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GB1288278A - - Google Patents

Info

Publication number
GB1288278A
GB1288278A GB5686169A GB5686169A GB1288278A GB 1288278 A GB1288278 A GB 1288278A GB 5686169 A GB5686169 A GB 5686169A GB 5686169 A GB5686169 A GB 5686169A GB 1288278 A GB1288278 A GB 1288278A
Authority
GB
United Kingdom
Prior art keywords
layer
oxide layer
semi
conductor
isolated
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Expired
Application number
GB5686169A
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed filed Critical
Publication of GB1288278A publication Critical patent/GB1288278A/en
Expired legal-status Critical Current

Links

Classifications

    • H10P50/691
    • H10P50/644
    • H10P95/00

Landscapes

  • Element Separation (AREA)

Abstract

1288278 Semi-conductor device TEXAS INSTRUMENTS Inc 20 Nov 1969 [31 Dec 1968] 56861/69 Heading H1K The (110) surface of a semi-conductor body has a recess therein which is bounded by {111} planes which form walls perpendicular to the {110} planes. In one embodiment (Figs. 7 to 16, not shown) dielectrically isolated circuits components are formed by epitaxially depositing N- type Si 36 on an N<SP>+</SP>-type Si layer 21, forming a silicon oxide layer 37 thereon and growing a high resistivity polycrystalline Si supporting layer 38 on the oxide layer 37, (Fig. 9, not shown). The layer 21 is lapped and polished and a photo mask 50 formed thereon, Fig. 11. The layer 21 and epitaxial layer 36 are etched using an aqueous solution of ethylenediamine and pyrocatechol to give isolated semi-conductor portions shaped as parallelepipeds (Figs. 12 and 16, not shown). The mask 50 is removed and a silicon oxide layer 46 formed over the isolated portions (Fig. 13, not shown) and a thick supporting layer 47 of polycrystalline Si formed over the oxide layer 46. The body is inverted and the supporting layer 38 removed by lapping and polishing to expose the oxide layer 37. The devices may be separated by scribing and breaking. In another embodiment (Figs. 1 to 6, not shown) parallelepiped pockets (29, 30) of epitaxially deposited semiconductor material are formed in semi-conductor body (21).
GB5686169A 1968-12-31 1969-11-20 Expired GB1288278A (en)

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
US78817768A 1968-12-31 1968-12-31

Publications (1)

Publication Number Publication Date
GB1288278A true GB1288278A (en) 1972-09-06

Family

ID=25143680

Family Applications (1)

Application Number Title Priority Date Filing Date
GB5686169A Expired GB1288278A (en) 1968-12-31 1969-11-20

Country Status (4)

Country Link
DE (1) DE1965408C3 (en)
FR (1) FR2027429B1 (en)
GB (1) GB1288278A (en)
NL (1) NL6918388A (en)

Cited By (3)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US4235014A (en) 1979-03-26 1980-11-25 Western Electric Company, Inc. Apparatus for assembling a plurality of articles
US4253280A (en) 1979-03-26 1981-03-03 Western Electric Company, Inc. Method of labelling directional characteristics of an article having two opposite major surfaces
US4983538A (en) * 1987-11-20 1991-01-08 Fujitsu Limited Method for fabricating a silicon carbide substrate

Families Citing this family (6)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US3579057A (en) * 1969-08-18 1971-05-18 Rca Corp Method of making a semiconductor article and the article produced thereby
GB1439351A (en) * 1972-06-02 1976-06-16 Texas Instruments Inc Capacitor
US4238275A (en) * 1978-12-29 1980-12-09 International Business Machines Corporation Pyrocatechol-amine-water solution for the determination of defects
JPH0775244B2 (en) * 1990-11-16 1995-08-09 信越半導体株式会社 Dielectric isolation substrate and manufacturing method thereof
JPH0775245B2 (en) * 1990-11-16 1995-08-09 信越半導体株式会社 Dielectric isolation substrate and manufacturing method thereof
RU2220449C1 (en) 2002-12-19 2003-12-27 Акционерное общество закрытого типа "ЛИТЭКС" Method and label for labeling items with aid of set of labels

Family Cites Families (2)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US3425879A (en) * 1965-10-24 1969-02-04 Texas Instruments Inc Method of making shaped epitaxial deposits
NL144778B (en) * 1966-12-20 1975-01-15 Western Electric Co METHOD OF MANUFACTURING A SEMICONDUCTOR DEVICE BY ANISOTROOPE ETCHING AS WELL AS THE DEVICE MANUFACTURED THEREFORE.

Cited By (3)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US4235014A (en) 1979-03-26 1980-11-25 Western Electric Company, Inc. Apparatus for assembling a plurality of articles
US4253280A (en) 1979-03-26 1981-03-03 Western Electric Company, Inc. Method of labelling directional characteristics of an article having two opposite major surfaces
US4983538A (en) * 1987-11-20 1991-01-08 Fujitsu Limited Method for fabricating a silicon carbide substrate

Also Published As

Publication number Publication date
FR2027429A1 (en) 1970-09-25
DE1965408C3 (en) 1979-01-25
DE1965408A1 (en) 1970-07-16
NL6918388A (en) 1970-07-02
FR2027429B1 (en) 1973-08-10
DE1965408B2 (en) 1978-02-16

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Legal Events

Date Code Title Description
PS Patent sealed [section 19, patents act 1949]
PE20 Patent expired after termination of 20 years