[go: up one dir, main page]

GB1201679A - Location of short circuits - Google Patents

Location of short circuits

Info

Publication number
GB1201679A
GB1201679A GB1736568A GB1736568A GB1201679A GB 1201679 A GB1201679 A GB 1201679A GB 1736568 A GB1736568 A GB 1736568A GB 1736568 A GB1736568 A GB 1736568A GB 1201679 A GB1201679 A GB 1201679A
Authority
GB
United Kingdom
Prior art keywords
probe
short circuit
location
line
points
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Expired
Application number
GB1736568A
Inventor
Owen Hosmer Davie
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
British Communications Corp Ltd
Original Assignee
British Communications Corp Ltd
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by British Communications Corp Ltd filed Critical British Communications Corp Ltd
Priority to GB1736568A priority Critical patent/GB1201679A/en
Publication of GB1201679A publication Critical patent/GB1201679A/en
Expired legal-status Critical Current

Links

Classifications

    • GPHYSICS
    • G01MEASURING; TESTING
    • G01RMEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
    • G01R31/00Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere
    • G01R31/28Testing of electronic circuits, e.g. by signal tracer
    • G01R31/2851Testing of integrated circuits [IC]
    • G01R31/2853Electrical testing of internal connections or -isolation, e.g. latch-up or chip-to-lead connections

Landscapes

  • Engineering & Computer Science (AREA)
  • Computer Hardware Design (AREA)
  • Microelectronics & Electronic Packaging (AREA)
  • General Engineering & Computer Science (AREA)
  • Physics & Mathematics (AREA)
  • General Physics & Mathematics (AREA)
  • Locating Faults (AREA)

Abstract

1,201,679. Locating short circuits. BRITISH COMMUNICATIONS CORP. Ltd. March 26, 1969 [April 10, 1968], No.17365/68. Heading G1U. To locate a short circuit in a network, current is caused to flow via the short between two first points in the network between which there is normally a relatively high impedance and the presence or absence of a consequential potential difference between two second points spaced along a network conductor is detected to determine whether the route of the short circuit current includes the portion of the conductor between the second points, these steps being repeated with the position of at least one of the second points adjusted to enable the position of the short circuit to be located. One second point and one first point may be common. The method may be used to locate a faulty module e.g. 3 in an integrated circuit assembly, consisting of a number of modules connected between two lines 1 and 4. Potential is applied between the lines from a supply 6 via a probe 7 also connected to the zero input of a differential amplifier 10. Probes 8 and 9 are located one to each side of the input probe 7 and are connected to the differential inputs of the amplifier. Current flow through the short circuit causes a potential difference between either probe 8 or 9 and probe 7 according to the location of the short circuit, to produce a deflection on the centre zero instrument 11 in a direction corresponding to the direction of flow. The position of the arrangement of probes is adjusted along the line 4 until this direction alters, the location of the fault thereby being established. In an alternative system Fig. 3 (not shown) where only limited access to the system under test is possible, the probe 7 and one of the others e.g. 9 are located at fixed positions at opposite ends of the line 4. The probe 8 is first connected to an access point close to the probe 7 and gradually moved along the line 4. When it reaches a position beyond which no short circuit current is flowing in the part of the line between the probes 8 and 9, no deflection is registered on the meter 11 (which in this arrangement need not be centre zero). Thus the location of the fault is determined.
GB1736568A 1968-04-10 1968-04-10 Location of short circuits Expired GB1201679A (en)

Priority Applications (1)

Application Number Priority Date Filing Date Title
GB1736568A GB1201679A (en) 1968-04-10 1968-04-10 Location of short circuits

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
GB1736568A GB1201679A (en) 1968-04-10 1968-04-10 Location of short circuits

Publications (1)

Publication Number Publication Date
GB1201679A true GB1201679A (en) 1970-08-12

Family

ID=10093927

Family Applications (1)

Application Number Title Priority Date Filing Date
GB1736568A Expired GB1201679A (en) 1968-04-10 1968-04-10 Location of short circuits

Country Status (1)

Country Link
GB (1) GB1201679A (en)

Cited By (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
FR2417779A1 (en) * 1978-02-21 1979-09-14 Teradyne Inc ELECTRICAL WIRING PLATE ANALYSIS DEVICE INTENDED TO IDENTIFY A FAULTY INTEGRATED CIRCUIT

Cited By (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
FR2417779A1 (en) * 1978-02-21 1979-09-14 Teradyne Inc ELECTRICAL WIRING PLATE ANALYSIS DEVICE INTENDED TO IDENTIFY A FAULTY INTEGRATED CIRCUIT

Similar Documents

Publication Publication Date Title
GB1498719A (en) Electrical test system
US4175253A (en) Analyzing electrical circuit boards
GB1431226A (en) Testing electronic components connector for deformable tubes
US3982180A (en) Apparatus for testing multiconductor cables for continuity, correct connections, and the absence of short circuits between conductors
CA1199069A (en) Active voltage probe
US4178543A (en) Analyzing electrical circuit boards
US4490673A (en) Testing an integrated circuit containing a tristate driver and a control signal generating network therefor
US4066914A (en) Electrically variable impedance circuits
US3611164A (en) Absolute magnitude peak detector
US3227953A (en) Bridge apparatus for determining the input resistance and beta figure for an in-circuit transistor
US4176313A (en) Analyzing electrical circuit boards
US4179652A (en) Analyzing electrical circuit boards
GB1201679A (en) Location of short circuits
US3739188A (en) Common wire compensation circuit
US3500204A (en) Equivalent circuit determination by pulse reflectometry with compensation for particular impedances
GB977076A (en) Circuit arrangements for locating faults in a communication line system
US3999013A (en) Bi-directional signaling apparatus
US3792349A (en) Dual channel, dual potential open-circuit test apparatus
US4091430A (en) Guard circuit for high impedance signal circuits
US3610842A (en) Checking system for binary decoder
US3588728A (en) Impedance bridge transducer circuits
EP0486114A2 (en) Electrical testing apparatus
US3543155A (en) Systems for imtegrating a signal and selectively measuring the amplitude of the integrated signal
US3033995A (en) Circuit for producing an output voltage indicative of the absolute valve of the difference between two input voltages
US1916304A (en) Testing system

Legal Events

Date Code Title Description
PS Patent sealed
PLNP Patent lapsed through nonpayment of renewal fees