FR2885221B1 - Camera d'examen photothermique a dispositif de reglage de l'offset. - Google Patents

Camera d'examen photothermique a dispositif de reglage de l'offset.

Info

Publication number: FR2885221B1
Authority: FR; France
Prior art keywords: photothermic; offset; adjusting; examination camera; examination
Prior art date: 2005-04-28
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.): Expired - Fee Related

Application number

FR0504332A

Other languages

English (en)

Other versions

FR2885221A1 (fr

Inventor

Marc Piriou

Laurent Legrandjacques

Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)

Areva NP SAS

Original Assignee

Framatome ANP SAS

Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)

2005-04-28

Filing date

2005-04-28

Publication date

2007-07-27

2005-04-28 Priority to FR0504332A priority Critical patent/FR2885221B1/fr

2005-04-28 Application filed by Framatome ANP SAS filed Critical Framatome ANP SAS

2006-03-27 Priority to PCT/FR2006/000663 priority patent/WO2006114487A1/fr

2006-03-27 Priority to US11/912,923 priority patent/US20080185520A1/en

2006-03-27 Priority to EP06726147A priority patent/EP1875217A1/fr

2006-03-27 Priority to CNA2006800196877A priority patent/CN101189506A/zh

2006-03-27 Priority to JP2008508248A priority patent/JP2008539403A/ja

2006-03-27 Priority to KR1020077027322A priority patent/KR20080012891A/ko

2006-11-03 Publication of FR2885221A1 publication Critical patent/FR2885221A1/fr

2007-07-27 Application granted granted Critical

2007-07-27 Publication of FR2885221B1 publication Critical patent/FR2885221B1/fr

2007-10-22 Priority to ZA200709073A priority patent/ZA200709073B/xx

2025-04-28 Anticipated expiration legal-status Critical

Status Expired - Fee Related legal-status Critical Current

Classifications

- G—PHYSICS
- G01—MEASURING; TESTING
- G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
- G01N25/00—Investigating or analyzing materials by the use of thermal means
- G01N25/72—Investigating presence of flaws

Landscapes

General Health & Medical Sciences (AREA)
Health & Medical Sciences (AREA)
Life Sciences & Earth Sciences (AREA)
Chemical & Material Sciences (AREA)
Analytical Chemistry (AREA)
Biochemistry (AREA)
Physics & Mathematics (AREA)
General Physics & Mathematics (AREA)
Immunology (AREA)
Pathology (AREA)
Investigating Or Analyzing Materials Using Thermal Means (AREA)
Radiation Pyrometers (AREA)
Photometry And Measurement Of Optical Pulse Characteristics (AREA)

FR0504332A 2005-04-28 2005-04-28 Camera d'examen photothermique a dispositif de reglage de l'offset. Expired - Fee Related FR2885221B1 (fr)

Priority Applications (8)

Application Number	Priority Date	Filing Date	Title
FR0504332A FR2885221B1 (fr)	2005-04-28	2005-04-28	Camera d'examen photothermique a dispositif de reglage de l'offset.
US11/912,923 US20080185520A1 (en)	2005-04-28	2006-03-27	Photothermal Inspection Camera Having an Offset Adjusting Device
EP06726147A EP1875217A1 (fr)	2005-04-28	2006-03-27	Camera d'examen photothermique a dispositif de reglage de l'offset
CNA2006800196877A CN101189506A (zh)	2005-04-28	2006-03-27	设有偏距调节装置的光热检测摄影仪
PCT/FR2006/000663 WO2006114487A1 (fr)	2005-04-28	2006-03-27	Camera d'examen photothermique a dispositif de reglage de l'offset
JP2008508248A JP2008539403A (ja)	2005-04-28	2006-03-27	オフセット調節デバイスを有する光熱検査カメラ
KR1020077027322A KR20080012891A (ko)	2005-04-28	2006-03-27	편심 조정 디바이스를 구비한 광열 검사 카메라
ZA200709073A ZA200709073B (en)	2005-04-28	2007-10-22	Photothermal inspection camera having an offset adjusting device

Applications Claiming Priority (1)

Application Number	Priority Date	Filing Date	Title
FR0504332A FR2885221B1 (fr)	2005-04-28	2005-04-28	Camera d'examen photothermique a dispositif de reglage de l'offset.

Publications (2)

Publication Number	Publication Date
FR2885221A1 FR2885221A1 (fr)	2006-11-03
FR2885221B1 true FR2885221B1 (fr)	2007-07-27

Family

ID=35478844

Family Applications (1)

Application Number	Title	Priority Date	Filing Date
FR0504332A Expired - Fee Related FR2885221B1 (fr)	2005-04-28	2005-04-28	Camera d'examen photothermique a dispositif de reglage de l'offset.

Country Status (8)

Country	Link
US (1)	US20080185520A1 (fr)
EP (1)	EP1875217A1 (fr)
JP (1)	JP2008539403A (fr)
KR (1)	KR20080012891A (fr)
CN (1)	CN101189506A (fr)
FR (1)	FR2885221B1 (fr)
WO (1)	WO2006114487A1 (fr)
ZA (1)	ZA200709073B (fr)

Families Citing this family (6)

* Cited by examiner, † Cited by third party
Publication number	Priority date	Publication date	Assignee	Title
CH703102B1 (de)	2010-05-03	2015-01-30	Winterthur Instr Ag	Vorrichtung zur berührungslosen und zerstörungsfreien Prüfung von Gegenständen.
CN104040327A (zh) *	2011-12-23	2014-09-10	西格里碳素欧洲公司	用于测量热导率的方法
DE102012106955B4 (de) *	2012-07-31	2014-04-03	Netzsch-Gerätebau GmbH	Vorrichtung und Verfahren zur photothermischen Untersuchung einer Probe
FR3020678B1 (fr) *	2014-04-30	2021-06-25	Areva Np	Procede d'examen photothermique et ensemble d'examen correspondant
JP2018059874A (ja) *	2016-10-07	2018-04-12	学校法人東北学院	熱源走査式サーモグラフィー装置
CN110133043A (zh) *	2019-06-04	2019-08-16	武汉科技大学	测量固态材料热导率的方法及系统

Family Cites Families (9)

* Cited by examiner, † Cited by third party
Publication number	Priority date	Publication date	Assignee	Title
US3886362A (en) *	1973-04-09	1975-05-27	Mikhail Mikhailovi Miroshnikov	Method and apparatus for thermal examination of the interior surface of annular stator packs for electrical machines
US4206348A (en) *	1978-06-05	1980-06-03	Eastman Kodak Company	Optical scanner with electrooptical feedback for beam positioning
NO164133C (no) *	1985-07-15	1993-10-26	Svein Otto Kanstad	Framgangsmaate og apparat for karakterisering og kontroll av stoffer, materialer og objekter
US4874948A (en) *	1986-12-29	1989-10-17	Canadian Patents And Development Limited	Method and apparatus for evaluating the degree of cure in polymeric composites
US5228776A (en) *	1992-05-06	1993-07-20	Therma-Wave, Inc.	Apparatus for evaluating thermal and electrical characteristics in a sample
US5573493A (en) *	1993-10-08	1996-11-12	United States Surgical Corporation	Endoscope attachment for changing angle of view
FR2760528B1 (fr) *	1997-03-05	1999-05-21	Framatome Sa	Procede et dispositif d'examen photothermique d'un materiau
TWI313059B (fr) *	2000-12-08	2009-08-01	Sony Corporatio
US6887233B2 (en) *	2001-03-22	2005-05-03	Lumenis, Inc.	Scanning laser handpiece with shaped output beam

2005
- 2005-04-28 FR FR0504332A patent/FR2885221B1/fr not_active Expired - Fee Related
2006
- 2006-03-27 KR KR1020077027322A patent/KR20080012891A/ko not_active Withdrawn
- 2006-03-27 EP EP06726147A patent/EP1875217A1/fr not_active Withdrawn
- 2006-03-27 CN CNA2006800196877A patent/CN101189506A/zh active Pending
- 2006-03-27 JP JP2008508248A patent/JP2008539403A/ja not_active Abandoned
- 2006-03-27 US US11/912,923 patent/US20080185520A1/en not_active Abandoned
- 2006-03-27 WO PCT/FR2006/000663 patent/WO2006114487A1/fr not_active Ceased
2007
- 2007-10-22 ZA ZA200709073A patent/ZA200709073B/xx unknown

Also Published As

Publication number	Publication date
EP1875217A1 (fr)	2008-01-09
FR2885221A1 (fr)	2006-11-03
JP2008539403A (ja)	2008-11-13
WO2006114487A1 (fr)	2006-11-02
KR20080012891A (ko)	2008-02-12
ZA200709073B (en)	2008-10-29
US20080185520A1 (en)	2008-08-07
CN101189506A (zh)	2008-05-28

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Legal Events

Date	Code	Title	Description
2007-08-10	CA	Change of address
2007-08-10	CD	Change of name or company name
2008-11-21	CL	Concession to grant licences
2016-03-30	PLFP	Fee payment	Year of fee payment: 12
2017-04-20	PLFP	Fee payment	Year of fee payment: 13
2018-03-22	PLFP	Fee payment	Year of fee payment: 14
2019-04-29	PLFP	Fee payment	Year of fee payment: 15
2020-04-30	PLFP	Fee payment	Year of fee payment: 16
2021-04-29	PLFP	Fee payment	Year of fee payment: 17
2022-04-28	PLFP	Fee payment	Year of fee payment: 18
2023-04-25	PLFP	Fee payment	Year of fee payment: 19
2025-01-03	ST	Notification of lapse	Effective date: 20241205