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FI911928L - Foerfarande och anordning foer detektering av smao foeroreningsmaengder. - Google Patents

Foerfarande och anordning foer detektering av smao foeroreningsmaengder. Download PDF

Info

Publication number
FI911928L
FI911928L FI911928A FI911928A FI911928L FI 911928 L FI911928 L FI 911928L FI 911928 A FI911928 A FI 911928A FI 911928 A FI911928 A FI 911928A FI 911928 L FI911928 L FI 911928L
Authority
FI
Finland
Prior art keywords
foeroreningsmaengder
smao
anordning foer
och anordning
foerfarande och
Prior art date
Application number
FI911928A
Other languages
English (en)
Other versions
FI911928A7 (fi
FI911928A0 (fi
Inventor
Lauren M Purcell
Albert F Lawrence
Original Assignee
Hughes Aircraft Co
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Hughes Aircraft Co filed Critical Hughes Aircraft Co
Publication of FI911928A0 publication Critical patent/FI911928A0/fi
Publication of FI911928L publication Critical patent/FI911928L/fi
Publication of FI911928A7 publication Critical patent/FI911928A7/fi

Links

Classifications

    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N1/00—Sampling; Preparing specimens for investigation
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N23/00—Investigating or analysing materials by the use of wave or particle radiation, e.g. X-rays or neutrons, not covered by groups G01N3/00 – G01N17/00, G01N21/00 or G01N22/00
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N21/00—Investigating or analysing materials by the use of optical means, i.e. using sub-millimetre waves, infrared, visible or ultraviolet light
    • G01N21/17—Systems in which incident light is modified in accordance with the properties of the material investigated
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N21/00—Investigating or analysing materials by the use of optical means, i.e. using sub-millimetre waves, infrared, visible or ultraviolet light
    • G01N21/84—Systems specially adapted for particular applications
    • G01N21/85—Investigating moving fluids or granular solids
    • G01N2021/8571—Investigating moving fluids or granular solids using filtering of sample fluid
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N2223/00—Investigating materials by wave or particle radiation
    • G01N2223/40—Imaging
    • G01N2223/418—Imaging electron microscope
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N2223/00—Investigating materials by wave or particle radiation
    • G01N2223/40—Imaging
    • G01N2223/426—Imaging image comparing, unknown with known substance
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N2223/00—Investigating materials by wave or particle radiation
    • G01N2223/60—Specific applications or type of materials
    • G01N2223/637—Specific applications or type of materials liquid
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N2223/00—Investigating materials by wave or particle radiation
    • G01N2223/60—Specific applications or type of materials
    • G01N2223/638—Specific applications or type of materials gas
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N2223/00—Investigating materials by wave or particle radiation
    • G01N2223/60—Specific applications or type of materials
    • G01N2223/652—Specific applications or type of materials impurities, foreign matter, trace amounts
    • Y—GENERAL TAGGING OF NEW TECHNOLOGICAL DEVELOPMENTS; GENERAL TAGGING OF CROSS-SECTIONAL TECHNOLOGIES SPANNING OVER SEVERAL SECTIONS OF THE IPC; TECHNICAL SUBJECTS COVERED BY FORMER USPC CROSS-REFERENCE ART COLLECTIONS [XRACs] AND DIGESTS
    • Y10—TECHNICAL SUBJECTS COVERED BY FORMER USPC
    • Y10S—TECHNICAL SUBJECTS COVERED BY FORMER USPC CROSS-REFERENCE ART COLLECTIONS [XRACs] AND DIGESTS
    • Y10S977/00—Nanotechnology
    • Y10S977/84—Manufacture, treatment, or detection of nanostructure
    • Y10S977/849—Manufacture, treatment, or detection of nanostructure with scanning probe
    • Y10S977/852—Manufacture, treatment, or detection of nanostructure with scanning probe for detection of specific nanostructure sample or nanostructure-related property

Landscapes

  • Physics & Mathematics (AREA)
  • Health & Medical Sciences (AREA)
  • Life Sciences & Earth Sciences (AREA)
  • Chemical & Material Sciences (AREA)
  • Analytical Chemistry (AREA)
  • Biochemistry (AREA)
  • General Health & Medical Sciences (AREA)
  • General Physics & Mathematics (AREA)
  • Immunology (AREA)
  • Pathology (AREA)
  • Sampling And Sample Adjustment (AREA)
  • Investigating Or Analysing Biological Materials (AREA)
FI911928A 1990-04-20 1991-04-19 Menetelmä ja laite pienien epäpuhtausmäärien havaitsemista varten FI911928A7 (fi)

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
US07/511,672 US5023452A (en) 1990-04-20 1990-04-20 Method and apparatus for detecting trace contaminents

Publications (3)

Publication Number Publication Date
FI911928A0 FI911928A0 (fi) 1991-04-19
FI911928L true FI911928L (fi) 1991-10-21
FI911928A7 FI911928A7 (fi) 1991-10-21

Family

ID=24035933

Family Applications (1)

Application Number Title Priority Date Filing Date
FI911928A FI911928A7 (fi) 1990-04-20 1991-04-19 Menetelmä ja laite pienien epäpuhtausmäärien havaitsemista varten

Country Status (7)

Country Link
US (1) US5023452A (fi)
EP (1) EP0453225A1 (fi)
JP (1) JPH04230828A (fi)
KR (1) KR910018794A (fi)
CA (1) CA2039108C (fi)
FI (1) FI911928A7 (fi)
NO (1) NO911530L (fi)

Families Citing this family (9)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPH06349916A (ja) * 1993-04-30 1994-12-22 Applied Materials Inc 基板上の粒子検出方法及び装置
US5412211A (en) * 1993-07-30 1995-05-02 Electroscan Corporation Environmental scanning electron microscope
US5362964A (en) * 1993-07-30 1994-11-08 Electroscan Corporation Environmental scanning electron microscope
US5410910A (en) * 1993-12-22 1995-05-02 University Of Virginia Patent Foundation Cryogenic atomic force microscope
US5821545A (en) * 1995-11-07 1998-10-13 Molecular Imaging Corporation Heated stage for a scanning probe microscope
US5654546A (en) * 1995-11-07 1997-08-05 Molecular Imaging Corporation Variable temperature scanning probe microscope based on a peltier device
US5859362A (en) * 1996-10-22 1999-01-12 Revenue Canada Trace vapor detection
US7759134B2 (en) * 2003-09-10 2010-07-20 Auburn University Magnetostrictive ligand sensor
JP4241756B2 (ja) * 2005-05-13 2009-03-18 オムロン株式会社 部品実装基板構造

Family Cites Families (11)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US4013888A (en) * 1975-07-24 1977-03-22 Macias Edward S Monitor for atmospheric pollutants
DE2654057B1 (de) * 1976-11-29 1978-04-27 Varian Mat Gmbh Verfahren zur Ionisierung von organischen Substanzen,sowie dieses Verfahren benutzendes Analysegeraet
GB1575409A (en) * 1977-08-23 1980-09-24 Awdeh Z Concentration apparatus
US4395493A (en) * 1981-05-14 1983-07-26 Coulter Electronics, Inc. Monolayer device using filter techniques
EP0148290A1 (en) * 1983-12-14 1985-07-17 Försvarets Forskningsanstalt Method and device at the analysis of liquid samples
US4594506A (en) * 1984-09-10 1986-06-10 Nicolet Instrument Corporation Gas chromatograph/mass spectrometer interface
JPS6177747A (ja) * 1984-09-25 1986-04-21 Murata Mfg Co Ltd 分析試料を担体に保持する方法および分析試料を担体に保持させるための装置
JPS633244A (ja) * 1986-06-24 1988-01-08 Japan Spectroscopic Co 赤外スペクトル測定のサンプリング法及び高速液クロと赤外分光光度計のインタ−フエイス並びに高速液クロ検出器用赤外分光光度計
US4740298A (en) * 1986-09-08 1988-04-26 Sepragen Corporation Chromatography column/moving belt interface
JPH0750042B2 (ja) * 1987-03-18 1995-05-31 株式会社島津製作所 スペクトル分析装置における状態分析方法
JPS63243853A (ja) * 1987-03-31 1988-10-11 Shimadzu Corp 自動定性分析装置

Also Published As

Publication number Publication date
NO911530L (no) 1991-10-21
EP0453225A1 (en) 1991-10-23
US5023452A (en) 1991-06-11
CA2039108C (en) 1994-11-08
NO911530D0 (no) 1991-04-18
JPH04230828A (ja) 1992-08-19
FI911928A7 (fi) 1991-10-21
KR910018794A (ko) 1991-11-30
CA2039108A1 (en) 1991-10-21
FI911928A0 (fi) 1991-04-19

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