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ES524404A0 - Sistema electronico analizador de estados logicos. - Google Patents

Sistema electronico analizador de estados logicos.

Info

Publication number
ES524404A0
ES524404A0 ES524404A ES524404A ES524404A0 ES 524404 A0 ES524404 A0 ES 524404A0 ES 524404 A ES524404 A ES 524404A ES 524404 A ES524404 A ES 524404A ES 524404 A0 ES524404 A0 ES 524404A0
Authority
ES
Spain
Prior art keywords
electronic system
logical states
system analyzer
analyzer
logical
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Granted
Application number
ES524404A
Other languages
English (en)
Other versions
ES8406120A1 (es
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
INST NAC SIST AUTO TEC COMPUTA
Original Assignee
INST NAC SIST AUTO TEC COMPUTA
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by INST NAC SIST AUTO TEC COMPUTA filed Critical INST NAC SIST AUTO TEC COMPUTA
Publication of ES8406120A1 publication Critical patent/ES8406120A1/es
Publication of ES524404A0 publication Critical patent/ES524404A0/es
Granted legal-status Critical Current

Links

Classifications

    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
    • G01R29/00—Arrangements for measuring or indicating electric quantities not covered by groups G01R19/00 - G01R27/00
    • G01R29/02—Measuring characteristics of individual pulses, e.g. deviation from pulse flatness, rise time or duration
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
    • G01R31/00—Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere
    • G01R31/50—Testing of electric apparatus, lines, cables or components for short-circuits, continuity, leakage current or incorrect line connections
    • G01R31/52—Testing for short-circuits, leakage current or ground faults
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
    • G01R31/00—Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere
    • G01R31/50—Testing of electric apparatus, lines, cables or components for short-circuits, continuity, leakage current or incorrect line connections
    • G01R31/54—Testing for continuity

Landscapes

  • Physics & Mathematics (AREA)
  • General Physics & Mathematics (AREA)
  • Tests Of Electronic Circuits (AREA)
  • Measurement Of Resistance Or Impedance (AREA)
ES524404A 1982-07-26 1983-07-22 Sistema electronico analizador de estados logicos. Granted ES524404A0 (es)

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
CS565582 1982-07-26

Publications (2)

Publication Number Publication Date
ES8406120A1 ES8406120A1 (es) 1984-07-01
ES524404A0 true ES524404A0 (es) 1984-07-01

Family

ID=5401823

Family Applications (1)

Application Number Title Priority Date Filing Date
ES524404A Granted ES524404A0 (es) 1982-07-26 1983-07-22 Sistema electronico analizador de estados logicos.

Country Status (7)

Country Link
US (1) US4675597A (es)
CU (1) CU21488A1 (es)
DE (1) DE3326336A1 (es)
ES (1) ES524404A0 (es)
FR (1) FR2530821B1 (es)
GB (1) GB2127157B (es)
HU (1) HU189723B (es)

Families Citing this family (25)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPS61267858A (ja) * 1985-01-18 1986-11-27 Nec Corp マイクロコンピユ−タ
US4722004A (en) * 1985-11-27 1988-01-26 Victor Company Of Japan, Ltd. Video signal discriminating apparatus
DE3766902D1 (de) * 1986-07-10 1991-02-07 Studer Willi Ag Verfahren und vorrichtung zur verarbeitung von impulsen eines signals, das durch vorausgehende uebertragung verzerrt ist.
US4888791A (en) * 1988-01-25 1989-12-19 Barndt Sr Robert A Clock decoder and data bit transition detector for fiber optic work station
SE8902053L (sv) * 1988-06-06 1989-12-07 Ferocem Pty Ltd Insprutnings- och taendningssystemtestapparat
DE3900292A1 (de) * 1989-01-07 1990-07-12 Acer Inc Frequenzdetektor
EP0418521A3 (en) * 1989-09-20 1992-07-15 International Business Machines Corporation Testable latch self checker
US4982109A (en) * 1989-10-04 1991-01-01 Westinghouse Electric Corp. Circuit and method for measuring the duration of a selected pulse in a pulse train
US5027046A (en) * 1990-05-29 1991-06-25 Westinghouse Electric Corp. Circuit and method for monitoring voltage pulse widths
US5223742A (en) * 1991-08-14 1993-06-29 Schumacher Mark E Circuit and method for monitoring a pulse width modulated waveform
US5264802A (en) * 1991-08-21 1993-11-23 Beg Mirza A Circuit and method for monitoring phase error modulation
US5581204A (en) * 1995-06-02 1996-12-03 International Business Machines Corporation Pulse width measurement circuit
US6130530A (en) * 1997-12-22 2000-10-10 Hd Electric Company Tester for power transformers and capacitors
JP4846215B2 (ja) * 2004-08-27 2011-12-28 株式会社アドバンテスト パルス発生器、タイミング発生器、及びパルス幅調整方法
US7595675B2 (en) * 2006-05-01 2009-09-29 International Business Machines Corporation Duty cycle measurement method and apparatus that operates in a calibration mode and a test mode
US7363178B2 (en) * 2006-05-01 2008-04-22 International Business Machines Corporation Method and apparatus for measuring the relative duty cycle of a clock signal
US7330061B2 (en) * 2006-05-01 2008-02-12 International Business Machines Corporation Method and apparatus for correcting the duty cycle of a digital signal
US7646177B2 (en) 2006-05-01 2010-01-12 International Business Machines Corporation Design structure for a duty cycle measurement apparatus that operates in a calibration mode and a test mode
US7420400B2 (en) * 2006-05-01 2008-09-02 International Business Machines Corporation Method and apparatus for on-chip duty cycle measurement
US7333905B2 (en) * 2006-05-01 2008-02-19 International Business Machines Corporation Method and apparatus for measuring the duty cycle of a digital signal
US7904264B2 (en) 2007-11-12 2011-03-08 International Business Machines Corporation Absolute duty cycle measurement
US8032850B2 (en) * 2007-11-12 2011-10-04 International Business Machines Corporation Structure for an absolute duty cycle measurement circuit
US7895005B2 (en) * 2007-11-20 2011-02-22 International Business Machines Corporation Duty cycle measurement for various signals throughout an integrated circuit device
US7917318B2 (en) * 2007-11-20 2011-03-29 International Business Machines Corporation Structure for a duty cycle measurement circuit
CN102854377B (zh) * 2012-09-14 2014-11-05 武汉大学 一种将电压转换为脉冲宽度的电路及方法

Family Cites Families (16)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US3116448A (en) * 1959-08-26 1963-12-31 Shell Oil Co Electrical well logging apparatus having surface digital recording means and a multivibrator included within a downhole instrument
US3418573A (en) * 1965-08-25 1968-12-24 Texas Instruments Inc Universal electronic test system for automatically making static and dynamic tests on an electronic device
US3487317A (en) * 1966-01-11 1969-12-30 Us Navy System for isolating a single pulse from a series of pulses
US3619775A (en) * 1969-11-25 1971-11-09 Pulse Monitors Inc Polarity and voltage level detecting test probe
US3892954A (en) * 1972-04-04 1975-07-01 Westinghouse Electric Corp Programmable, tester for protection and safeguards logic functions
US3790767A (en) * 1972-12-04 1974-02-05 A Alexander Pulse analyzing tester
US4034287A (en) * 1975-12-15 1977-07-05 Pitney-Bowes, Inc. General purpose digital logic monitor
US4011447A (en) * 1976-02-09 1977-03-08 Henderson George R System for detecting the edges of a moving object employing a photocell and an amplifier in the saturation mode
JPS52123670A (en) * 1976-04-09 1977-10-18 Takeda Riken Ind Co Ltd Digital frequency measuring device
US4139819A (en) * 1977-12-01 1979-02-13 Worley Eugene R Multifunction frequency counter
US4152639A (en) * 1978-01-27 1979-05-01 Mono-Probe Corporation Electrical circuit voltage and continuity testing device
US4174805A (en) * 1978-04-13 1979-11-20 Ncr Corporation Method and apparatus for transmitting data to a predefined destination bus
US4236246A (en) * 1978-11-03 1980-11-25 Genrad, Inc. Method of and apparatus for testing electronic circuit assemblies and the like
DE2915530A1 (de) * 1979-04-18 1980-10-30 Christian Beha Gmbh Tech Neuen Elektronisches spannungs- und durchgangspruefgeraet
JPS5644367U (es) * 1979-09-13 1981-04-22
US4424482A (en) * 1981-09-14 1984-01-03 Eaton Corporation Adaptive bandwidth signal encoder

Also Published As

Publication number Publication date
GB2127157A (en) 1984-04-04
FR2530821A1 (fr) 1984-01-27
HUT34622A (en) 1985-03-28
ES8406120A1 (es) 1984-07-01
US4675597A (en) 1987-06-23
HU189723B (en) 1986-07-28
GB2127157B (en) 1986-03-05
FR2530821B1 (fr) 1987-02-27
DE3326336A1 (de) 1984-02-09
CU21488A1 (es) 1987-06-09
GB8317237D0 (en) 1983-07-27

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