ES531768A0 - Perfeccionamientos en un dispositivo para la deteccion de fallos superficiales. - Google Patents

Perfeccionamientos en un dispositivo para la deteccion de fallos superficiales.

Info

Publication number: ES531768A0
Authority: ES; Spain
Prior art keywords: detection; surface faults; faults
Prior art date: 1983-04-22
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.): Granted

Application number

ES531768A

Other languages

English (en)

Other versions

ES8505480A1 (es

Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)

Erwin Sick GmbH Optik Elektronik

Original Assignee

Erwin Sick GmbH Optik Elektronik

Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)

1983-04-22

Filing date

1984-04-18

Publication date

1985-05-16

1984-04-18 Application filed by Erwin Sick GmbH Optik Elektronik filed Critical Erwin Sick GmbH Optik Elektronik

1985-05-16 Publication of ES531768A0 publication Critical patent/ES531768A0/es

1985-05-16 Publication of ES8505480A1 publication Critical patent/ES8505480A1/es

Status Expired legal-status Critical Current

Classifications

- G—PHYSICS
- G01—MEASURING; TESTING
- G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
- G01N21/00—Investigating or analysing materials by the use of optical means, i.e. using sub-millimetre waves, infrared, visible or ultraviolet light
- G01N21/84—Systems specially adapted for particular applications
- G01N21/88—Investigating the presence of flaws or contamination
- G01N21/89—Investigating the presence of flaws or contamination in moving material, e.g. running paper or textiles
- G01N21/8901—Optical details; Scanning details

Landscapes

Engineering & Computer Science (AREA)
Textile Engineering (AREA)
Physics & Mathematics (AREA)
Health & Medical Sciences (AREA)
Life Sciences & Earth Sciences (AREA)
Chemical & Material Sciences (AREA)
Analytical Chemistry (AREA)
Biochemistry (AREA)
General Health & Medical Sciences (AREA)
General Physics & Mathematics (AREA)
Immunology (AREA)
Pathology (AREA)
Investigating Materials By The Use Of Optical Means Adapted For Particular Applications (AREA)
Length Measuring Devices By Optical Means (AREA)
Manufacturing Optical Record Carriers (AREA)

ES531768A 1983-04-22 1984-04-18 Perfeccionamientos en un dispositivo para la deteccion de fallos superficiales. Expired ES8505480A1 (es)

Applications Claiming Priority (1)

Application Number	Priority Date	Filing Date	Title
DE3314620		1983-04-22

Publications (2)

Publication Number	Publication Date
ES531768A0 true ES531768A0 (es)	1985-05-16
ES8505480A1 ES8505480A1 (es)	1985-05-16

Family

ID=6197080

Family Applications (1)

Application Number	Title	Priority Date	Filing Date
ES531768A Expired ES8505480A1 (es)	1983-04-22	1984-04-18	Perfeccionamientos en un dispositivo para la deteccion de fallos superficiales.

Country Status (5)

Country	Link
US (1)	US4632546A (es)
EP (1)	EP0123929B1 (es)
JP (2)	JPS6089735A (es)
DE (1)	DE3472300D1 (es)
ES (1)	ES8505480A1 (es)

Families Citing this family (22)

* Cited by examiner, † Cited by third party
Publication number	Priority date	Publication date	Assignee	Title
DE3446355C2 (de) *	1984-12-19	1986-11-06	Erwin Sick Gmbh Optik-Elektronik, 7808 Waldkirch	Optisches Fehlersuchgerät
DE3518832A1 (de) *	1985-05-24	1986-11-27	Erwin Sick Gmbh Optik-Elektronik, 7808 Waldkirch	Oberflaechenbeschaffenheitsfeststellungs-lichtabtastvorrichtung mit einem lichtkonzentrator
DE3709500A1 (de) *	1985-09-24	1988-10-06	Sick Optik Elektronik Erwin	Optische bahnueberwachungseinrichtung mit zeilenkameras mit gerichteter beleuchtung
DE3534019A1 (de) *	1985-09-24	1987-04-02	Sick Optik Elektronik Erwin	Optische bahnueberwachungsvorrichtung
DE8700520U1 (de) *	1987-01-12	1987-03-12	Erwin Sick Gmbh Optik-Elektronik, 7808 Waldkirch	Scanner zur optischen Abtastung von Objekten, insbesondere Aufzeichnungsplatten
GB2202627A (en) *	1987-03-23	1988-09-28	Sick Optik Elektronik Erwin	Optical arrangement in web monitoring device
US4868404A (en) *	1987-04-23	1989-09-19	Hajime Industries, Ltd.	Surface inspection apparatus using a mask system to monitor uneven surfaces
NL8802404A (nl) *	1988-09-30	1990-04-17	Meyn Bv	Werkwijze en inrichting voor het door middel van doorstraling controleren van voedselprodukten.
US5027418A (en) *	1989-02-13	1991-06-25	Matsushita Electric Industrial Co., Ltd.	Electro-optical inspection apparatus for printed-circuit boards with components mounted thereon
US4972091A (en) *	1989-05-16	1990-11-20	Canadian Patents And Development Limited/Societe Canadienne Des Brevets Et D'exploitation Limitee	Method and apparatus for detecting the presence of flaws in a moving sheet of material
US4943734A (en) *	1989-06-30	1990-07-24	Qc Optics, Inc.	Inspection apparatus and method for detecting flaws on a diffractive surface
JPH0695075B2 (ja) *	1990-03-16	1994-11-24	工業技術院長	表面性状検出方法
FR2688064B1 (fr) *	1992-07-22	1997-10-17	Scanera Sc	Dispositif de detection de defauts de materiaux fibreux
US5661561A (en) *	1995-06-02	1997-08-26	Accu-Sort Systems, Inc.	Dimensioning system
DE19528519A1 (de) *	1995-08-03	1997-02-06	Tzn Forschung & Entwicklung	Vorrichtung zur Detektion streifenförmiger Oberflächenfehler
US6853446B1 (en) *	1999-08-16	2005-02-08	Applied Materials, Inc.	Variable angle illumination wafer inspection system
US6596996B1 (en) *	2001-07-24	2003-07-22	The Board Of Regents For Oklahoma State University	Optical spectral reflectance sensor and controller
WO2003010488A1 (en) *	2001-07-27	2003-02-06	Hamamatsu Metrix Co., Ltd.	Composite optical sensor unit and optical disk inspection device using it
DE10137340A1 (de) *	2001-07-31	2003-02-20	Heidelberger Druckmasch Ag	Verfahren und Vorrichtung zur Erkennung von Fremdkörpern und Oberflächendefekten auf einer transparenten Vorlage sowie zur Korrektur von dadurch verursachten Bildfehlern einer Abbildung der Vorlage
JP2003247957A (ja) *	2002-02-26	2003-09-05	Matsushita Electric Ind Co Ltd	表面異物検査装置
US7130036B1 (en)	2003-09-16	2006-10-31	Kla-Tencor Technologies Corp.	Methods and systems for inspection of an entire wafer surface using multiple detection channels
GB2429764A (en) *	2005-08-30	2007-03-07	Imp College Innovations Ltd	A scanning device using a first optical system with a first focal length and a second optical system with a second focal length

Family Cites Families (18)

* Cited by examiner, † Cited by third party
Publication number	Priority date	Publication date	Assignee	Title
US3474254A (en) *	1968-02-26	1969-10-21	Sick Erwin	Photoelectronic apparatus for scanning textile material
DE2200222A1 (de) *	1972-01-04	1973-07-12	Ibm Deutschland	Vorrichtung zur bestimmung der oberflaechenguete
DE2211654A1 (de) *	1972-03-10	1973-09-20	Paul Lippke	Einrichtung zum pruefen bewegter bahnen aus papier, kunststoff- oder metallfolien und dgl
US3790286A (en) *	1972-04-21	1974-02-05	Phillips Petroleum Co	Carbon black testing by analyzing non-specularly reflected polarized light
JPS5611894B2 (es) *	1973-09-26	1981-03-17
JPS5637499B2 (es) *	1973-11-15	1981-09-01
DE2611539C3 (de) *	1976-03-18	1982-09-09	Agfa-Gevaert Ag, 5090 Leverkusen	Verfahren zum Erkennen und Orten von sich in Längsrichtung einer laufenden Materialbahn erstreckenden Fehlern
US4030835A (en) *	1976-05-28	1977-06-21	Rca Corporation	Defect detection system
DE2627609A1 (de) *	1976-06-19	1977-12-29	Ibm Deutschland	Interferometrisches verfahren
US4180830A (en) *	1977-06-28	1979-12-25	Rca Corporation	Depth estimation system using diffractive effects of the grooves and signal elements in the grooves
JPS5414789A (en) *	1977-07-05	1979-02-03	Mitsubishi Electric Corp	Surface inspecting apparatus
US4197011A (en) *	1977-09-22	1980-04-08	Rca Corporation	Defect detection and plotting system
DE2800351B2 (de) *	1978-01-04	1979-11-15	Erwin Sick Gmbh Optik-Elektronik, 7808 Waldkirch	Optische Vorrichtung zur Bestimmung des Lichtaustrittswinkels bei einer mit einem Lichtfleck abgetasteten Materialbahn
JPS5594145A (en) *	1979-01-12	1980-07-17	Hitachi Ltd	Method of and device for inspecting surface of article
JPS5587907A (en) *	1978-12-27	1980-07-03	Fuji Photo Film Co Ltd	Device for continuously inspecting surface of object
US4352564A (en) *	1980-05-30	1982-10-05	Rca Corporation	Missing order defect detection apparatus
JPS6038592B2 (ja) *	1980-06-16	1985-09-02	石川島播磨重工業株式会社	高速回転機器の従動機器側シ−ル構造
US4395122A (en) *	1981-04-29	1983-07-26	Rca Corporation	Defect detection system

1984
- 1984-03-30 DE DE8484103553T patent/DE3472300D1/de not_active Expired
- 1984-03-30 EP EP84103553A patent/EP0123929B1/de not_active Expired
- 1984-04-13 US US06/599,890 patent/US4632546A/en not_active Expired - Fee Related
- 1984-04-16 JP JP59076406A patent/JPS6089735A/ja active Pending
- 1984-04-18 ES ES531768A patent/ES8505480A1/es not_active Expired
1992
- 1992-11-24 JP JP080727U patent/JPH064655U/ja active Pending

Also Published As

Publication number	Publication date
DE3472300D1 (en)	1988-07-28
EP0123929B1 (de)	1988-06-22
EP0123929A2 (de)	1984-11-07
EP0123929A3 (en)	1985-12-04
JPH064655U (ja)	1994-01-21
ES8505480A1 (es)	1985-05-16
US4632546A (en)	1986-12-30
JPS6089735A (ja)	1985-05-20

Publication	Publication Date	Title
ES531768A0 (es)	1985-05-16	Perfeccionamientos en un dispositivo para la deteccion de fallos superficiales.
BR8306175A (pt)	1984-06-12	Metodos para deteccao onogenica
FI854642A7 (fi)	1985-11-25	Laite etupäässä kovien pintojen puhdistamiseksi.
DE3582783D1 (de)	1991-06-13	Einrichtung zum erfassen der drehlage.
IT1209554B (it)	1989-08-30	Sonda a contatto.
FI850746A7 (fi)	1985-02-22	Laite mikro-organismien havaitsemiseksi.
NO162095C (no)	1989-11-01	Apparat for posisjonsbestemmelse.
DE3483249D1 (de)	1990-10-25	Vereinfachte pruefvorrichtung.
ES519684A0 (es)	1984-03-01	Perfeccionamientos en un aparato de ensenanza o recreativo.
FI853114A7 (fi)	1986-02-16	Laite jauhatusraon ilmaisemiseksi.
ES530048A0 (es)	1984-11-01	Perfeccionamientos en un dispositivo de frenado
ES527993A0 (es)	1985-03-01	Un dispositivo de inspeccion.
NL181492C (nl)	1987-09-01	Afmeerinrichting.
DE3484199D1 (de)	1991-04-04	Stellungsmessgeraet.
FI832041A7 (fi)	1984-01-20	Menetelmä ja laite kankaiden puhdistamista varten.
DE3484634D1 (de)	1991-07-04	Geraet zur fehlererkennung.
NL188841C (nl)	1992-10-16	Afmeerinrichting.
NO154688C (no)	1986-12-03	Toemmeanordning for bulkgods.
DE3579900D1 (de)	1990-10-31	Apparat zum entdecken von luecken im vereinigungsgebiet einer gefalteten schachtel.
ES276952Y (es)	1985-01-16	Un estraficado para utilizacion en prendas de uso.
NL183281C (nl)	1991-08-16	Afmeerinrichting.
ES531772A0 (es)	1985-05-01	Perfeccionamientos en un dispositivo termofluxometrico.
NO159752C (no)	1989-02-01	Lastm leanordning for heiseverk.
ES508169A0 (es)	1983-07-16	"perfeccionamientos introducidos en un aparato para detectar defectos en objetos".
FI845046A7 (fi)	1985-06-23	Laite poikkeamien havaitsemiseksi vakosametin valmistuksessa.

Legal Events

Date	Code	Title	Description
1997-08-01	FD1A	Patent lapsed	Effective date: 19970612