GB1201679A - Location of short circuits - Google Patents
Location of short circuitsInfo
- Publication number
- GB1201679A GB1201679A GB1736568A GB1736568A GB1201679A GB 1201679 A GB1201679 A GB 1201679A GB 1736568 A GB1736568 A GB 1736568A GB 1736568 A GB1736568 A GB 1736568A GB 1201679 A GB1201679 A GB 1201679A
- Authority
- GB
- United Kingdom
- Prior art keywords
- probe
- short circuit
- location
- line
- points
- Prior art date
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
- Expired
Links
Classifications
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
- G01R31/00—Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere
- G01R31/28—Testing of electronic circuits, e.g. by signal tracer
- G01R31/2851—Testing of integrated circuits [IC]
- G01R31/2853—Electrical testing of internal connections or -isolation, e.g. latch-up or chip-to-lead connections
Landscapes
- Engineering & Computer Science (AREA)
- Computer Hardware Design (AREA)
- Microelectronics & Electronic Packaging (AREA)
- General Engineering & Computer Science (AREA)
- Physics & Mathematics (AREA)
- General Physics & Mathematics (AREA)
- Locating Faults (AREA)
Abstract
1,201,679. Locating short circuits. BRITISH COMMUNICATIONS CORP. Ltd. March 26, 1969 [April 10, 1968], No.17365/68. Heading G1U. To locate a short circuit in a network, current is caused to flow via the short between two first points in the network between which there is normally a relatively high impedance and the presence or absence of a consequential potential difference between two second points spaced along a network conductor is detected to determine whether the route of the short circuit current includes the portion of the conductor between the second points, these steps being repeated with the position of at least one of the second points adjusted to enable the position of the short circuit to be located. One second point and one first point may be common. The method may be used to locate a faulty module e.g. 3 in an integrated circuit assembly, consisting of a number of modules connected between two lines 1 and 4. Potential is applied between the lines from a supply 6 via a probe 7 also connected to the zero input of a differential amplifier 10. Probes 8 and 9 are located one to each side of the input probe 7 and are connected to the differential inputs of the amplifier. Current flow through the short circuit causes a potential difference between either probe 8 or 9 and probe 7 according to the location of the short circuit, to produce a deflection on the centre zero instrument 11 in a direction corresponding to the direction of flow. The position of the arrangement of probes is adjusted along the line 4 until this direction alters, the location of the fault thereby being established. In an alternative system Fig. 3 (not shown) where only limited access to the system under test is possible, the probe 7 and one of the others e.g. 9 are located at fixed positions at opposite ends of the line 4. The probe 8 is first connected to an access point close to the probe 7 and gradually moved along the line 4. When it reaches a position beyond which no short circuit current is flowing in the part of the line between the probes 8 and 9, no deflection is registered on the meter 11 (which in this arrangement need not be centre zero). Thus the location of the fault is determined.
Priority Applications (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| GB1736568A GB1201679A (en) | 1968-04-10 | 1968-04-10 | Location of short circuits |
Applications Claiming Priority (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| GB1736568A GB1201679A (en) | 1968-04-10 | 1968-04-10 | Location of short circuits |
Publications (1)
| Publication Number | Publication Date |
|---|---|
| GB1201679A true GB1201679A (en) | 1970-08-12 |
Family
ID=10093927
Family Applications (1)
| Application Number | Title | Priority Date | Filing Date |
|---|---|---|---|
| GB1736568A Expired GB1201679A (en) | 1968-04-10 | 1968-04-10 | Location of short circuits |
Country Status (1)
| Country | Link |
|---|---|
| GB (1) | GB1201679A (en) |
Cited By (1)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| FR2417779A1 (en) * | 1978-02-21 | 1979-09-14 | Teradyne Inc | ELECTRICAL WIRING PLATE ANALYSIS DEVICE INTENDED TO IDENTIFY A FAULTY INTEGRATED CIRCUIT |
-
1968
- 1968-04-10 GB GB1736568A patent/GB1201679A/en not_active Expired
Cited By (1)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| FR2417779A1 (en) * | 1978-02-21 | 1979-09-14 | Teradyne Inc | ELECTRICAL WIRING PLATE ANALYSIS DEVICE INTENDED TO IDENTIFY A FAULTY INTEGRATED CIRCUIT |
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Legal Events
| Date | Code | Title | Description |
|---|---|---|---|
| PS | Patent sealed | ||
| PLNP | Patent lapsed through nonpayment of renewal fees |