FR2677125B1 - Appareil et procede de detection de defauts sur pieces metalliques. - Google Patents
Appareil et procede de detection de defauts sur pieces metalliques.Info
- Publication number
- FR2677125B1 FR2677125B1 FR9106507A FR9106507A FR2677125B1 FR 2677125 B1 FR2677125 B1 FR 2677125B1 FR 9106507 A FR9106507 A FR 9106507A FR 9106507 A FR9106507 A FR 9106507A FR 2677125 B1 FR2677125 B1 FR 2677125B1
- Authority
- FR
- France
- Prior art keywords
- metal parts
- detecting defects
- defects
- detecting
- metal
- Prior art date
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
- Expired - Fee Related
Links
- 239000002184 metal Substances 0.000 title 1
Classifications
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
- G01N27/00—Investigating or analysing materials by the use of electric, electrochemical, or magnetic means
- G01N27/72—Investigating or analysing materials by the use of electric, electrochemical, or magnetic means by investigating magnetic variables
- G01N27/82—Investigating or analysing materials by the use of electric, electrochemical, or magnetic means by investigating magnetic variables for investigating the presence of flaws
- G01N27/90—Investigating or analysing materials by the use of electric, electrochemical, or magnetic means by investigating magnetic variables for investigating the presence of flaws using eddy currents
- G01N27/9046—Investigating or analysing materials by the use of electric, electrochemical, or magnetic means by investigating magnetic variables for investigating the presence of flaws using eddy currents by analysing electrical signals
- G01N27/9053—Compensating for probe to workpiece spacing
Landscapes
- Chemical & Material Sciences (AREA)
- Chemical Kinetics & Catalysis (AREA)
- Electrochemistry (AREA)
- Physics & Mathematics (AREA)
- Health & Medical Sciences (AREA)
- Life Sciences & Earth Sciences (AREA)
- Analytical Chemistry (AREA)
- Biochemistry (AREA)
- General Health & Medical Sciences (AREA)
- General Physics & Mathematics (AREA)
- Immunology (AREA)
- Pathology (AREA)
- Investigating Or Analyzing Materials By The Use Of Magnetic Means (AREA)
Priority Applications (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| FR9106507A FR2677125B1 (fr) | 1991-05-30 | 1991-05-30 | Appareil et procede de detection de defauts sur pieces metalliques. |
Applications Claiming Priority (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| FR9106507A FR2677125B1 (fr) | 1991-05-30 | 1991-05-30 | Appareil et procede de detection de defauts sur pieces metalliques. |
Publications (2)
| Publication Number | Publication Date |
|---|---|
| FR2677125A1 FR2677125A1 (fr) | 1992-12-04 |
| FR2677125B1 true FR2677125B1 (fr) | 1997-01-17 |
Family
ID=9413273
Family Applications (1)
| Application Number | Title | Priority Date | Filing Date |
|---|---|---|---|
| FR9106507A Expired - Fee Related FR2677125B1 (fr) | 1991-05-30 | 1991-05-30 | Appareil et procede de detection de defauts sur pieces metalliques. |
Country Status (1)
| Country | Link |
|---|---|
| FR (1) | FR2677125B1 (fr) |
Family Cites Families (6)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| GB1005815A (en) * | 1960-10-14 | 1965-09-29 | Gkn Group Services Ltd | Improvements relating to methods of and apparatus for the detection of flaws |
| JPS4939462A (fr) * | 1972-08-15 | 1974-04-12 | ||
| JPS5752856A (en) * | 1980-09-16 | 1982-03-29 | Hitachi Ltd | Electromagnetic ultrasonic flaw detecting device |
| JPS5926054A (ja) * | 1982-08-02 | 1984-02-10 | Mitsubishi Electric Corp | 探傷用検出ヘツド |
| JPS61219857A (ja) * | 1985-03-26 | 1986-09-30 | Nichizou Tec:Kk | 塗膜のある金属表面の渦流探傷方法および装置 |
| US4843318A (en) * | 1987-07-15 | 1989-06-27 | Magnetic Analysis Corporation | Distance compensation in magnetic probe testing systems wherein object to probe spacing is employed as an exponent in excitings probes or processing probe outputs |
-
1991
- 1991-05-30 FR FR9106507A patent/FR2677125B1/fr not_active Expired - Fee Related
Also Published As
| Publication number | Publication date |
|---|---|
| FR2677125A1 (fr) | 1992-12-04 |
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Legal Events
| Date | Code | Title | Description |
|---|---|---|---|
| ST | Notification of lapse |