DE69300587D1 - Mikrovakuumvorrichtung. - Google Patents
Mikrovakuumvorrichtung.Info
- Publication number
- DE69300587D1 DE69300587D1 DE69300587T DE69300587T DE69300587D1 DE 69300587 D1 DE69300587 D1 DE 69300587D1 DE 69300587 T DE69300587 T DE 69300587T DE 69300587 T DE69300587 T DE 69300587T DE 69300587 D1 DE69300587 D1 DE 69300587D1
- Authority
- DE
- Germany
- Prior art keywords
- vacuum device
- micro vacuum
- micro
- vacuum
- Prior art date
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
- Expired - Fee Related
Links
Classifications
-
- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01J—ELECTRIC DISCHARGE TUBES OR DISCHARGE LAMPS
- H01J31/00—Cathode ray tubes; Electron beam tubes
- H01J31/08—Cathode ray tubes; Electron beam tubes having a screen on or from which an image or pattern is formed, picked up, converted, or stored
- H01J31/10—Image or pattern display tubes, i.e. having electrical input and optical output; Flying-spot tubes for scanning purposes
- H01J31/12—Image or pattern display tubes, i.e. having electrical input and optical output; Flying-spot tubes for scanning purposes with luminescent screen
-
- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01J—ELECTRIC DISCHARGE TUBES OR DISCHARGE LAMPS
- H01J1/00—Details of electrodes, of magnetic control means, of screens, or of the mounting or spacing thereof, common to two or more basic types of discharge tubes or lamps
- H01J1/02—Main electrodes
- H01J1/13—Solid thermionic cathodes
- H01J1/20—Cathodes heated indirectly by an electric current; Cathodes heated by electron or ion bombardment
-
- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01J—ELECTRIC DISCHARGE TUBES OR DISCHARGE LAMPS
- H01J21/00—Vacuum tubes
- H01J21/02—Tubes with a single discharge path
- H01J21/06—Tubes with a single discharge path having electrostatic control means only
- H01J21/10—Tubes with a single discharge path having electrostatic control means only with one or more immovable internal control electrodes, e.g. triode, pentode, octode
- H01J21/105—Tubes with a single discharge path having electrostatic control means only with one or more immovable internal control electrodes, e.g. triode, pentode, octode with microengineered cathode and control electrodes, e.g. Spindt-type
Applications Claiming Priority (2)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| JP32638392 | 1992-12-07 | ||
| JP5329952A JPH08138561A (ja) | 1992-12-07 | 1993-11-30 | 微小真空デバイス |
Publications (2)
| Publication Number | Publication Date |
|---|---|
| DE69300587D1 true DE69300587D1 (de) | 1995-11-09 |
| DE69300587T2 DE69300587T2 (de) | 1996-03-28 |
Family
ID=26572170
Family Applications (1)
| Application Number | Title | Priority Date | Filing Date |
|---|---|---|---|
| DE69300587T Expired - Fee Related DE69300587T2 (de) | 1992-12-07 | 1993-12-07 | Mikrovakuumvorrichtung. |
Country Status (5)
| Country | Link |
|---|---|
| US (1) | US5463277A (de) |
| EP (1) | EP0601533B1 (de) |
| JP (1) | JPH08138561A (de) |
| KR (1) | KR0160530B1 (de) |
| DE (1) | DE69300587T2 (de) |
Families Citing this family (20)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| US5841219A (en) * | 1993-09-22 | 1998-11-24 | University Of Utah Research Foundation | Microminiature thermionic vacuum tube |
| JP3131339B2 (ja) * | 1993-12-22 | 2001-01-31 | 三菱電機株式会社 | 陰極、陰極線管および陰極線管の作動方法 |
| US5686779A (en) * | 1995-03-01 | 1997-11-11 | The United States Of America As Represented By The Secretary Of The Army | High sensitivity temperature sensor and sensor array |
| US5818166A (en) * | 1996-07-03 | 1998-10-06 | Si Diamond Technology, Inc. | Field emission device with edge emitter and method for making |
| US5955828A (en) * | 1996-10-16 | 1999-09-21 | University Of Utah Research Foundation | Thermionic optical emission device |
| JP3377162B2 (ja) * | 1997-01-17 | 2003-02-17 | 株式会社リコー | 熱分析装置およびその計測方法 |
| WO1999003603A1 (en) | 1997-07-16 | 1999-01-28 | Systemation Engineered Products, Inc. | Inspection handler apparatus and method |
| US6188939B1 (en) | 1997-08-18 | 2001-02-13 | The Texas A&M University System | Advanced law enforcement and response technology |
| JPH1196892A (ja) | 1997-09-17 | 1999-04-09 | Nec Corp | フィールドエミッタ |
| FR2792770A1 (fr) * | 1999-04-22 | 2000-10-27 | Cit Alcatel | Fonctionnement a haute pression d'une cathode froide a emission de champ |
| KR100749460B1 (ko) * | 2001-04-25 | 2007-08-14 | 삼성에스디아이 주식회사 | 전계 방출 표시소자와 그의 제조 방법 |
| US6995502B2 (en) | 2002-02-04 | 2006-02-07 | Innosys, Inc. | Solid state vacuum devices and method for making the same |
| US7005783B2 (en) | 2002-02-04 | 2006-02-28 | Innosys, Inc. | Solid state vacuum devices and method for making the same |
| US20060006787A1 (en) * | 2004-07-06 | 2006-01-12 | David Champion | Electronic device having a plurality of conductive beams |
| KR20070010660A (ko) * | 2005-07-19 | 2007-01-24 | 삼성에스디아이 주식회사 | 전자 방출 소자 및 이를 구비한 평판 디스플레이 장치 |
| US8719960B2 (en) * | 2008-01-31 | 2014-05-06 | The Board Of Trustees Of The University Of Illinois | Temperature-dependent nanoscale contact potential measurement technique and device |
| US8387443B2 (en) * | 2009-09-11 | 2013-03-05 | The Board Of Trustees Of The University Of Illinois | Microcantilever with reduced second harmonic while in contact with a surface and nano scale infrared spectrometer |
| WO2013016528A1 (en) * | 2011-07-28 | 2013-01-31 | The Board Of Trustees Of The University Of Illinois | Electron emission device |
| CN107346720B (zh) * | 2016-05-04 | 2020-09-01 | 中国科学院苏州纳米技术与纳米仿生研究所 | 场发射器件及其制作方法 |
| CN110875165A (zh) * | 2018-08-30 | 2020-03-10 | 中国科学院微电子研究所 | 一种场发射阴极电子源及其阵列 |
Family Cites Families (9)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| GB8621600D0 (en) * | 1986-09-08 | 1987-03-18 | Gen Electric Co Plc | Vacuum devices |
| US4855636A (en) * | 1987-10-08 | 1989-08-08 | Busta Heinz H | Micromachined cold cathode vacuum tube device and method of making |
| FR2641412B1 (fr) * | 1988-12-30 | 1991-02-15 | Thomson Tubes Electroniques | Source d'electrons du type a emission de champ |
| US5217401A (en) * | 1989-07-07 | 1993-06-08 | Matsushita Electric Industrial Co., Ltd. | Method of manufacturing a field-emission type switching device |
| JP2574500B2 (ja) * | 1990-03-01 | 1997-01-22 | 松下電器産業株式会社 | プレーナ型冷陰極の製造方法 |
| JPH0456040A (ja) * | 1990-06-22 | 1992-02-24 | Yokogawa Electric Corp | 微小真空デバイス |
| US5204588A (en) * | 1991-01-14 | 1993-04-20 | Sony Corporation | Quantum phase interference transistor |
| JPH04286825A (ja) * | 1991-03-15 | 1992-10-12 | Canon Inc | 熱電子放出素子 |
| US5145438A (en) * | 1991-07-15 | 1992-09-08 | Xerox Corporation | Method of manufacturing a planar microelectronic device |
-
1993
- 1993-11-30 JP JP5329952A patent/JPH08138561A/ja active Pending
- 1993-12-06 US US08/161,609 patent/US5463277A/en not_active Expired - Lifetime
- 1993-12-07 DE DE69300587T patent/DE69300587T2/de not_active Expired - Fee Related
- 1993-12-07 KR KR1019930026690A patent/KR0160530B1/ko not_active Expired - Fee Related
- 1993-12-07 EP EP93119687A patent/EP0601533B1/de not_active Expired - Lifetime
Also Published As
| Publication number | Publication date |
|---|---|
| US5463277A (en) | 1995-10-31 |
| EP0601533B1 (de) | 1995-10-04 |
| KR940016429A (ko) | 1994-07-23 |
| JPH08138561A (ja) | 1996-05-31 |
| KR0160530B1 (ko) | 1998-12-01 |
| EP0601533A1 (de) | 1994-06-15 |
| DE69300587T2 (de) | 1996-03-28 |
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Legal Events
| Date | Code | Title | Description |
|---|---|---|---|
| 8364 | No opposition during term of opposition | ||
| 8339 | Ceased/non-payment of the annual fee |