FI20096035A0 - Mätdon och anordning för att mäta egenskaper av ett objekt och av en yta på objektet - Google Patents
Mätdon och anordning för att mäta egenskaper av ett objekt och av en yta på objektetInfo
- Publication number
- FI20096035A0 FI20096035A0 FI20096035A FI20096035A FI20096035A0 FI 20096035 A0 FI20096035 A0 FI 20096035A0 FI 20096035 A FI20096035 A FI 20096035A FI 20096035 A FI20096035 A FI 20096035A FI 20096035 A0 FI20096035 A0 FI 20096035A0
- Authority
- FI
- Finland
- Prior art keywords
- measurements
- measuring properties
- properties
- measuring
- Prior art date
Links
- 238000005259 measurement Methods 0.000 title 1
Classifications
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
- G01N21/00—Investigating or analysing materials by the use of optical means, i.e. using sub-millimetre waves, infrared, visible or ultraviolet light
- G01N21/17—Systems in which incident light is modified in accordance with the properties of the material investigated
- G01N21/55—Specular reflectivity
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01B—MEASURING LENGTH, THICKNESS OR SIMILAR LINEAR DIMENSIONS; MEASURING ANGLES; MEASURING AREAS; MEASURING IRREGULARITIES OF SURFACES OR CONTOURS
- G01B11/00—Measuring arrangements characterised by the use of optical techniques
- G01B11/02—Measuring arrangements characterised by the use of optical techniques for measuring length, width or thickness
- G01B11/06—Measuring arrangements characterised by the use of optical techniques for measuring length, width or thickness for measuring thickness ; e.g. of sheet material
- G01B11/0616—Measuring arrangements characterised by the use of optical techniques for measuring length, width or thickness for measuring thickness ; e.g. of sheet material of coating
- G01B11/0625—Measuring arrangements characterised by the use of optical techniques for measuring length, width or thickness for measuring thickness ; e.g. of sheet material of coating with measurement of absorption or reflection
- G01B11/0633—Measuring arrangements characterised by the use of optical techniques for measuring length, width or thickness for measuring thickness ; e.g. of sheet material of coating with measurement of absorption or reflection using one or more discrete wavelengths
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01B—MEASURING LENGTH, THICKNESS OR SIMILAR LINEAR DIMENSIONS; MEASURING ANGLES; MEASURING AREAS; MEASURING IRREGULARITIES OF SURFACES OR CONTOURS
- G01B11/00—Measuring arrangements characterised by the use of optical techniques
- G01B11/02—Measuring arrangements characterised by the use of optical techniques for measuring length, width or thickness
- G01B11/06—Measuring arrangements characterised by the use of optical techniques for measuring length, width or thickness for measuring thickness ; e.g. of sheet material
- G01B11/0608—Height gauges
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01B—MEASURING LENGTH, THICKNESS OR SIMILAR LINEAR DIMENSIONS; MEASURING ANGLES; MEASURING AREAS; MEASURING IRREGULARITIES OF SURFACES OR CONTOURS
- G01B11/00—Measuring arrangements characterised by the use of optical techniques
- G01B11/02—Measuring arrangements characterised by the use of optical techniques for measuring length, width or thickness
- G01B11/06—Measuring arrangements characterised by the use of optical techniques for measuring length, width or thickness for measuring thickness ; e.g. of sheet material
- G01B11/0616—Measuring arrangements characterised by the use of optical techniques for measuring length, width or thickness for measuring thickness ; e.g. of sheet material of coating
- G01B11/0625—Measuring arrangements characterised by the use of optical techniques for measuring length, width or thickness for measuring thickness ; e.g. of sheet material of coating with measurement of absorption or reflection
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01B—MEASURING LENGTH, THICKNESS OR SIMILAR LINEAR DIMENSIONS; MEASURING ANGLES; MEASURING AREAS; MEASURING IRREGULARITIES OF SURFACES OR CONTOURS
- G01B11/00—Measuring arrangements characterised by the use of optical techniques
- G01B11/02—Measuring arrangements characterised by the use of optical techniques for measuring length, width or thickness
- G01B11/06—Measuring arrangements characterised by the use of optical techniques for measuring length, width or thickness for measuring thickness ; e.g. of sheet material
- G01B11/0616—Measuring arrangements characterised by the use of optical techniques for measuring length, width or thickness for measuring thickness ; e.g. of sheet material of coating
- G01B11/0641—Measuring arrangements characterised by the use of optical techniques for measuring length, width or thickness for measuring thickness ; e.g. of sheet material of coating with measurement of polarization
- G01B11/065—Measuring arrangements characterised by the use of optical techniques for measuring length, width or thickness for measuring thickness ; e.g. of sheet material of coating with measurement of polarization using one or more discrete wavelengths
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01B—MEASURING LENGTH, THICKNESS OR SIMILAR LINEAR DIMENSIONS; MEASURING ANGLES; MEASURING AREAS; MEASURING IRREGULARITIES OF SURFACES OR CONTOURS
- G01B11/00—Measuring arrangements characterised by the use of optical techniques
- G01B11/02—Measuring arrangements characterised by the use of optical techniques for measuring length, width or thickness
- G01B11/06—Measuring arrangements characterised by the use of optical techniques for measuring length, width or thickness for measuring thickness ; e.g. of sheet material
- G01B11/0691—Measuring arrangements characterised by the use of optical techniques for measuring length, width or thickness for measuring thickness ; e.g. of sheet material of objects while moving
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
- G01N21/00—Investigating or analysing materials by the use of optical means, i.e. using sub-millimetre waves, infrared, visible or ultraviolet light
- G01N21/17—Systems in which incident light is modified in accordance with the properties of the material investigated
- G01N21/41—Refractivity; Phase-affecting properties, e.g. optical path length
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
- G01N21/00—Investigating or analysing materials by the use of optical means, i.e. using sub-millimetre waves, infrared, visible or ultraviolet light
- G01N21/17—Systems in which incident light is modified in accordance with the properties of the material investigated
- G01N21/55—Specular reflectivity
- G01N21/57—Measuring gloss
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01B—MEASURING LENGTH, THICKNESS OR SIMILAR LINEAR DIMENSIONS; MEASURING ANGLES; MEASURING AREAS; MEASURING IRREGULARITIES OF SURFACES OR CONTOURS
- G01B2210/00—Aspects not specifically covered by any group under G01B, e.g. of wheel alignment, caliper-like sensors
- G01B2210/40—Caliper-like sensors
- G01B2210/44—Caliper-like sensors with detectors on both sides of the object to be measured
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01B—MEASURING LENGTH, THICKNESS OR SIMILAR LINEAR DIMENSIONS; MEASURING ANGLES; MEASURING AREAS; MEASURING IRREGULARITIES OF SURFACES OR CONTOURS
- G01B2210/00—Aspects not specifically covered by any group under G01B, e.g. of wheel alignment, caliper-like sensors
- G01B2210/50—Using chromatic effects to achieve wavelength-dependent depth resolution
Landscapes
- Physics & Mathematics (AREA)
- General Physics & Mathematics (AREA)
- Health & Medical Sciences (AREA)
- Life Sciences & Earth Sciences (AREA)
- Chemical & Material Sciences (AREA)
- Analytical Chemistry (AREA)
- Biochemistry (AREA)
- General Health & Medical Sciences (AREA)
- Immunology (AREA)
- Pathology (AREA)
- Length Measuring Devices By Optical Means (AREA)
- Investigating Or Analysing Materials By Optical Means (AREA)
Priority Applications (8)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| FI20096035A FI124299B (sv) | 2009-10-08 | 2009-10-08 | Mätdon och anordning för att mäta egenskaper av ett objekt och av en yta på objektet |
| PCT/FI2010/050778 WO2011042606A1 (en) | 2009-10-08 | 2010-10-07 | Measuring instrument and method for determination of the properties of an item and its surface |
| EP10821623.5A EP2486392B1 (en) | 2009-10-08 | 2010-10-07 | Measuring instrument and method for determination of the properties of an item and its surface |
| ES10821623T ES2743461T3 (es) | 2009-10-08 | 2010-10-07 | Instrumento de medida y método para determinación de las propiedades de un artículo y su superficie |
| JP2012532637A JP2013507608A (ja) | 2009-10-08 | 2010-10-07 | 物品及びその表面の特性を決定するための測定機器及び方法 |
| CN201080045557.7A CN102575985B (zh) | 2009-10-08 | 2010-10-07 | 用于确定物品及其表面的特性的测量仪器和方法 |
| US13/500,073 US8786836B2 (en) | 2009-10-08 | 2010-10-07 | Measuring instrument and method for determination of the properties of an item and its surface |
| PL10821623T PL2486392T3 (pl) | 2009-10-08 | 2010-10-07 | Przyrząd pomiarowy i sposób określania właściwości przedmiotu i jego powierzchni |
Applications Claiming Priority (2)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| FI20096035A FI124299B (sv) | 2009-10-08 | 2009-10-08 | Mätdon och anordning för att mäta egenskaper av ett objekt och av en yta på objektet |
| FI20096035 | 2009-10-08 |
Publications (3)
| Publication Number | Publication Date |
|---|---|
| FI20096035A0 true FI20096035A0 (sv) | 2009-10-08 |
| FI20096035A7 FI20096035A7 (sv) | 2011-04-09 |
| FI124299B FI124299B (sv) | 2014-06-13 |
Family
ID=41263452
Family Applications (1)
| Application Number | Title | Priority Date | Filing Date |
|---|---|---|---|
| FI20096035A FI124299B (sv) | 2009-10-08 | 2009-10-08 | Mätdon och anordning för att mäta egenskaper av ett objekt och av en yta på objektet |
Country Status (8)
| Country | Link |
|---|---|
| US (1) | US8786836B2 (sv) |
| EP (1) | EP2486392B1 (sv) |
| JP (1) | JP2013507608A (sv) |
| CN (1) | CN102575985B (sv) |
| ES (1) | ES2743461T3 (sv) |
| FI (1) | FI124299B (sv) |
| PL (1) | PL2486392T3 (sv) |
| WO (1) | WO2011042606A1 (sv) |
Families Citing this family (43)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| CN102739952B (zh) * | 2011-03-29 | 2015-06-03 | 财团法人工业技术研究院 | 多视角取像方法及其应用系统 |
| WO2013028196A1 (en) | 2011-08-25 | 2013-02-28 | Alliance For Sustainable Energy, Llc | On-line, continuous monitoring in solar cell and fuel cell manufacturing using spectral reflectance imaging |
| DE112012004576B4 (de) * | 2011-11-01 | 2022-05-05 | Coatings Foreign Ip Co. Llc | Verfahren zur Vorhersage metallischen Glanzes einer Beschichtung resultierend von Beschichtungszusammensetzungen durch Nassfarbmessungen |
| FI125408B (sv) * | 2012-09-17 | 2015-09-30 | Focalspec Oy | Förfarande och mätanordning för mätning av ytans avstånd, tjockleken och optiska egenskaper hos ett objekt |
| JP5701837B2 (ja) * | 2012-10-12 | 2015-04-15 | 横河電機株式会社 | 変位センサ、変位測定方法 |
| FI20126126L (sv) * | 2012-10-30 | 2014-05-01 | Metso Automation Oy | Förfarande och anordning för att mäta glans |
| GB2507813B (en) * | 2012-11-13 | 2017-06-21 | Focalspec Oy | Apparatus and method for inspecting seals of items |
| CN103063615B (zh) * | 2012-12-28 | 2014-12-31 | 天威(成都)太阳能热发电开发有限公司 | 基于抛物面反射镜的光洁度测量仪及其测量方法 |
| WO2015038850A2 (en) * | 2013-09-12 | 2015-03-19 | Sio2 Medical Products, Inc. | Rapid, non-destructive, selective infrared spectrometry analysis of organic coatings on molded articles |
| JP5907364B2 (ja) * | 2015-02-17 | 2016-04-26 | 横河電機株式会社 | 分光特性測定装置、分光特性測定方法、面状測定対象物品質監視装置 |
| CN107949767B (zh) * | 2015-08-27 | 2021-09-14 | 伊利诺斯工具制品有限公司 | 用于三维应变测量的场分离器 |
| FI127908B (sv) * | 2015-09-22 | 2019-05-15 | Teknologian Tutkimuskeskus Vtt Oy | Förfarande och anordning för mätning av nivån på en yta |
| US9863842B2 (en) * | 2015-09-24 | 2018-01-09 | Novartis Ag | Method for characterizing an ophthalmic lens |
| FI126900B (sv) * | 2015-12-29 | 2017-07-31 | Optiweld Oy | Förfarande och arrangemang för analys av en egenskap hos en svetsfog |
| DE102016122528A1 (de) * | 2016-11-22 | 2018-05-24 | Carl Zeiss Microscopy Gmbh | Verfahren zum Steuern oder Regeln einer Mikroskopbeleuchtung |
| US10480935B2 (en) | 2016-12-02 | 2019-11-19 | Alliance For Sustainable Energy, Llc | Thickness mapping using multispectral imaging |
| EP3346229B1 (en) * | 2017-01-09 | 2022-03-30 | Unity Semiconductor GmbH | Method and assembly for determining the thickness of layers in a sample stack |
| JP2018147579A (ja) * | 2017-03-01 | 2018-09-20 | オムロン株式会社 | 光電センサ |
| DE102017126310A1 (de) | 2017-11-09 | 2019-05-09 | Precitec Optronik Gmbh | Abstandsmessvorrichtung |
| CN110118737A (zh) * | 2018-02-05 | 2019-08-13 | 康代有限公司 | 检查包括光敏聚酰亚胺层的物体 |
| CN108550080A (zh) | 2018-03-16 | 2018-09-18 | 阿里巴巴集团控股有限公司 | 物品定损方法及装置 |
| WO2019229826A1 (ja) * | 2018-05-29 | 2019-12-05 | 株式会社 日立ハイテクノロジーズ | 高さ測定装置 |
| CN108955549A (zh) * | 2018-09-11 | 2018-12-07 | 深圳立仪科技有限公司 | 一种透光材料双面测厚装置 |
| CN108827172B (zh) * | 2018-10-11 | 2019-01-08 | 中国人民解放军国防科技大学 | 基于固态变焦透镜的非接触式激光测厚装置及方法 |
| DE102018130901A1 (de) * | 2018-12-04 | 2020-06-04 | Precitec Optronik Gmbh | Optische Messeinrichtung |
| JP2020148463A (ja) * | 2019-03-11 | 2020-09-17 | 株式会社日立ハイテク | 高さ測定装置及びビーム照射装置 |
| US12442713B2 (en) * | 2019-04-11 | 2025-10-14 | Cryovac, Llc | System for in-line inspection of seal integrity |
| US10876882B1 (en) * | 2019-06-26 | 2020-12-29 | Honeywell International Inc. | Online grade selection for weight measurements of composite sheets |
| CN110425983B (zh) * | 2019-07-26 | 2021-04-06 | 杭州电子科技大学 | 一种基于偏振多光谱的单目视觉三维重建测距方法 |
| CN110398447A (zh) * | 2019-08-15 | 2019-11-01 | 华帝股份有限公司 | 一种高灵敏度油烟浓度测量装置 |
| SE543645C2 (sv) * | 2019-09-02 | 2021-05-11 | Odinwell Ab | Optical device and method for monitoring a measurement object |
| CN113514478B (zh) * | 2020-04-10 | 2025-05-06 | 深圳中科飞测科技股份有限公司 | 一种检测设备及其对准方法和检测方法 |
| WO2021255584A1 (de) | 2020-06-19 | 2021-12-23 | Precitec Optronik Gmbh | Chromatisch konfokale messvorrichtung |
| DE102020116810A1 (de) | 2020-06-25 | 2021-12-30 | CiTEX Holding GmbH | THz-Messverfahren und THz-Messvorrichtung zum Vermessen eines Messobjektes, insbesondere eines Rohres |
| CN111750786B (zh) * | 2020-07-06 | 2022-03-01 | 上海新昇半导体科技有限公司 | 厚度量测设备、抛光系统及抛光物料管理方法 |
| FI130557B (sv) * | 2020-09-29 | 2023-11-17 | Lmi Tech Inc | Anordning för att bestämma ett objekts avstånd, yttjocklek och optiska egenskaper och relaterade förfaranden |
| CN213481255U (zh) * | 2020-11-16 | 2021-06-18 | 海伯森技术(深圳)有限公司 | 一种线光谱共焦传感器 |
| US11346790B1 (en) * | 2020-12-02 | 2022-05-31 | Onto Innovation Inc. | Focus system for oblique optical metrology device |
| FI20215460A1 (sv) | 2021-04-19 | 2022-10-20 | Lmi Tech Oy | Belysningsenhet och förfarande för generering av mätningsljus och optisk mätanordning |
| CN113959349B (zh) * | 2021-10-25 | 2022-04-19 | 湖南捷力泰科技有限公司 | 一种膜片质量检测装置及其方法 |
| CN114839165B (zh) * | 2022-04-12 | 2023-06-23 | 征图新视(江苏)科技股份有限公司 | 基于相机的表面光泽度检测方法 |
| CN115060191A (zh) * | 2022-05-16 | 2022-09-16 | 浙江大学 | 一种基于线性滤光器分光的用于三维面型测量的光谱共焦系统 |
| CN120008488A (zh) * | 2025-01-17 | 2025-05-16 | 海伯森技术(深圳)有限公司 | 表面轮廓检测装置及方法 |
Family Cites Families (15)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| US5747813A (en) * | 1992-06-16 | 1998-05-05 | Kla-Tencop. Corporation | Broadband microspectro-reflectometer |
| US5785651A (en) * | 1995-06-07 | 1998-07-28 | Keravision, Inc. | Distance measuring confocal microscope |
| JPH09222361A (ja) * | 1995-12-12 | 1997-08-26 | Omron Corp | 物体の色等の検出装置及びそれを用いた検査装置 |
| US6031620A (en) * | 1997-05-01 | 2000-02-29 | Impact Systems, Inc. | Gloss sensor resistant to tilting and shifting paper and with improved calibration |
| JP2001305057A (ja) * | 2000-04-19 | 2001-10-31 | Nichicon Corp | 光沢センサ |
| FR2848664B1 (fr) * | 2002-12-11 | 2005-03-11 | Micro Module | Detecteur de position, forme et reflectivite d'une surface |
| US7345772B2 (en) * | 2004-08-06 | 2008-03-18 | Voith Paper Patent Gmbh | Optical triangulation device and method of measuring a variable of a web using the device |
| JP3980608B2 (ja) * | 2004-10-29 | 2007-09-26 | シャープ株式会社 | 鏡面光沢予測装置、鏡面光沢予測方法、鏡面光沢予測装置の制御プログラム、および、記録媒体 |
| DE102005023351A1 (de) * | 2005-05-17 | 2006-11-30 | Micro-Epsilon Messtechnik Gmbh & Co Kg | Vorrichtung und Verfahren zum Vermessen von Oberflächen |
| US7460233B2 (en) * | 2005-11-08 | 2008-12-02 | Honeywell International Inc. | Pass-line and tilt insensitive sensor |
| JP2007147299A (ja) * | 2005-11-24 | 2007-06-14 | Kobe Steel Ltd | 変位測定装置及び変位測定方法 |
| JP4674577B2 (ja) * | 2006-09-05 | 2011-04-20 | ソニー株式会社 | 膜厚判定装置、膜厚判定方法 |
| FR2907029B1 (fr) * | 2006-10-16 | 2009-12-04 | Clextral | Procede et installation de production en continu d'un produit poreux en poudre. |
| FI119259B (sv) | 2006-10-18 | 2008-09-15 | Valtion Teknillinen | Bestämning av yta och tjocklek |
| WO2009032094A1 (en) * | 2007-08-31 | 2009-03-12 | Abb Ltd. | Web thickness measurement device |
-
2009
- 2009-10-08 FI FI20096035A patent/FI124299B/sv active IP Right Grant
-
2010
- 2010-10-07 EP EP10821623.5A patent/EP2486392B1/en active Active
- 2010-10-07 CN CN201080045557.7A patent/CN102575985B/zh not_active Ceased
- 2010-10-07 US US13/500,073 patent/US8786836B2/en active Active
- 2010-10-07 PL PL10821623T patent/PL2486392T3/pl unknown
- 2010-10-07 WO PCT/FI2010/050778 patent/WO2011042606A1/en not_active Ceased
- 2010-10-07 JP JP2012532637A patent/JP2013507608A/ja active Pending
- 2010-10-07 ES ES10821623T patent/ES2743461T3/es active Active
Also Published As
| Publication number | Publication date |
|---|---|
| FI20096035A7 (sv) | 2011-04-09 |
| US8786836B2 (en) | 2014-07-22 |
| US20120206710A1 (en) | 2012-08-16 |
| CN102575985A (zh) | 2012-07-11 |
| PL2486392T3 (pl) | 2020-01-31 |
| ES2743461T3 (es) | 2020-02-19 |
| FI124299B (sv) | 2014-06-13 |
| JP2013507608A (ja) | 2013-03-04 |
| EP2486392A4 (en) | 2017-01-04 |
| EP2486392A1 (en) | 2012-08-15 |
| WO2011042606A1 (en) | 2011-04-14 |
| EP2486392B1 (en) | 2019-06-05 |
| CN102575985B (zh) | 2015-10-14 |
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Legal Events
| Date | Code | Title | Description |
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