[go: up one dir, main page]

FR1580234A - - Google Patents

Info

Publication number
FR1580234A
FR1580234A FR151943A FR1580234DA FR1580234A FR 1580234 A FR1580234 A FR 1580234A FR 151943 A FR151943 A FR 151943A FR 1580234D A FR1580234D A FR 1580234DA FR 1580234 A FR1580234 A FR 1580234A
Authority
FR
France
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Expired
Application number
FR151943A
Other languages
French (fr)
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed filed Critical
Application granted granted Critical
Publication of FR1580234A publication Critical patent/FR1580234A/fr
Expired legal-status Critical Current

Links

Classifications

    • H—ELECTRICITY
    • H01—ELECTRIC ELEMENTS
    • H01J—ELECTRIC DISCHARGE TUBES OR DISCHARGE LAMPS
    • H01J49/00—Particle spectrometers or separator tubes
    • H01J49/02—Details
    • H01J49/10—Ion sources; Ion guns
    • H01J49/16—Ion sources; Ion guns using surface ionisation, e.g. field-, thermionic- or photo-emission
    • H01J49/161—Ion sources; Ion guns using surface ionisation, e.g. field-, thermionic- or photo-emission using photoionisation, e.g. by laser

Landscapes

  • Physics & Mathematics (AREA)
  • Optics & Photonics (AREA)
  • Engineering & Computer Science (AREA)
  • Plasma & Fusion (AREA)
  • Chemical & Material Sciences (AREA)
  • Analytical Chemistry (AREA)
  • Other Investigation Or Analysis Of Materials By Electrical Means (AREA)
  • Electron Sources, Ion Sources (AREA)
  • Electron Tubes For Measurement (AREA)
FR151943A 1968-05-15 1968-05-15 Expired FR1580234A (en)

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
FR151943 1968-05-15

Publications (1)

Publication Number Publication Date
FR1580234A true FR1580234A (en) 1969-09-05

Family

ID=8650281

Family Applications (1)

Application Number Title Priority Date Filing Date
FR151943A Expired FR1580234A (en) 1968-05-15 1968-05-15

Country Status (8)

Country Link
US (1) US3644731A (en)
BE (1) BE732190A (en)
CH (1) CH510369A (en)
DE (1) DE1922871B2 (en)
ES (1) ES367221A1 (en)
FR (1) FR1580234A (en)
GB (1) GB1268813A (en)
LU (1) LU58541A1 (en)

Cited By (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
EP0084086A3 (en) * 1982-01-16 1984-02-22 Leybold-Heraeus GmbH Laser microsensor

Families Citing this family (16)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US3748475A (en) * 1972-02-17 1973-07-24 T Roberts Neutron generator axially assisted by laser
US3944826A (en) * 1973-07-19 1976-03-16 Applied Research Laboratories Limited Methods and apparatus for analyzing mixtures
DE2540505A1 (en) * 1975-09-11 1977-03-24 Leybold Heraeus Gmbh & Co Kg FLIGHT TIME MASS SPECTROMETERS FOR IONS WITH DIFFERENT ENERGIES
DE2739829C2 (en) * 1977-09-03 1986-04-10 Gesellschaft für Strahlen- und Umweltforschung mbH, 8000 München Arrangement for analyzing a sample layer by bombarding it with electromagnetic radiation
DE2740183A1 (en) * 1977-09-07 1979-03-08 Leybold Heraeus Gmbh & Co Kg DEVICE FOR FOCUSING ELECTROMAGNETIC RADIATION ON A SAMPLE
JPS57205953A (en) * 1981-06-12 1982-12-17 Jeol Ltd Ion source
US4740692A (en) * 1985-06-13 1988-04-26 Mitsubishi Denki Kabushiki Kaisha Laser mass spectroscopic analyzer and method
GB8703012D0 (en) * 1987-02-10 1987-03-18 Vg Instr Group Secondary ion mass spectrometer
JP2564404B2 (en) * 1989-09-20 1996-12-18 株式会社日立製作所 Mass spectrometry
US5204530A (en) * 1991-12-27 1993-04-20 Philippe Chastagner Noise reduction in negative-ion quadrupole mass spectrometry
DE19637480C2 (en) * 1996-09-13 2001-02-08 Thorald Bergmann Device for mass spectrometric analysis of surfaces
GB0021902D0 (en) * 2000-09-06 2000-10-25 Kratos Analytical Ltd Ion optics system for TOF mass spectrometer
GB2400976B (en) * 2000-09-06 2005-02-09 Kratos Analytical Ltd Ion optics system for TOF mass spectrometer
US20090202692A1 (en) * 2008-02-11 2009-08-13 Sang Hoon Chun Seasoning dispenser
JP5801144B2 (en) * 2011-08-30 2015-10-28 株式会社東芝 Ion source
CN110828281B (en) * 2019-11-15 2020-10-09 中国科学院大连化学物理研究所 An ion enrichment ion transfer tube

Cited By (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
EP0084086A3 (en) * 1982-01-16 1984-02-22 Leybold-Heraeus GmbH Laser microsensor

Also Published As

Publication number Publication date
US3644731A (en) 1972-02-22
GB1268813A (en) 1972-03-29
CH510369A (en) 1971-07-15
DE1922871B2 (en) 1972-02-17
LU58541A1 (en) 1969-07-29
BE732190A (en) 1969-10-01
ES367221A1 (en) 1971-05-01
DE1922871A1 (en) 1969-11-20

Similar Documents

Publication Publication Date Title
AU5506869A (en)
AU5184069A (en)
FR1580234A (en)
AU6168869A (en)
AU6171569A (en)
AU4811568A (en)
AU4744468A (en)
BE709484A (en)
BE709415A (en)
BE727723A (en)
BE727535A (en)
BE727456A (en)
BE727197A (en)
BE727091A (en)
BE727032A (en)
BE726757A (en)
BE726479A (en)
BE726429A (en)
BE726266A (en)
BE725259A (en)
BE723943A (en)
BE709496A (en)
BE728289A (en)
BE709479A (en)
BE709446A (en)

Legal Events

Date Code Title Description
ST Notification of lapse