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FR2571501B1 - Appareil de mesure des caracteristiques de dispositifs electroniques - Google Patents

Appareil de mesure des caracteristiques de dispositifs electroniques

Info

Publication number
FR2571501B1
FR2571501B1 FR8514776A FR8514776A FR2571501B1 FR 2571501 B1 FR2571501 B1 FR 2571501B1 FR 8514776 A FR8514776 A FR 8514776A FR 8514776 A FR8514776 A FR 8514776A FR 2571501 B1 FR2571501 B1 FR 2571501B1
Authority
FR
France
Prior art keywords
measuring
electronic devices
electronic
devices
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Expired
Application number
FR8514776A
Other languages
English (en)
Other versions
FR2571501A1 (fr
Inventor
Ryoichi Sakai
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
Tektronix Japan Ltd
Original Assignee
Sony Tektronix Corp
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Priority claimed from JP59208791A external-priority patent/JPS6187429A/ja
Priority claimed from JP20879284A external-priority patent/JPS6186664A/ja
Application filed by Sony Tektronix Corp filed Critical Sony Tektronix Corp
Publication of FR2571501A1 publication Critical patent/FR2571501A1/fr
Application granted granted Critical
Publication of FR2571501B1 publication Critical patent/FR2571501B1/fr
Expired legal-status Critical Current

Links

Classifications

    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
    • G01R31/00—Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere
    • G01R31/26—Testing of individual semiconductor devices
    • G01R31/2601—Apparatus or methods therefor
    • G01R31/2603—Apparatus or methods therefor for curve tracing of semiconductor characteristics, e.g. on oscilloscope
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
    • G01R31/00—Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere
    • G01R31/26—Testing of individual semiconductor devices
    • G01R31/2607—Circuits therefor

Landscapes

  • Physics & Mathematics (AREA)
  • General Physics & Mathematics (AREA)
  • Measurement Of Current Or Voltage (AREA)
  • Measurement Of Resistance Or Impedance (AREA)
FR8514776A 1984-10-04 1985-10-04 Appareil de mesure des caracteristiques de dispositifs electroniques Expired FR2571501B1 (fr)

Applications Claiming Priority (2)

Application Number Priority Date Filing Date Title
JP59208791A JPS6187429A (ja) 1984-10-04 1984-10-04 繰返し電圧発生回路
JP20879284A JPS6186664A (ja) 1984-10-04 1984-10-04 素子測定装置

Publications (2)

Publication Number Publication Date
FR2571501A1 FR2571501A1 (fr) 1986-04-11
FR2571501B1 true FR2571501B1 (fr) 1989-01-20

Family

ID=26517045

Family Applications (1)

Application Number Title Priority Date Filing Date
FR8514776A Expired FR2571501B1 (fr) 1984-10-04 1985-10-04 Appareil de mesure des caracteristiques de dispositifs electroniques

Country Status (5)

Country Link
CA (1) CA1242813A (fr)
DE (1) DE3533636C2 (fr)
FR (1) FR2571501B1 (fr)
GB (1) GB2165363B (fr)
NL (1) NL8502385A (fr)

Families Citing this family (2)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPH0721526B2 (ja) * 1987-08-18 1995-03-08 ソニ−・テクトロニクス株式会社 素子測定装置
CN108508342B (zh) * 2018-05-28 2020-07-17 中国科学院上海微系统与信息技术研究所 一种igbt短路过流检测电路

Family Cites Families (3)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US2980853A (en) * 1958-04-28 1961-04-18 Ryan Aeronautical Co Component output characteristic tracer
DE3144040A1 (de) * 1981-11-05 1983-05-19 Elektronikus Mérökészülékek Gyára, 1631 Budapest Schaltungsanordnung zur erzeugung von einer abhaengigen und einer unabhaengigen veraenderlichen sowie parameterwerten entsprechenden digitalen mengen sowie zu deren digitaler verarbeitung
FR2555758B1 (fr) * 1983-11-25 1986-09-26 Ecole Nale Sup Electro Applica Appareil de mesure de caracteristiques statiques de transistors et de diodes

Also Published As

Publication number Publication date
GB2165363B (en) 1989-01-18
DE3533636C2 (de) 1995-04-06
DE3533636A1 (de) 1986-04-10
GB2165363A (en) 1986-04-09
GB8522462D0 (en) 1985-10-16
CA1242813A (fr) 1988-10-04
FR2571501A1 (fr) 1986-04-11
NL8502385A (nl) 1986-05-01

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Legal Events

Date Code Title Description
ST Notification of lapse