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FI20155830L - Method and arrangement for detecting harmful substances - Google Patents

Method and arrangement for detecting harmful substances Download PDF

Info

Publication number
FI20155830L
FI20155830L FI20155830A FI20155830A FI20155830L FI 20155830 L FI20155830 L FI 20155830L FI 20155830 A FI20155830 A FI 20155830A FI 20155830 A FI20155830 A FI 20155830A FI 20155830 L FI20155830 L FI 20155830L
Authority
FI
Finland
Prior art keywords
ions
reagent component
harmful substance
harmful substances
molecules
Prior art date
Application number
FI20155830A
Other languages
Finnish (fi)
Swedish (sv)
Other versions
FI20155830A7 (en
Inventor
Heikki Junninen
Juha Kangasluoma
Tuukka Petäjä
Mikko Sipilä
Original Assignee
Univ Helsinki
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Univ Helsinki filed Critical Univ Helsinki
Priority to FI20155830A priority Critical patent/FI20155830L/en
Priority to PCT/FI2016/050793 priority patent/WO2017081370A1/en
Publication of FI20155830A7 publication Critical patent/FI20155830A7/en
Publication of FI20155830L publication Critical patent/FI20155830L/en

Links

Classifications

    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N27/00—Investigating or analysing materials by the use of electric, electrochemical, or magnetic means
    • G01N27/62—Investigating or analysing materials by the use of electric, electrochemical, or magnetic means by investigating the ionisation of gases, e.g. aerosols; by investigating electric discharges, e.g. emission of cathode
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N1/00—Sampling; Preparing specimens for investigation
    • G01N1/28—Preparing specimens for investigation including physical details of (bio-)chemical methods covered elsewhere, e.g. G01N33/50, C12Q
    • G01N1/44—Sample treatment involving radiation, e.g. heat
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N1/00—Sampling; Preparing specimens for investigation
    • G01N1/02—Devices for withdrawing samples
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N23/00—Investigating or analysing materials by the use of wave or particle radiation, e.g. X-rays or neutrons, not covered by groups G01N3/00 – G01N17/00, G01N21/00 or G01N22/00
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N23/00—Investigating or analysing materials by the use of wave or particle radiation, e.g. X-rays or neutrons, not covered by groups G01N3/00 – G01N17/00, G01N21/00 or G01N22/00
    • G01N23/02—Investigating or analysing materials by the use of wave or particle radiation, e.g. X-rays or neutrons, not covered by groups G01N3/00 – G01N17/00, G01N21/00 or G01N22/00 by transmitting the radiation through the material
    • G01N23/04—Investigating or analysing materials by the use of wave or particle radiation, e.g. X-rays or neutrons, not covered by groups G01N3/00 – G01N17/00, G01N21/00 or G01N22/00 by transmitting the radiation through the material and forming images of the material
    • H—ELECTRICITY
    • H01—ELECTRIC ELEMENTS
    • H01J—ELECTRIC DISCHARGE TUBES OR DISCHARGE LAMPS
    • H01J49/00—Particle spectrometers or separator tubes
    • H01J49/02—Details
    • H01J49/10—Ion sources; Ion guns
    • H01J49/16—Ion sources; Ion guns using surface ionisation, e.g. field-, thermionic- or photo-emission
    • H01J49/161—Ion sources; Ion guns using surface ionisation, e.g. field-, thermionic- or photo-emission using photoionisation, e.g. by laser
    • H01J49/162—Direct photo-ionisation, e.g. single photon or multi-photon ionisation
    • H—ELECTRICITY
    • H01—ELECTRIC ELEMENTS
    • H01J—ELECTRIC DISCHARGE TUBES OR DISCHARGE LAMPS
    • H01J49/00—Particle spectrometers or separator tubes
    • H01J49/26—Mass spectrometers or separator tubes
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N1/00—Sampling; Preparing specimens for investigation
    • G01N1/02—Devices for withdrawing samples
    • G01N2001/022—Devices for withdrawing samples sampling for security purposes, e.g. contraband, warfare agents
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N1/00—Sampling; Preparing specimens for investigation
    • G01N1/02—Devices for withdrawing samples
    • G01N2001/028—Sampling from a surface, swabbing, vaporising
    • H—ELECTRICITY
    • H01—ELECTRIC ELEMENTS
    • H01J—ELECTRIC DISCHARGE TUBES OR DISCHARGE LAMPS
    • H01J49/00—Particle spectrometers or separator tubes
    • H01J49/02—Details
    • H01J49/04—Arrangements for introducing or extracting samples to be analysed, e.g. vacuum locks; Arrangements for external adjustment of electron- or ion-optical components

Landscapes

  • Chemical & Material Sciences (AREA)
  • Physics & Mathematics (AREA)
  • Analytical Chemistry (AREA)
  • Immunology (AREA)
  • Life Sciences & Earth Sciences (AREA)
  • Biochemistry (AREA)
  • General Health & Medical Sciences (AREA)
  • General Physics & Mathematics (AREA)
  • Health & Medical Sciences (AREA)
  • Pathology (AREA)
  • Optics & Photonics (AREA)
  • Engineering & Computer Science (AREA)
  • Plasma & Fusion (AREA)
  • Chemical Kinetics & Catalysis (AREA)
  • Electrochemistry (AREA)
  • Analysing Materials By The Use Of Radiation (AREA)
  • Other Investigation Or Analysis Of Materials By Electrical Means (AREA)

Abstract

A security screening arrangement (100) for detecting harmful substances, such as explosives, drugs and poisons, comprises a receiving device (101) for receiving an object (102) comprising the possible harmful substances, a carrier gas providing device (106) for providing a carrier gas flow (108) comprising reagent component (110), and an X-ray device (112), where the X-ray radiation of said X-ray radiation device is configured to produce (113) ions (114) of the reagent component (110) of the carrier gas flow (108). The produced reagent component ions (114) are introduced (115) to the molecules (103) of the harmful substance and thereby charge said molecules (103) of the harmful substance by using said produced reagent component ions (114) and thereby producing target ions (116) of said harmful substance molecules. The target ions (116) are then introduced (118, 119, 120) to the mass spectrometer (117) for detection existence of said harmful substance.
FI20155830A 2015-11-11 2015-11-11 Method and arrangement for detecting harmful substances FI20155830L (en)

Priority Applications (2)

Application Number Priority Date Filing Date Title
FI20155830A FI20155830L (en) 2015-11-11 2015-11-11 Method and arrangement for detecting harmful substances
PCT/FI2016/050793 WO2017081370A1 (en) 2015-11-11 2016-11-10 Method and arrangement for detecting harmful substances

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
FI20155830A FI20155830L (en) 2015-11-11 2015-11-11 Method and arrangement for detecting harmful substances

Publications (2)

Publication Number Publication Date
FI20155830A7 FI20155830A7 (en) 2017-05-12
FI20155830L true FI20155830L (en) 2017-05-12

Family

ID=58694745

Family Applications (1)

Application Number Title Priority Date Filing Date
FI20155830A FI20155830L (en) 2015-11-11 2015-11-11 Method and arrangement for detecting harmful substances

Country Status (2)

Country Link
FI (1) FI20155830L (en)
WO (1) WO2017081370A1 (en)

Family Cites Families (5)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JP2000028579A (en) * 1998-07-08 2000-01-28 Hitachi Ltd Sample gas sampling device and dangerous substance detection device
DE19933650C1 (en) * 1999-07-17 2001-03-08 Bruker Saxonia Analytik Gmbh Ionization chamber with a non-radioactive ionization source
JP2009198469A (en) * 2008-02-25 2009-09-03 Mitsubishi Heavy Ind Ltd Nuclear material detecting device, nuclear material inspection system, and clearance system
JP5945108B2 (en) * 2011-10-06 2016-07-05 株式会社日立製作所 Attachment inspection apparatus and inspection method
US20140284204A1 (en) * 2013-03-22 2014-09-25 Airmodus Oy Method and device for ionizing particles of a sample gas glow

Also Published As

Publication number Publication date
FI20155830A7 (en) 2017-05-12
WO2017081370A1 (en) 2017-05-18

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Legal Events

Date Code Title Description
FD Application lapsed