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DE69332604D1 - Federkontaktstift mit zwei Kontaktnadeln - Google Patents

Federkontaktstift mit zwei Kontaktnadeln

Info

Publication number
DE69332604D1
DE69332604D1 DE69332604T DE69332604T DE69332604D1 DE 69332604 D1 DE69332604 D1 DE 69332604D1 DE 69332604 T DE69332604 T DE 69332604T DE 69332604 T DE69332604 T DE 69332604T DE 69332604 D1 DE69332604 D1 DE 69332604D1
Authority
DE
Germany
Prior art keywords
contact
spring
pins
pin
contact pin
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Expired - Fee Related
Application number
DE69332604T
Other languages
English (en)
Other versions
DE69332604T2 (de
Inventor
Jeffery P Stowers
Henri T Burgers
Paul D Blackard
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
Virginia Panel Corp
Original Assignee
Virginia Panel Corp
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Virginia Panel Corp filed Critical Virginia Panel Corp
Application granted granted Critical
Publication of DE69332604D1 publication Critical patent/DE69332604D1/de
Publication of DE69332604T2 publication Critical patent/DE69332604T2/de
Anticipated expiration legal-status Critical
Expired - Fee Related legal-status Critical Current

Links

Classifications

    • H—ELECTRICITY
    • H01—ELECTRIC ELEMENTS
    • H01R—ELECTRICALLY-CONDUCTIVE CONNECTIONS; STRUCTURAL ASSOCIATIONS OF A PLURALITY OF MUTUALLY-INSULATED ELECTRICAL CONNECTING ELEMENTS; COUPLING DEVICES; CURRENT COLLECTORS
    • H01R13/00—Details of coupling devices of the kinds covered by groups H01R12/70 or H01R24/00 - H01R33/00
    • H01R13/02—Contact members
    • H01R13/22—Contacts for co-operating by abutting
    • H01R13/24—Contacts for co-operating by abutting resilient; resiliently-mounted
    • H01R13/2407—Contacts for co-operating by abutting resilient; resiliently-mounted characterized by the resilient means
    • H01R13/2421—Contacts for co-operating by abutting resilient; resiliently-mounted characterized by the resilient means using coil springs
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
    • G01R1/00—Details of instruments or arrangements of the types included in groups G01R5/00 - G01R13/00 and G01R31/00
    • G01R1/02—General constructional details
    • G01R1/06—Measuring leads; Measuring probes
    • G01R1/067—Measuring probes
    • G01R1/06711—Probe needles; Cantilever beams; "Bump" contacts; Replaceable probe pins
    • G01R1/06716—Elastic
    • G01R1/06722—Spring-loaded
    • H—ELECTRICITY
    • H01—ELECTRIC ELEMENTS
    • H01R—ELECTRICALLY-CONDUCTIVE CONNECTIONS; STRUCTURAL ASSOCIATIONS OF A PLURALITY OF MUTUALLY-INSULATED ELECTRICAL CONNECTING ELEMENTS; COUPLING DEVICES; CURRENT COLLECTORS
    • H01R12/00—Structural associations of a plurality of mutually-insulated electrical connecting elements, specially adapted for printed circuits, e.g. printed circuit boards [PCB], flat or ribbon cables, or like generally planar structures, e.g. terminal strips, terminal blocks; Coupling devices specially adapted for printed circuits, flat or ribbon cables, or like generally planar structures; Terminals specially adapted for contact with, or insertion into, printed circuits, flat or ribbon cables, or like generally planar structures
    • H01R12/70—Coupling devices
    • H01R12/71—Coupling devices for rigid printing circuits or like structures
    • H01R12/712—Coupling devices for rigid printing circuits or like structures co-operating with the surface of the printed circuit or with a coupling device exclusively provided on the surface of the printed circuit
    • H01R12/714—Coupling devices for rigid printing circuits or like structures co-operating with the surface of the printed circuit or with a coupling device exclusively provided on the surface of the printed circuit with contacts abutting directly the printed circuit; Button contacts therefore provided on the printed circuit
    • H—ELECTRICITY
    • H01—ELECTRIC ELEMENTS
    • H01R—ELECTRICALLY-CONDUCTIVE CONNECTIONS; STRUCTURAL ASSOCIATIONS OF A PLURALITY OF MUTUALLY-INSULATED ELECTRICAL CONNECTING ELEMENTS; COUPLING DEVICES; CURRENT COLLECTORS
    • H01R13/00—Details of coupling devices of the kinds covered by groups H01R12/70 or H01R24/00 - H01R33/00
    • H01R13/02—Contact members
    • H01R13/22—Contacts for co-operating by abutting
    • H01R13/24—Contacts for co-operating by abutting resilient; resiliently-mounted
    • H01R13/2407—Contacts for co-operating by abutting resilient; resiliently-mounted characterized by the resilient means
    • H01R13/2414—Contacts for co-operating by abutting resilient; resiliently-mounted characterized by the resilient means conductive elastomers

Landscapes

  • Physics & Mathematics (AREA)
  • General Physics & Mathematics (AREA)
  • Measuring Leads Or Probes (AREA)
DE69332604T 1993-04-21 1993-07-09 Federkontaktstift mit zwei Kontaktnadeln Expired - Fee Related DE69332604T2 (de)

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
US08/049,395 US5420519A (en) 1992-03-10 1993-04-21 Double-headed spring contact probe assembly

Publications (2)

Publication Number Publication Date
DE69332604D1 true DE69332604D1 (de) 2003-02-06
DE69332604T2 DE69332604T2 (de) 2003-12-18

Family

ID=21959597

Family Applications (1)

Application Number Title Priority Date Filing Date
DE69332604T Expired - Fee Related DE69332604T2 (de) 1993-04-21 1993-07-09 Federkontaktstift mit zwei Kontaktnadeln

Country Status (3)

Country Link
US (1) US5420519A (de)
EP (1) EP0621485B1 (de)
DE (1) DE69332604T2 (de)

Families Citing this family (34)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US5576631A (en) * 1992-03-10 1996-11-19 Virginia Panel Corporation Coaxial double-headed spring contact probe assembly
US5942906A (en) * 1994-11-18 1999-08-24 Virginia Panel Corporation Interface system utilizing engagement mechanism
DE29519413U1 (de) * 1995-12-07 1996-01-25 TSK Prüfsysteme GmbH, 32457 Porta Westfalica Prüfstift
SG71046A1 (en) 1996-10-10 2000-03-21 Connector Systems Tech Nv High density connector and method of manufacture
US5877554A (en) * 1997-11-03 1999-03-02 Advanced Interconnections Corp. Converter socket terminal
US6222377B1 (en) * 1998-01-13 2001-04-24 Masatoshi Kato Circuit board probe device
US6104205A (en) * 1998-02-26 2000-08-15 Interconnect Devices, Inc. Probe with tab retainer
US6020635A (en) * 1998-07-07 2000-02-01 Advanced Interconnections Corporation Converter socket terminal
US5973267A (en) * 1998-07-13 1999-10-26 Huang; Jason Probe sheath
US6326799B1 (en) * 2000-02-29 2001-12-04 Charles A. Schein Wireless test fixture for testing printed circuit boards
EP1290454B1 (de) * 2000-06-16 2007-02-28 NHK Spring Co., Ltd. Mikrokontaktprüfnadel und elektrischer messfühler
US6605952B2 (en) * 2001-06-27 2003-08-12 Intel Corporation Zero connection for on-chip testing
US6882138B2 (en) * 2002-01-11 2005-04-19 Virginia Panel Corporation Modular test adapter for rapid action engagement interface
US6677772B1 (en) 2002-08-21 2004-01-13 Micron Technology, Inc. Contactor with isolated spring tips
JP3768183B2 (ja) * 2002-10-28 2006-04-19 山一電機株式会社 狭ピッチｉｃパッケージ用ｉｃソケット
US6910924B1 (en) 2004-01-20 2005-06-28 The Boeing Company Wireless CASS interface device
US7091415B2 (en) * 2004-08-16 2006-08-15 Virginia Panel Corporation Low profile mass interconnect device
US7179108B2 (en) * 2004-09-08 2007-02-20 Advanced Interconnections Corporation Hermaphroditic socket/adapter
US7114996B2 (en) * 2004-09-08 2006-10-03 Advanced Interconnections Corporation Double-pogo converter socket terminal
US7690925B2 (en) * 2005-02-24 2010-04-06 Advanced Interconnections Corp. Terminal assembly with pin-retaining socket
US7220134B2 (en) * 2005-02-24 2007-05-22 Advanced Interconnections Corporation Low profile LGA socket assembly
US7435102B2 (en) * 2005-02-24 2008-10-14 Advanced Interconnections Corporation Interconnecting electrical devices
US7267563B2 (en) * 2005-03-08 2007-09-11 Virginia Panel Corporation Dual engagement lever interface
US20070167038A1 (en) * 2006-01-18 2007-07-19 Glenn Goodman Hermaphroditic socket/adapter
US20080009148A1 (en) * 2006-07-07 2008-01-10 Glenn Goodman Guided pin and plunger
US7297014B1 (en) 2006-07-10 2007-11-20 Virginia Panel Corporation Spring lock interface engagement system
US8351218B2 (en) * 2008-03-05 2013-01-08 Virginia Panel Corporation Multi-tier mass interconnect device
US20100267291A1 (en) * 2009-04-20 2010-10-21 Scott Chabineau-Lovgren Swaging process for improved compliant contact electrical test performance
US8777675B2 (en) * 2012-09-26 2014-07-15 Intel Corporation Vertical contact for shielded sockets
CN106099486B (zh) * 2016-08-22 2019-11-26 深圳市华惠连接器有限公司 电连接器可伸缩接触件
SG11201903814UA (en) * 2016-11-30 2019-05-30 Nidec Read Corp Contact terminal, inspection jig, and inspection device
CN109103644A (zh) * 2018-08-31 2018-12-28 东莞中探探针有限公司 弹簧式探针
CN113109608A (zh) * 2021-04-12 2021-07-13 渭南高新区木王科技有限公司 一种多点面接触式单动测试探针
KR102708183B1 (ko) * 2021-11-24 2024-09-23 주식회사 에스디에이 스크류 프로브가 구비된 프로브카드 및 이의 제조방법

Family Cites Families (18)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US3157455A (en) * 1962-12-24 1964-11-17 Nippon Electric Co Electrical connector
US3255430A (en) * 1964-12-07 1966-06-07 New Twist Connector Corp Spirally wound pin connector
US4528500A (en) * 1980-11-25 1985-07-09 Lightbody James D Apparatus and method for testing circuit boards
CH645730A5 (fr) * 1982-01-08 1984-10-15 Technobal Sa Contact d'essai pour le test de circuits imprimes, et tete de contact amovible pour un tel contact d'essai.
JPS60127466A (ja) * 1983-12-14 1985-07-08 Yamaichi Seikou:Kk プロ−ブコンタクト
CH667925A5 (de) * 1984-03-08 1988-11-15 Feinmetall Gmbh Federkontaktstift fuer pruefadapter zum kontaktieren von prueflingen zwecks pruefung auf deren elektrische fehlerfreiheit.
US4749943A (en) * 1984-06-11 1988-06-07 Thomas Black Automatic test system
US4721903A (en) * 1985-02-27 1988-01-26 The Boeing Company Probe and method for electrically contacting surfaces with protective coatings
US4884024A (en) * 1985-11-19 1989-11-28 Teradyne, Inc. Test pin assembly for circuit board tester
US4636026A (en) * 1985-12-20 1987-01-13 Augat Inc. Electrical test probe
EP0242542A1 (de) * 1986-03-26 1987-10-28 Feinmetall Gesellschaft mit beschrÀ¤nkter Haftung Prüfadapter
EP0251040B1 (de) * 1986-06-23 1991-11-21 Feinmetall Gesellschaft mit beschrÀ¤nkter Haftung Federkontaktstift und Verfahren zu seiner Herstellung
JPS6398566A (ja) * 1986-10-15 1988-04-30 Seiko Epson Corp コンタクトプロ−ブ
US4935696A (en) * 1987-04-16 1990-06-19 Teradyne, Inc. Test pin assembly for circuit board tester
DE3820795A1 (de) * 1988-06-20 1989-12-21 Ingun Pruefmittelbau Gmbh Gefederter kontaktstift zum pruefen von prueflingen
US5034749A (en) * 1988-10-06 1991-07-23 Electro Scientific Industries, Inc. Sliding contact test apparatus
US5032787A (en) * 1989-11-03 1991-07-16 Everett/Charles Contact Products, Inc. Electrical test probe having rotational control of the probe shaft
US4983909A (en) * 1989-11-28 1991-01-08 Everett/Charles Contact Products, Inc. Repetitive-switching

Also Published As

Publication number Publication date
EP0621485A2 (de) 1994-10-26
US5420519A (en) 1995-05-30
EP0621485A3 (de) 1994-12-14
EP0621485B1 (de) 2003-01-02
DE69332604T2 (de) 2003-12-18

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Legal Events

Date Code Title Description
8364 No opposition during term of opposition
8339 Ceased/non-payment of the annual fee