FR2228241B1 - - Google Patents
Info
- Publication number
- FR2228241B1 FR2228241B1 FR7415470A FR7415470A FR2228241B1 FR 2228241 B1 FR2228241 B1 FR 2228241B1 FR 7415470 A FR7415470 A FR 7415470A FR 7415470 A FR7415470 A FR 7415470A FR 2228241 B1 FR2228241 B1 FR 2228241B1
- Authority
- FR
- France
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
- Expired
Links
Classifications
-
- H10P95/00—
-
- G—PHYSICS
- G03—PHOTOGRAPHY; CINEMATOGRAPHY; ANALOGOUS TECHNIQUES USING WAVES OTHER THAN OPTICAL WAVES; ELECTROGRAPHY; HOLOGRAPHY
- G03B—APPARATUS OR ARRANGEMENTS FOR TAKING PHOTOGRAPHS OR FOR PROJECTING OR VIEWING THEM; APPARATUS OR ARRANGEMENTS EMPLOYING ANALOGOUS TECHNIQUES USING WAVES OTHER THAN OPTICAL WAVES; ACCESSORIES THEREFOR
- G03B17/00—Details of cameras or camera bodies; Accessories therefor
- G03B17/24—Details of cameras or camera bodies; Accessories therefor with means for separately producing marks on the film, e.g. title, time of exposure
- G03B17/245—Optical means
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- G—PHYSICS
- G03—PHOTOGRAPHY; CINEMATOGRAPHY; ANALOGOUS TECHNIQUES USING WAVES OTHER THAN OPTICAL WAVES; ELECTROGRAPHY; HOLOGRAPHY
- G03F—PHOTOMECHANICAL PRODUCTION OF TEXTURED OR PATTERNED SURFACES, e.g. FOR PRINTING, FOR PROCESSING OF SEMICONDUCTOR DEVICES; MATERIALS THEREFOR; ORIGINALS THEREFOR; APPARATUS SPECIALLY ADAPTED THEREFOR
- G03F9/00—Registration or positioning of originals, masks, frames, photographic sheets or textured or patterned surfaces, e.g. automatically
- G03F9/70—Registration or positioning of originals, masks, frames, photographic sheets or textured or patterned surfaces, e.g. automatically for microlithography
Landscapes
- General Physics & Mathematics (AREA)
- Physics & Mathematics (AREA)
- Exposure And Positioning Against Photoresist Photosensitive Materials (AREA)
- Engineering & Computer Science (AREA)
- Exposure Of Semiconductors, Excluding Electron Or Ion Beam Exposure (AREA)
- Holders For Sensitive Materials And Originals (AREA)
- Projection-Type Copiers In General (AREA)
- Mounting And Adjusting Of Optical Elements (AREA)
- Condensed Matter Physics & Semiconductors (AREA)
- Manufacturing & Machinery (AREA)
- Computer Hardware Design (AREA)
- Microelectronics & Electronic Packaging (AREA)
- Power Engineering (AREA)
Applications Claiming Priority (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| GB2107373A GB1473301A (en) | 1973-05-03 | 1973-05-03 | Manufacture of multi-layer structures |
Publications (2)
| Publication Number | Publication Date |
|---|---|
| FR2228241A1 FR2228241A1 (fr) | 1974-11-29 |
| FR2228241B1 true FR2228241B1 (fr) | 1978-08-04 |
Family
ID=10156749
Family Applications (1)
| Application Number | Title | Priority Date | Filing Date |
|---|---|---|---|
| FR7415470A Expired FR2228241B1 (fr) | 1973-05-03 | 1974-05-03 |
Country Status (6)
| Country | Link |
|---|---|
| US (1) | US4007988A (fr) |
| JP (1) | JPS5234907B2 (fr) |
| DE (1) | DE2421509C3 (fr) |
| FR (1) | FR2228241B1 (fr) |
| GB (1) | GB1473301A (fr) |
| NL (1) | NL7406011A (fr) |
Families Citing this family (6)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| DE2708682C3 (de) * | 1977-02-28 | 1981-04-09 | Siemens AG, 1000 Berlin und 8000 München | Verfahren zum Justieren einer Belichtungsmaske relativ zu einer Substratscheibe bei der Fotolithografie |
| US4232969A (en) * | 1979-05-30 | 1980-11-11 | International Business Machines Corporation | Projection optical system for aligning an image on a surface |
| JPS58116541A (ja) * | 1981-12-29 | 1983-07-11 | Canon Inc | 整合方法 |
| US4479711A (en) * | 1982-12-02 | 1984-10-30 | Canon Kabushiki Kaisha | Mask aligner |
| US4679942A (en) * | 1984-02-24 | 1987-07-14 | Nippon Kogaku K. K. | Method of aligning a semiconductor substrate and a photomask |
| DE10102540B4 (de) * | 2001-01-19 | 2013-03-21 | Vistec Semiconductor Systems Jena Gmbh | Anordnung und Verfahren zur Identifikation von Substraten |
Family Cites Families (8)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| US3264106A (en) * | 1961-11-13 | 1966-08-02 | Harold H Alldis | Pin registration board and method |
| US3299777A (en) * | 1965-06-14 | 1967-01-24 | Harris Intertype Corp | Web register mechanism |
| FR1542515A (fr) * | 1966-07-21 | 1968-09-09 | Ibm | Montage à réglage automatique servant à réaliser un cadrage optique |
| FR95303E (fr) * | 1967-02-13 | 1970-08-21 | Olivetti General Electric Spa | Procédé de fabrication de dessins photographiques pour circuits imprimés. |
| US3490846A (en) * | 1967-06-01 | 1970-01-20 | Kasper Instruments | Optical alignment and exposure apparatus |
| GB1312825A (en) * | 1969-04-19 | 1973-04-11 | Licentia Gmbh | Method and apparatus for bringing a mask and a semiconductor body into register with one another |
| FR2046588A5 (fr) * | 1970-04-30 | 1971-03-05 | Bassereau Roger | |
| US3742229A (en) * | 1972-06-29 | 1973-06-26 | Massachusetts Inst Technology | Soft x-ray mask alignment system |
-
1973
- 1973-05-03 GB GB2107373A patent/GB1473301A/en not_active Expired
-
1974
- 1974-05-02 JP JP49049648A patent/JPS5234907B2/ja not_active Expired
- 1974-05-03 US US05/466,914 patent/US4007988A/en not_active Expired - Lifetime
- 1974-05-03 FR FR7415470A patent/FR2228241B1/fr not_active Expired
- 1974-05-03 DE DE2421509A patent/DE2421509C3/de not_active Expired
- 1974-05-03 NL NL7406011A patent/NL7406011A/xx not_active Application Discontinuation
Also Published As
| Publication number | Publication date |
|---|---|
| US4007988A (en) | 1977-02-15 |
| FR2228241A1 (fr) | 1974-11-29 |
| DE2421509A1 (de) | 1974-11-21 |
| JPS5019365A (fr) | 1975-02-28 |
| GB1473301A (en) | 1977-05-11 |
| DE2421509C3 (de) | 1979-12-20 |
| NL7406011A (fr) | 1974-11-05 |
| JPS5234907B2 (fr) | 1977-09-06 |
| DE2421509B2 (de) | 1976-10-07 |
Similar Documents
Legal Events
| Date | Code | Title | Description |
|---|---|---|---|
| TP | Transmission of property | ||
| ST | Notification of lapse |