[go: up one dir, main page]

DE69200926D1 - Verfahren und anordnung zum eichen eines optischen pyrometers und standardplättchen dafür. - Google Patents

Verfahren und anordnung zum eichen eines optischen pyrometers und standardplättchen dafür.

Info

Publication number
DE69200926D1
DE69200926D1 DE69200926T DE69200926T DE69200926D1 DE 69200926 D1 DE69200926 D1 DE 69200926D1 DE 69200926 T DE69200926 T DE 69200926T DE 69200926 T DE69200926 T DE 69200926T DE 69200926 D1 DE69200926 D1 DE 69200926D1
Authority
DE
Germany
Prior art keywords
temperature value
reference region
pct
pyrometer
calibrating
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Expired - Lifetime
Application number
DE69200926T
Other languages
English (en)
Inventor
Jean-Marie Dilhac
Christian Ganibal
Bernard Rousset
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
EUROP COMMUNITIES
Original Assignee
EUROP COMMUNITIES
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by EUROP COMMUNITIES filed Critical EUROP COMMUNITIES
Application granted granted Critical
Publication of DE69200926D1 publication Critical patent/DE69200926D1/de
Anticipated expiration legal-status Critical
Expired - Lifetime legal-status Critical Current

Links

Classifications

    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01J—MEASUREMENT OF INTENSITY, VELOCITY, SPECTRAL CONTENT, POLARISATION, PHASE OR PULSE CHARACTERISTICS OF INFRARED, VISIBLE OR ULTRAVIOLET LIGHT; COLORIMETRY; RADIATION PYROMETRY
    • G01J5/00—Radiation pyrometry, e.g. infrared or optical thermometry
    • G01J5/0003—Radiation pyrometry, e.g. infrared or optical thermometry for sensing the radiant heat transfer of samples, e.g. emittance meter
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01J—MEASUREMENT OF INTENSITY, VELOCITY, SPECTRAL CONTENT, POLARISATION, PHASE OR PULSE CHARACTERISTICS OF INFRARED, VISIBLE OR ULTRAVIOLET LIGHT; COLORIMETRY; RADIATION PYROMETRY
    • G01J5/00—Radiation pyrometry, e.g. infrared or optical thermometry
    • G01J5/0003—Radiation pyrometry, e.g. infrared or optical thermometry for sensing the radiant heat transfer of samples, e.g. emittance meter
    • G01J5/0007—Radiation pyrometry, e.g. infrared or optical thermometry for sensing the radiant heat transfer of samples, e.g. emittance meter of wafers or semiconductor substrates, e.g. using Rapid Thermal Processing
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01J—MEASUREMENT OF INTENSITY, VELOCITY, SPECTRAL CONTENT, POLARISATION, PHASE OR PULSE CHARACTERISTICS OF INFRARED, VISIBLE OR ULTRAVIOLET LIGHT; COLORIMETRY; RADIATION PYROMETRY
    • G01J5/00—Radiation pyrometry, e.g. infrared or optical thermometry
    • G01J5/52—Radiation pyrometry, e.g. infrared or optical thermometry using comparison with reference sources, e.g. disappearing-filament pyrometer
    • G01J5/53—Reference sources, e.g. standard lamps; Black bodies

Landscapes

  • Physics & Mathematics (AREA)
  • General Physics & Mathematics (AREA)
  • Spectroscopy & Molecular Physics (AREA)
  • Testing Or Measuring Of Semiconductors Or The Like (AREA)
  • Radiation Pyrometers (AREA)
DE69200926T 1991-05-02 1992-05-04 Verfahren und anordnung zum eichen eines optischen pyrometers und standardplättchen dafür. Expired - Lifetime DE69200926D1 (de)

Applications Claiming Priority (2)

Application Number Priority Date Filing Date Title
LU87933A LU87933A1 (fr) 1991-05-02 1991-05-02 Procede et dispositif d'etalonnage d'un pyrometre optique et plaquettes etalons correspondantes
PCT/FR1992/000406 WO1992019943A1 (fr) 1991-05-02 1992-05-04 Procede et dispositif d'etalonnage d'un pyrometre optique et plaquettes etalons correspondantes

Publications (1)

Publication Number Publication Date
DE69200926D1 true DE69200926D1 (de) 1995-01-26

Family

ID=19731294

Family Applications (1)

Application Number Title Priority Date Filing Date
DE69200926T Expired - Lifetime DE69200926D1 (de) 1991-05-02 1992-05-04 Verfahren und anordnung zum eichen eines optischen pyrometers und standardplättchen dafür.

Country Status (10)

Country Link
US (1) US5553939A (de)
EP (1) EP0582645B1 (de)
JP (1) JPH06509638A (de)
AT (1) ATE115721T1 (de)
CA (1) CA2108571A1 (de)
DE (1) DE69200926D1 (de)
IE (1) IE72191B1 (de)
LU (1) LU87933A1 (de)
PT (1) PT100448A (de)
WO (1) WO1992019943A1 (de)

Families Citing this family (26)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
DE19513951C2 (de) * 1995-04-12 2002-04-11 Zinser Textilmaschinen Gmbh Verfahren für das Überwachen einer temperaturgeregelten Heizvorrichtung
IL117951A (en) * 1995-09-06 1999-09-22 3T True Temperature Technologi Method and apparatus for true temperature determination
US5938335A (en) * 1996-04-08 1999-08-17 Applied Materials, Inc. Self-calibrating temperature probe
US6536944B1 (en) * 1996-10-09 2003-03-25 Symyx Technologies, Inc. Parallel screen for rapid thermal characterization of materials
US5988874A (en) * 1997-09-05 1999-11-23 Advanced Micro Devices, Inc. Black body reference for RTA
KR100266328B1 (ko) * 1997-12-23 2000-10-02 김규현 티타늄실리사이드형성방법및이를이용한티타늄실리사이드의형성온도보정방법
WO2000006981A1 (de) * 1998-07-28 2000-02-10 Steag Rtp Systems Gmbh Verfahren und vorrichtung zum kalibrieren von emissivitätsunabhängigen temperaturmessungen
DE19934299C2 (de) * 1998-07-28 2003-04-03 Steag Ast Elektronik Gmbh Verfahren und Vorrichtung zum Kalibrieren von emissivitätsunabhängigen Temperaturmessungen
US6293696B1 (en) * 1999-05-03 2001-09-25 Steag Rtp Systems, Inc. System and process for calibrating pyrometers in thermal processing chambers
DE19922278B4 (de) * 1999-05-11 2004-02-12 Virtualfab Technologie Gmbh Verfahren zur Bestimmung des Emissions- bzw. Absorptionsgrades von Objekten
KR20030044378A (ko) * 2001-11-29 2003-06-09 주식회사 포스코 반사정보를 이용한 방사율 보정 온도계
CN101324470B (zh) * 2001-12-26 2011-03-30 加拿大马特森技术有限公司 测量温度和热处理的方法及系统
US7052180B2 (en) * 2002-01-04 2006-05-30 Kelvin Shih LED junction temperature tester
WO2004057650A1 (en) * 2002-12-20 2004-07-08 Mattson Technology Canada, Inc. Methods and systems for supporting a workpiece and for heat-treating the workpiece
DE102004018578B4 (de) * 2004-04-16 2007-02-22 Siemens Ag Verfahren und Vorrichtung zur Erfassung eines Verschmutzungsgrades eines betriebenen Umrichtergerätes
JP4683869B2 (ja) * 2004-07-08 2011-05-18 独立行政法人理化学研究所 半導体デバイスの故障診断方法と装置
US7275861B2 (en) * 2005-01-31 2007-10-02 Veeco Instruments Inc. Calibration wafer and method of calibrating in situ temperatures
DE102007042779B4 (de) * 2007-09-07 2009-07-09 Mattson Thermal Products Gmbh Kalibrationssubstrat und -verfahren
US8523427B2 (en) * 2008-02-27 2013-09-03 Analog Devices, Inc. Sensor device with improved sensitivity to temperature variation in a semiconductor substrate
US9070590B2 (en) 2008-05-16 2015-06-30 Mattson Technology, Inc. Workpiece breakage prevention method and apparatus
EP2365307B1 (de) * 2009-05-12 2012-07-18 LayTec Aktiengesellschaft Verfahren zur Kalibrierung eines Pyrometers, Verfahren zur Bestimmung der Temperatur eines Halbleiterwafers und System zur Bestimmung der Temperatur eines Halbleiterwafers
JP5590454B2 (ja) * 2010-10-05 2014-09-17 株式会社リコー 電気素子、集積素子及び電子回路
JP5590459B2 (ja) * 2010-12-08 2014-09-17 株式会社リコー 露点計測装置および気体特性測定装置
JP5590460B2 (ja) * 2010-12-08 2014-09-17 株式会社リコー 露点計測装置および気体特性測定装置
JP5590461B2 (ja) * 2010-12-08 2014-09-17 株式会社リコー 露点計測装置および気体特性測定装置
US8749629B2 (en) * 2011-02-09 2014-06-10 Siemens Energy, Inc. Apparatus and method for temperature mapping a turbine component in a high temperature combustion environment

Family Cites Families (8)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US4475823A (en) * 1982-04-09 1984-10-09 Piezo Electric Products, Inc. Self-calibrating thermometer
US4502792A (en) * 1982-12-20 1985-03-05 Shell Oil Company Apparatus for calibrating a pyrometer
DE3601537A1 (de) * 1986-01-20 1987-07-23 Messerschmitt Boelkow Blohm Verfahren zum radiometrischen kalibrieren optoelektronischer sensoren
GB2186968B (en) * 1986-02-20 1990-03-21 Metal Box Co Ltd Temperature monitoring systems
US4854727A (en) * 1987-10-26 1989-08-08 Ag Processing Technologies, Inc. Emissivity calibration apparatus and method
US4969748A (en) * 1989-04-13 1990-11-13 Peak Systems, Inc. Apparatus and method for compensating for errors in temperature measurement of semiconductor wafers during rapid thermal processing
US5221142A (en) * 1991-05-20 1993-06-22 Peak Systems, Inc. Method and apparatus for temperature measurement using thermal expansion
US5265957A (en) * 1992-08-11 1993-11-30 Texas Instruments Incorporated Wireless temperature calibration device and method

Also Published As

Publication number Publication date
EP0582645B1 (de) 1994-12-14
IE921487A1 (en) 1992-11-04
IE72191B1 (en) 1997-03-26
EP0582645A1 (de) 1994-02-16
JPH06509638A (ja) 1994-10-27
ATE115721T1 (de) 1994-12-15
PT100448A (pt) 1994-04-29
WO1992019943A1 (fr) 1992-11-12
CA2108571A1 (fr) 1992-11-03
US5553939A (en) 1996-09-10
LU87933A1 (fr) 1992-12-15

Similar Documents

Publication Publication Date Title
DE69200926D1 (de) Verfahren und anordnung zum eichen eines optischen pyrometers und standardplättchen dafür.
ATE207611T1 (de) Verfahren und gerät zur messung der substrattemperatur
AU1064092A (en) Fertility probe
DE69820670D1 (de) Absolutmessung von eigenschaften mit luftkalibrierung
KR970077431A (ko) 기판 온도 측정을 위한 방법 및 장치
DK203191D0 (da) Fremgangsmaade og apparat til bestemmelse af relevante blodparametre
CA2062757A1 (en) Measuring apparatus and method
FR2628213B1 (fr) Sonde perfectionnee pour mesures spectrometriques de resonances magnetiques aux tres hautes temperatures
JPH02245624A (ja) 放射温度測定装置
ATE158075T1 (de) Verfahren und vorrichtung, zwei magnetische sensoren und eine laser-messeinrichtung enthaltend, für das messen der dicke eines filmes
JP2000121681A (ja) 電気回路の共振周波数測定方法及び装置
JPS5542058A (en) Method of measuring temperature in furnace
JPS5618440A (en) Measuring method for precision film thickness of silicon thin film grown on sapphire substrate
JPS6475902A (en) Method for measuring refractive index and film thickness
CN217005751U (zh) 热波成像涂层厚度测量系统
FR2628214B1 (fr) Sonde pour mesures spectrometriques de resonances magnetiques aux tres hautes temperatures
JPS59231445A (ja) 交番電流による変態量率の測定方法
RU94038297A (ru) Способ неразрушающего контроля поверхности объекта
GB2009414A (en) Thickness measuring device and method
SU669220A1 (ru) Способ измерени температуры магнитооптического материала
JPS6438620A (en) Measuring method of contact stress of pin by ultrasonic wave
JPH0548405B2 (de)
SU1100496A1 (ru) Устройство дл измерени деформаций поверхности объекта
RU2033603C1 (ru) Способ измерения коэффициента отражения
SU1384931A1 (ru) Способ измерени деформации объекта

Legal Events

Date Code Title Description
8332 No legal effect for de