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DE69615883D1 - Verfahren für DRAM-Kondensator-Elektrode - Google Patents

Verfahren für DRAM-Kondensator-Elektrode

Info

Publication number
DE69615883D1
DE69615883D1 DE69615883T DE69615883T DE69615883D1 DE 69615883 D1 DE69615883 D1 DE 69615883D1 DE 69615883 T DE69615883 T DE 69615883T DE 69615883 T DE69615883 T DE 69615883T DE 69615883 D1 DE69615883 D1 DE 69615883D1
Authority
DE
Germany
Prior art keywords
capacitor electrode
dram capacitor
dram
electrode
capacitor
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Expired - Lifetime
Application number
DE69615883T
Other languages
English (en)
Other versions
DE69615883T2 (de
Inventor
Darius L Crenshaw
Rick L Wise
Jeffrey Mckee
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
Texas Instruments Inc
Original Assignee
Texas Instruments Inc
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Texas Instruments Inc filed Critical Texas Instruments Inc
Publication of DE69615883D1 publication Critical patent/DE69615883D1/de
Application granted granted Critical
Publication of DE69615883T2 publication Critical patent/DE69615883T2/de
Anticipated expiration legal-status Critical
Expired - Lifetime legal-status Critical Current

Links

Classifications

    • H—ELECTRICITY
    • H10—SEMICONDUCTOR DEVICES; ELECTRIC SOLID-STATE DEVICES NOT OTHERWISE PROVIDED FOR
    • H10B—ELECTRONIC MEMORY DEVICES
    • H10B12/00—Dynamic random access memory [DRAM] devices
    • H10B12/01—Manufacture or treatment
    • H10B12/02—Manufacture or treatment for one transistor one-capacitor [1T-1C] memory cells
    • H10B12/03—Making the capacitor or connections thereto
    • H10B12/033—Making the capacitor or connections thereto the capacitor extending over the transistor
    • H—ELECTRICITY
    • H10—SEMICONDUCTOR DEVICES; ELECTRIC SOLID-STATE DEVICES NOT OTHERWISE PROVIDED FOR
    • H10B—ELECTRONIC MEMORY DEVICES
    • H10B12/00—Dynamic random access memory [DRAM] devices
    • H10B12/30—DRAM devices comprising one-transistor - one-capacitor [1T-1C] memory cells
    • H10B12/31—DRAM devices comprising one-transistor - one-capacitor [1T-1C] memory cells having a storage electrode stacked over the transistor
    • H10B12/318—DRAM devices comprising one-transistor - one-capacitor [1T-1C] memory cells having a storage electrode stacked over the transistor the storage electrode having multiple segments
    • H—ELECTRICITY
    • H10—SEMICONDUCTOR DEVICES; ELECTRIC SOLID-STATE DEVICES NOT OTHERWISE PROVIDED FOR
    • H10D—INORGANIC ELECTRIC SEMICONDUCTOR DEVICES
    • H10D1/00—Resistors, capacitors or inductors
    • H10D1/60—Capacitors
    • H10D1/68—Capacitors having no potential barriers
    • H10D1/692—Electrodes
    • H10D1/711—Electrodes having non-planar surfaces, e.g. formed by texturisation
    • H—ELECTRICITY
    • H10—SEMICONDUCTOR DEVICES; ELECTRIC SOLID-STATE DEVICES NOT OTHERWISE PROVIDED FOR
    • H10D—INORGANIC ELECTRIC SEMICONDUCTOR DEVICES
    • H10D1/00—Resistors, capacitors or inductors
    • H10D1/60—Capacitors
    • H10D1/68—Capacitors having no potential barriers
    • H10D1/692—Electrodes
    • H10D1/711—Electrodes having non-planar surfaces, e.g. formed by texturisation
    • H10D1/712—Electrodes having non-planar surfaces, e.g. formed by texturisation being rough surfaces, e.g. using hemispherical grains
    • H—ELECTRICITY
    • H10—SEMICONDUCTOR DEVICES; ELECTRIC SOLID-STATE DEVICES NOT OTHERWISE PROVIDED FOR
    • H10D—INORGANIC ELECTRIC SEMICONDUCTOR DEVICES
    • H10D1/00—Resistors, capacitors or inductors
    • H10D1/60—Capacitors
    • H10D1/68—Capacitors having no potential barriers
    • H10D1/692—Electrodes
    • H10D1/711—Electrodes having non-planar surfaces, e.g. formed by texturisation
    • H10D1/714—Electrodes having non-planar surfaces, e.g. formed by texturisation having horizontal extensions
    • H—ELECTRICITY
    • H10—SEMICONDUCTOR DEVICES; ELECTRIC SOLID-STATE DEVICES NOT OTHERWISE PROVIDED FOR
    • H10D—INORGANIC ELECTRIC SEMICONDUCTOR DEVICES
    • H10D1/00—Resistors, capacitors or inductors
    • H10D1/60—Capacitors
    • H10D1/68—Capacitors having no potential barriers
    • H10D1/692—Electrodes
    • H10D1/711—Electrodes having non-planar surfaces, e.g. formed by texturisation
    • H10D1/716—Electrodes having non-planar surfaces, e.g. formed by texturisation having vertical extensions

Landscapes

  • Engineering & Computer Science (AREA)
  • Manufacturing & Machinery (AREA)
  • Semiconductor Memories (AREA)
  • Semiconductor Integrated Circuits (AREA)
DE69615883T 1995-03-09 1996-02-21 Verfahren für DRAM-Kondensator-Elektrode Expired - Lifetime DE69615883T2 (de)

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
US08/401,740 US5726085A (en) 1995-03-09 1995-03-09 Method of fabricating a dynamic random access memory (DRAM) cell capacitor using hemispherical grain (HSG) polysilicon and selective polysilicon etchback

Publications (2)

Publication Number Publication Date
DE69615883D1 true DE69615883D1 (de) 2001-11-22
DE69615883T2 DE69615883T2 (de) 2002-05-16

Family

ID=23589030

Family Applications (1)

Application Number Title Priority Date Filing Date
DE69615883T Expired - Lifetime DE69615883T2 (de) 1995-03-09 1996-02-21 Verfahren für DRAM-Kondensator-Elektrode

Country Status (6)

Country Link
US (1) US5726085A (de)
EP (1) EP0732738B1 (de)
JP (1) JPH098250A (de)
KR (1) KR100441069B1 (de)
DE (1) DE69615883T2 (de)
TW (1) TW293158B (de)

Families Citing this family (35)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US5858838A (en) * 1998-02-23 1999-01-12 Taiwan Semiconductor Manufacturing Company, Ltd. Method for increasing DRAM capacitance via use of a roughened surface bottom capacitor plate
KR100224710B1 (ko) 1995-10-10 1999-10-15 윤종용 반도체 장치의 커패시터 제조 방법
JPH09121033A (ja) * 1995-10-24 1997-05-06 Sony Corp キャパシタの製造方法
KR970054170A (de) * 1995-12-25 1997-07-31
US5928969A (en) * 1996-01-22 1999-07-27 Micron Technology, Inc. Method for controlled selective polysilicon etching
US6027970A (en) * 1996-05-17 2000-02-22 Micron Technology, Inc. Method of increasing capacitance of memory cells incorporating hemispherical grained silicon
US5976931A (en) * 1996-08-30 1999-11-02 United Microelectronics Corp. Method for increasing capacitance
NL1004811C2 (nl) * 1996-12-18 1998-06-19 United Microelectronics Corp Werkwijze voor het verhogen van de capaciteit.
FR2758008B1 (fr) * 1996-12-30 1999-02-19 United Microelectronics Corp Procede pour augmenter la capacite dans des dispositifs a circuits integres
CN1057639C (zh) * 1997-04-10 2000-10-18 联华电子股份有限公司 半导体元件的制造方法
JP3039438B2 (ja) 1997-04-18 2000-05-08 日本電気株式会社 半導体記憶装置及びその製造方法
US6218260B1 (en) 1997-04-22 2001-04-17 Samsung Electronics Co., Ltd. Methods of forming integrated circuit capacitors having improved electrode and dielectric layer characteristics and capacitors formed thereby
KR100274593B1 (ko) * 1997-09-04 2000-12-15 윤종용 디램 셀 캐패시터 및 그의 제조 방법
US5866455A (en) * 1997-10-20 1999-02-02 Texas Instruments - Acer Incorporated Method for forming a dram cell with a multiple pillar-shaped capacitor
TW350119B (en) * 1997-10-24 1999-01-11 Nan Ya Tech Corporation Manufacturing method and the structure of IC capacitors the invention relates to a manufacturing method and the structure of IC capacitors
KR100273987B1 (ko) 1997-10-31 2001-02-01 윤종용 디램 장치 및 제조 방법
TW401598B (en) * 1997-11-27 2000-08-11 United Microelectronics Corp The manufacture method of hemispherical grain silicon (HSG-Si)
TW382807B (en) * 1997-12-01 2000-02-21 United Microelectronics Corp Method for fabricating DRAM capacitor
TW364162B (en) * 1997-12-05 1999-07-11 United Microelectronics Corp Process for charge storage electrode structure
TW364205B (en) * 1997-12-19 1999-07-11 United Microelectronics Corp Method for producing DRAM capacitor
KR100319207B1 (ko) 1998-06-15 2002-01-05 윤종용 메모리 셀의 실린더형 스토리지 커패시터 및 그 제조방법
US6037219A (en) * 1998-06-25 2000-03-14 Vanguard International Semiconductor Corporation One step in situ doped amorphous silicon layers used for selective hemispherical grain silicon formation for crown shaped capacitor applications
US6127221A (en) * 1998-09-10 2000-10-03 Vanguard International Semiconductor Corporation In situ, one step, formation of selective hemispherical grain silicon layer, and a nitride-oxide dielectric capacitor layer, for a DRAM application
TW455935B (en) * 1998-09-21 2001-09-21 Mosel Vitelic Inc Manufacture method of hemi-spherical grain structure on surface of semiconductor substrate
US6762057B1 (en) * 1998-10-23 2004-07-13 Micron Technology, Inc. Separation apparatus including porous silicon column
US7115422B1 (en) 1998-10-23 2006-10-03 Micron Technology, Inc. Separation apparatus including porous silicon column
KR100277909B1 (ko) * 1998-12-23 2001-02-01 김영환 커패시터의 구조 및 제조 방법
KR100363083B1 (ko) 1999-01-20 2002-11-30 삼성전자 주식회사 반구형 그레인 커패시터 및 그 형성방법
KR100317042B1 (ko) 1999-03-18 2001-12-22 윤종용 반구형 알갱이 실리콘을 가지는 실린더형 커패시터 및 그 제조방법
KR100322536B1 (ko) 1999-06-29 2002-03-18 윤종용 에치 백을 이용한 다결정 실리콘 컨택 플러그 형성방법 및 이를 이용한 반도체 소자의 제조방법
US6236080B1 (en) * 1999-07-22 2001-05-22 Worldwide Semiconductor Manufacturing Corp. Method of manufacturing a capacitor for high density DRAMs
US6194265B1 (en) 1999-07-22 2001-02-27 Vanguard International Semiconductor Corporation Process for integrating hemispherical grain silicon and a nitride-oxide capacitor dielectric layer for a dynamic random access memory capacitor structure
JP2011205143A (ja) * 1999-11-10 2011-10-13 Renesas Electronics Corp キャパシタを有する半導体装置およびその製造方法
KR100653979B1 (ko) * 2000-06-30 2006-12-05 주식회사 하이닉스반도체 캐패시터의 하부전극 형성방법
US6887755B2 (en) * 2003-09-05 2005-05-03 Micron Technology, Inc. Methods of forming rugged silicon-containing surfaces

Family Cites Families (11)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
KR930006730B1 (ko) * 1991-03-20 1993-07-23 삼성전자 주식회사 고집적 반도체 메모리장치의 커패시터 제조방법
US5256587A (en) * 1991-03-20 1993-10-26 Goldstar Electron Co., Ltd. Methods of patterning and manufacturing semiconductor devices
KR940009616B1 (ko) * 1991-09-09 1994-10-15 금성일렉트론 주식회사 홀 캐패시터 셀 및 그 제조방법
KR950009740B1 (ko) * 1991-11-12 1995-08-26 금성일렉트론주식회사 메모리 캐패시터 제조방법 및 그 구조
TW221720B (de) * 1991-11-15 1994-03-11 Gold Star Co
US5350707A (en) * 1991-11-19 1994-09-27 Samsung Electronics Co., Ltd. Method for making a capacitor having an electrode surface with a plurality of trenches formed therein
KR960002097B1 (ko) * 1992-02-28 1996-02-10 삼성전자주식회사 반도체장치의 커패시터 제조방법
US5204280A (en) * 1992-04-09 1993-04-20 International Business Machines Corporation Process for fabricating multiple pillars inside a dram trench for increased capacitor surface
DE4321638A1 (de) * 1992-09-19 1994-03-24 Samsung Electronics Co Ltd Halbleiterspeicherbauelement mit einem Kondensator und Verfahren zu seiner Herstellung
JPH06275778A (ja) * 1993-03-23 1994-09-30 Sony Corp キャパシタの形成方法
JPH07122652A (ja) * 1993-10-28 1995-05-12 Sanyo Electric Co Ltd 半導体装置の製造方法

Also Published As

Publication number Publication date
KR100441069B1 (ko) 2004-12-03
JPH098250A (ja) 1997-01-10
EP0732738B1 (de) 2001-10-17
DE69615883T2 (de) 2002-05-16
TW293158B (de) 1996-12-11
EP0732738A1 (de) 1996-09-18
US5726085A (en) 1998-03-10

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Legal Events

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