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FI20031765A0 - Method and arrangement for performing testing of an electronic device - Google Patents

Method and arrangement for performing testing of an electronic device

Info

Publication number
FI20031765A0
FI20031765A0 FI20031765A FI20031765A FI20031765A0 FI 20031765 A0 FI20031765 A0 FI 20031765A0 FI 20031765 A FI20031765 A FI 20031765A FI 20031765 A FI20031765 A FI 20031765A FI 20031765 A0 FI20031765 A0 FI 20031765A0
Authority
FI
Finland
Prior art keywords
arrangement
electronic device
performing testing
testing
electronic
Prior art date
Application number
FI20031765A
Other languages
Finnish (fi)
Swedish (sv)
Other versions
FI20031765L (en
FI117578B (en
Inventor
Toomas Tiismaa
Original Assignee
Jot Automation Oy
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Jot Automation Oy filed Critical Jot Automation Oy
Priority to FI20031765A priority Critical patent/FI117578B/en
Publication of FI20031765A0 publication Critical patent/FI20031765A0/en
Priority to PCT/FI2004/000731 priority patent/WO2005054877A1/en
Publication of FI20031765L publication Critical patent/FI20031765L/en
Application granted granted Critical
Publication of FI117578B publication Critical patent/FI117578B/en

Links

Classifications

    • H—ELECTRICITY
    • H04—ELECTRIC COMMUNICATION TECHNIQUE
    • H04M—TELEPHONIC COMMUNICATION
    • H04M1/00—Substation equipment, e.g. for use by subscribers
    • H04M1/24—Arrangements for testing
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
    • G01R1/00—Details of instruments or arrangements of the types included in groups G01R5/00 - G01R13/00 and G01R31/00
    • G01R1/02—General constructional details
    • G01R1/04—Housings; Supporting members; Arrangements of terminals
    • G01R1/0408—Test fixtures or contact fields; Connectors or connecting adaptors; Test clips; Test sockets

Landscapes

  • Engineering & Computer Science (AREA)
  • Signal Processing (AREA)
  • Testing Electric Properties And Detecting Electric Faults (AREA)
  • Testing Of Individual Semiconductor Devices (AREA)
FI20031765A 2003-12-03 2003-12-03 Method and arrangement for performing testing of an electronic device FI117578B (en)

Priority Applications (2)

Application Number Priority Date Filing Date Title
FI20031765A FI117578B (en) 2003-12-03 2003-12-03 Method and arrangement for performing testing of an electronic device
PCT/FI2004/000731 WO2005054877A1 (en) 2003-12-03 2004-12-02 Method and arrangement for testing an electronic device

Applications Claiming Priority (2)

Application Number Priority Date Filing Date Title
FI20031765 2003-12-03
FI20031765A FI117578B (en) 2003-12-03 2003-12-03 Method and arrangement for performing testing of an electronic device

Publications (3)

Publication Number Publication Date
FI20031765A0 true FI20031765A0 (en) 2003-12-03
FI20031765L FI20031765L (en) 2005-06-04
FI117578B FI117578B (en) 2006-11-30

Family

ID=29763464

Family Applications (1)

Application Number Title Priority Date Filing Date
FI20031765A FI117578B (en) 2003-12-03 2003-12-03 Method and arrangement for performing testing of an electronic device

Country Status (2)

Country Link
FI (1) FI117578B (en)
WO (1) WO2005054877A1 (en)

Families Citing this family (20)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US8022712B2 (en) 2005-12-20 2011-09-20 Jot Automation Oy Testing adapter
FI122041B (en) * 2008-09-18 2011-07-29 Jot Automation Oy Test Adapter Configuration
US11010841B2 (en) 2008-10-02 2021-05-18 Ecoatm, Llc Kiosk for recycling electronic devices
US7881965B2 (en) 2008-10-02 2011-02-01 ecoATM, Inc. Secondary market and vending system for devices
CN102331427A (en) * 2011-08-30 2012-01-25 常州天合光能有限公司 Test method for invisible cracks on solar cell module
WO2013116256A1 (en) * 2012-02-01 2013-08-08 ecoATM, Inc. Method and apparatus for recycling electronic devices
US20130200915A1 (en) * 2012-02-06 2013-08-08 Peter G. Panagas Test System with Test Trays and Automated Test Tray Handling
WO2016053378A1 (en) 2014-10-02 2016-04-07 ecoATM, Inc. Wireless-enabled kiosk for recycling consumer devices
US10445708B2 (en) 2014-10-03 2019-10-15 Ecoatm, Llc System for electrically testing mobile devices at a consumer-operated kiosk, and associated devices and methods
CA3056457A1 (en) 2014-10-31 2016-05-06 Mark Vincent Bowles Systems and methods for recycling consumer electronic devices
US10269110B2 (en) 2016-06-28 2019-04-23 Ecoatm, Llc Methods and systems for detecting cracks in illuminated electronic device screens
CN109061237B (en) * 2018-08-03 2022-05-17 中国航空工业集团公司雷华电子技术研究所 Automatic clamping universal device for accurate testing of microwave module
US12322259B2 (en) 2018-12-19 2025-06-03 Ecoatm, Llc Systems and methods for vending and/or purchasing mobile phones and other electronic devices
EP3924918A1 (en) 2019-02-12 2021-12-22 ecoATM, LLC Kiosk for evaluating and purchasing used electronic devices
EP3928254A1 (en) 2019-02-18 2021-12-29 ecoATM, LLC Neural network based physical condition evaluation of electronic devices, and associated systems and methods
JP2023508903A (en) 2019-12-18 2023-03-06 エコエーティーエム， エルエルシー Systems and methods for selling and/or buying mobile phones and other electronic devices
CA3192483A1 (en) 2020-08-17 2022-02-24 Ecoatm, Llc Connector carrier for electronic device kiosk
US12271929B2 (en) 2020-08-17 2025-04-08 Ecoatm Llc Evaluating an electronic device using a wireless charger
EP4205092A1 (en) 2020-08-25 2023-07-05 ecoATM, LLC Evaluating and recycling electronic devices
WO2023283647A1 (en) 2021-07-09 2023-01-12 Ecoatm, Llc Identifying electronic devices using temporally changing information

Family Cites Families (2)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US6170329B1 (en) * 1999-06-14 2001-01-09 Agilent Technologies, Inc. Test fixture customization adapter enclosure
US6828773B2 (en) * 2002-03-21 2004-12-07 Agilent Technologies, Inc. Adapter method and apparatus for interfacing a tester with a device under test

Also Published As

Publication number Publication date
WO2005054877A1 (en) 2005-06-16
FI20031765L (en) 2005-06-04
FI117578B (en) 2006-11-30

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