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DE68914617D1 - Nachweisvorrichtung für Kathodenlumineszenzanalyse. - Google Patents

Nachweisvorrichtung für Kathodenlumineszenzanalyse.

Info

Publication number
DE68914617D1
DE68914617D1 DE68914617T DE68914617T DE68914617D1 DE 68914617 D1 DE68914617 D1 DE 68914617D1 DE 68914617 T DE68914617 T DE 68914617T DE 68914617 T DE68914617 T DE 68914617T DE 68914617 D1 DE68914617 D1 DE 68914617D1
Authority
DE
Germany
Prior art keywords
detection device
cathode luminescence
luminescence analysis
analysis
cathode
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Expired - Lifetime
Application number
DE68914617T
Other languages
English (en)
Other versions
DE68914617T2 (de
Inventor
Marco Braglia
Franceschi Roberto De
Paolo Montangero
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
TIM SpA
Original Assignee
SIP SAS
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by SIP SAS filed Critical SIP SAS
Application granted granted Critical
Publication of DE68914617D1 publication Critical patent/DE68914617D1/de
Publication of DE68914617T2 publication Critical patent/DE68914617T2/de
Anticipated expiration legal-status Critical
Expired - Lifetime legal-status Critical Current

Links

Classifications

    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N23/00—Investigating or analysing materials by the use of wave or particle radiation, e.g. X-rays or neutrons, not covered by groups G01N3/00 – G01N17/00, G01N21/00 or G01N22/00
    • G01N23/22—Investigating or analysing materials by the use of wave or particle radiation, e.g. X-rays or neutrons, not covered by groups G01N3/00 – G01N17/00, G01N21/00 or G01N22/00 by measuring secondary emission from the material
    • G01N23/225—Investigating or analysing materials by the use of wave or particle radiation, e.g. X-rays or neutrons, not covered by groups G01N3/00 – G01N17/00, G01N21/00 or G01N22/00 by measuring secondary emission from the material using electron or ion
    • G01N23/2251—Investigating or analysing materials by the use of wave or particle radiation, e.g. X-rays or neutrons, not covered by groups G01N3/00 – G01N17/00, G01N21/00 or G01N22/00 by measuring secondary emission from the material using electron or ion using incident electron beams, e.g. scanning electron microscopy [SEM]
    • G01N23/2254—Measuring cathodoluminescence
    • H—ELECTRICITY
    • H01—ELECTRIC ELEMENTS
    • H01J—ELECTRIC DISCHARGE TUBES OR DISCHARGE LAMPS
    • H01J37/00—Discharge tubes with provision for introducing objects or material to be exposed to the discharge, e.g. for the purpose of examination or processing thereof
    • H01J37/02—Details
    • H01J37/244—Detectors; Associated components or circuits therefor
    • H—ELECTRICITY
    • H01—ELECTRIC ELEMENTS
    • H01J—ELECTRIC DISCHARGE TUBES OR DISCHARGE LAMPS
    • H01J2237/00—Discharge tubes exposing object to beam, e.g. for analysis treatment, etching, imaging
    • H01J2237/244—Detection characterized by the detecting means
    • H01J2237/2445—Photon detectors for X-rays, light, e.g. photomultipliers
    • H—ELECTRICITY
    • H01—ELECTRIC ELEMENTS
    • H01J—ELECTRIC DISCHARGE TUBES OR DISCHARGE LAMPS
    • H01J2237/00—Discharge tubes exposing object to beam, e.g. for analysis treatment, etching, imaging
    • H01J2237/245—Detection characterised by the variable being measured
    • H01J2237/24507—Intensity, dose or other characteristics of particle beams or electromagnetic radiation

Landscapes

  • Chemical & Material Sciences (AREA)
  • Analytical Chemistry (AREA)
  • Physics & Mathematics (AREA)
  • Health & Medical Sciences (AREA)
  • Life Sciences & Earth Sciences (AREA)
  • Biochemistry (AREA)
  • General Health & Medical Sciences (AREA)
  • General Physics & Mathematics (AREA)
  • Immunology (AREA)
  • Pathology (AREA)
  • Investigating, Analyzing Materials By Fluorescence Or Luminescence (AREA)
DE68914617T 1988-12-16 1989-12-14 Nachweisvorrichtung für Kathodenlumineszenzanalyse. Expired - Lifetime DE68914617T2 (de)

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
IT68115/88A IT1223998B (it) 1988-12-16 1988-12-16 Sistema di rivelazione per analisi in catodoluminescenza

Publications (2)

Publication Number Publication Date
DE68914617D1 true DE68914617D1 (de) 1994-05-19
DE68914617T2 DE68914617T2 (de) 1994-09-01

Family

ID=11307958

Family Applications (2)

Application Number Title Priority Date Filing Date
DE68914617T Expired - Lifetime DE68914617T2 (de) 1988-12-16 1989-12-14 Nachweisvorrichtung für Kathodenlumineszenzanalyse.
DE198989123169T Pending DE373656T1 (de) 1988-12-16 1989-12-14 Nachweisvorrichtung fuer kathodenlumineszenzanalyse.

Family Applications After (1)

Application Number Title Priority Date Filing Date
DE198989123169T Pending DE373656T1 (de) 1988-12-16 1989-12-14 Nachweisvorrichtung fuer kathodenlumineszenzanalyse.

Country Status (6)

Country Link
US (1) US5010253A (de)
EP (1) EP0373656B1 (de)
JP (1) JPH0660874B2 (de)
CA (1) CA2004551C (de)
DE (2) DE68914617T2 (de)
IT (1) IT1223998B (de)

Families Citing this family (14)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US5264704A (en) * 1992-11-17 1993-11-23 National University Of Singapore High efficiency cathodoluminescence detector with high discrimination against backscattered electrons
US5468967A (en) * 1994-08-26 1995-11-21 National University Of Singapore Double reflection cathodoluminescence detector with extremely high discrimination against backscattered electrons
US5724131A (en) * 1995-06-14 1998-03-03 The National University Of Singapore Integrated emission microscope for panchromatic imaging, continuous wavelength spectroscopy and selective area spectroscopic mapping
US5569920A (en) * 1995-06-14 1996-10-29 National University Of Singapore Retractable cathodoluminescence detector with high ellipticity and high backscattered electron rejection performance for large area specimens
US5741967A (en) * 1996-04-15 1998-04-21 Gas Research Institute Method for determining optimum horizontal drilling direction and drilling horizon
JPH09329557A (ja) * 1996-06-11 1997-12-22 Seiko Instr Inc マイクロ蛍光ｘ線分析装置
JP2002042713A (ja) * 2000-07-28 2002-02-08 Jeol Ltd 対物レンズ内検出器を備えた走査電子顕微鏡
DE102009046211B4 (de) * 2009-10-30 2017-08-24 Carl Zeiss Microscopy Gmbh Detektionsvorrichtung und Teilchenstrahlgerät mit Detektionsvorrichtung
US8410443B1 (en) * 2011-10-25 2013-04-02 Gatan, Inc. Integrated backscattered electron detector with cathodoluminescence collection optics
US20130140459A1 (en) * 2011-12-01 2013-06-06 Gatan, Inc. System and method for sample analysis by three dimensional cathodoluminescence
RU167351U1 (ru) * 2016-06-20 2017-01-10 Федеральное государственное бюджетное научное учреждение "Научно-исследовательский институт глазных болезней" Детектор катодолюминесценции для сканирующего электронного микроскопа
US11114274B2 (en) * 2019-12-23 2021-09-07 Carl Zeiss Smt Gmbh Method and system for testing an integrated circuit
US11443916B2 (en) * 2020-04-15 2022-09-13 Kla Corporation Thin pellicle material for protection of solid-state electron detectors
JP2025532970A (ja) * 2022-10-07 2025-10-03 シランナ・ユー・ブイ・テクノロジーズ・プライベート・リミテッド カソードルミネッセンスを使用した材料の表面特徴付け

Family Cites Families (6)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US3146347A (en) * 1961-08-25 1964-08-25 Lab For Electronics Inc Apparatus for analyzing material by excited x-rays
US3864570A (en) * 1973-09-24 1975-02-04 William P Zingaro Low energy x-ray detector
US4121010A (en) * 1977-07-27 1978-10-17 The United States Of America As Represented By The United States Department Of Energy Thermoluminescent phosphor
FR2410271A1 (fr) * 1977-11-29 1979-06-22 Anvar Perfectionnements aux procedes de micro-analyse faisant intervenir un rayonnement x
GB2133927B (en) * 1982-12-10 1986-09-03 Nat Res Dev Electroluminescent devices
US4806772A (en) * 1985-10-10 1989-02-21 Quantex Corporation Infrared sensing device outputting orange light and a process for making the same

Also Published As

Publication number Publication date
CA2004551C (en) 1994-03-08
JPH0660874B2 (ja) 1994-08-10
US5010253A (en) 1991-04-23
IT8868115A0 (it) 1988-12-16
DE68914617T2 (de) 1994-09-01
JPH02190747A (ja) 1990-07-26
EP0373656A2 (de) 1990-06-20
EP0373656B1 (de) 1994-04-13
IT1223998B (it) 1990-09-29
EP0373656A3 (de) 1991-06-12
DE373656T1 (de) 1991-09-26
CA2004551A1 (en) 1990-06-16

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Legal Events

Date Code Title Description
8364 No opposition during term of opposition
8327 Change in the person/name/address of the patent owner

Owner name: TELECOM ITALIA S.P.A., TURIN/TORINO, IT