10-18 |
| DE2047952B2 (en) | 1973-03-22 |
| DE2047952A1 (en) | 1972-04-06 |
Similar Documents
| Publication | Publication Date | Title |
|---|---|---|
| GB1328734A (en) | Method and means for photometrically evaluating light-absorbing zones in a thin layer of light-scattering material | |
| US3667846A (en) | Optical surface inspection apparatus | |
| GB1156969A (en) | Non-Contacting Gauge | |
| SE7905294L (en) | STOFTMETNING | |
| US3854044A (en) | A method and apparatus for measuring a transmission spectrum of a film | |
| JPS56126747A (en) | Inspecting method for flaw, alien substance and the like on surface of sample and device therefor | |
| GB1352727A (en) | Method and device for detecting surface defects of a substan tially smooth material | |
| EP0396409A3 (en) | High resolution ellipsometric apparatus | |
| GB1065752A (en) | Fault detecting | |
| GB1338129A (en) | Photometric analyzer | |
| GB1212946A (en) | Polarimeter | |
| GB1330101A (en) | Method of nondestructive measurement of the state of a surface | |
| GB1404944A (en) | Apparatus for the production of a measurement signal or a measurement and control signal | |
| EP0453797B1 (en) | Infrared ray moisture meter | |
| DE3373212D1 (en) | Detector system for measuring the intensity of a radiation scattered at a predetermined angle from a sample irradiated at a specified angle of incidence | |
| GB1271172A (en) | An arrangement for measuring the refractive index of liquids | |
| US3562539A (en) | Apparatus for scanning thin-layer and other chromatograms | |
| US3260850A (en) | Measuring the water content of photographic layers | |
| GB1284442A (en) | Method and electro-optical system for inspecting bodies such as tiles | |
| ES372098A1 (en) | Radiation sensitive defect scanner for transparent materials | |
| GB1431902A (en) | Optical method and apparatus for exampining surfaces | |
| GB1596295A (en) | Optical apparatus and method | |
| GB1406296A (en) | Method and apparatus for measuring optical irregularities in an article | |
| GB1350617A (en) | Apparatus for monitoring the refractive index of a fluid | |
| JPS6241224Y2 (en) |
Legal Events
| Date | Code | Title | Description |
|---|---|---|---|
| PS | Patent sealed [section 19, patents act 1949] | ||
| PCNP | Patent ceased through non-payment of renewal fee |