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DK200800578A - LHP Sampler - Google Patents

LHP Sampler Download PDF

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Publication number
DK200800578A
DK200800578A DK200800578A DKPA200800578A DK200800578A DK 200800578 A DK200800578 A DK 200800578A DK 200800578 A DK200800578 A DK 200800578A DK PA200800578 A DKPA200800578 A DK PA200800578A DK 200800578 A DK200800578 A DK 200800578A
Authority
DK
Denmark
Prior art keywords
probe
sampling cup
housing
solid
sample space
Prior art date
Application number
DK200800578A
Other languages
Danish (da)
Inventor
Jekmohan Vejay
Original Assignee
Gea Process Engineering Nps Lt
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Gea Process Engineering Nps Lt filed Critical Gea Process Engineering Nps Lt
Priority to DK200800578A priority Critical patent/DK200800578A/en
Publication of DK200800578A publication Critical patent/DK200800578A/en

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  • Investigating Or Analysing Materials By Optical Means (AREA)

Claims (17)

1. An apparatus for analysing solid, particulate materials, comprising a housing defining an axial direction, and a probe including an analytical sensor, said probe being located in said housing and being adapted for introduction into the solid, particulate material, characterized in that it further comprises an inlet duct for solid, particulate material, a sampling cup located downstream from the inlet duct and having an inner surface defining a sample space in fluid communication with an exit port of the sampling cup, an outlet duct located downstream from the sampling cup, said outlet duct being in fluid communication with said exit port, wherein the probe is displaceable in the axial direction between a first extreme position in which the displaceable probe is located at a distance from the sampling cup and the analytical sensor is retracted from the sample space, and a second extreme position in which the displaceable probe blocks the exit port of the sampling cup and the analytical sensor is located within the sample space.
2. An apparatus according to claim 1, wherein said sampling cup has an outer surface defining an overflow conduit, said overflow conduit being in fluid communication with the outlet duct.
3. An apparatus according to claim 1 or 2, wherein the housing is essentially vertically arranged and the inlet duct is located in an upper section of the housing and the sampling cup in a lower section of the housing.
4. An apparatus according to any one of the preceding claims, wherein the probe is adapted to be located in an intermediate position, in which the analytical sensor is located within the sample space and there is fluid communication between the sample space and the exit port.
5. An apparatus according to any one of the preceding claims, wherein the probe has a tip which has a conically shaped outer surface, and the inner surface of the sampling cup has a conical shape corresponding to the shape of the tip of the probe.
6. An apparatus according to any one of the preceding claims, wherein the sampling cup is concentric with respect to the axial direction of the housing.
7. An apparatus according to any one of the preceding claims, wherein the analytical sensor is adapted for optical analysis within the electromagnetic spectrum.
8. An apparatus according to claim 7, wherein the probe comprises a transmitting light guide, a receiving light guide, a measuring window, a deflecting mirror, and wherein the housing comprises a calibrating element.
9. An apparatus according to claim 7 or 8, wherein said apparatus further comprises a light source and a fibre-optic collector.
10. An apparatus according to any one of claims 7-9, wherein the optical analysis is performed within the infrared or the near-infrared (NIR) region of the electromagnetic spectrum.
11. An apparatus according to claim 10, wherein the optical analysis is performed in a reflective, transmissive or transflective mode.
12. An apparatus according to any one of the preceding claims, wherein a cross-validation sampler is provided downstream of the sampling cup.
13. A method for analysing a solid, particulate material using an apparatus according to any one of the preceding claims, wherein the axially displaceable probe is positioned to hold the analytical sensor in the sample space and keeping it in analytical proximity of solid, particulate material in the apparatus.
14. A method according to claim 13, wherein the axially displaceable probe is positioned in the second extreme position, and the analysis is performed in a static mode.
15. A method according to claim 13, wherein the axially displaceable probe is positioned away from the second extreme position, and the analysis is performed in a dynamic or in-flow mode.
16. A method according to claim 13, wherein the apparatus is utilised for conducting automated analyses according to a programmed series of events comprising dynamic and/or static sampling of a solid, particulate material.
17. Use of the apparatus according to any one of claims 1-12 in connection with operation units, continuous or batch, including powder transfer arrangements, blending devices, fluid bed drying, fluid bed granulation, compacting granulation, coating, spray drying or the like,
DK200800578A 2008-04-23 2008-04-23 LHP Sampler DK200800578A (en)

Priority Applications (1)

Application Number Priority Date Filing Date Title
DK200800578A DK200800578A (en) 2008-04-23 2008-04-23 LHP Sampler

Applications Claiming Priority (2)

Application Number Priority Date Filing Date Title
DK200800578 2008-04-23
DK200800578A DK200800578A (en) 2008-04-23 2008-04-23 LHP Sampler

Publications (1)

Publication Number Publication Date
DK200800578A true DK200800578A (en) 2008-04-23

Family

ID=39363780

Family Applications (1)

Application Number Title Priority Date Filing Date
DK200800578A DK200800578A (en) 2008-04-23 2008-04-23 LHP Sampler

Country Status (1)

Country Link
DK (1) DK200800578A (en)

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