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EE201000060A - Meetod ja seade sageduskarakteristiku m tmiseks - Google Patents

Meetod ja seade sageduskarakteristiku m tmiseks

Info

Publication number
EE201000060A
EE201000060A EEP201000060A EEP201000060A EE201000060A EE 201000060 A EE201000060 A EE 201000060A EE P201000060 A EEP201000060 A EE P201000060A EE P201000060 A EEP201000060 A EE P201000060A EE 201000060 A EE201000060 A EE 201000060A
Authority
EE
Estonia
Prior art keywords
measuring
frequency response
response
frequency
Prior art date
Application number
EEP201000060A
Other languages
English (en)
Inventor
Olev@M�rtens
Mart@Min
Raul@Land
Paul@Annus
T@nis@Saar
Marko@Reidla
Original Assignee
Tallinna@Tehnika�likool
O�@ELI@O@Tehnoloogia@Arenduskeskus
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Tallinna@Tehnika�likool, O�@ELI@O@Tehnoloogia@Arenduskeskus filed Critical Tallinna@Tehnika�likool
Priority to EEP201000060A priority Critical patent/EE05616B1/et
Priority to US13/177,961 priority patent/US8854030B2/en
Publication of EE201000060A publication Critical patent/EE201000060A/et
Publication of EE05616B1 publication Critical patent/EE05616B1/et

Links

Classifications

    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
    • G01R31/00—Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere
    • G01R31/28—Testing of electronic circuits, e.g. by signal tracer
    • G01R31/316—Testing of analog circuits
    • G01R31/3163—Functional testing

Landscapes

  • Engineering & Computer Science (AREA)
  • General Engineering & Computer Science (AREA)
  • Physics & Mathematics (AREA)
  • General Physics & Mathematics (AREA)
  • Measurement Of Resistance Or Impedance (AREA)
EEP201000060A 2010-07-07 2010-07-07 Meetod ja seade sageduskarakteristiku m??tmiseks EE05616B1 (et)

Priority Applications (2)

Application Number Priority Date Filing Date Title
EEP201000060A EE05616B1 (et) 2010-07-07 2010-07-07 Meetod ja seade sageduskarakteristiku m??tmiseks
US13/177,961 US8854030B2 (en) 2010-07-07 2011-07-07 Method and device for frequency response measurement

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
EEP201000060A EE05616B1 (et) 2010-07-07 2010-07-07 Meetod ja seade sageduskarakteristiku m??tmiseks

Publications (2)

Publication Number Publication Date
EE201000060A true EE201000060A (et) 2012-02-15
EE05616B1 EE05616B1 (et) 2012-12-17

Family

ID=45438137

Family Applications (1)

Application Number Title Priority Date Filing Date
EEP201000060A EE05616B1 (et) 2010-07-07 2010-07-07 Meetod ja seade sageduskarakteristiku m??tmiseks

Country Status (2)

Country Link
US (1) US8854030B2 (et)
EE (1) EE05616B1 (et)

Families Citing this family (12)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US9562939B2 (en) * 2012-07-30 2017-02-07 Huntington Ingalls Incorporated System and method for impedance measurement using series and shunt injection
US9304148B2 (en) 2012-10-23 2016-04-05 Tektronix, Inc. Internal chirp generator with time aligned acquisition in a mixed-domain oscilloscope
CN102944802B (zh) * 2012-12-12 2015-01-07 湖南大学 一种电压互感器动态频率响应函数估计方法及其实现装置
US9626463B2 (en) 2012-12-28 2017-04-18 Dassault Systemes Simulia Corp. Accelerated algorithm for modal frequency response calculation
CN106501601B (zh) * 2016-11-03 2019-01-04 南京航空航天大学 一种光电探测器频率响应测量方法及测量系统
CN106483373B (zh) * 2016-11-03 2019-04-05 南京航空航天大学 一种电光调制器频率响应测量方法及测量系统
US10585529B2 (en) 2016-11-04 2020-03-10 Microsoft Technology Licensing, Llc Selecting correlation reference based on noise estimation
CN106772193B (zh) * 2016-12-16 2023-01-31 贵州航天计量测试技术研究所 一种利用电流互感器频率特性测量装置的测量方法
ES2867349A1 (es) * 2019-11-28 2021-10-20 Convergrid S L Sistema y procedimiento para la integracion y supervision de equipos electricos para estabilizacion de las redes electricas
CN114966661A (zh) * 2020-06-30 2022-08-30 华为技术有限公司 一种雷达探测方法及相关装置
CN114371342B (zh) * 2022-03-21 2022-05-27 国仪量子(合肥)技术有限公司 Fpga及基于其的实时信号测频方法以及锁相放大器
EP4510922A4 (en) * 2022-04-22 2025-11-05 Impel Ip Llc DIAGNOSIS OF PATHOLOGIES USING A SPECTRAL ELECTRICAL IMPEDANCE DEVICE

Family Cites Families (10)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US4945234A (en) * 1989-05-19 1990-07-31 Extrel Ftms, Inc. Method and apparatus for producing an arbitrary excitation spectrum for Fourier transform mass spectrometry
US5797840A (en) 1994-09-14 1998-08-25 Ramot University Authority For Applied Research & Industrial Development Ltd. Apparatus and method for time dependent power spectrum analysis of physiological signals
US6501807B1 (en) 1998-02-06 2002-12-31 Intermec Ip Corp. Data recovery system for radio frequency identification interrogator
WO2003073089A1 (en) 2002-02-25 2003-09-04 Zyomyx, Inc. Method and device for performing impedance spectroscopy
WO2006012503A2 (en) 2004-07-22 2006-02-02 Auburn University Automatic analog test & compensation with built-in pattern generator & analyzer
KR100613602B1 (ko) 2005-02-07 2006-08-21 삼성전자주식회사 Ｖｓｂ 수신기에 적용되는 심벌 타이밍 복원 장치 및 그방법
GB2428949B (en) * 2005-07-28 2007-11-14 Artimi Inc Communications systems and methods
US8773151B2 (en) * 2006-04-24 2014-07-08 Oü Eliko Tehnoloogia Arenduskeskus Method and device for multichannel multifrequency analysis of an object
EE05166B1 (et) * 2007-01-23 2009-04-15 ELIKO Tehnoloogiaarenduskeskus O� Meetod ja seade RFID-vastuv?tja dekoodri snkroniseerimiseks
KR100939276B1 (ko) * 2008-04-22 2010-01-29 인하대학교 산학협력단 Ｕｗｂ 거리측정 시스템과 그의 구동방법

Also Published As

Publication number Publication date
EE05616B1 (et) 2012-12-17
US8854030B2 (en) 2014-10-07
US20120007583A1 (en) 2012-01-12

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