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FR2360889A1 - Appareil d'essai automatique pour composants a semi-conducteur complexes et procede d'essai de tels composants - Google Patents

Appareil d'essai automatique pour composants a semi-conducteur complexes et procede d'essai de tels composants

Info

Publication number
FR2360889A1
FR2360889A1 FR7720040A FR7720040A FR2360889A1 FR 2360889 A1 FR2360889 A1 FR 2360889A1 FR 7720040 A FR7720040 A FR 7720040A FR 7720040 A FR7720040 A FR 7720040A FR 2360889 A1 FR2360889 A1 FR 2360889A1
Authority
FR
France
Prior art keywords
components
logic
analog
complex semiconductor
test apparatus
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Granted
Application number
FR7720040A
Other languages
English (en)
Other versions
FR2360889B1 (fr
Inventor
Steve H Foreman
Ernest H Millham
James E Ortloff
Ronald J Prilik
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
International Business Machines Corp
Original Assignee
International Business Machines Corp
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by International Business Machines Corp filed Critical International Business Machines Corp
Publication of FR2360889A1 publication Critical patent/FR2360889A1/fr
Application granted granted Critical
Publication of FR2360889B1 publication Critical patent/FR2360889B1/fr
Granted legal-status Critical Current

Links

Classifications

    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
    • G01R31/00—Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere
    • G01R31/28—Testing of electronic circuits, e.g. by signal tracer
    • G01R31/3167—Testing of combined analog and digital circuits

Landscapes

  • Engineering & Computer Science (AREA)
  • General Engineering & Computer Science (AREA)
  • Physics & Mathematics (AREA)
  • General Physics & Mathematics (AREA)
  • Tests Of Electronic Circuits (AREA)
  • Test And Diagnosis Of Digital Computers (AREA)

Abstract

Appareil d'essai automatique pour composants à semi-conducteur complexes. Les fonctions logiques et analogiques dans ce composant sont testées à l'aide d'un adaptateur 50 couplé à des appareils d'essai logiques et analogiques contrôlé par une unité de traitement. L'adaptateur fournit l'environnement électrique pour adapter une gamme de composants aux appareils essai logique et analogique Il permet l'adaptation en impédance d'une multiplicité d'unité d'excitation et de réponse 26 connectés par l'intermédiaire d'un multiplexeur 36, 38 à la gamme de composants soumis à l'essai. Permet un très grand nombre de tests simultanés et peut être appliqué au test de composants complexes réalisant des fonctions logiques et analogiques.
FR7720040A 1976-08-06 1977-06-21 Appareil d'essai automatique pour composants a semi-conducteur complexes et procede d'essai de tels composants Granted FR2360889A1 (fr)

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
US05/712,303 US4044244A (en) 1976-08-06 1976-08-06 Automatic tester for complex semiconductor components including combinations of logic, memory and analog devices and processes of testing thereof

Publications (2)

Publication Number Publication Date
FR2360889A1 true FR2360889A1 (fr) 1978-03-03
FR2360889B1 FR2360889B1 (fr) 1982-09-17

Family

ID=24861564

Family Applications (1)

Application Number Title Priority Date Filing Date
FR7720040A Granted FR2360889A1 (fr) 1976-08-06 1977-06-21 Appareil d'essai automatique pour composants a semi-conducteur complexes et procede d'essai de tels composants

Country Status (3)

Country Link
US (1) US4044244A (fr)
JP (1) JPS5319737A (fr)
FR (1) FR2360889A1 (fr)

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US4635259A (en) * 1983-08-01 1987-01-06 Fairchild Semiconductor Corporation Method and apparatus for monitoring response signals during automated testing of electronic circuits
US4646299A (en) * 1983-08-01 1987-02-24 Fairchild Semiconductor Corporation Method and apparatus for applying and monitoring programmed test signals during automated testing of electronic circuits
US4637020A (en) * 1983-08-01 1987-01-13 Fairchild Semiconductor Corporation Method and apparatus for monitoring automated testing of electronic circuits
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US4656632A (en) * 1983-11-25 1987-04-07 Giordano Associates, Inc. System for automatic testing of circuits and systems
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JPS6125230A (ja) * 1984-07-13 1986-02-04 Sony Corp Ｉｃ装置
US4682330A (en) * 1985-10-11 1987-07-21 International Business Machines Corporation Hierarchical test system architecture
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US5400343A (en) * 1992-02-28 1995-03-21 Intel Corporation Apparatus and method for defective column detection for semiconductor memories
US5414352A (en) * 1993-01-26 1995-05-09 Raytheon Company Parametric test circuit with plural range resistors
KR0130028B1 (ko) * 1994-09-01 1998-04-06 김광호 반도체 집적장치
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US5671147A (en) * 1995-08-11 1997-09-23 Hewlett-Packard Company AC mains test system for measuring current harmonics and voltage variations
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US6363507B1 (en) * 1998-10-19 2002-03-26 Teradyne, Inc. Integrated multi-channel analog test instrument architecture providing flexible triggering
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KR100505661B1 (ko) * 2002-12-20 2005-08-03 삼성전자주식회사 반도체 테스트 장치 및 그 구동방법
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US8222910B2 (en) * 2009-07-16 2012-07-17 Atmel Corporation Method and apparatus for sub-assembly error detection in high voltage analog circuits and pins
TWI408390B (zh) * 2010-06-25 2013-09-11 Princeton Technology Corp 用於類比量測模組之控制電路與相關控制模組
US20140136148A1 (en) * 2012-11-15 2014-05-15 Microsoft Corporation Automatic determination of device specific interoperability
CN106526456B (zh) * 2016-12-02 2023-03-21 河南中烟工业有限责任公司 一种集成电路在线测试装置和测试方法
US10613143B2 (en) 2018-04-03 2020-04-07 Hamilton Sundstrand Corporation System and method for providing automation of microprocessor analog input stimulation
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US3487304A (en) * 1968-02-02 1969-12-30 Aai Corp Sequential test apparatus for electrical circuits including a digital controlled analog test signal generating unit
DE1929850A1 (de) * 1968-06-14 1970-01-02 Teradyne Inc Schaltungspruefeinrichtung
US3733587A (en) * 1971-05-10 1973-05-15 Westinghouse Electric Corp Universal buffer interface for computer controlled test systems
FR2289967A1 (fr) * 1974-10-28 1976-05-28 Honeywell Bull Soc Ind Dispositif de test et diagnostic d'un appareil peripherique d'une unite de traitement de donnees

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US3622876A (en) * 1970-12-14 1971-11-23 Datatron Inc Digital module tester system
US3816813A (en) * 1972-01-24 1974-06-11 Spacetac Inc Automatic converter tester

Patent Citations (5)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US3487304A (en) * 1968-02-02 1969-12-30 Aai Corp Sequential test apparatus for electrical circuits including a digital controlled analog test signal generating unit
DE1929850A1 (de) * 1968-06-14 1970-01-02 Teradyne Inc Schaltungspruefeinrichtung
FR2010912A1 (fr) * 1968-06-14 1970-02-20 Teradyne Inc
US3733587A (en) * 1971-05-10 1973-05-15 Westinghouse Electric Corp Universal buffer interface for computer controlled test systems
FR2289967A1 (fr) * 1974-10-28 1976-05-28 Honeywell Bull Soc Ind Dispositif de test et diagnostic d'un appareil peripherique d'une unite de traitement de donnees

Non-Patent Citations (1)

* Cited by examiner, † Cited by third party
Title
EXBK/78 *

Also Published As

Publication number Publication date
JPS5319737A (en) 1978-02-23
JPS5444619B2 (fr) 1979-12-27
FR2360889B1 (fr) 1982-09-17
US4044244A (en) 1977-08-23

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