FI20070474L - Förfarande och anordning för närfälts imaging - Google Patents
Förfarande och anordning för närfälts imaging Download PDFInfo
- Publication number
- FI20070474L FI20070474L FI20070474A FI20070474A FI20070474L FI 20070474 L FI20070474 L FI 20070474L FI 20070474 A FI20070474 A FI 20070474A FI 20070474 A FI20070474 A FI 20070474A FI 20070474 L FI20070474 L FI 20070474L
- Authority
- FI
- Finland
- Prior art keywords
- near field
- field imaging
- imaging
- field
- Prior art date
Links
- 238000003384 imaging method Methods 0.000 title 1
- 238000000034 method Methods 0.000 title 1
Classifications
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
- G01N22/00—Investigating or analysing materials by the use of microwaves or radio waves, i.e. electromagnetic waves with a wavelength of one millimetre or more
-
- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01Q—ANTENNAS, i.e. RADIO AERIALS
- H01Q15/00—Devices for reflection, refraction, diffraction or polarisation of waves radiated from an antenna, e.g. quasi-optical devices
- H01Q15/02—Refracting or diffracting devices, e.g. lens, prism
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01V—GEOPHYSICS; GRAVITATIONAL MEASUREMENTS; DETECTING MASSES OR OBJECTS; TAGS
- G01V3/00—Electric or magnetic prospecting or detecting; Measuring magnetic field characteristics of the earth, e.g. declination, deviation
- G01V3/12—Electric or magnetic prospecting or detecting; Measuring magnetic field characteristics of the earth, e.g. declination, deviation operating with electromagnetic waves
-
- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01Q—ANTENNAS, i.e. RADIO AERIALS
- H01Q15/00—Devices for reflection, refraction, diffraction or polarisation of waves radiated from an antenna, e.g. quasi-optical devices
- H01Q15/0006—Devices acting selectively as reflecting surface, as diffracting or as refracting device, e.g. frequency filtering or angular spatial filtering devices
- H01Q15/0013—Devices acting selectively as reflecting surface, as diffracting or as refracting device, e.g. frequency filtering or angular spatial filtering devices said selective devices working as frequency-selective reflecting surfaces, e.g. FSS, dichroic plates, surfaces being partly transmissive and reflective
- H01Q15/0026—Devices acting selectively as reflecting surface, as diffracting or as refracting device, e.g. frequency filtering or angular spatial filtering devices said selective devices working as frequency-selective reflecting surfaces, e.g. FSS, dichroic plates, surfaces being partly transmissive and reflective said selective devices having a stacked geometry or having multiple layers
-
- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01Q—ANTENNAS, i.e. RADIO AERIALS
- H01Q15/00—Devices for reflection, refraction, diffraction or polarisation of waves radiated from an antenna, e.g. quasi-optical devices
- H01Q15/0006—Devices acting selectively as reflecting surface, as diffracting or as refracting device, e.g. frequency filtering or angular spatial filtering devices
- H01Q15/0086—Devices acting selectively as reflecting surface, as diffracting or as refracting device, e.g. frequency filtering or angular spatial filtering devices said selective devices having materials with a synthesized negative refractive index, e.g. metamaterials or left-handed materials
-
- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01Q—ANTENNAS, i.e. RADIO AERIALS
- H01Q15/00—Devices for reflection, refraction, diffraction or polarisation of waves radiated from an antenna, e.g. quasi-optical devices
- H01Q15/02—Refracting or diffracting devices, e.g. lens, prism
- H01Q15/10—Refracting or diffracting devices, e.g. lens, prism comprising three-dimensional array of impedance discontinuities, e.g. holes in conductive surfaces or conductive discs forming artificial dielectric
-
- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01Q—ANTENNAS, i.e. RADIO AERIALS
- H01Q21/00—Antenna arrays or systems
- H01Q21/06—Arrays of individually energised antenna units similarly polarised and spaced apart
- H01Q21/061—Two dimensional planar arrays
- H01Q21/064—Two dimensional planar arrays using horn or slot aerials
Landscapes
- Physics & Mathematics (AREA)
- Life Sciences & Earth Sciences (AREA)
- General Physics & Mathematics (AREA)
- Engineering & Computer Science (AREA)
- Electromagnetism (AREA)
- Remote Sensing (AREA)
- Chemical & Material Sciences (AREA)
- General Life Sciences & Earth Sciences (AREA)
- Geology (AREA)
- Geophysics (AREA)
- Health & Medical Sciences (AREA)
- Environmental & Geological Engineering (AREA)
- Analytical Chemistry (AREA)
- Biochemistry (AREA)
- General Health & Medical Sciences (AREA)
- Immunology (AREA)
- Pathology (AREA)
- Investigating Or Analysing Materials By Optical Means (AREA)
- Transforming Light Signals Into Electric Signals (AREA)
Priority Applications (3)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| FI20070474A FI20070474L (sv) | 2007-06-14 | 2007-06-14 | Förfarande och anordning för närfälts imaging |
| EP08775449.5A EP2168210A4 (en) | 2007-06-14 | 2008-06-16 | PROCESS AND APPARATUS FOR NEAR FIELD IMAGING |
| PCT/FI2008/000071 WO2008152190A1 (en) | 2007-06-14 | 2008-06-16 | Method and apparatus for near-field imaging |
Applications Claiming Priority (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| FI20070474A FI20070474L (sv) | 2007-06-14 | 2007-06-14 | Förfarande och anordning för närfälts imaging |
Publications (3)
| Publication Number | Publication Date |
|---|---|
| FI20070474A0 FI20070474A0 (sv) | 2007-06-14 |
| FI20070474A7 FI20070474A7 (sv) | 2008-12-15 |
| FI20070474L true FI20070474L (sv) | 2008-12-15 |
Family
ID=38212331
Family Applications (1)
| Application Number | Title | Priority Date | Filing Date |
|---|---|---|---|
| FI20070474A FI20070474L (sv) | 2007-06-14 | 2007-06-14 | Förfarande och anordning för närfälts imaging |
Country Status (3)
| Country | Link |
|---|---|
| EP (1) | EP2168210A4 (sv) |
| FI (1) | FI20070474L (sv) |
| WO (1) | WO2008152190A1 (sv) |
Family Cites Families (5)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| DE3531893A1 (de) * | 1985-09-06 | 1987-03-19 | Siemens Ag | Verfahren zur bestimmung der verteilung der dielektrizitaetskonstanten in einem untersuchungskoerper sowie messanordnung zur durchfuehrung des verfahrens |
| US5982326A (en) * | 1997-07-21 | 1999-11-09 | Chow; Yung Leonard | Active micropatch antenna device and array system |
| GB0127514D0 (en) * | 2001-11-16 | 2002-01-09 | Marconi Optical Components Ltd | Imaging device |
| WO2003062840A1 (en) * | 2002-01-18 | 2003-07-31 | Her Majesty In Right Of Canada As Represented By The Minister Of Industry | Antenna array for the measurement of complex electromagnetic fields |
| JP4825053B2 (ja) * | 2005-09-29 | 2011-11-30 | オリンパス株式会社 | 光学装置 |
-
2007
- 2007-06-14 FI FI20070474A patent/FI20070474L/sv not_active Application Discontinuation
-
2008
- 2008-06-16 WO PCT/FI2008/000071 patent/WO2008152190A1/en not_active Ceased
- 2008-06-16 EP EP08775449.5A patent/EP2168210A4/en not_active Withdrawn
Also Published As
| Publication number | Publication date |
|---|---|
| FI20070474A0 (sv) | 2007-06-14 |
| FI20070474A7 (sv) | 2008-12-15 |
| WO2008152190A1 (en) | 2008-12-18 |
| EP2168210A4 (en) | 2013-09-25 |
| EP2168210A1 (en) | 2010-03-31 |
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Legal Events
| Date | Code | Title | Description |
|---|---|---|---|
| PC | Transfer of assignment of patent |
Owner name: TEKNILLINEN KORKEAKOULU Free format text: TEKNILLINEN KORKEAKOULU |
|
| FD | Application lapsed |