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GB1268175A - Integrated circuit - Google Patents

Integrated circuit

Info

Publication number
GB1268175A
GB1268175A GB3047/70A GB304770A GB1268175A GB 1268175 A GB1268175 A GB 1268175A GB 3047/70 A GB3047/70 A GB 3047/70A GB 304770 A GB304770 A GB 304770A GB 1268175 A GB1268175 A GB 1268175A
Authority
GB
United Kingdom
Prior art keywords
circuits
switch
paths
basic
gates
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Expired
Application number
GB3047/70A
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
Hitachi Ltd
Original Assignee
Hitachi Ltd
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Hitachi Ltd filed Critical Hitachi Ltd
Publication of GB1268175A publication Critical patent/GB1268175A/en
Expired legal-status Critical Current

Links

Classifications

    • HELECTRICITY
    • H10SEMICONDUCTOR DEVICES; ELECTRIC SOLID-STATE DEVICES NOT OTHERWISE PROVIDED FOR
    • H10DINORGANIC ELECTRIC SEMICONDUCTOR DEVICES
    • H10D84/00Integrated devices formed in or on semiconductor substrates that comprise only semiconducting layers, e.g. on Si wafers or on GaAs-on-Si wafers
    • H10D84/90Masterslice integrated circuits
    • HELECTRICITY
    • H10SEMICONDUCTOR DEVICES; ELECTRIC SOLID-STATE DEVICES NOT OTHERWISE PROVIDED FOR
    • H10DINORGANIC ELECTRIC SEMICONDUCTOR DEVICES
    • H10D99/00Subject matter not provided for in other groups of this subclass
    • H10P74/23
    • H10P74/232
    • H10P74/277

Landscapes

  • Testing Or Measuring Of Semiconductors Or The Like (AREA)
  • Semiconductor Integrated Circuits (AREA)
  • Testing Of Individual Semiconductor Devices (AREA)
  • Tests Of Electronic Circuits (AREA)

Abstract

1,268,175. Semi-conductor devices. HITACHI Ltd. 21 Jan., 1970 [27 Jan., 1969], No. 3047/70. Heading HlK. An integrated circuit includes a plurality of basic electronic circuits, e.g. AND gates, OR gates, multivibrators, mutually interconnected in a normal operational relationship by signal transmitting paths, and at least one electronic switch having a control electrode, the switch being provided in one of the paths. The switch may be a MISFET 11 comprising source and drain regions (20, 21), Fig. lb (not shown), with source and drain electrodes 12, 13 connected to terminal pads C, C<SP>1</SP>, and a gate electrode 14, forming the control electrode, connected to a terminal pad 17 by a conducting region 15 of the substrate (10). The MISFET 11 is connected in the signal paths 16 between the basic circuits A, B, and such a switch may be provided in some or each of paths 16. The gate electrodes of the switches are connected together. In operation, the gate electrodes are energized, and the switches checked for continuity via terminal pads CC<SP>1</SP>, DD<SP>1</SP> &c. The gates are then de-energized isolating the basic circuits A, B &c., which are then checked for their correct individual operation. For normal working the switches are closed by energizing the gate electrodes, enabling the integrated circuit to function as a whole. The device is said to enable complex integrated circuits to be checked in basic circuit form enabling faulty circuits to be located although they may be mounted in series, parallel, multistage, or contain feedback loops.
GB3047/70A 1969-01-27 1970-01-21 Integrated circuit Expired GB1268175A (en)

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
JP525769 1969-01-27

Publications (1)

Publication Number Publication Date
GB1268175A true GB1268175A (en) 1972-03-22

Family

ID=11606155

Family Applications (1)

Application Number Title Priority Date Filing Date
GB3047/70A Expired GB1268175A (en) 1969-01-27 1970-01-21 Integrated circuit

Country Status (2)

Country Link
FR (1) FR2029458A1 (en)
GB (1) GB1268175A (en)

Cited By (3)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
EP0739034A3 (en) * 1995-04-20 1999-07-14 Mitsubishi Denki Kabushiki Kaisha Integrated circuit device and fabricating method thereof
EP1048957A3 (en) * 1999-04-30 2003-11-12 NEC Electronics Corporation Integrated circuit device having process parameter measuring circuit
WO2009020787A1 (en) * 2007-08-03 2009-02-12 Dsm Solutions, Inc. Programmable logic devices comprising junction field effect transistors, and methods of using the same

Cited By (4)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
EP0739034A3 (en) * 1995-04-20 1999-07-14 Mitsubishi Denki Kabushiki Kaisha Integrated circuit device and fabricating method thereof
EP1048957A3 (en) * 1999-04-30 2003-11-12 NEC Electronics Corporation Integrated circuit device having process parameter measuring circuit
WO2009020787A1 (en) * 2007-08-03 2009-02-12 Dsm Solutions, Inc. Programmable logic devices comprising junction field effect transistors, and methods of using the same
US7629812B2 (en) 2007-08-03 2009-12-08 Dsm Solutions, Inc. Switching circuits and methods for programmable logic devices

Also Published As

Publication number Publication date
DE2003060A1 (en) 1970-07-30
DE2003060B2 (en) 1972-05-04
FR2029458A1 (en) 1970-10-23

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