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FR2640095B1 - Circuit integre de blocage aux tensions d'alimentation faibles - Google Patents

Circuit integre de blocage aux tensions d'alimentation faibles

Info

Publication number
FR2640095B1
FR2640095B1 FR8911052A FR8911052A FR2640095B1 FR 2640095 B1 FR2640095 B1 FR 2640095B1 FR 8911052 A FR8911052 A FR 8911052A FR 8911052 A FR8911052 A FR 8911052A FR 2640095 B1 FR2640095 B1 FR 2640095B1
Authority
FR
France
Prior art keywords
supply voltages
low supply
locking circuit
integrated locking
integrated
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Expired - Fee Related
Application number
FR8911052A
Other languages
English (en)
Other versions
FR2640095A1 (fr
Inventor
A. Pease Robert
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
National Semiconductor Corp
Original Assignee
National Semiconductor Corp
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by National Semiconductor Corp filed Critical National Semiconductor Corp
Publication of FR2640095A1 publication Critical patent/FR2640095A1/fr
Application granted granted Critical
Publication of FR2640095B1 publication Critical patent/FR2640095B1/fr
Anticipated expiration legal-status Critical
Expired - Fee Related legal-status Critical Current

Links

Classifications

    • H—ELECTRICITY
    • H03—ELECTRONIC CIRCUITRY
    • H03K—PULSE TECHNIQUE
    • H03K17/00—Electronic switching or gating, i.e. not by contact-making and –breaking
    • H03K17/30—Modifications for providing a predetermined threshold before switching
    • H—ELECTRICITY
    • H03—ELECTRONIC CIRCUITRY
    • H03K—PULSE TECHNIQUE
    • H03K17/00—Electronic switching or gating, i.e. not by contact-making and –breaking
    • H03K17/22—Modifications for ensuring a predetermined initial state when the supply voltage has been applied
    • H—ELECTRICITY
    • H03—ELECTRONIC CIRCUITRY
    • H03K—PULSE TECHNIQUE
    • H03K17/00—Electronic switching or gating, i.e. not by contact-making and –breaking
    • H03K17/22—Modifications for ensuring a predetermined initial state when the supply voltage has been applied
    • H03K2017/226—Modifications for ensuring a predetermined initial state when the supply voltage has been applied in bipolar transistor switches
FR8911052A 1988-08-22 1989-08-21 Circuit integre de blocage aux tensions d'alimentation faibles Expired - Fee Related FR2640095B1 (fr)

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
US07/236,110 US5122920A (en) 1988-08-22 1988-08-22 Low voltage lockout circuit

Publications (2)

Publication Number Publication Date
FR2640095A1 FR2640095A1 (fr) 1990-06-08
FR2640095B1 true FR2640095B1 (fr) 1994-03-11

Family

ID=22888175

Family Applications (1)

Application Number Title Priority Date Filing Date
FR8911052A Expired - Fee Related FR2640095B1 (fr) 1988-08-22 1989-08-21 Circuit integre de blocage aux tensions d'alimentation faibles

Country Status (5)

Country Link
US (1) US5122920A (fr)
JP (1) JPH02105620A (fr)
DE (1) DE3927281A1 (fr)
FR (1) FR2640095B1 (fr)
GB (1) GB2224898B (fr)

Families Citing this family (7)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US5498972A (en) * 1990-08-15 1996-03-12 Telefonaktiebolaget Lm Ericsson Device for monitoring the supply voltage on integrated circuits
US5258758A (en) * 1991-01-31 1993-11-02 Crystal Semiconductor Corporation DAC shutdown for low power supply condition
US5196833A (en) * 1991-08-13 1993-03-23 Ford Motor Company Low voltage detector circuit
US6600639B1 (en) * 2001-06-14 2003-07-29 National Semiconductor Corporation Precision low voltage supply system and method with undervoltage lockout capabilities
US7932641B2 (en) * 2007-06-11 2011-04-26 International Business Machines Corporation Low voltage head room detection for reliable start-up of self-biased analog circuits
CN103684406A (zh) * 2013-11-27 2014-03-26 苏州贝克微电子有限公司 一种低电平锁存电路
KR102427327B1 (ko) 2017-07-25 2022-08-01 삼성전자주식회사 불휘발성 메모리 장치, 그것의 동작 방법, 및 그것을 포함하는 저장 장치

Family Cites Families (6)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
SU955324A1 (ru) * 1981-03-24 1982-08-30 Научно-Исследовательский Электротехнический Институт Производственного Объединения "Хэмз" Устройство дл защиты электроустановок от снижени питающего напр жени
JPH0237548B2 (ja) * 1981-07-31 1990-08-24 Sharp Kk Batsuteriichetsukaakairo
US4463271A (en) * 1981-12-28 1984-07-31 Raytheon Company Transistor switching circuitry having hysteresis
SU1099345A2 (ru) * 1982-03-12 1984-06-23 Научно-Исследовательский Электротехнический Институт Производственного Объединения "Хэмз" Устройство дл защиты электроустановки от снижени питающего напр жени
US4849656A (en) * 1987-06-11 1989-07-18 Unitrode Corp. Power-on detection circuit
US4789917A (en) * 1987-08-31 1988-12-06 National Semiconductor Corp. MOS I/O protection using switched body circuit design

Also Published As

Publication number Publication date
FR2640095A1 (fr) 1990-06-08
DE3927281A1 (de) 1990-03-01
GB2224898B (en) 1992-09-02
GB8918801D0 (en) 1989-09-27
GB2224898A (en) 1990-05-16
US5122920A (en) 1992-06-16
JPH02105620A (ja) 1990-04-18

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Legal Events

Date Code Title Description
ST Notification of lapse