[go: up one dir, main page]

FI914733L - TEST METHOD AND TEST APPARATUS - Google Patents

TEST METHOD AND TEST APPARATUS Download PDF

Info

Publication number
FI914733L
FI914733L FI914733A FI914733A FI914733L FI 914733 L FI914733 L FI 914733L FI 914733 A FI914733 A FI 914733A FI 914733 A FI914733 A FI 914733A FI 914733 L FI914733 L FI 914733L
Authority
FI
Finland
Prior art keywords
test
arrangement
standardized
area
structures
Prior art date
Application number
FI914733A
Other languages
Finnish (fi)
Other versions
FI914733A0 (en
FI100829B (en
Inventor
Matti Weissenfelt
Hannu Olkkola
Original Assignee
Matti Weissenfelt
Hannu Olkkola
Tiensyrjae Kari
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Matti Weissenfelt, Hannu Olkkola, Tiensyrjae Kari filed Critical Matti Weissenfelt
Priority to FI914733A priority Critical patent/FI100829B/en
Publication of FI914733A0 publication Critical patent/FI914733A0/en
Publication of FI914733L publication Critical patent/FI914733L/en
Application granted granted Critical
Publication of FI100829B publication Critical patent/FI100829B/en

Links

Landscapes

  • Tests Of Electronic Circuits (AREA)
  • Testing Or Measuring Of Semiconductors Or The Like (AREA)

Abstract

The invention concerns a test method and test apparatus for detection and localization of manufacturing defects in an electronic arrangement that contains test structures according to standard IEEE 1149.1, hereafter "the tested arrangement" by means of selected current diagnosis. The selected current diagnosis significantly broadens the area of application of wiring tests according to standard IEEE 1149.1 (JTAG) on component boards that contain both components with standardized test structures and traditional components without the standardized test structure. Broadening of the area of application and the increased coverage of wiring tests are based on measurement of changes in the value of the operating current that an arrangement takes from a power source by means of a computer-control test arrangement that contains a current measurement device and a control device for the test structures, when the test arrangement by means of the standardized test structure placed in the test arrangement has guided the test arrangement into a desired controlled static state or states. <IMAGE>
FI914733A 1991-10-08 1991-10-08 Test method and test apparatus FI100829B (en)

Priority Applications (1)

Application Number Priority Date Filing Date Title
FI914733A FI100829B (en) 1991-10-08 1991-10-08 Test method and test apparatus

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
FI914733A FI100829B (en) 1991-10-08 1991-10-08 Test method and test apparatus

Publications (3)

Publication Number Publication Date
FI914733A0 FI914733A0 (en) 1991-10-08
FI914733L true FI914733L (en) 1993-04-09
FI100829B FI100829B (en) 1998-02-27

Family

ID=8533253

Family Applications (1)

Application Number Title Priority Date Filing Date
FI914733A FI100829B (en) 1991-10-08 1991-10-08 Test method and test apparatus

Country Status (1)

Country Link
FI (1) FI100829B (en)

Families Citing this family (2)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
FI110034B (en) * 2000-02-11 2002-11-15 Elektrobit Oy Test arrangement and test procedure
US7206547B2 (en) 2003-09-30 2007-04-17 Elektrobit Oy Method of testing electric circuit, and arrangement

Also Published As

Publication number Publication date
FI914733A0 (en) 1991-10-08
FI100829B (en) 1998-02-27

Similar Documents

Publication Publication Date Title
FR2614105B1 (en) APPARATUS AND PROBE FOR TESTING PRINTED CIRCUIT BOARDS
GB2001178B (en) Programmable circuit system tester
DE3688612D1 (en) SYSTEM WITH ELECTRON BEAM TESTING PROBE FOR ANALYZING INTEGRATED CIRCUITS.
EP0285799A3 (en) Device for the functional electric testing of wiring arrays, in particular of circuit boards
GB1523060A (en) Printed circuit board tester
DE3065137D1 (en) Electrical test probe for use in testing circuits on printed circuit boards and the like
SG86333A1 (en) Static ram circuit for deffect analysis
EP0454347A3 (en) Vacuum-actuated test fixture for testing electronic components
DE3850889D1 (en) Apparatus for examining a populated electronic device.
GB8825319D0 (en) Apparatus for testing input pin leakage current of device under test
KR880700275A (en) Electronic device testing methods and integrated circuit testers for testing
HK1002835A1 (en) Testing apparatus
DE69419269D1 (en) Procedure for the automatic detection of open circuits
FI914733L (en) TEST METHOD AND TEST APPARATUS
FR2602593B1 (en) CURRENT MEASURING DEVICE
NZ306552A (en) Testing printed circuit boards by passing them between opposed boards bearing test probes
FR2613079B1 (en) APPARATUS FOR AUTOMATICALLY TESTING ELECTRONIC CIRCUITS AND MEASURING TIME
JPS5427755A (en) Circuit testing equipment
GB2268277B (en) Improvements in or relating to electronic circuit test apparatus
GB2172403B (en) Method for operating automatic test equipment
JPS5322757A (en) Testing apparatus of electric a ppliances
JPS54151478A (en) Pin connection checking system of integrated circuits being tested in integrated circuit testing apparatus
JPS51126192A (en) An inspection apparatus to inspect inside surface of a test piese
JPH03190253A (en) Inspection device for image sensor measurement
ATE262678T1 (en) DEVICE FOR INSPECTING TEST OBJECTS AND USE OF THE DEVICE

Legal Events

Date Code Title Description
PC Transfer of assignment of patent

Owner name: ELEKTROBIT TESTING OY

Free format text: ELEKTROBIT TESTING OY

PC Transfer of assignment of patent

Owner name: ELEKTROBIT SYSTEM TEST OY

Free format text: ELEKTROBIT SYSTEM TEST OY