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FI20040600L - Paperipinnan laadun testaus - Google Patents

Paperipinnan laadun testaus Download PDF

Info

Publication number
FI20040600L
FI20040600L FI20040600A FI20040600A FI20040600L FI 20040600 L FI20040600 L FI 20040600L FI 20040600 A FI20040600 A FI 20040600A FI 20040600 A FI20040600 A FI 20040600A FI 20040600 L FI20040600 L FI 20040600L
Authority
FI
Finland
Prior art keywords
paper surface
surface quality
quality testing
testing
paper
Prior art date
Application number
FI20040600A
Other languages
English (en)
Swedish (sv)
Other versions
FI20040600A0 (fi
FI117834B (fi
Inventor
Kari Saarinen
Karri Muinoinen
Original Assignee
Abb Research Ltd
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Abb Research Ltd filed Critical Abb Research Ltd
Priority to FI20040600A priority Critical patent/FI117834B/fi
Publication of FI20040600A0 publication Critical patent/FI20040600A0/fi
Priority to PCT/FI2005/050134 priority patent/WO2005106436A1/en
Publication of FI20040600L publication Critical patent/FI20040600L/fi
Application granted granted Critical
Publication of FI117834B publication Critical patent/FI117834B/fi

Links

Classifications

    • GPHYSICS
    • G01MEASURING; TESTING
    • G01NINVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N21/00Investigating or analysing materials by the use of optical means, i.e. using sub-millimetre waves, infrared, visible or ultraviolet light
    • G01N21/17Systems in which incident light is modified in accordance with the properties of the material investigated
    • G01N21/21Polarisation-affecting properties
    • GPHYSICS
    • G01MEASURING; TESTING
    • G01NINVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N21/00Investigating or analysing materials by the use of optical means, i.e. using sub-millimetre waves, infrared, visible or ultraviolet light
    • G01N21/17Systems in which incident light is modified in accordance with the properties of the material investigated
    • G01N21/47Scattering, i.e. diffuse reflection
    • GPHYSICS
    • G01MEASURING; TESTING
    • G01NINVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N21/00Investigating or analysing materials by the use of optical means, i.e. using sub-millimetre waves, infrared, visible or ultraviolet light
    • G01N21/17Systems in which incident light is modified in accordance with the properties of the material investigated
    • G01N21/47Scattering, i.e. diffuse reflection
    • G01N2021/4704Angular selective
    • G01N2021/4709Backscatter
    • GPHYSICS
    • G01MEASURING; TESTING
    • G01NINVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N21/00Investigating or analysing materials by the use of optical means, i.e. using sub-millimetre waves, infrared, visible or ultraviolet light
    • G01N21/84Systems specially adapted for particular applications
    • G01N21/86Investigating moving sheets
    • G01N2021/8663Paper, e.g. gloss, moisture content

Landscapes

  • Physics & Mathematics (AREA)
  • Health & Medical Sciences (AREA)
  • Life Sciences & Earth Sciences (AREA)
  • Chemical & Material Sciences (AREA)
  • Analytical Chemistry (AREA)
  • Biochemistry (AREA)
  • General Health & Medical Sciences (AREA)
  • General Physics & Mathematics (AREA)
  • Immunology (AREA)
  • Pathology (AREA)
  • Investigating Or Analysing Materials By Optical Means (AREA)
  • Investigating Materials By The Use Of Optical Means Adapted For Particular Applications (AREA)
  • Length Measuring Devices By Optical Means (AREA)
FI20040600A 2004-04-28 2004-04-28 Paperipinnan laadun testaus FI117834B (fi)

Priority Applications (2)

Application Number Priority Date Filing Date Title
FI20040600A FI117834B (fi) 2004-04-28 2004-04-28 Paperipinnan laadun testaus
PCT/FI2005/050134 WO2005106436A1 (en) 2004-04-28 2005-04-27 Paper surface quality testing

Applications Claiming Priority (2)

Application Number Priority Date Filing Date Title
FI20040600A FI117834B (fi) 2004-04-28 2004-04-28 Paperipinnan laadun testaus
FI20040600 2004-04-28

Publications (3)

Publication Number Publication Date
FI20040600A0 FI20040600A0 (fi) 2004-04-28
FI20040600L true FI20040600L (fi) 2005-10-29
FI117834B FI117834B (fi) 2007-03-15

Family

ID=32104234

Family Applications (1)

Application Number Title Priority Date Filing Date
FI20040600A FI117834B (fi) 2004-04-28 2004-04-28 Paperipinnan laadun testaus

Country Status (2)

Country Link
FI (1) FI117834B (fi)
WO (1) WO2005106436A1 (fi)

Families Citing this family (2)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
CN101158640B (zh) * 2007-11-06 2010-06-09 山东大学 一种使用线阵ccd快速测量相干背散射的装置及方法
CN106442870A (zh) * 2016-07-29 2017-02-22 维达纸业(中国)有限公司 一种纸张在线质检系统及其方法

Family Cites Families (10)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US4097751A (en) * 1976-09-24 1978-06-27 Grumman Aerospace Corporation Retroreflectance measuring apparatus
SU1383168A1 (ru) * 1986-04-28 1988-03-23 Ленинградский институт текстильной и легкой промышленности им.С.М.Кирова Оптический способ контрол прочности листовых волокнистых светопропускающих материалов в процессе их производства
JP2741416B2 (ja) * 1988-10-31 1998-04-15 シュヴァイツァリッシェ アイトゲノッセンシャフト ピー エス アイ パウル シェラー インスティチュート 試験体の多点を同時に無接触試験する装置およびその使用
US5063301A (en) * 1989-12-21 1991-11-05 The Standard Oil Company Noninvasive method and apparatus using coherent backscattering for process control
US5155558A (en) * 1990-09-19 1992-10-13 E. I. Du Pont De Nemours And Company Method and apparatus for analyzing the appearance features of a surface
DE19733775A1 (de) * 1997-08-05 1999-02-18 Honeywell Ag Verfahren zur Messung von Eigenschaften einer Materialoberfläche
US6690473B1 (en) * 1999-02-01 2004-02-10 Sensys Instruments Corporation Integrated surface metrology
FI991071A0 (fi) * 1999-05-10 1999-05-10 Valmet Automation Inc Menetelmä ja mittausjärjestely mitata paperin pintaa
DE19950588B4 (de) * 1999-10-20 2013-07-18 Byk Gardner Gmbh Vorrichtung und Verfahren zur Qualitätskontrolle von insbesondere lackierten Oberflächen
JP4164430B2 (ja) * 2002-10-29 2008-10-15 キヤノン株式会社 記録媒体識別装置、記録装置、および記録媒体識別方法

Also Published As

Publication number Publication date
WO2005106436A1 (en) 2005-11-10
WO2005106436A8 (en) 2006-01-19
FI20040600A0 (fi) 2004-04-28
FI117834B (fi) 2007-03-15

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