[go: up one dir, main page]

FI20031658A0 - Menetelmä ja laitteisto näytteiden tutkimiseksi massaspektrometrisesti - Google Patents

Menetelmä ja laitteisto näytteiden tutkimiseksi massaspektrometrisesti

Info

Publication number
FI20031658A0
FI20031658A0 FI20031658A FI20031658A FI20031658A0 FI 20031658 A0 FI20031658 A0 FI 20031658A0 FI 20031658 A FI20031658 A FI 20031658A FI 20031658 A FI20031658 A FI 20031658A FI 20031658 A0 FI20031658 A0 FI 20031658A0
Authority
FI
Finland
Prior art keywords
mass spectrometry
spectrometry
mass
Prior art date
Application number
FI20031658A
Other languages
English (en)
Swedish (sv)
Other versions
FI119747B (fi
FI20031658L (fi
Inventor
Risto Kostiainen
Samuli Franssila
Tapio Kotiaho
Seppo Marttila
Original Assignee
Licentia Oy
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Licentia Oy filed Critical Licentia Oy
Priority to FI20031658A priority Critical patent/FI119747B/fi
Publication of FI20031658A0 publication Critical patent/FI20031658A0/fi
Priority to EP04798292A priority patent/EP1683179A2/en
Priority to JP2006538878A priority patent/JP4767864B2/ja
Priority to US10/579,225 priority patent/US7863559B2/en
Priority to PCT/FI2004/000683 priority patent/WO2005047848A2/en
Priority to CA002545368A priority patent/CA2545368A1/en
Publication of FI20031658L publication Critical patent/FI20031658L/fi
Application granted granted Critical
Publication of FI119747B publication Critical patent/FI119747B/fi

Links

Classifications

    • H—ELECTRICITY
    • H01—ELECTRIC ELEMENTS
    • H01J—ELECTRIC DISCHARGE TUBES OR DISCHARGE LAMPS
    • H01J49/00—Particle spectrometers or separator tubes
    • H01J49/02—Details
    • H01J49/10—Ion sources; Ion guns
    • H01J49/16—Ion sources; Ion guns using surface ionisation, e.g. field-, thermionic- or photo-emission
    • H01J49/168—Ion sources; Ion guns using surface ionisation, e.g. field-, thermionic- or photo-emission field ionisation, e.g. corona discharge
    • H—ELECTRICITY
    • H01—ELECTRIC ELEMENTS
    • H01J—ELECTRIC DISCHARGE TUBES OR DISCHARGE LAMPS
    • H01J49/00—Particle spectrometers or separator tubes
    • H01J49/0013—Miniaturised spectrometers, e.g. having smaller than usual scale, integrated conventional components
    • H01J49/0018—Microminiaturised spectrometers, e.g. chip-integrated devices, Micro-Electro-Mechanical Systems [MEMS]
    • H—ELECTRICITY
    • H01—ELECTRIC ELEMENTS
    • H01J—ELECTRIC DISCHARGE TUBES OR DISCHARGE LAMPS
    • H01J49/00—Particle spectrometers or separator tubes
    • H01J49/02—Details
    • H01J49/04—Arrangements for introducing or extracting samples to be analysed, e.g. vacuum locks; Arrangements for external adjustment of electron- or ion-optical components
    • H01J49/0431—Arrangements for introducing or extracting samples to be analysed, e.g. vacuum locks; Arrangements for external adjustment of electron- or ion-optical components for liquid samples
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N30/00—Investigating or analysing materials by separation into components using adsorption, absorption or similar phenomena or using ion-exchange, e.g. chromatography or field flow fractionation
    • G01N30/02—Column chromatography
    • G01N30/60—Construction of the column
    • G01N30/6095—Micromachined or nanomachined, e.g. micro- or nanosize
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N30/00—Investigating or analysing materials by separation into components using adsorption, absorption or similar phenomena or using ion-exchange, e.g. chromatography or field flow fractionation
    • G01N30/02—Column chromatography
    • G01N30/62—Detectors specially adapted therefor
    • G01N30/72—Mass spectrometers
    • G01N30/7233—Mass spectrometers interfaced to liquid or supercritical fluid chromatograph

Landscapes

  • Chemical & Material Sciences (AREA)
  • Analytical Chemistry (AREA)
  • Physics & Mathematics (AREA)
  • Engineering & Computer Science (AREA)
  • Plasma & Fusion (AREA)
  • Other Investigation Or Analysis Of Materials By Electrical Means (AREA)
  • Electron Tubes For Measurement (AREA)
FI20031658A 2003-11-14 2003-11-14 Menetelmä ja laitteisto näytteiden tutkimiseksi massaspektrometrisesti FI119747B (fi)

Priority Applications (6)

Application Number Priority Date Filing Date Title
FI20031658A FI119747B (fi) 2003-11-14 2003-11-14 Menetelmä ja laitteisto näytteiden tutkimiseksi massaspektrometrisesti
EP04798292A EP1683179A2 (en) 2003-11-14 2004-11-15 Method and apparatus for mass spectrometric analysis
JP2006538878A JP4767864B2 (ja) 2003-11-14 2004-11-15 質量分析方法と装置
US10/579,225 US7863559B2 (en) 2003-11-14 2004-11-15 Method and apparatus for mass spectrometric analysis
PCT/FI2004/000683 WO2005047848A2 (en) 2003-11-14 2004-11-15 Method and apparatus for mass spectrometric analysis
CA002545368A CA2545368A1 (en) 2003-11-14 2004-11-15 Method and apparatus for mass spectrometric analysis

Applications Claiming Priority (2)

Application Number Priority Date Filing Date Title
FI20031658A FI119747B (fi) 2003-11-14 2003-11-14 Menetelmä ja laitteisto näytteiden tutkimiseksi massaspektrometrisesti
FI20031658 2003-11-14

Publications (3)

Publication Number Publication Date
FI20031658A0 true FI20031658A0 (fi) 2003-11-14
FI20031658L FI20031658L (fi) 2005-05-15
FI119747B FI119747B (fi) 2009-02-27

Family

ID=29558629

Family Applications (1)

Application Number Title Priority Date Filing Date
FI20031658A FI119747B (fi) 2003-11-14 2003-11-14 Menetelmä ja laitteisto näytteiden tutkimiseksi massaspektrometrisesti

Country Status (6)

Country Link
US (1) US7863559B2 (fi)
EP (1) EP1683179A2 (fi)
JP (1) JP4767864B2 (fi)
CA (1) CA2545368A1 (fi)
FI (1) FI119747B (fi)
WO (1) WO2005047848A2 (fi)

Families Citing this family (11)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
DE102007052500A1 (de) 2007-11-02 2009-06-04 Helmholtz Zentrum München Deutsches Forschungszentrum Für Gesundheit Und Umwelt (Gmbh) Verfahren und Vorrichtung für den Nachweis von mindestens einer Zielsubstanz
US8716655B2 (en) * 2009-07-02 2014-05-06 Tricorntech Corporation Integrated ion separation spectrometer
JP5995643B2 (ja) * 2012-10-11 2016-09-21 ヒューマン・メタボローム・テクノロジーズ株式会社 酸性化合物の検出方法
US9837257B2 (en) * 2013-06-21 2017-12-05 Smiths Detection Montreal Inc. Method and device for a coated corona ionization source
EP3109612A1 (en) * 2015-06-26 2016-12-28 Nina Wojtas Mems deposition trap for vacuum transducer protection
US11162972B2 (en) * 2018-05-23 2021-11-02 University Of Central Florida Research Foundation, Inc. Resonant MEMS piezoelectric sensor
JP6922961B2 (ja) * 2018-10-18 2021-08-18 株式会社村田製作所 回転運動検出用微小電気機械デバイス
WO2021111887A1 (ja) * 2019-12-06 2021-06-10 ソニーグループ株式会社 力覚センサモジュール
EP4111488A1 (en) * 2020-02-28 2023-01-04 Georgetown University Apparatus and methods for detection and quantification of elements in molecules
DE102020214695B4 (de) * 2020-11-23 2022-06-09 Micro-Sensys Gmbh Vorrichtung zur Ermittlung eines Füllstands einer Flüssigkeit in einem Behälter
CN113311096B (zh) * 2021-06-28 2024-12-06 中国科学院上海微系统与信息技术研究所 氦离子化检测器及其制备方法

Family Cites Families (14)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPH065228B2 (ja) * 1983-12-13 1994-01-19 株式会社日立製作所 大気圧イオン化式試料導入装置
JP2633974B2 (ja) 1990-04-18 1997-07-23 株式会社日立製作所 試料のイオン化および質量分析のための装置
US5259254A (en) * 1991-09-25 1993-11-09 Cetac Technologies, Inc. Sample introduction system for inductively coupled plasma and other gas-phase, or particle, detectors utilizing ultrasonic nebulization, and method of use
US5750988A (en) 1994-07-11 1998-05-12 Hewlett-Packard Company Orthogonal ion sampling for APCI mass spectrometry
CN100435900C (zh) 1998-09-17 2008-11-26 阿德文生物科学公司 液相色谱系统，化学分离装置及质谱分析装置和方法
WO2000041214A1 (en) 1999-01-08 2000-07-13 Northeastern University ELECTRO-PNEUMATIC DISTRIBUTOR FOR MULTIPLEXED ν-TAS DEVICES
US6690004B2 (en) * 1999-07-21 2004-02-10 The Charles Stark Draper Laboratory, Inc. Method and apparatus for electrospray-augmented high field asymmetric ion mobility spectrometry
JP3618262B2 (ja) * 1999-10-13 2005-02-09 株式会社日立製作所 質量分析計及びそのイオン源
US6610978B2 (en) * 2001-03-27 2003-08-26 Agilent Technologies, Inc. Integrated sample preparation, separation and introduction microdevice for inductively coupled plasma mass spectrometry
US6649908B2 (en) * 2001-09-20 2003-11-18 Agilent Technologies, Inc. Multiplexing capillary array for atmospheric pressure ionization-mass spectrometry
GB2391694B (en) * 2002-08-01 2006-03-01 Microsaic Systems Ltd Monolithic micro-engineered mass spectrometer
US7417225B2 (en) * 2002-09-25 2008-08-26 Thermo Finnigan Llc Apparatus and method for adjustment of ion separation resolution in FAIMS
US7057170B2 (en) * 2004-03-12 2006-06-06 Northrop Grumman Corporation Compact ion gauge using micromachining and MISOC devices
GB2422951B (en) * 2005-02-07 2010-07-28 Microsaic Systems Ltd Integrated analytical device

Also Published As

Publication number Publication date
CA2545368A1 (en) 2005-05-26
WO2005047848A2 (en) 2005-05-26
FI119747B (fi) 2009-02-27
JP2007511755A (ja) 2007-05-10
JP4767864B2 (ja) 2011-09-07
WO2005047848A3 (en) 2005-08-18
EP1683179A2 (en) 2006-07-26
FI20031658L (fi) 2005-05-15
US7863559B2 (en) 2011-01-04
US20090108193A1 (en) 2009-04-30

Similar Documents

Publication Publication Date Title
FI20031930A0 (fi) Menetelmä ja laitteisto betonimassan valmistamiseksi
EP1535306A4 (en) APPARATUS AND METHOD FOR MASS SPECTROMETRY
GB2402471B (en) An analysis method and apparatus
DE60319787D1 (de) Montageverfahren und -vorrichtung
DE112004003144A5 (de) Verfahren und Vorrichtung zur Massenspektrometrie
DK1620551T3 (da) Phospholipase og fremgangsmåde til fremstilling deraf
NO20042922L (no) Fremgangsmate og apparat for bronnintervensjon
GB2422009B (en) Method and apparatus for mass spectrometry
FI20030936L (fi) Menetelmä ja laitteisto lasin lämmittämiseksi
FI20031816A0 (fi) Menetelmä ja laite kuvan luomiseksi
DE60301147D1 (de) RC4 Verfahren zur Verschlüsselung von Paketen
EP1494007B8 (de) Vorrichtung und Verfahren zum Analysieren von Proben
FI20030706L (fi) Etätunnistin, laitteisto ja menetelmä haluttujen etätunnistinkomponenttien aktivoimiseksi
FI20020547A7 (fi) Menetelmä ja laitteisto kokoonpanoon
FI20031658A0 (fi) Menetelmä ja laitteisto näytteiden tutkimiseksi massaspektrometrisesti
FI20031641L (fi) Menetelmä ja laitteisto eloperäisen materiaalin käsittelemiseksi
FI20020162L (fi) Menetelmä ja laite kuumaliimaukseen
FI20021112A7 (fi) Menetelmä ja järjestely paikannuksen suorittamiseksi
FI20035084L (fi) Menetelmä ja järjestelmä valinnan suorittamiseksi ja elektroniikkalaite
FI20020295L (fi) Menetelmä ja laite lietenäytteiden ottamiseksi
FI20060385A7 (fi) Menetelmä ja laitteisto puun kuivaamiseksi
FI20040205A0 (fi) Menetelmä ja laite pikatestin valmistamiseksi
GB2402808B (en) Method and device for the mass-spectrometric analysis of gases
FI20031534L (fi) Menetelmä ja laitteisto betonielementtien valamiseksi
FI20020169A0 (fi) Menetelmõ ja laite orgaanisen massan hapettamiseksi

Legal Events

Date Code Title Description
FG Patent granted

Ref document number: 119747

Country of ref document: FI

MM Patent lapsed