DE69936701D1 - Sensormatrixanordnung - Google Patents

Sensormatrixanordnung

Info

Publication number: DE69936701D1
Authority: DE; Germany
Prior art keywords: sensor array; array; sensor
Prior art date: 1998-11-02
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.): Expired - Lifetime

Application number

DE69936701T

Other languages

English (en)

Other versions

DE69936701T2 (de

Inventor

Frederick A Perner

Min Cao

Charles M C Tan

Jeremy A Theil

Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)

Aptina Imaging Corp

Original Assignee

Hewlett Packard Co

Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)

1998-11-02

Filing date

1999-11-01

Publication date

2007-09-13

1999-11-01 Application filed by Hewlett Packard Co filed Critical Hewlett Packard Co

2007-09-13 Publication of DE69936701D1 publication Critical patent/DE69936701D1/de

2008-06-12 Application granted granted Critical

2008-06-12 Publication of DE69936701T2 publication Critical patent/DE69936701T2/de

2019-11-02 Anticipated expiration legal-status Critical

Status Expired - Lifetime legal-status Critical Current

Classifications

- H—ELECTRICITY
- H10—SEMICONDUCTOR DEVICES; ELECTRIC SOLID-STATE DEVICES NOT OTHERWISE PROVIDED FOR
- H10F—INORGANIC SEMICONDUCTOR DEVICES SENSITIVE TO INFRARED RADIATION, LIGHT, ELECTROMAGNETIC RADIATION OF SHORTER WAVELENGTH OR CORPUSCULAR RADIATION
- H10F39/00—Integrated devices, or assemblies of multiple devices, comprising at least one element covered by group H10F30/00, e.g. radiation detectors comprising photodiode arrays
- H10F39/80—Constructional details of image sensors
- H10F39/802—Geometry or disposition of elements in pixels, e.g. address-lines or gate electrodes

DE69936701T 1998-11-02 1999-11-01 Sensormatrixanordnung Expired - Lifetime DE69936701T2 (de)

Applications Claiming Priority (2)

Application Number	Priority Date	Filing Date	Title
US184426		1998-11-02
US09/184,426 US6545711B1 (en)	1998-11-02	1998-11-02	Photo diode pixel sensor array having a guard ring

Publications (2)

Publication Number	Publication Date
DE69936701D1 true DE69936701D1 (de)	2007-09-13
DE69936701T2 DE69936701T2 (de)	2008-06-12

Family

ID=22676815

Family Applications (1)

Application Number	Title	Priority Date	Filing Date
DE69936701T Expired - Lifetime DE69936701T2 (de)	1998-11-02	1999-11-01	Sensormatrixanordnung

Country Status (4)

Country	Link
US (1)	US6545711B1 (de)
EP (1)	EP0999596B1 (de)
JP (1)	JP2000138363A (de)
DE (1)	DE69936701T2 (de)

Families Citing this family (6)

* Cited by examiner, † Cited by third party
Publication number	Priority date	Publication date	Assignee	Title
JP2000131444A (ja) *	1998-10-28	2000-05-12	Canon Inc	放射線検出装置、放射線検出システム、及び放射線検出装置の製造方法
US6928144B2 (en) *	2003-08-01	2005-08-09	General Electric Company	Guard ring for direct photo-to-electron conversion detector array
US7414653B2 (en) *	2003-12-19	2008-08-19	Micron Technology, Inc.	Dark reduction via feedback control of photodiode bias
US7528420B2 (en) *	2007-05-23	2009-05-05	Visera Technologies Company Limited	Image sensing devices and methods for fabricating the same
US8753917B2 (en) *	2010-12-14	2014-06-17	International Business Machines Corporation	Method of fabricating photoconductor-on-active pixel device
EP3502957B1 (de) *	2017-12-21	2021-07-21	Fingerprint Cards AB	Fingerabdruckerfassungsvorrichtung mit kantenkompensierender struktur

Family Cites Families (18)

* Cited by examiner, † Cited by third party
Publication number	Priority date	Publication date	Assignee	Title
JPS6149569A (ja) *	1984-08-17	1986-03-11	Matsushita Electronics Corp	固体撮像装置
JP2509592B2 (ja) *	1986-12-26	1996-06-19	株式会社東芝	積層型固体撮像装置
US5497146A (en) *	1992-06-03	1996-03-05	Frontec, Incorporated	Matrix wiring substrates
US5535084A (en) *	1992-07-24	1996-07-09	Kawasaki Steel Corporation	Semiconductor integrated circuit having protection circuits
GB9226890D0 (en) *	1992-12-23	1993-02-17	Philips Electronics Uk Ltd	An imaging device
JPH06291294A (ja) *	1993-03-31	1994-10-18	Toshiba Corp	固体撮像装置
JP2601143B2 (ja) *	1993-06-17	1997-04-16	日本電気株式会社	半導体装置
US5751049A (en) *	1993-08-16	1998-05-12	Texas Instruments Incorporated	Two-color infrared detector
JPH08195442A (ja) *	1995-01-17	1996-07-30	Sony Corp	半導体集積回路の保護回路
US5627850A (en) *	1995-03-20	1997-05-06	Paradigm Lasers, Inc.	Laser diode array
US6013923A (en) *	1995-07-31	2000-01-11	1294339 Ontario, Inc.	Semiconductor switch array with electrostatic discharge protection and method of fabricating
US5736732A (en) *	1996-12-23	1998-04-07	General Electric Company	Induced charge prevention in semiconductor imaging devices
KR100240872B1 (ko) *	1997-02-17	2000-01-15	윤종용	정전기 방전 보호 회로 및 그것을 구비하는 집적 회로
US5859450A (en) *	1997-09-30	1999-01-12	Intel Corporation	Dark current reducing guard ring
US6060763A (en) *	1997-11-14	2000-05-09	Nec Corporation	Semiconductor device and method for producing same
US6096618A (en) *	1998-01-20	2000-08-01	International Business Machines Corporation	Method of making a Schottky diode with sub-minimum guard ring
US6229192B1 (en) *	1998-01-27	2001-05-08	Ois Optical Imaging Systems, Inc.	Image sensor or LCD including switching pin diodes
US6018187A (en) *	1998-10-19	2000-01-25	Hewlett-Packard Cmpany	Elevated pin diode active pixel sensor including a unique interconnection structure

1998
- 1998-11-02 US US09/184,426 patent/US6545711B1/en not_active Expired - Lifetime
1999
- 1999-10-14 JP JP11293029A patent/JP2000138363A/ja active Pending
- 1999-11-01 EP EP99308662A patent/EP0999596B1/de not_active Expired - Lifetime
- 1999-11-01 DE DE69936701T patent/DE69936701T2/de not_active Expired - Lifetime

Also Published As

Publication number	Publication date
JP2000138363A (ja)	2000-05-16
US6545711B1 (en)	2003-04-08
EP0999596A2 (de)	2000-05-10
EP0999596B1 (de)	2007-08-01
DE69936701T2 (de)	2008-06-12
EP0999596A3 (de)	2001-05-09

Publication	Publication Date	Title
DE69912887D1 (de)	2003-12-24	Sensor
DE59811545D1 (de)	2004-07-15	Messaufnehmer
DE69938221D1 (de)	2008-04-10	Positionssensor
DE69917403T8 (de)	2005-04-21	Glukose-sensor
DE59812495D1 (de)	2005-02-24	Winkelsensor
DE59914644D1 (de)	2008-03-20	Optischer Sensor
DE59911604D1 (de)	2005-03-17	Optischer sensor
DE59712724D1 (de)	2006-10-19	Füllstandsgeber
DE59909301D1 (de)	2004-06-03	Optischer sensor
DE69934776D1 (de)	2007-02-22	Positionssensor
DE69835247D1 (de)	2006-08-31	Verbesserte Sensoranordnungen
NO20005270D0 (no)	2000-10-19	Elektrokjemisk føler
DE60033722D1 (de)	2007-04-19	Bildsensoranordnung
DE59814373D1 (de)	2009-08-27	Füllstandssensor
DE50015835D1 (de)	2010-02-25	Sensor
DE69939508D1 (de)	2008-10-23	Optischer Sensor
DE19983808T1 (de)	2002-01-10	Differenz-VGMR-Sensor
DE59809734D1 (de)	2003-10-30	Wegsensor
DE59712865D1 (de)	2007-09-06	Sensoranordnung
DE59906220D1 (de)	2003-08-14	Weg-Winkel-Sensor
DE19881346D2 (de)	2000-08-10	Sensorelement
DE69824398D1 (de)	2004-07-15	Photodiodenanordnung
DE19815150B4 (de)	2005-03-10	Sensoranordnung
NO991000D0 (no)	1999-03-01	Sensorelement
DE59812166D1 (de)	2004-12-02	Winkelsensor

Legal Events

Date	Code	Title	Description
2008-05-08	8327	Change in the person/name/address of the patent owner	Owner name: HEWLETT-PACKARD DEVELOPMENT CO., L.P., HOUSTON, US
2008-08-07	8327	Change in the person/name/address of the patent owner	Owner name: MICRON TECHNOLOGY, INC., BOISE, ID., US
2008-08-21	8364	No opposition during term of opposition
2010-06-24	8327	Change in the person/name/address of the patent owner	Owner name: APTINA IMAGING CORP., GRAND CAYMAN, CAYMAN ISL, KY