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DE68924744D1 - Kontaktstiftelektronik-Einrichtung mit Phasenjustierung für einen IC-Tester und Verfahren zur Phasenjustierung. - Google Patents

Kontaktstiftelektronik-Einrichtung mit Phasenjustierung für einen IC-Tester und Verfahren zur Phasenjustierung.

Info

Publication number
DE68924744D1
DE68924744D1 DE68924744T DE68924744T DE68924744D1 DE 68924744 D1 DE68924744 D1 DE 68924744D1 DE 68924744 T DE68924744 T DE 68924744T DE 68924744 T DE68924744 T DE 68924744T DE 68924744 D1 DE68924744 D1 DE 68924744D1
Authority
DE
Germany
Prior art keywords
phase adjustment
tester
contact pin
electronics device
pin electronics
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Expired - Fee Related
Application number
DE68924744T
Other languages
English (en)
Other versions
DE68924744T2 (de
Inventor
Kenji Yoshida
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
Advantest Corp
Original Assignee
Advantest Corp
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Advantest Corp filed Critical Advantest Corp
Application granted granted Critical
Publication of DE68924744D1 publication Critical patent/DE68924744D1/de
Publication of DE68924744T2 publication Critical patent/DE68924744T2/de
Anticipated expiration legal-status Critical
Expired - Fee Related legal-status Critical Current

Links

Classifications

    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
    • G01R31/00—Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere
    • G01R31/28—Testing of electronic circuits, e.g. by signal tracer
    • G01R31/317—Testing of digital circuits
    • G01R31/3181—Functional testing
    • G01R31/319—Tester hardware, i.e. output processing circuits
    • G01R31/31903—Tester hardware, i.e. output processing circuits tester configuration
    • G01R31/31908—Tester set-up, e.g. configuring the tester to the device under test [DUT], down loading test patterns
    • G01R31/3191—Calibration

Landscapes

  • Engineering & Computer Science (AREA)
  • General Engineering & Computer Science (AREA)
  • Physics & Mathematics (AREA)
  • General Physics & Mathematics (AREA)
  • Tests Of Electronic Circuits (AREA)
DE68924744T 1988-08-29 1989-08-28 Kontaktstiftelektronik-Einrichtung mit Phasenjustierung für einen IC-Tester und Verfahren zur Phasenjustierung. Expired - Fee Related DE68924744T2 (de)

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
JP63215855A JP2688941B2 (ja) 1988-08-29 1988-08-29 位相補正装置

Publications (2)

Publication Number Publication Date
DE68924744D1 true DE68924744D1 (de) 1995-12-14
DE68924744T2 DE68924744T2 (de) 1996-05-02

Family

ID=16679392

Family Applications (1)

Application Number Title Priority Date Filing Date
DE68924744T Expired - Fee Related DE68924744T2 (de) 1988-08-29 1989-08-28 Kontaktstiftelektronik-Einrichtung mit Phasenjustierung für einen IC-Tester und Verfahren zur Phasenjustierung.

Country Status (4)

Country Link
US (1) US4929888A (de)
EP (1) EP0356967B1 (de)
JP (1) JP2688941B2 (de)
DE (1) DE68924744T2 (de)

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US5025205A (en) * 1989-06-22 1991-06-18 Texas Instruments Incorporated Reconfigurable architecture for logic test system
US5235566A (en) * 1989-09-07 1993-08-10 Amdahl Corporation Clock skew measurement technique
US5003256A (en) * 1989-09-07 1991-03-26 Amdahl Corporation Clock skew measurement technique
JP2582906B2 (ja) * 1989-10-21 1997-02-19 東芝マイクロエレクトロニクス株式会社 半導体装置の直流電流・電圧特性の測定方法
US5293626A (en) * 1990-06-08 1994-03-08 Cray Research, Inc. Clock distribution apparatus and processes particularly useful in multiprocessor systems
JPH0481675A (ja) * 1990-07-25 1992-03-16 Mitsubishi Electric Corp 半導体デバイステスト装置
US5225772A (en) * 1990-09-05 1993-07-06 Schlumberger Technologies, Inc. Automatic test equipment system using pin slice architecture
US5212443A (en) * 1990-09-05 1993-05-18 Schlumberger Technologies, Inc. Event sequencer for automatic test equipment
US5471136A (en) * 1991-07-24 1995-11-28 Genrad Limited Test system for calculating the propagation delays in signal paths leading to a plurality of pins associated with a circuit
FR2682191B1 (fr) * 1991-10-04 1995-08-11 Aerospatiale Methode de compensation automatique des incertitudes de temps d'un systeme electronique teste par un testeur automatique.
US5268639A (en) * 1992-06-05 1993-12-07 Rambus, Inc. Testing timing parameters of high speed integrated circuit devices
US5402079A (en) * 1992-12-18 1995-03-28 Vlsi Technology, Inc. Integrated circuit relay control system
JP3591657B2 (ja) * 1993-10-13 2004-11-24 株式会社アドバンテスト 半導体ｉｃ試験装置
US5459738A (en) * 1994-01-26 1995-10-17 Watari; Hiromichi Apparatus and method for digital circuit testing
JPH07294605A (ja) * 1994-04-22 1995-11-10 Advantest Corp 半導体試験装置用校正データの転送装置及びその方法
US5521493A (en) * 1994-11-21 1996-05-28 Megatest Corporation Semiconductor test system including a novel driver/load circuit
US5589766A (en) * 1995-04-06 1996-12-31 General Electric Company Field-testable integrated circuit and method of testing
JPH09318704A (ja) * 1996-05-30 1997-12-12 Ando Electric Co Ltd Ｉｃ試験装置
KR100245929B1 (ko) * 1997-06-30 2000-03-02 윤종용 클록 사용 제한조건이 설정된 고속 메모리 소자 검사방법
US6820234B2 (en) 1998-06-29 2004-11-16 Acuid Limited Skew calibration means and a method of skew calibration
WO2000000836A1 (en) 1998-06-29 2000-01-06 Iliya Valeryevich Klochkov A skew calibration means and a method of skew calibration
US6158030A (en) 1998-08-21 2000-12-05 Micron Technology, Inc. System and method for aligning output signals in massively parallel testers and other electronic devices
US6329833B1 (en) * 1999-02-24 2001-12-11 Xilinx, Inc. System and method for automatically measuring input voltage levels for integrated circuits
JP4118463B2 (ja) * 1999-07-23 2008-07-16 株式会社アドバンテスト タイミング保持機能を搭載したｉｃ試験装置
JP2001141792A (ja) * 1999-10-01 2001-05-25 Schlumberger Technol Inc 源同期信号出力を有する電子デバイスを試験する方法および装置
US6642734B1 (en) * 1999-12-01 2003-11-04 Hitachi Electronics Engineering Co., Ltd. Method and apparatus to generate a ground level of a semiconductor IC tester having a plurality of substrates
US6622103B1 (en) * 2000-06-20 2003-09-16 Formfactor, Inc. System for calibrating timing of an integrated circuit wafer tester
US6441666B1 (en) 2000-07-20 2002-08-27 Silicon Graphics, Inc. System and method for generating clock signals
JP4508385B2 (ja) * 2000-08-31 2010-07-21 株式会社アドバンテスト タイミング発生器及び半導体試験装置
US6677775B2 (en) * 2001-01-10 2004-01-13 Analog Devices, Inc. Circuit testing device using a driver to perform electronics testing
JP2002296329A (ja) * 2001-03-30 2002-10-09 Agilent Technologies Japan Ltd 集積回路の試験装置
CN1680820B (zh) 2001-06-07 2010-09-29 株式会社艾德温特斯特 半导体试验装置的校准方法
US6940271B2 (en) * 2001-08-17 2005-09-06 Nptest, Inc. Pin electronics interface circuit
DE10330043B4 (de) * 2003-06-30 2007-09-27 Infineon Technologies Ag System und Kalibrierverfahren
KR100505425B1 (ko) * 2003-06-30 2005-08-04 주식회사 하이닉스반도체 반도체 장치에서의 신호의 지연 시간 제어 방법
EP2081036A3 (de) * 2003-09-09 2010-06-09 Advantest Corporation Tester
US7502974B2 (en) * 2006-02-22 2009-03-10 Verigy (Singapore) Pte. Ltd. Method and apparatus for determining which timing sets to pre-load into the pin electronics of a circuit test system, and for pre-loading or storing said timing sets
JP5235190B2 (ja) * 2007-03-20 2013-07-10 株式会社アドバンテスト クロックデータリカバリ回路、方法ならびにそれらを利用した試験装置
EP2136218A1 (de) 2007-03-22 2009-12-23 Advantest Corporation Datenempfangsschaltung, tester damit und timing-einstellschaltung für ein strobe-signal und verfahren
US8295182B2 (en) 2007-07-03 2012-10-23 Credence Systems Corporation Routed event test system and method
JP2009103469A (ja) * 2007-10-19 2009-05-14 Advantest Corp 試験装置、スキュー測定装置、デバイスおよびボード
US7755375B2 (en) * 2008-01-08 2010-07-13 Advantest Corporation Test apparatus, probe card, and test method
CN102057287B (zh) 2008-06-09 2013-08-21 株式会社爱德万测试 测试装置
US20100325372A1 (en) * 2009-06-17 2010-12-23 Housty Oswin E Parallel training of dynamic random access memory channel controllers
KR101315499B1 (ko) * 2009-06-29 2013-10-07 가부시키가이샤 어드밴티스트 시험 장치, 교정 방법 및 프로그램

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* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US31056A (en) * 1861-01-01 Nut-machine
USRE31056E (en) 1977-03-23 1982-10-12 Fairchild Camera & Instrument Corp. Computer controlled high-speed circuit for testing electronic devices
JPS5832178A (ja) * 1981-08-19 1983-02-25 Advantest Corp Ｉｃテスタ
US4635259A (en) * 1983-08-01 1987-01-06 Fairchild Semiconductor Corporation Method and apparatus for monitoring response signals during automated testing of electronic circuits
US4635256A (en) * 1983-08-01 1987-01-06 Fairchild Semiconductor Corporation Formatter for high speed test system
US4660197A (en) * 1985-11-01 1987-04-21 Teradyne, Inc. Circuitry for synchronizing a multiple channel circuit tester

Also Published As

Publication number Publication date
DE68924744T2 (de) 1996-05-02
EP0356967A2 (de) 1990-03-07
JP2688941B2 (ja) 1997-12-10
EP0356967A3 (de) 1991-07-03
JPH0262983A (ja) 1990-03-02
US4929888A (en) 1990-05-29
EP0356967B1 (de) 1995-11-08

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Legal Events

Date Code Title Description
8364 No opposition during term of opposition
8339 Ceased/non-payment of the annual fee