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FI20012271L - Förfarande för att bestämma motsvarande punkter - Google Patents

Förfarande för att bestämma motsvarande punkter Download PDF

Info

Publication number
FI20012271L
FI20012271L FI20012271A FI20012271A FI20012271L FI 20012271 L FI20012271 L FI 20012271L FI 20012271 A FI20012271 A FI 20012271A FI 20012271 A FI20012271 A FI 20012271A FI 20012271 L FI20012271 L FI 20012271L
Authority
FI
Finland
Prior art keywords
counterpoints
determining
determining counterpoints
Prior art date
Application number
FI20012271A
Other languages
English (en)
Finnish (fi)
Other versions
FI20012271A0 (sv
FI112279B (sv
Inventor
Esa Leikas
Original Assignee
Mapvision Oy Ltd
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Mapvision Oy Ltd filed Critical Mapvision Oy Ltd
Priority to FI20012271A priority Critical patent/FI112279B/sv
Publication of FI20012271A0 publication Critical patent/FI20012271A0/sv
Priority to JP2003546046A priority patent/JP4402458B2/ja
Priority to ES02803416.3T priority patent/ES2605735T3/es
Priority to PCT/FI2002/000928 priority patent/WO2003044460A1/en
Priority to US10/496,144 priority patent/US7046377B2/en
Priority to EP02803416.3A priority patent/EP1459035B1/en
Priority to AU2002366117A priority patent/AU2002366117A1/en
Publication of FI20012271L publication Critical patent/FI20012271L/sv
Application granted granted Critical
Publication of FI112279B publication Critical patent/FI112279B/sv

Links

Classifications

    • G—PHYSICS
    • G06—COMPUTING OR CALCULATING; COUNTING
    • G06T—IMAGE DATA PROCESSING OR GENERATION, IN GENERAL
    • G06T7/00—Image analysis
    • G06T7/60—Analysis of geometric attributes
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01B—MEASURING LENGTH, THICKNESS OR SIMILAR LINEAR DIMENSIONS; MEASURING ANGLES; MEASURING AREAS; MEASURING IRREGULARITIES OF SURFACES OR CONTOURS
    • G01B11/00—Measuring arrangements characterised by the use of optical techniques
    • G01B11/24—Measuring arrangements characterised by the use of optical techniques for measuring contours or curvatures
    • G—PHYSICS
    • G06—COMPUTING OR CALCULATING; COUNTING
    • G06T—IMAGE DATA PROCESSING OR GENERATION, IN GENERAL
    • G06T7/00—Image analysis
    • G06T7/50—Depth or shape recovery
    • G06T7/55—Depth or shape recovery from multiple images
    • G06T7/593—Depth or shape recovery from multiple images from stereo images
    • G—PHYSICS
    • G06—COMPUTING OR CALCULATING; COUNTING
    • G06T—IMAGE DATA PROCESSING OR GENERATION, IN GENERAL
    • G06T7/00—Image analysis
    • G06T7/70—Determining position or orientation of objects or cameras
    • G—PHYSICS
    • G06—COMPUTING OR CALCULATING; COUNTING
    • G06T—IMAGE DATA PROCESSING OR GENERATION, IN GENERAL
    • G06T7/00—Image analysis
    • G06T7/97—Determining parameters from multiple pictures

Landscapes

  • Engineering & Computer Science (AREA)
  • Physics & Mathematics (AREA)
  • General Physics & Mathematics (AREA)
  • Computer Vision & Pattern Recognition (AREA)
  • Theoretical Computer Science (AREA)
  • Geometry (AREA)
  • Length Measuring Devices By Optical Means (AREA)
FI20012271A 2001-11-21 2001-11-21 Förfarande för att bestämma motsvarande punkter FI112279B (sv)

Priority Applications (7)

Application Number Priority Date Filing Date Title
FI20012271A FI112279B (sv) 2001-11-21 2001-11-21 Förfarande för att bestämma motsvarande punkter
JP2003546046A JP4402458B2 (ja) 2001-11-21 2002-11-20 三次元計測における対応ポイントを決定する方法
ES02803416.3T ES2605735T3 (es) 2001-11-21 2002-11-20 Procedimiento para determinar puntos correspondientes en mediciones tridimensionales estereoscópicas
PCT/FI2002/000928 WO2003044460A1 (en) 2001-11-21 2002-11-20 Method for determining corresponding points in three-dimensional measurement
US10/496,144 US7046377B2 (en) 2001-11-21 2002-11-20 Method for determining corresponding points in three-dimensional measurement
EP02803416.3A EP1459035B1 (en) 2001-11-21 2002-11-20 Method for determining corresponding points in stereoscopic three-dimensional measurements
AU2002366117A AU2002366117A1 (en) 2001-11-21 2002-11-20 Method for determining corresponding points in three-dimensional measurement

Applications Claiming Priority (2)

Application Number Priority Date Filing Date Title
FI20012271A FI112279B (sv) 2001-11-21 2001-11-21 Förfarande för att bestämma motsvarande punkter
FI20012271 2001-11-21

Publications (3)

Publication Number Publication Date
FI20012271A0 FI20012271A0 (sv) 2001-11-21
FI20012271L true FI20012271L (sv) 2003-05-22
FI112279B FI112279B (sv) 2003-11-14

Family

ID=8562309

Family Applications (1)

Application Number Title Priority Date Filing Date
FI20012271A FI112279B (sv) 2001-11-21 2001-11-21 Förfarande för att bestämma motsvarande punkter

Country Status (7)

Country Link
US (1) US7046377B2 (sv)
EP (1) EP1459035B1 (sv)
JP (1) JP4402458B2 (sv)
AU (1) AU2002366117A1 (sv)
ES (1) ES2605735T3 (sv)
FI (1) FI112279B (sv)
WO (1) WO2003044460A1 (sv)

Families Citing this family (21)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US7257248B2 (en) * 2003-03-27 2007-08-14 General Electric Company Non-contact measurement system and method
EP1875159A1 (en) * 2005-04-11 2008-01-09 Faro Technologies Inc. Three-dimensional coordinate measuring device
US20070152157A1 (en) * 2005-11-04 2007-07-05 Raydon Corporation Simulation arena entity tracking system
CN100385197C (zh) * 2006-06-08 2008-04-30 天津世纪动力光电科学仪器有限公司 便携式无导轨结构光三维扫描测量系统及其测量方法
US20080306708A1 (en) * 2007-06-05 2008-12-11 Raydon Corporation System and method for orientation and location calibration for image sensors
FI123049B (sv) * 2007-09-03 2012-10-15 Mapvision Ltd Oy System för en lagrande artificiell syn
US20110292406A1 (en) * 2008-10-28 2011-12-01 3Shape A/S Scanner with feedback control
CN102135417B (zh) * 2010-12-26 2013-05-22 北京航空航天大学 一种全自动三维特征提取方法
CN102126162B (zh) * 2010-12-26 2013-09-25 北京航空航天大学 一种数控机床加工在线测量方法
CN102722886B (zh) * 2012-05-21 2015-12-09 浙江捷尚视觉科技股份有限公司 一种基于三维标定和特征点匹配的视频测速方法
CN102944191B (zh) * 2012-11-28 2015-06-10 北京航空航天大学 一种基于平面圆靶标的三维视觉测量数据拼接方法及装置
CN103528520B (zh) * 2013-10-08 2016-03-23 哈尔滨工业大学 基于双目视觉的同步运行顶升系统的检测装置与方法
CN105739339A (zh) * 2016-03-18 2016-07-06 上海斐讯数据通信技术有限公司 一种人体识别和定位的方法和系统
CN106841206B (zh) * 2016-12-19 2018-07-24 大连理工大学 大型零件化学铣削切割非接触在线检测方法
WO2018203362A1 (ja) * 2017-05-01 2018-11-08 株式会社ニコン 加工装置及び加工方法
CN108748137B (zh) * 2018-04-11 2021-02-02 陈小龙 一种实物扫描建模方法及其应用
FR3082934B1 (fr) * 2018-06-26 2021-10-08 Safran Nacelles Dispositif et procede de projection laser pour fabrication de pieces en materiau composite par drapage
CN110702025B (zh) * 2019-05-30 2021-03-19 北京航空航天大学 一种光栅式双目立体视觉三维测量系统及方法
CN111578866B (zh) * 2020-06-16 2021-04-20 大连理工大学 一种多线激光传感器组合测量的空间位姿标定方法
CN114782434B (zh) * 2022-06-20 2022-09-27 青岛大学附属医院 一种内窥镜合作目标定位方法及系统
CN115792869B (zh) * 2022-12-27 2025-02-18 江苏集萃智能光电系统研究所有限公司 一种2d面阵相机与线激光3d传感器联合标定方法及装置

Family Cites Families (21)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US4188544A (en) * 1977-08-22 1980-02-12 Weyerhaeuser Company Method and apparatus for automatically processing a workpiece employing calibrated scanning
US4294544A (en) * 1979-08-03 1981-10-13 Altschuler Bruce R Topographic comparator
EP0159187A3 (en) 1984-04-17 1987-07-15 Simon-Carves Limited A surface topography measuring system
JPH0726828B2 (ja) * 1986-04-18 1995-03-29 株式会社トプコン 形状測定装置
FR2629198B1 (fr) 1988-03-25 1994-07-08 Kreon Ingenierie Marketing Procede de determination et de reconstitution des coordonnees spatiales de chacun des points d'un ensemble de points echantillonnant une surface tridimensionnelle, et procede de realisation d'une image tridimensionnelle de cette surface a partir desdites coordonnees
JPH02110789A (ja) * 1988-10-20 1990-04-23 Niigata Eng Co Ltd ３次元物体の形状認識方法
US4979815A (en) * 1989-02-17 1990-12-25 Tsikos Constantine J Laser range imaging system based on projective geometry
US5383013A (en) * 1992-09-18 1995-01-17 Nec Research Institute, Inc. Stereoscopic computer vision system
US5388059A (en) * 1992-12-30 1995-02-07 University Of Maryland Computer vision system for accurate monitoring of object pose
US5532816A (en) * 1994-03-15 1996-07-02 Stellar Industries, Inc. Laser tracking wheel alignment measurement apparatus and method
US6147760A (en) * 1994-08-30 2000-11-14 Geng; Zheng Jason High speed three dimensional imaging method
JP3478606B2 (ja) * 1994-10-12 2003-12-15 キヤノン株式会社 立体画像表示方法および装置
US6122065A (en) * 1996-08-12 2000-09-19 Centre De Recherche Industrielle Du Quebec Apparatus and method for detecting surface defects
JP3372014B2 (ja) * 1996-08-29 2003-01-27 ダイハツ工業株式会社 エンジン外付け部品の誤欠品検査装置
JPH10283473A (ja) * 1997-04-03 1998-10-23 Sumitomo Electric Ind Ltd 画像処理による欠け検査方法および装置
WO1999000661A1 (en) 1997-06-30 1999-01-07 Semiconductor Technologies & Instruments, Inc. Method and apparatus for inspecting a workpiece
US6173070B1 (en) * 1997-12-30 2001-01-09 Cognex Corporation Machine vision method using search models to find features in three dimensional images
US6789039B1 (en) * 2000-04-05 2004-09-07 Microsoft Corporation Relative range camera calibration
JP4089148B2 (ja) * 2000-10-17 2008-05-28 株式会社日立製作所 通訳サービス方法および通訳サービス装置
US6492651B2 (en) * 2001-02-08 2002-12-10 3D Systems, Inc. Surface scanning system for selective deposition modeling
US6868194B2 (en) * 2001-12-19 2005-03-15 General Electric Company Method for the extraction of image features caused by structure light using image reconstruction

Also Published As

Publication number Publication date
JP4402458B2 (ja) 2010-01-20
US20050012056A1 (en) 2005-01-20
WO2003044460A1 (en) 2003-05-30
FI20012271A0 (sv) 2001-11-21
EP1459035B1 (en) 2016-08-31
US7046377B2 (en) 2006-05-16
JP2005509879A (ja) 2005-04-14
AU2002366117A1 (en) 2003-06-10
EP1459035A1 (en) 2004-09-22
FI112279B (sv) 2003-11-14
ES2605735T3 (es) 2017-03-16

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