[go: up one dir, main page]

FI20095064A0 - Järjestely ja menetelmä optisen mittauslaitteen mittapään ohjaamiseksi - Google Patents

Järjestely ja menetelmä optisen mittauslaitteen mittapään ohjaamiseksi

Info

Publication number
FI20095064A0
FI20095064A0 FI20095064A FI20095064A FI20095064A0 FI 20095064 A0 FI20095064 A0 FI 20095064A0 FI 20095064 A FI20095064 A FI 20095064A FI 20095064 A FI20095064 A FI 20095064A FI 20095064 A0 FI20095064 A0 FI 20095064A0
Authority
FI
Finland
Prior art keywords
controlling
measuring instrument
measuring head
optical
optical measuring
Prior art date
Application number
FI20095064A
Other languages
English (en)
Swedish (sv)
Inventor
Jyrki Laitinen
Markku Ojala
Jarkko Sarmaala
Christer Isaksson
Original Assignee
Wallac Oy
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Wallac Oy filed Critical Wallac Oy
Priority to FI20095064A priority Critical patent/FI20095064A0/fi
Publication of FI20095064A0 publication Critical patent/FI20095064A0/fi
Priority to PCT/FI2010/050022 priority patent/WO2010084244A1/en
Priority to US13/145,652 priority patent/US8542349B2/en
Priority to EP10702718A priority patent/EP2382476B1/en
Priority to CA2748731A priority patent/CA2748731C/en
Priority to CN201080005118.3A priority patent/CN102292643B/zh

Links

Classifications

    • GPHYSICS
    • G01MEASURING; TESTING
    • G01NINVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N35/00Automatic analysis not limited to methods or materials provided for in any single one of groups G01N1/00 - G01N33/00; Handling materials therefor
    • G01N35/02Automatic analysis not limited to methods or materials provided for in any single one of groups G01N1/00 - G01N33/00; Handling materials therefor using a plurality of sample containers moved by a conveyor system past one or more treatment or analysis stations
    • G01N35/028Automatic analysis not limited to methods or materials provided for in any single one of groups G01N1/00 - G01N33/00; Handling materials therefor using a plurality of sample containers moved by a conveyor system past one or more treatment or analysis stations having reaction cells in the form of microtitration plates
    • GPHYSICS
    • G01MEASURING; TESTING
    • G01NINVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N21/00Investigating or analysing materials by the use of optical means, i.e. using sub-millimetre waves, infrared, visible or ultraviolet light
    • G01N21/62Systems in which the material investigated is excited whereby it emits light or causes a change in wavelength of the incident light
    • G01N21/63Systems in which the material investigated is excited whereby it emits light or causes a change in wavelength of the incident light optically excited
    • G01N21/64Fluorescence; Phosphorescence
    • G01N21/645Specially adapted constructive features of fluorimeters
    • G01N21/6452Individual samples arranged in a regular 2D-array, e.g. multiwell plates
    • GPHYSICS
    • G01MEASURING; TESTING
    • G01NINVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N21/00Investigating or analysing materials by the use of optical means, i.e. using sub-millimetre waves, infrared, visible or ultraviolet light
    • G01N21/62Systems in which the material investigated is excited whereby it emits light or causes a change in wavelength of the incident light
    • G01N21/63Systems in which the material investigated is excited whereby it emits light or causes a change in wavelength of the incident light optically excited
    • G01N21/64Fluorescence; Phosphorescence
    • G01N21/645Specially adapted constructive features of fluorimeters
    • G01N2021/6484Optical fibres
    • GPHYSICS
    • G01MEASURING; TESTING
    • G01NINVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N35/00Automatic analysis not limited to methods or materials provided for in any single one of groups G01N1/00 - G01N33/00; Handling materials therefor
    • G01N35/02Automatic analysis not limited to methods or materials provided for in any single one of groups G01N1/00 - G01N33/00; Handling materials therefor using a plurality of sample containers moved by a conveyor system past one or more treatment or analysis stations
    • G01N35/04Details of the conveyor system
    • G01N2035/0401Sample carriers, cuvettes or reaction vessels
    • G01N2035/0418Plate elements with several rows of samples
    • G01N2035/0422Plate elements with several rows of samples carried on a linear conveyor
    • G01N2035/0424Two or more linear conveyors
    • GPHYSICS
    • G01MEASURING; TESTING
    • G01NINVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N21/00Investigating or analysing materials by the use of optical means, i.e. using sub-millimetre waves, infrared, visible or ultraviolet light
    • G01N21/01Arrangements or apparatus for facilitating the optical investigation
    • G01N21/13Moving of cuvettes or solid samples to or from the investigating station

Landscapes

  • Health & Medical Sciences (AREA)
  • Chemical & Material Sciences (AREA)
  • Biochemistry (AREA)
  • Physics & Mathematics (AREA)
  • Life Sciences & Earth Sciences (AREA)
  • Analytical Chemistry (AREA)
  • General Health & Medical Sciences (AREA)
  • General Physics & Mathematics (AREA)
  • Immunology (AREA)
  • Pathology (AREA)
  • Chemical Kinetics & Catalysis (AREA)
  • Nuclear Medicine, Radiotherapy & Molecular Imaging (AREA)
  • Investigating, Analyzing Materials By Fluorescence Or Luminescence (AREA)
  • Investigating Strength Of Materials By Application Of Mechanical Stress (AREA)
  • Investigating Or Analysing Materials By Optical Means (AREA)
FI20095064A 2009-01-26 2009-01-26 Järjestely ja menetelmä optisen mittauslaitteen mittapään ohjaamiseksi FI20095064A0 (fi)

Priority Applications (6)

Application Number Priority Date Filing Date Title
FI20095064A FI20095064A0 (fi) 2009-01-26 2009-01-26 Järjestely ja menetelmä optisen mittauslaitteen mittapään ohjaamiseksi
PCT/FI2010/050022 WO2010084244A1 (en) 2009-01-26 2010-01-18 An arrangement and a method for controlling a measurement head of an optical measurement instrument
US13/145,652 US8542349B2 (en) 2009-01-26 2010-01-18 Arrangement and a method for controlling a measurement head of an optical measurement instrument
EP10702718A EP2382476B1 (en) 2009-01-26 2010-01-18 An arrangement and a method for controlling a measurement head of an optical measurement instrument
CA2748731A CA2748731C (en) 2009-01-26 2010-01-18 An arrangement and a method for controlling a measurement head of an optical measurement instrument
CN201080005118.3A CN102292643B (zh) 2009-01-26 2010-01-18 一种光学测试装置以及控制光学测试装置测试头的机构和方法

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
FI20095064A FI20095064A0 (fi) 2009-01-26 2009-01-26 Järjestely ja menetelmä optisen mittauslaitteen mittapään ohjaamiseksi

Publications (1)

Publication Number Publication Date
FI20095064A0 true FI20095064A0 (fi) 2009-01-26

Family

ID=40329519

Family Applications (1)

Application Number Title Priority Date Filing Date
FI20095064A FI20095064A0 (fi) 2009-01-26 2009-01-26 Järjestely ja menetelmä optisen mittauslaitteen mittapään ohjaamiseksi

Country Status (6)

Country Link
US (1) US8542349B2 (fi)
EP (1) EP2382476B1 (fi)
CN (1) CN102292643B (fi)
CA (1) CA2748731C (fi)
FI (1) FI20095064A0 (fi)
WO (1) WO2010084244A1 (fi)

Families Citing this family (11)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
FI20095063A0 (fi) * 2009-01-26 2009-01-26 Wallac Oy Optinen mittauslaite
FI20115483A0 (fi) 2011-05-19 2011-05-19 Wallac Oy Mittauslaite
TW201516533A (zh) * 2013-10-21 2015-05-01 Hon Hai Prec Ind Co Ltd 背光模組
WO2015075653A2 (en) * 2013-11-19 2015-05-28 Idea Machine Development Design & Production Ltd. Multi-well plates and methods of use thereof
WO2016030464A1 (en) * 2014-08-28 2016-03-03 Single Technologies Ab High throughput biochemical screening
CN104777136B (zh) * 2015-03-25 2018-06-19 深圳市贝沃德克生物技术研究院有限公司 基于表面等离子共振技术的生物标志物检测方法与系统
WO2017131740A1 (en) * 2016-01-29 2017-08-03 Hewlett-Packard Development Company, L.P. Sample-reagent mixture thermal cycling
KR20200075814A (ko) * 2017-08-15 2020-06-26 옴니옴 인코포레이티드 화학적 및 생물학적 분석물의 검출에 유용한 스캐닝 장치 및 방법
KR20210003159A (ko) * 2018-04-17 2021-01-11 토템즈 포지션 에스에이알엘 부품의 위치 결정 장치 및 방법
DE102018212489A1 (de) * 2018-07-26 2020-01-30 Implen GmbH Vorrichtung für eine lichtspektroskopische Analyse
CN113613787B (zh) * 2019-02-20 2023-06-13 加利福尼亚太平洋生物科学股份有限公司 用于检测化学和生物分析物的扫描装置和方法

Family Cites Families (10)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
EP0030148A1 (en) * 1979-11-28 1981-06-10 Portalab Instruments Limited Portable photometer
WO2000004364A2 (en) 1998-07-15 2000-01-27 Ljl Biosystems, Inc. Evanescent field illumination devices and methods
FI982005L (fi) * 1998-09-17 2000-03-18 Wallac Oy Näytteiden kuvantamislaite
JP2002156383A (ja) 2000-11-21 2002-05-31 Fuji Photo Film Co Ltd 高さ位置調整装置、光学系高さ位置調整装置および光学系高さ位置調整装置を用いたデータ生成装置
DE10121732A1 (de) * 2001-05-04 2002-11-07 Leica Microsystems Mikroskop und Verfahren zum Betreiben eines Mikroskops
US7123035B2 (en) 2002-04-10 2006-10-17 Credence Systems Corporation Optics landing system and method therefor
US20040096368A1 (en) 2002-06-28 2004-05-20 Igen International, Inc. Assay systems and components
JP2005106790A (ja) * 2003-01-09 2005-04-21 Univ Kanazawa 走査型プローブ顕微鏡および分子構造変化観測方法
JP4645739B2 (ja) * 2006-04-03 2011-03-09 株式会社島津製作所 微量液体試料用光学測定装置
CN2916659Y (zh) * 2006-06-19 2007-06-27 中国科学院上海光学精密机械研究所 模块化扫描探针显微镜

Also Published As

Publication number Publication date
CN102292643A (zh) 2011-12-21
CA2748731C (en) 2017-06-27
US8542349B2 (en) 2013-09-24
CA2748731A1 (en) 2010-07-29
US20120002190A1 (en) 2012-01-05
WO2010084244A1 (en) 2010-07-29
EP2382476A1 (en) 2011-11-02
CN102292643B (zh) 2014-03-05
EP2382476B1 (en) 2012-11-28

Similar Documents

Publication Publication Date Title
FI20095064A0 (fi) Järjestely ja menetelmä optisen mittauslaitteen mittapään ohjaamiseksi
FI20095356A0 (fi) Järjestelmä ja menetelmä kohteen optiseksi mittaamiseksi
FI20106402A0 (fi) Menetelmä ja laitteisto nanoselluloosan valmistamiseksi
BRPI1010670A2 (pt) método e aparelho para sensoriamento ótico
FI20115482A (fi) Menetelmä ja laite kaasukomponentin konsentraation määrittämiseksi lasielementin sisällä
FI20115401A (fi) Järjestelmä ja menetelmä musiikkisoittimen soiton harjoittamiseksi
FI20085665A0 (fi) Menetelmä ja laite etäisyyden mittaamiseen
EP2427796A4 (en) OPTICAL DEVICE AND METHOD
EP2223398A4 (en) DEVICE AND METHOD FOR LASER DIODE COMPENSATION
FI20096059A0 (fi) Menetelmä ja laitteisto biohiilen valmistamiseksi
FI20106091A0 (fi) Paketoitu kuituoptinen komponentti ja menetelmä sen valmistamiseksi
FI20105783A0 (fi) Menetelmä ja laite pinnan värin ja muiden ominaisuuksien mittaamiseksi
FI20105945A0 (fi) Menetelmä ja laite reititysdatan mainostuksen ohjaamiseksi
FI20105487A0 (fi) Menetelmä ja laitteisto poratankojen kierreliitosten kireystilan tunnistamiseksi
FI20085206A0 (fi) Menetelmä ja laite luun tiheyden mittaamista varten
FI20090410A0 (fi) Menetelmä ja laitteisto hissin köysien heilumisen vähentämiseksi
EP2299476A4 (en) METHOD AND DEVICE FOR LASER REPAIRING
FI20085283A0 (fi) Menetelmä kaasujen mittaamiseksi
FI20086189A0 (fi) Menetelmä ja laitteisto kohteen kuvaamiseksi
FI20095059A0 (fi) Laitteisto ja menetelmä näytteiden optiseksi mittaamiseksi
FI20086107A0 (fi) Menetelmä ja laitteisto ihmisen kehon elintoimintojen mittaamiseen
EP2201353A4 (en) METHOD AND DEVICE FOR MEASURING POST-TRANSLATIONAL PROTEIN MODIFICATION
FI20096142A0 (fi) Menetelmä ja laitteisto rainamaisen materiaalin pituusleikkauksen ohjaamiseksi
FI20096033A0 (fi) Menetelmä indikaattorin valmistamiseksi ja menetelmällä valmistettu indikaattori
FI20086109A0 (fi) Menetelmä ja laite adheesiovoimien mittaamiseksi

Legal Events

Date Code Title Description
FD Application lapsed