FR2950441B1 - Capteur optique dote de champ lateral pour la numerisation 3d - Google Patents
Capteur optique dote de champ lateral pour la numerisation 3dInfo
- Publication number
- FR2950441B1 FR2950441B1 FR0904528A FR0904528A FR2950441B1 FR 2950441 B1 FR2950441 B1 FR 2950441B1 FR 0904528 A FR0904528 A FR 0904528A FR 0904528 A FR0904528 A FR 0904528A FR 2950441 B1 FR2950441 B1 FR 2950441B1
- Authority
- FR
- France
- Prior art keywords
- scanning
- optical sensor
- lateral field
- lateral
- field
- Prior art date
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
- Active
Links
Classifications
-
- G—PHYSICS
- G02—OPTICS
- G02B—OPTICAL ELEMENTS, SYSTEMS OR APPARATUS
- G02B21/00—Microscopes
- G02B21/0004—Microscopes specially adapted for specific applications
- G02B21/002—Scanning microscopes
- G02B21/0024—Confocal scanning microscopes (CSOMs) or confocal "macroscopes"; Accessories which are not restricted to use with CSOMs, e.g. sample holders
- G02B21/0052—Optical details of the image generation
- G02B21/0064—Optical details of the image generation multi-spectral or wavelength-selective arrangements, e.g. wavelength fan-out, chromatic profiling
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01B—MEASURING LENGTH, THICKNESS OR SIMILAR LINEAR DIMENSIONS; MEASURING ANGLES; MEASURING AREAS; MEASURING IRREGULARITIES OF SURFACES OR CONTOURS
- G01B11/00—Measuring arrangements characterised by the use of optical techniques
- G01B11/24—Measuring arrangements characterised by the use of optical techniques for measuring contours or curvatures
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01B—MEASURING LENGTH, THICKNESS OR SIMILAR LINEAR DIMENSIONS; MEASURING ANGLES; MEASURING AREAS; MEASURING IRREGULARITIES OF SURFACES OR CONTOURS
- G01B2210/00—Aspects not specifically covered by any group under G01B, e.g. of wheel alignment, caliper-like sensors
- G01B2210/50—Using chromatic effects to achieve wavelength-dependent depth resolution
Landscapes
- Physics & Mathematics (AREA)
- General Physics & Mathematics (AREA)
- Spectroscopy & Molecular Physics (AREA)
- Chemical & Material Sciences (AREA)
- Analytical Chemistry (AREA)
- Optics & Photonics (AREA)
- Length Measuring Devices By Optical Means (AREA)
Priority Applications (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| FR0904528A FR2950441B1 (fr) | 2009-09-23 | 2009-09-23 | Capteur optique dote de champ lateral pour la numerisation 3d |
Applications Claiming Priority (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| FR0904528A FR2950441B1 (fr) | 2009-09-23 | 2009-09-23 | Capteur optique dote de champ lateral pour la numerisation 3d |
Publications (2)
| Publication Number | Publication Date |
|---|---|
| FR2950441A1 FR2950441A1 (fr) | 2011-03-25 |
| FR2950441B1 true FR2950441B1 (fr) | 2012-05-18 |
Family
ID=41395513
Family Applications (1)
| Application Number | Title | Priority Date | Filing Date |
|---|---|---|---|
| FR0904528A Active FR2950441B1 (fr) | 2009-09-23 | 2009-09-23 | Capteur optique dote de champ lateral pour la numerisation 3d |
Country Status (1)
| Country | Link |
|---|---|
| FR (1) | FR2950441B1 (fr) |
Cited By (4)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| CN103196568B (zh) * | 2012-01-05 | 2017-05-24 | 株式会社三丰 | 波长检测器及使用波长检测器的接触探头 |
| CN107063127A (zh) * | 2015-12-03 | 2017-08-18 | 欧姆龙株式会社 | 光学测量装置 |
| CN109073369A (zh) * | 2016-03-25 | 2018-12-21 | Fogale 纳米技术公司 | 用于以可变空间分辨率对晶片等对象进行2d/3d检测的共焦色差装置和方法 |
| CN109073368A (zh) * | 2016-03-25 | 2018-12-21 | Fogale 纳米技术公司 | 用于晶片等对象的2d/3d检测的色差共焦装置和方法 |
Families Citing this family (22)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| GB2489722B (en) | 2011-04-06 | 2017-01-18 | Precitec Optronik Gmbh | Apparatus and method for determining a depth of a region having a high aspect ratio that protrudes into a surface of a semiconductor wafer |
| DE102011051146B3 (de) | 2011-06-17 | 2012-10-04 | Precitec Optronik Gmbh | Prüfverfahren zum Prüfen einer Verbindungsschicht zwischen waferförmigen Proben |
| EP2667151A1 (fr) | 2012-05-21 | 2013-11-27 | Sysmelec SA | Convertisseur chromatique d'altimétrie |
| DE102012111008B4 (de) | 2012-11-15 | 2014-05-22 | Precitec Optronik Gmbh | Optisches Messverfahren und optische Messvorrichtung zum Erfassen einer Oberflächentopographie |
| AT514500B1 (de) * | 2013-06-17 | 2018-06-15 | Precitec Optronik Gmbh | Optische Messvorrichtung und optisches Messverfahren |
| US10591279B2 (en) | 2014-12-09 | 2020-03-17 | Asentys Sas | Integrated optical device for contactless measurement of altitudes and thicknesses |
| DE102015112769B4 (de) | 2015-08-04 | 2022-09-08 | Carl Zeiss Ag | Vorrichtung und Verfahren zur optischen Probenuntersuchung |
| US10317344B2 (en) | 2016-09-07 | 2019-06-11 | Kla-Tencor Corporation | Speed enhancement of chromatic confocal metrology |
| US10260941B2 (en) | 2016-10-04 | 2019-04-16 | Precitec Optronik Gmbh | Chromatic confocal distance sensor |
| DE102016221630A1 (de) | 2016-11-04 | 2018-05-09 | Carl Zeiss Industrielle Messtechnik Gmbh | Konfokal chromatischer Sensor zur Bestimmung von Koordinaten eines Messobjekts |
| US10234265B2 (en) | 2016-12-12 | 2019-03-19 | Precitec Optronik Gmbh | Distance measuring device and method for measuring distances |
| DE102017126310A1 (de) | 2017-11-09 | 2019-05-09 | Precitec Optronik Gmbh | Abstandsmessvorrichtung |
| DE102018201211B4 (de) | 2018-01-26 | 2021-08-12 | Carl Zeiss Industrielle Messtechnik Gmbh | Chromatisch konfokaler Multispotsensor zur Bestimmung von Koordinaten eines Messobjekts |
| EP3567339A1 (fr) * | 2018-05-10 | 2019-11-13 | Nanovea, Inc. | Dispositif et procédé de chromatisme axial de lumière blanche de balayage de surface 3d |
| DE102018118290A1 (de) * | 2018-07-27 | 2020-01-30 | Carl Zeiss Industrielle Messtechnik Gmbh | Sensor zur Bestimmung von geometrischen Eigenschaften eines Messobjekts |
| DE102018130901A1 (de) | 2018-12-04 | 2020-06-04 | Precitec Optronik Gmbh | Optische Messeinrichtung |
| KR20230011403A (ko) | 2020-06-19 | 2023-01-20 | 프레시텍 옵트로닉 게엠베하 | 크로마틱 공초점 측정장치 |
| US11997248B2 (en) | 2020-12-18 | 2024-05-28 | Yoed Abraham | Fiber-optic 3D imaging |
| US11162783B1 (en) * | 2020-12-18 | 2021-11-02 | Yoed Abraham | Fiber-optic 3D imaging |
| DE102022207032A1 (de) * | 2022-07-11 | 2024-01-11 | Micro-Epsilon Optronic Gmbh | Einrichtung, Vorrichtung und Verfahren zur konfokal-chromatischen Abstands- und/ oder Dickenmessung |
| CN115950364B (zh) * | 2023-02-27 | 2026-01-20 | 珠海横琴华辰微科技有限公司 | 一种光谱黑洞共焦测量装置及测量方法 |
| CN116625246A (zh) * | 2023-05-04 | 2023-08-22 | 中国工程物理研究院激光聚变研究中心 | 一种新型多模式轴向色差共焦传感器 |
Family Cites Families (3)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| EP1245987B1 (fr) * | 1988-07-13 | 2008-01-23 | Optiscan Pty Ltd | Microscope confocal à balayage |
| FR2738343B1 (fr) * | 1995-08-30 | 1997-10-24 | Cohen Sabban Joseph | Dispositif de microstratigraphie optique |
| US7450243B2 (en) * | 2006-07-10 | 2008-11-11 | The Board Of Trustees Of The University Of Illinois | Volumetric endoscopic coherence microscopy using a coherent fiber bundle |
-
2009
- 2009-09-23 FR FR0904528A patent/FR2950441B1/fr active Active
Cited By (5)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| CN103196568B (zh) * | 2012-01-05 | 2017-05-24 | 株式会社三丰 | 波长检测器及使用波长检测器的接触探头 |
| CN107063127A (zh) * | 2015-12-03 | 2017-08-18 | 欧姆龙株式会社 | 光学测量装置 |
| CN107063127B (zh) * | 2015-12-03 | 2020-06-30 | 欧姆龙株式会社 | 光学测量装置 |
| CN109073369A (zh) * | 2016-03-25 | 2018-12-21 | Fogale 纳米技术公司 | 用于以可变空间分辨率对晶片等对象进行2d/3d检测的共焦色差装置和方法 |
| CN109073368A (zh) * | 2016-03-25 | 2018-12-21 | Fogale 纳米技术公司 | 用于晶片等对象的2d/3d检测的色差共焦装置和方法 |
Also Published As
| Publication number | Publication date |
|---|---|
| FR2950441A1 (fr) | 2011-03-25 |
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Legal Events
| Date | Code | Title | Description |
|---|---|---|---|
| TP | Transmission of property |
Owner name: SCIENCES ET TECHNIQUES INDUSTRIELLES DE LA LUM, FR Effective date: 20120125 |
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| PLFP | Fee payment |
Year of fee payment: 8 |
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| PLFP | Fee payment |
Year of fee payment: 9 |
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| PLFP | Fee payment |
Year of fee payment: 10 |
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| PLFP | Fee payment |
Year of fee payment: 11 |
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| PLFP | Fee payment |
Year of fee payment: 12 |
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| PLFP | Fee payment |
Year of fee payment: 13 |
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| PLFP | Fee payment |
Year of fee payment: 14 |
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| PLFP | Fee payment |
Year of fee payment: 15 |
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| PLFP | Fee payment |
Year of fee payment: 16 |