FI20095794A0 - A method and system for examining the properties of a reflective transparent object - Google Patents
A method and system for examining the properties of a reflective transparent objectInfo
- Publication number
- FI20095794A0 FI20095794A0 FI20095794A FI20095794A FI20095794A0 FI 20095794 A0 FI20095794 A0 FI 20095794A0 FI 20095794 A FI20095794 A FI 20095794A FI 20095794 A FI20095794 A FI 20095794A FI 20095794 A0 FI20095794 A0 FI 20095794A0
- Authority
- FI
- Finland
- Prior art keywords
- examining
- properties
- transparent object
- reflective transparent
- reflective
- Prior art date
Links
Classifications
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01B—MEASURING LENGTH, THICKNESS OR SIMILAR LINEAR DIMENSIONS; MEASURING ANGLES; MEASURING AREAS; MEASURING IRREGULARITIES OF SURFACES OR CONTOURS
- G01B11/00—Measuring arrangements characterised by the use of optical techniques
- G01B11/02—Measuring arrangements characterised by the use of optical techniques for measuring length, width or thickness
- G01B11/06—Measuring arrangements characterised by the use of optical techniques for measuring length, width or thickness for measuring thickness ; e.g. of sheet material
- G01B11/0616—Measuring arrangements characterised by the use of optical techniques for measuring length, width or thickness for measuring thickness ; e.g. of sheet material of coating
- G01B11/0641—Measuring arrangements characterised by the use of optical techniques for measuring length, width or thickness for measuring thickness ; e.g. of sheet material of coating with measurement of polarization
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
- G01N21/00—Investigating or analysing materials by the use of optical means, i.e. using sub-millimetre waves, infrared, visible or ultraviolet light
- G01N21/62—Systems in which the material investigated is excited whereby it emits light or causes a change in wavelength of the incident light
- G01N21/66—Systems in which the material investigated is excited whereby it emits light or causes a change in wavelength of the incident light electrically excited, e.g. electroluminescence
- G01N21/67—Systems in which the material investigated is excited whereby it emits light or causes a change in wavelength of the incident light electrically excited, e.g. electroluminescence using electric arcs or discharges
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
- G01N21/00—Investigating or analysing materials by the use of optical means, i.e. using sub-millimetre waves, infrared, visible or ultraviolet light
- G01N21/84—Systems specially adapted for particular applications
- G01N21/8422—Investigating thin films, e.g. matrix isolation method
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
- G01N21/00—Investigating or analysing materials by the use of optical means, i.e. using sub-millimetre waves, infrared, visible or ultraviolet light
- G01N21/84—Systems specially adapted for particular applications
- G01N21/88—Investigating the presence of flaws or contamination
- G01N21/89—Investigating the presence of flaws or contamination in moving material, e.g. running paper or textiles
- G01N21/892—Investigating the presence of flaws or contamination in moving material, e.g. running paper or textiles characterised by the flaw, defect or object feature examined
- G01N21/896—Optical defects in or on transparent materials, e.g. distortion, surface flaws in conveyed flat sheet or rod
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
- G01N21/00—Investigating or analysing materials by the use of optical means, i.e. using sub-millimetre waves, infrared, visible or ultraviolet light
- G01N21/84—Systems specially adapted for particular applications
- G01N21/88—Investigating the presence of flaws or contamination
- G01N21/95—Investigating the presence of flaws or contamination characterised by the material or shape of the object to be examined
- G01N21/958—Inspecting transparent materials or objects, e.g. windscreens
Landscapes
- Physics & Mathematics (AREA)
- Health & Medical Sciences (AREA)
- General Physics & Mathematics (AREA)
- Chemical & Material Sciences (AREA)
- Life Sciences & Earth Sciences (AREA)
- Analytical Chemistry (AREA)
- Biochemistry (AREA)
- General Health & Medical Sciences (AREA)
- Immunology (AREA)
- Pathology (AREA)
- Nuclear Medicine, Radiotherapy & Molecular Imaging (AREA)
- Engineering & Computer Science (AREA)
- Textile Engineering (AREA)
- Mathematical Physics (AREA)
- Length Measuring Devices By Optical Means (AREA)
- Investigating Or Analysing Materials By Optical Means (AREA)
Priority Applications (2)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| FI20095794A FI20095794A0 (en) | 2009-07-16 | 2009-07-16 | A method and system for examining the properties of a reflective transparent object |
| PCT/FI2010/050583 WO2011007047A1 (en) | 2009-07-16 | 2010-07-06 | Method, apparatus and arrangement for detecting properties of a reflective transparent object |
Applications Claiming Priority (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| FI20095794A FI20095794A0 (en) | 2009-07-16 | 2009-07-16 | A method and system for examining the properties of a reflective transparent object |
Publications (1)
| Publication Number | Publication Date |
|---|---|
| FI20095794A0 true FI20095794A0 (en) | 2009-07-16 |
Family
ID=40935874
Family Applications (1)
| Application Number | Title | Priority Date | Filing Date |
|---|---|---|---|
| FI20095794A FI20095794A0 (en) | 2009-07-16 | 2009-07-16 | A method and system for examining the properties of a reflective transparent object |
Country Status (2)
| Country | Link |
|---|---|
| FI (1) | FI20095794A0 (en) |
| WO (1) | WO2011007047A1 (en) |
Families Citing this family (7)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| FI20115482A (en) * | 2011-05-18 | 2012-11-19 | Sparklike Ab Oy | Method and apparatus for determining the concentration of a gas component within a glass element |
| FI20145030L (en) | 2014-01-15 | 2015-07-16 | Sparklike Ab Oy | Method and apparatus for detecting a gas component within a transparent volume |
| CN104316190A (en) * | 2014-11-03 | 2015-01-28 | 苏州精创光学仪器有限公司 | Method for measuring color, brightness and reflectance spectrum of glass at different angles |
| JP7075853B2 (en) * | 2017-09-13 | 2022-05-26 | 住友化学株式会社 | Defect inspection device, defect inspection method, manufacturing method of circular polarizing plate or elliptical polarizing plate, manufacturing method of retardation plate |
| CN110823807B (en) * | 2019-10-29 | 2022-11-04 | 广东鑫瑞新材料科技有限公司 | Online hue detection device and detection method of magnetic control base film |
| CN111239164B (en) * | 2020-04-02 | 2023-04-07 | 上海御微半导体技术有限公司 | Defect detection device and method thereof |
| TWI804401B (en) | 2022-07-28 | 2023-06-01 | 國立成功大學 | Optical measurement system |
Family Cites Families (9)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| US2119577A (en) * | 1937-04-23 | 1938-06-07 | Electrical Testing Lab | Strain gauge for and method of measuring strains in glass |
| US3062087A (en) * | 1956-04-09 | 1962-11-06 | Budd Co | Apparatus for investigating polarized light phenomena |
| CN1087424A (en) * | 1992-09-29 | 1994-06-01 | 昆士兰大学 | Defective in the glass that detects |
| GB2310925B (en) * | 1996-03-06 | 2000-08-09 | Anthony Michael Glazer | Method and apparatus for indicating optical anisotropy |
| FI113805B (en) * | 1998-04-03 | 2004-06-15 | Licentia Oy | Method and apparatus for analyzing gas mixtures |
| GB2338309B (en) * | 1998-06-13 | 2002-05-08 | Neil Colin Hamilton | Recognition apparatus for toughened glass |
| AT410257B (en) * | 2000-10-23 | 2003-03-25 | Mte Innovative Measurement Sol | DEVICE FOR CHECKING AND CHECKING A SINGLE GLASS PANEL OR INSULATING GLASS ELEMENT |
| US7583368B1 (en) * | 2006-04-05 | 2009-09-01 | Electronic Design To Market, Inc. | Method of enhancing measurement of stress in glass |
| US7369240B1 (en) * | 2006-07-20 | 2008-05-06 | Litesentry Corporation | Apparatus and methods for real-time adaptive inspection for glass production |
-
2009
- 2009-07-16 FI FI20095794A patent/FI20095794A0/en not_active Application Discontinuation
-
2010
- 2010-07-06 WO PCT/FI2010/050583 patent/WO2011007047A1/en not_active Ceased
Also Published As
| Publication number | Publication date |
|---|---|
| WO2011007047A1 (en) | 2011-01-20 |
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Legal Events
| Date | Code | Title | Description |
|---|---|---|---|
| FD | Application lapsed |