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FI20070474L - Förfarande och anordning för närfälts imaging - Google Patents

Förfarande och anordning för närfälts imaging Download PDF

Info

Publication number
FI20070474L
FI20070474L FI20070474A FI20070474A FI20070474L FI 20070474 L FI20070474 L FI 20070474L FI 20070474 A FI20070474 A FI 20070474A FI 20070474 A FI20070474 A FI 20070474A FI 20070474 L FI20070474 L FI 20070474L
Authority
FI
Finland
Prior art keywords
near field
field imaging
imaging
field
Prior art date
Application number
FI20070474A
Other languages
English (en)
Finnish (fi)
Other versions
FI20070474A0 (sv
FI20070474A7 (sv
Inventor
Sergei Tretyakov
Stanislav Maslovski
Pekka Alitalo
Original Assignee
Teknillinen Korkeakoulu
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Teknillinen Korkeakoulu filed Critical Teknillinen Korkeakoulu
Priority to FI20070474A priority Critical patent/FI20070474L/sv
Publication of FI20070474A0 publication Critical patent/FI20070474A0/sv
Priority to EP08775449.5A priority patent/EP2168210A4/en
Priority to PCT/FI2008/000071 priority patent/WO2008152190A1/en
Publication of FI20070474A7 publication Critical patent/FI20070474A7/sv
Publication of FI20070474L publication Critical patent/FI20070474L/sv

Links

Classifications

    • GPHYSICS
    • G01MEASURING; TESTING
    • G01NINVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N22/00Investigating or analysing materials by the use of microwaves or radio waves, i.e. electromagnetic waves with a wavelength of one millimetre or more
    • HELECTRICITY
    • H01ELECTRIC ELEMENTS
    • H01QANTENNAS, i.e. RADIO AERIALS
    • H01Q15/00Devices for reflection, refraction, diffraction or polarisation of waves radiated from an antenna, e.g. quasi-optical devices
    • H01Q15/02Refracting or diffracting devices, e.g. lens, prism
    • GPHYSICS
    • G01MEASURING; TESTING
    • G01VGEOPHYSICS; GRAVITATIONAL MEASUREMENTS; DETECTING MASSES OR OBJECTS; TAGS
    • G01V3/00Electric or magnetic prospecting or detecting; Measuring magnetic field characteristics of the earth, e.g. declination, deviation
    • G01V3/12Electric or magnetic prospecting or detecting; Measuring magnetic field characteristics of the earth, e.g. declination, deviation operating with electromagnetic waves
    • HELECTRICITY
    • H01ELECTRIC ELEMENTS
    • H01QANTENNAS, i.e. RADIO AERIALS
    • H01Q15/00Devices for reflection, refraction, diffraction or polarisation of waves radiated from an antenna, e.g. quasi-optical devices
    • H01Q15/0006Devices acting selectively as reflecting surface, as diffracting or as refracting device, e.g. frequency filtering or angular spatial filtering devices
    • H01Q15/0013Devices acting selectively as reflecting surface, as diffracting or as refracting device, e.g. frequency filtering or angular spatial filtering devices said selective devices working as frequency-selective reflecting surfaces, e.g. FSS, dichroic plates, surfaces being partly transmissive and reflective
    • H01Q15/0026Devices acting selectively as reflecting surface, as diffracting or as refracting device, e.g. frequency filtering or angular spatial filtering devices said selective devices working as frequency-selective reflecting surfaces, e.g. FSS, dichroic plates, surfaces being partly transmissive and reflective said selective devices having a stacked geometry or having multiple layers
    • HELECTRICITY
    • H01ELECTRIC ELEMENTS
    • H01QANTENNAS, i.e. RADIO AERIALS
    • H01Q15/00Devices for reflection, refraction, diffraction or polarisation of waves radiated from an antenna, e.g. quasi-optical devices
    • H01Q15/0006Devices acting selectively as reflecting surface, as diffracting or as refracting device, e.g. frequency filtering or angular spatial filtering devices
    • H01Q15/0086Devices acting selectively as reflecting surface, as diffracting or as refracting device, e.g. frequency filtering or angular spatial filtering devices said selective devices having materials with a synthesized negative refractive index, e.g. metamaterials or left-handed materials
    • HELECTRICITY
    • H01ELECTRIC ELEMENTS
    • H01QANTENNAS, i.e. RADIO AERIALS
    • H01Q15/00Devices for reflection, refraction, diffraction or polarisation of waves radiated from an antenna, e.g. quasi-optical devices
    • H01Q15/02Refracting or diffracting devices, e.g. lens, prism
    • H01Q15/10Refracting or diffracting devices, e.g. lens, prism comprising three-dimensional array of impedance discontinuities, e.g. holes in conductive surfaces or conductive discs forming artificial dielectric
    • HELECTRICITY
    • H01ELECTRIC ELEMENTS
    • H01QANTENNAS, i.e. RADIO AERIALS
    • H01Q21/00Antenna arrays or systems
    • H01Q21/06Arrays of individually energised antenna units similarly polarised and spaced apart
    • H01Q21/061Two dimensional planar arrays
    • H01Q21/064Two dimensional planar arrays using horn or slot aerials

Landscapes

  • Physics & Mathematics (AREA)
  • Life Sciences & Earth Sciences (AREA)
  • General Physics & Mathematics (AREA)
  • Engineering & Computer Science (AREA)
  • Electromagnetism (AREA)
  • Remote Sensing (AREA)
  • Chemical & Material Sciences (AREA)
  • General Life Sciences & Earth Sciences (AREA)
  • Geology (AREA)
  • Geophysics (AREA)
  • Health & Medical Sciences (AREA)
  • Environmental & Geological Engineering (AREA)
  • Analytical Chemistry (AREA)
  • Biochemistry (AREA)
  • General Health & Medical Sciences (AREA)
  • Immunology (AREA)
  • Pathology (AREA)
  • Investigating Or Analysing Materials By Optical Means (AREA)
  • Transforming Light Signals Into Electric Signals (AREA)
FI20070474A 2007-06-14 2007-06-14 Förfarande och anordning för närfälts imaging FI20070474L (sv)

Priority Applications (3)

Application Number Priority Date Filing Date Title
FI20070474A FI20070474L (sv) 2007-06-14 2007-06-14 Förfarande och anordning för närfälts imaging
EP08775449.5A EP2168210A4 (en) 2007-06-14 2008-06-16 PROCESS AND APPARATUS FOR NEAR FIELD IMAGING
PCT/FI2008/000071 WO2008152190A1 (en) 2007-06-14 2008-06-16 Method and apparatus for near-field imaging

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
FI20070474A FI20070474L (sv) 2007-06-14 2007-06-14 Förfarande och anordning för närfälts imaging

Publications (3)

Publication Number Publication Date
FI20070474A0 FI20070474A0 (sv) 2007-06-14
FI20070474A7 FI20070474A7 (sv) 2008-12-15
FI20070474L true FI20070474L (sv) 2008-12-15

Family

ID=38212331

Family Applications (1)

Application Number Title Priority Date Filing Date
FI20070474A FI20070474L (sv) 2007-06-14 2007-06-14 Förfarande och anordning för närfälts imaging

Country Status (3)

Country Link
EP (1) EP2168210A4 (sv)
FI (1) FI20070474L (sv)
WO (1) WO2008152190A1 (sv)

Family Cites Families (5)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
DE3531893A1 (de) * 1985-09-06 1987-03-19 Siemens Ag Verfahren zur bestimmung der verteilung der dielektrizitaetskonstanten in einem untersuchungskoerper sowie messanordnung zur durchfuehrung des verfahrens
US5982326A (en) * 1997-07-21 1999-11-09 Chow; Yung Leonard Active micropatch antenna device and array system
GB0127514D0 (en) * 2001-11-16 2002-01-09 Marconi Optical Components Ltd Imaging device
WO2003062840A1 (en) * 2002-01-18 2003-07-31 Her Majesty In Right Of Canada As Represented By The Minister Of Industry Antenna array for the measurement of complex electromagnetic fields
JP4825053B2 (ja) * 2005-09-29 2011-11-30 オリンパス株式会社 光学装置

Also Published As

Publication number Publication date
FI20070474A0 (sv) 2007-06-14
FI20070474A7 (sv) 2008-12-15
WO2008152190A1 (en) 2008-12-18
EP2168210A4 (en) 2013-09-25
EP2168210A1 (en) 2010-03-31

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Legal Events

Date Code Title Description
PC Transfer of assignment of patent

Owner name: TEKNILLINEN KORKEAKOULU

Free format text: TEKNILLINEN KORKEAKOULU

FD Application lapsed