GB1249812A - Improvements relating to semiconductor devices - Google Patents
Improvements relating to semiconductor devicesInfo
- Publication number
- GB1249812A GB1249812A GB27138/69A GB2713869A GB1249812A GB 1249812 A GB1249812 A GB 1249812A GB 27138/69 A GB27138/69 A GB 27138/69A GB 2713869 A GB2713869 A GB 2713869A GB 1249812 A GB1249812 A GB 1249812A
- Authority
- GB
- United Kingdom
- Prior art keywords
- base
- collector
- emitter
- oxide layer
- conductivity
- Prior art date
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
- Expired
Links
Classifications
-
- H—ELECTRICITY
- H10—SEMICONDUCTOR DEVICES; ELECTRIC SOLID-STATE DEVICES NOT OTHERWISE PROVIDED FOR
- H10D—INORGANIC ELECTRIC SEMICONDUCTOR DEVICES
- H10D64/00—Electrodes of devices having potential barriers
- H10D64/111—Field plates
-
- H—ELECTRICITY
- H10—SEMICONDUCTOR DEVICES; ELECTRIC SOLID-STATE DEVICES NOT OTHERWISE PROVIDED FOR
- H10D—INORGANIC ELECTRIC SEMICONDUCTOR DEVICES
- H10D99/00—Subject matter not provided for in other groups of this subclass
-
- H10W42/00—
Landscapes
- Bipolar Transistors (AREA)
Abstract
1,249,812. Semi-conductor devices. FERRANTI Ltd. 13 May, 1970 [29 May, 1969], No. 27138/69. Heading H1K. A transistor 10 formed in a Si wafer of N conductivity material comprises a N conductivity collector 11, a P conductivity base 12 adjacent a major surface 13, and a N conductivity emitter 14 extending to the surface; the base and emitter being formed by diffusion through a Si oxide mask 15. The collector, base, and emitter base junctions comprise depletion layers 16, 17, and the oxide mask also passivates the surface portions of the junctions. Annular and circular apertures 18, 19 for base and emitter contacts are etched through the oxide layer, and a gold collector electrode 20 is provided on opposite face 21. The oxide layer 15 tends to lower the resistivity of the surface of annular portion 22 of the collector, and to diminish the thickness of the surface portions of the collector-base junction depletion layer, but base contact 23 in aperture 18 is connected to a field electrode 24 on the oxide layer overlying the collector portions 22, which is maintained at a potential difference thereto, producing an electric field across the oxide layer and counteracting the reduction in thickness of the depletion layer. This increases the breakdown value of the collector-base junction. The base and emitter contacts 23, 25 in apertures 18, 19 and the field electrode 24 are formed by selectively etching an aluminium layer deposited on the apertured oxide layer 15, and the field electrode 24 is connected to base contact 23 by a narrow aluminium neck or a small diameter wire 26 spanning a minor part of the surface of the depletion layer of PN junction 16, to avoid instability thereof.
Priority Applications (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| GB27138/69A GB1249812A (en) | 1969-05-29 | 1969-05-29 | Improvements relating to semiconductor devices |
Applications Claiming Priority (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| GB27138/69A GB1249812A (en) | 1969-05-29 | 1969-05-29 | Improvements relating to semiconductor devices |
Publications (1)
| Publication Number | Publication Date |
|---|---|
| GB1249812A true GB1249812A (en) | 1971-10-13 |
Family
ID=10254841
Family Applications (1)
| Application Number | Title | Priority Date | Filing Date |
|---|---|---|---|
| GB27138/69A Expired GB1249812A (en) | 1969-05-29 | 1969-05-29 | Improvements relating to semiconductor devices |
Country Status (1)
| Country | Link |
|---|---|
| GB (1) | GB1249812A (en) |
Cited By (3)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| EP0021643A1 (en) * | 1979-06-08 | 1981-01-07 | Fujitsu Limited | Semiconductor device having a soft-error preventing structure |
| WO1982003949A1 (en) * | 1981-05-06 | 1982-11-11 | Hartmut Michel | Planar transistor structure |
| GB2128025A (en) * | 1982-09-24 | 1984-04-18 | Hitachi Ltd | Protective electrode for electronic device |
-
1969
- 1969-05-29 GB GB27138/69A patent/GB1249812A/en not_active Expired
Cited By (3)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| EP0021643A1 (en) * | 1979-06-08 | 1981-01-07 | Fujitsu Limited | Semiconductor device having a soft-error preventing structure |
| WO1982003949A1 (en) * | 1981-05-06 | 1982-11-11 | Hartmut Michel | Planar transistor structure |
| GB2128025A (en) * | 1982-09-24 | 1984-04-18 | Hitachi Ltd | Protective electrode for electronic device |
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