[go: up one dir, main page]

DE60336077D1 - Optischer sensor - Google Patents

Optischer sensor

Info

Publication number
DE60336077D1
DE60336077D1 DE60336077T DE60336077T DE60336077D1 DE 60336077 D1 DE60336077 D1 DE 60336077D1 DE 60336077 T DE60336077 T DE 60336077T DE 60336077 T DE60336077 T DE 60336077T DE 60336077 D1 DE60336077 D1 DE 60336077D1
Authority
DE
Germany
Prior art keywords
optical sensor
optical
sensor
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Expired - Lifetime
Application number
DE60336077T
Other languages
English (en)
Inventor
Yasuhiro Suzuki
Seiichiro Mizuno
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
Hamamatsu Photonics KK
Original Assignee
Hamamatsu Photonics KK
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Hamamatsu Photonics KK filed Critical Hamamatsu Photonics KK
Application granted granted Critical
Publication of DE60336077D1 publication Critical patent/DE60336077D1/de
Anticipated expiration legal-status Critical
Expired - Lifetime legal-status Critical Current

Links

Classifications

    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01J—MEASUREMENT OF INTENSITY, VELOCITY, SPECTRAL CONTENT, POLARISATION, PHASE OR PULSE CHARACTERISTICS OF INFRARED, VISIBLE OR ULTRAVIOLET LIGHT; COLORIMETRY; RADIATION PYROMETRY
    • G01J1/00—Photometry, e.g. photographic exposure meter
    • G01J1/42—Photometry, e.g. photographic exposure meter using electric radiation detectors
    • G01J1/44—Electric circuits
    • G01J1/46—Electric circuits using a capacitor
    • H—ELECTRICITY
    • H04—ELECTRIC COMMUNICATION TECHNIQUE
    • H04N—PICTORIAL COMMUNICATION, e.g. TELEVISION
    • H04N23/00—Cameras or camera modules comprising electronic image sensors; Control thereof
    • H04N23/70—Circuitry for compensating brightness variation in the scene
    • H—ELECTRICITY
    • H04—ELECTRIC COMMUNICATION TECHNIQUE
    • H04N—PICTORIAL COMMUNICATION, e.g. TELEVISION
    • H04N25/00—Circuitry of solid-state image sensors [SSIS]; Control thereof
    • H04N25/70—SSIS architectures; Circuits associated therewith
    • H04N25/76—Addressed sensors, e.g. MOS or CMOS sensors
    • H04N25/78—Readout circuits for addressed sensors, e.g. output amplifiers or A/D converters
    • H—ELECTRICITY
    • H10—SEMICONDUCTOR DEVICES; ELECTRIC SOLID-STATE DEVICES NOT OTHERWISE PROVIDED FOR
    • H10F—INORGANIC SEMICONDUCTOR DEVICES SENSITIVE TO INFRARED RADIATION, LIGHT, ELECTROMAGNETIC RADIATION OF SHORTER WAVELENGTH OR CORPUSCULAR RADIATION
    • H10F39/00—Integrated devices, or assemblies of multiple devices, comprising at least one element covered by group H10F30/00, e.g. radiation detectors comprising photodiode arrays
    • H10F39/10—Integrated devices
    • H10F39/12—Image sensors
    • H10F39/18—Complementary metal-oxide-semiconductor [CMOS] image sensors; Photodiode array image sensors
    • H10F39/189—X-ray, gamma-ray or corpuscular radiation imagers
    • H10F39/1898—Indirect radiation image sensors, e.g. using luminescent members
    • H—ELECTRICITY
    • H10—SEMICONDUCTOR DEVICES; ELECTRIC SOLID-STATE DEVICES NOT OTHERWISE PROVIDED FOR
    • H10F—INORGANIC SEMICONDUCTOR DEVICES SENSITIVE TO INFRARED RADIATION, LIGHT, ELECTROMAGNETIC RADIATION OF SHORTER WAVELENGTH OR CORPUSCULAR RADIATION
    • H10F39/00—Integrated devices, or assemblies of multiple devices, comprising at least one element covered by group H10F30/00, e.g. radiation detectors comprising photodiode arrays
    • H10F39/80—Constructional details of image sensors
    • H10F39/809—Constructional details of image sensors of hybrid image sensors
    • H10W72/07251—
    • H10W72/20—

Landscapes

  • Engineering & Computer Science (AREA)
  • Multimedia (AREA)
  • Signal Processing (AREA)
  • Power Engineering (AREA)
  • Physics & Mathematics (AREA)
  • General Physics & Mathematics (AREA)
  • Spectroscopy & Molecular Physics (AREA)
  • Photometry And Measurement Of Optical Pulse Characteristics (AREA)
  • Transforming Light Signals Into Electric Signals (AREA)
  • Solid State Image Pick-Up Elements (AREA)
  • Light Receiving Elements (AREA)
DE60336077T 2002-12-25 2003-12-25 Optischer sensor Expired - Lifetime DE60336077D1 (de)

Applications Claiming Priority (2)

Application Number Priority Date Filing Date Title
JP2002375115A JP4663956B2 (ja) 2002-12-25 2002-12-25 光検出装置
PCT/JP2003/016802 WO2004059268A1 (ja) 2002-12-25 2003-12-25 光検出装置

Publications (1)

Publication Number Publication Date
DE60336077D1 true DE60336077D1 (de) 2011-03-31

Family

ID=32677325

Family Applications (1)

Application Number Title Priority Date Filing Date
DE60336077T Expired - Lifetime DE60336077D1 (de) 2002-12-25 2003-12-25 Optischer sensor

Country Status (7)

Country Link
US (2) US7642496B2 (de)
EP (1) EP1577652B1 (de)
JP (1) JP4663956B2 (de)
CN (1) CN100501355C (de)
AU (1) AU2003296124A1 (de)
DE (1) DE60336077D1 (de)
WO (1) WO2004059268A1 (de)

Families Citing this family (13)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
FI121724B (fi) * 2005-04-12 2011-03-15 Planmeca Oy CCD-sensorijärjestely ja menetelmä panoraama- ja/tai kalloröntgenkuvausta varten
JP4931367B2 (ja) * 2005-04-28 2012-05-16 シャープ株式会社 検出装置及びそれを備えた表示装置
JP4825116B2 (ja) 2006-11-22 2011-11-30 浜松ホトニクス株式会社 固体撮像装置及び撮像方法
JP5450188B2 (ja) 2010-03-16 2014-03-26 株式会社東芝 放射線検出装置、放射線検出装置の製造方法および画像撮影装置
JP5475057B2 (ja) 2012-04-20 2014-04-16 株式会社 オフィス・カラーサイエンス 変角分光イメージング測定方法およびその装置
US9945774B2 (en) 2012-04-24 2018-04-17 Siemens Healthcare Diagnostics Inc. Channel light measurement apparatus having reduced signal-to-noise ratio
JP5878444B2 (ja) * 2012-09-04 2016-03-08 富士フイルム株式会社 放射線画像検出装置
US9106336B1 (en) * 2012-09-14 2015-08-11 Google Inc. Photo-sensor array to adjust alignment of optical receiver
FR3006500B1 (fr) * 2013-06-04 2016-10-28 Centre Nat De La Rech Scient - Cnrs - Capteur cmos a photosites standard
CN106289333B (zh) * 2015-05-29 2019-01-25 苏州坤元微电子有限公司 电容充放电控制模块以及电流频率转换电路
EP4582806A3 (de) 2017-09-19 2025-08-13 Beckman Coulter, Inc. Analoge lichtmessung und photonenzählung bei chemilumineszenzmessungen
JP2019057873A (ja) * 2017-09-22 2019-04-11 ソニーセミコンダクタソリューションズ株式会社 固体撮像素子及び電子機器
CN111786659A (zh) * 2020-06-22 2020-10-16 西安交通大学 一种宽范围高精度电荷脉冲生成电路及工作方法

Family Cites Families (21)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPH082165B2 (ja) 1986-02-28 1996-01-10 本田技研工業株式会社 携帯用エンジン発電機
JPS62203531U (de) * 1986-06-18 1987-12-25
JPS63204131A (ja) 1987-02-19 1988-08-23 Olympus Optical Co Ltd 光電変換素子アレイの蓄積時間制御装置
JPS63205527A (ja) 1987-02-20 1988-08-25 Sanyo Electric Co Ltd 測光回路
JPH03262932A (ja) * 1990-03-14 1991-11-22 Fuji Electric Co Ltd 電荷蓄積形光センサ回路
JPH0754823Y2 (ja) * 1990-04-18 1995-12-18 株式会社アドバンテスト 光強度測定装置
JPH0530431A (ja) * 1991-07-18 1993-02-05 Konica Corp 固体撮像装置の露光時間制御回路
JPH07333348A (ja) * 1994-06-03 1995-12-22 Toshiba Corp 放射線検出器およびこれを用いたｘ線ｃｔ装置
JPH0933979A (ja) * 1995-07-19 1997-02-07 Olympus Optical Co Ltd 露出測光装置
JP3957803B2 (ja) * 1996-02-22 2007-08-15 キヤノン株式会社 光電変換装置
JP3019010B2 (ja) * 1996-11-13 2000-03-13 日本電気株式会社 撮像装置
JP4098884B2 (ja) 1998-07-08 2008-06-11 浜松ホトニクス株式会社 固体撮像装置
JP4358351B2 (ja) * 1999-04-27 2009-11-04 浜松ホトニクス株式会社 光検出装置
JP2001054020A (ja) 1999-08-10 2001-02-23 Minolta Co Ltd 固体撮像装置
JP4550957B2 (ja) * 1999-11-15 2010-09-22 浜松ホトニクス株式会社 光検出装置
DE19959539A1 (de) * 1999-12-09 2001-06-13 Thomson Brandt Gmbh Bildaufnehmer
JP2001291877A (ja) * 2000-04-05 2001-10-19 Hamamatsu Photonics Kk 固体撮像装置
AU2001276726A1 (en) * 2000-08-03 2002-02-18 Hamamatsu Photonics K.K. Optical sensor
JP4054168B2 (ja) * 2000-08-10 2008-02-27 日本放送協会 撮像デバイス及びその動作方法
JP4628586B2 (ja) 2001-05-14 2011-02-09 浜松ホトニクス株式会社 光検出装置
JP3977735B2 (ja) * 2002-12-25 2007-09-19 浜松ホトニクス株式会社 光検出装置

Also Published As

Publication number Publication date
CN100501355C (zh) 2009-06-17
JP2004205359A (ja) 2004-07-22
US20090184237A1 (en) 2009-07-23
CN1732377A (zh) 2006-02-08
AU2003296124A1 (en) 2004-07-22
JP4663956B2 (ja) 2011-04-06
WO2004059268A1 (ja) 2004-07-15
EP1577652B1 (de) 2011-02-16
US7642496B2 (en) 2010-01-05
EP1577652A1 (de) 2005-09-21
EP1577652A4 (de) 2009-11-18
US20060197083A1 (en) 2006-09-07

Similar Documents

Publication Publication Date Title
DE60212254D1 (de) Optischer sensor
IS2896B (is) Gerviaugasteinn
DE60327418D1 (de) Lagesensor
DE602004030335D1 (de) Optisches element
DE60318905D1 (de) Optisches Element
NO20015552L (no) Optisk forskyvnings-sensor
DE60332694D1 (de) Näherungssensor
DE50311591D1 (de) Optischer sensor
DE60301365D1 (de) Optischer Verschiebungsdetektor
DE50308293D1 (de) Bildgeber
DE50309063D1 (de) Kraftsensor
DE60336077D1 (de) Optischer sensor
EP1577955A4 (de) Optischer sensor
ATA16882004A (de) Sensor
DE10322017B8 (de) Sensoreinheit
DE60217410D1 (de) Optisches element
DE60304800D1 (de) Optischer Verstärker
FI20030333A7 (fi) MSM-anturi
DE60319891D1 (de) Optischer Verstärker
DE50310686D1 (de) Temperaturfühler
NO20045350D0 (no) Sensor
DE60309193D1 (de) Optischer winkelcodierer
DE60328480D1 (de) Optischer verstärker
EP1541979A4 (de) Optischer sensor
DE10392936D2 (de) Niveaugeber