DE60327965D1 - Röntgenstreusystem zur Überwachung mit einfahrbarem Röntgenschirm - Google Patents
Röntgenstreusystem zur Überwachung mit einfahrbarem RöntgenschirmInfo
- Publication number
- DE60327965D1 DE60327965D1 DE60327965T DE60327965T DE60327965D1 DE 60327965 D1 DE60327965 D1 DE 60327965D1 DE 60327965 T DE60327965 T DE 60327965T DE 60327965 T DE60327965 T DE 60327965T DE 60327965 D1 DE60327965 D1 DE 60327965D1
- Authority
- DE
- Germany
- Prior art keywords
- ray
- retractable
- monitoring
- scattering system
- screen
- Prior art date
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
- Expired - Lifetime
Links
Classifications
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
- G01N23/00—Investigating or analysing materials by the use of wave or particle radiation, e.g. X-rays or neutrons, not covered by groups G01N3/00 – G01N17/00, G01N21/00 or G01N22/00
- G01N23/20—Investigating or analysing materials by the use of wave or particle radiation, e.g. X-rays or neutrons, not covered by groups G01N3/00 – G01N17/00, G01N21/00 or G01N22/00 by using diffraction of the radiation by the materials, e.g. for investigating crystal structure; by using scattering of the radiation by the materials, e.g. for investigating non-crystalline materials; by using reflection of the radiation by the materials
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
- G01N23/00—Investigating or analysing materials by the use of wave or particle radiation, e.g. X-rays or neutrons, not covered by groups G01N3/00 – G01N17/00, G01N21/00 or G01N22/00
- G01N23/20—Investigating or analysing materials by the use of wave or particle radiation, e.g. X-rays or neutrons, not covered by groups G01N3/00 – G01N17/00, G01N21/00 or G01N22/00 by using diffraction of the radiation by the materials, e.g. for investigating crystal structure; by using scattering of the radiation by the materials, e.g. for investigating non-crystalline materials; by using reflection of the radiation by the materials
- G01N23/20008—Constructional details of analysers, e.g. characterised by X-ray source, detector or optical system; Accessories therefor; Preparing specimens therefor
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01S—RADIO DIRECTION-FINDING; RADIO NAVIGATION; DETERMINING DISTANCE OR VELOCITY BY USE OF RADIO WAVES; LOCATING OR PRESENCE-DETECTING BY USE OF THE REFLECTION OR RERADIATION OF RADIO WAVES; ANALOGOUS ARRANGEMENTS USING OTHER WAVES
- G01S17/00—Systems using the reflection or reradiation of electromagnetic waves other than radio waves, e.g. lidar systems
- G01S17/02—Systems using the reflection of electromagnetic waves other than radio waves
- G01S17/06—Systems determining position data of a target
- G01S17/46—Indirect determination of position data
- G01S17/48—Active triangulation systems, i.e. using the transmission and reflection of electromagnetic waves other than radio waves
Landscapes
- Physics & Mathematics (AREA)
- Chemical & Material Sciences (AREA)
- General Physics & Mathematics (AREA)
- Life Sciences & Earth Sciences (AREA)
- Pathology (AREA)
- Analytical Chemistry (AREA)
- Biochemistry (AREA)
- General Health & Medical Sciences (AREA)
- Crystallography & Structural Chemistry (AREA)
- Immunology (AREA)
- Health & Medical Sciences (AREA)
- Electromagnetism (AREA)
- Engineering & Computer Science (AREA)
- Computer Networks & Wireless Communication (AREA)
- Radar, Positioning & Navigation (AREA)
- Remote Sensing (AREA)
- Analysing Materials By The Use Of Radiation (AREA)
Applications Claiming Priority (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| US10/127,352 US6718008B1 (en) | 2002-04-22 | 2002-04-22 | X-ray diffraction screening system with retractable x-ray shield |
Publications (1)
| Publication Number | Publication Date |
|---|---|
| DE60327965D1 true DE60327965D1 (de) | 2009-07-30 |
Family
ID=28790939
Family Applications (1)
| Application Number | Title | Priority Date | Filing Date |
|---|---|---|---|
| DE60327965T Expired - Lifetime DE60327965D1 (de) | 2002-04-22 | 2003-04-16 | Röntgenstreusystem zur Überwachung mit einfahrbarem Röntgenschirm |
Country Status (3)
| Country | Link |
|---|---|
| US (1) | US6718008B1 (de) |
| EP (1) | EP1357377B1 (de) |
| DE (1) | DE60327965D1 (de) |
Families Citing this family (26)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| DE10317678A1 (de) * | 2003-04-17 | 2004-11-18 | Bruker Axs Gmbh | Röntgen-optisches System zum kombinatorischen Screening einer Probenbibliothek |
| US7269245B2 (en) * | 2004-07-30 | 2007-09-11 | Bruker Axs, Inc. | Combinatorial screening system and X-ray diffraction and Raman spectroscopy |
| DE102004050428B4 (de) * | 2004-10-15 | 2006-09-28 | Mtu Aero Engines Gmbh | Vorrichtung und Verfahren zur Darstellung der Wirkrichtung eines Arbeitsmittels |
| JP3912606B2 (ja) * | 2004-10-26 | 2007-05-09 | 株式会社リガク | Ｘ線薄膜検査装置と、プロダクトウエーハの薄膜検査装置およびその方法 |
| WO2006104173A1 (ja) * | 2005-03-28 | 2006-10-05 | Fujifilm Corporation | 光量調整方法、画像記録方法及び装置 |
| WO2007026461A1 (ja) * | 2005-08-29 | 2007-03-08 | Rigaku Corporation | 縦横小角ｘ線散乱装置及び小角ｘ線散乱の測定方法 |
| US7796726B1 (en) * | 2006-02-14 | 2010-09-14 | University Of Maryland, Baltimore County | Instrument and method for X-ray diffraction, fluorescence, and crystal texture analysis without sample preparation |
| CN101231255B (zh) * | 2008-02-02 | 2010-08-25 | 丹东方圆仪器有限公司 | X射线衍射仪用多功能样品架 |
| US8243878B2 (en) * | 2010-01-07 | 2012-08-14 | Jordan Valley Semiconductors Ltd. | High-resolution X-ray diffraction measurement with enhanced sensitivity |
| US8687766B2 (en) | 2010-07-13 | 2014-04-01 | Jordan Valley Semiconductors Ltd. | Enhancing accuracy of fast high-resolution X-ray diffractometry |
| US8437450B2 (en) | 2010-12-02 | 2013-05-07 | Jordan Valley Semiconductors Ltd. | Fast measurement of X-ray diffraction from tilted layers |
| US8781070B2 (en) | 2011-08-11 | 2014-07-15 | Jordan Valley Semiconductors Ltd. | Detection of wafer-edge defects |
| JP6096419B2 (ja) * | 2012-04-12 | 2017-03-15 | 株式会社堀場製作所 | Ｘ線検出装置 |
| JP6270215B2 (ja) * | 2013-11-25 | 2018-01-31 | 株式会社リガク | Ｘ線分析装置の光軸調整装置 |
| US9726624B2 (en) | 2014-06-18 | 2017-08-08 | Bruker Jv Israel Ltd. | Using multiple sources/detectors for high-throughput X-ray topography measurement |
| CN108472005B (zh) | 2015-11-09 | 2021-09-14 | 瑞迪艾森有限公司 | 辐射屏蔽装置及其应用 |
| JP6656519B2 (ja) * | 2016-06-15 | 2020-03-04 | 株式会社リガク | Ｘ線回折装置 |
| US10386313B2 (en) | 2016-09-29 | 2019-08-20 | Bruker Jv Israel Ltd. | Closed-loop control of X-ray knife edge |
| CN106841254A (zh) * | 2017-01-06 | 2017-06-13 | 中国工程物理研究院核物理与化学研究所 | 一种用于中子散射实验的温度加载装置 |
| WO2020142556A1 (en) | 2019-01-02 | 2020-07-09 | Yifat Jonathan | Radiation protection apparatus and materials therefor |
| US12011306B2 (en) | 2019-01-02 | 2024-06-18 | Radiaction Ltd | Patient head protection device |
| EP3993705B1 (de) | 2019-07-02 | 2024-07-24 | Radiaction Ltd. | Entfaltbare strahlenschutzabdeckung |
| EP3961198A1 (de) | 2020-08-26 | 2022-03-02 | Malvern Panalytical B.V. | Probenhalter für eine röntgenstrahlanalysevorrichtung |
| RU205232U1 (ru) * | 2020-12-03 | 2021-07-05 | Федеральное государственное бюджетное образовательное учреждение высшего образования «Московский государственный университет имени М.В.Ломоносова» (МГУ) | Держатель образцов для регистрации спектров рентгеновского поглощения в инертной атмосфере |
| RU203691U1 (ru) * | 2020-12-25 | 2021-04-15 | федеральное государственное автономное образовательное учреждение высшего образования "Санкт-Петербургский политехнический университет Петра Великого" (ФГАОУ ВО "СПбПУ") | Держатель образца для проведения рентгеноструктурных измерений в широком температурном диапазоне, с возможностью одновременного приложения к образцу одноосной деформации растяжения и электрического поля |
| RU205420U1 (ru) * | 2020-12-30 | 2021-07-14 | Федеральное государственное бюджетное образовательное учреждение высшего образования "Московский государственный университет имени М.В.Ломоносова" (МГУ) | Держатель образцов для регистрации спектров рентгеновского поглощения в инертной атмосфере |
Family Cites Families (11)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| US3663812A (en) * | 1969-02-27 | 1972-05-16 | Mc Donnell Douglas Corp | X-ray spectrographic means having fixed analyzing and detecting means |
| DE3125803A1 (de) * | 1981-06-30 | 1983-01-13 | Siemens AG, 1000 Berlin und 8000 München | Kristall-roentgen-sequenzspektrometer |
| US5359640A (en) * | 1993-08-10 | 1994-10-25 | Siemens Industrial Automation, Inc. | X-ray micro diffractometer sample positioner |
| EP1149282A2 (de) * | 1998-12-18 | 2001-10-31 | Symyx Technologies, Inc. | Verfahren zur charakterisierung von bibliotheken verschiedener materialien mittels röntgenstrahlen |
| JP3373803B2 (ja) * | 1999-05-28 | 2003-02-04 | 科学技術振興事業団 | コンビナトリアルｘ線回折装置 |
| US6404849B1 (en) * | 1999-08-11 | 2002-06-11 | Abbott Laboratories | Automated sample handling for X-ray crystallography |
| US6507636B1 (en) * | 2000-02-10 | 2003-01-14 | Studiengesellschaft Kohle Mbh | Rapid X-ray diffraction screening method of polymorph libraries created in multi-well plates |
| GB0014587D0 (en) * | 2000-06-14 | 2000-08-09 | Europ Economic Community | X-ray reflectivity apparatus and method |
| US6577705B1 (en) * | 2001-04-02 | 2003-06-10 | William Chang | Combinatorial material analysis using X-ray capillary optics |
| US6535575B2 (en) * | 2001-04-12 | 2003-03-18 | Jordan Valley Applied Radiation Ltd. | Pulsed X-ray reflectometer |
| US6512814B2 (en) * | 2001-04-12 | 2003-01-28 | Jordan Valley Applied Radiation | X-ray reflectometer |
-
2002
- 2002-04-22 US US10/127,352 patent/US6718008B1/en not_active Expired - Lifetime
-
2003
- 2003-04-16 DE DE60327965T patent/DE60327965D1/de not_active Expired - Lifetime
- 2003-04-16 EP EP03008688A patent/EP1357377B1/de not_active Expired - Lifetime
Also Published As
| Publication number | Publication date |
|---|---|
| EP1357377A3 (de) | 2004-01-21 |
| US6718008B1 (en) | 2004-04-06 |
| EP1357377B1 (de) | 2009-06-17 |
| EP1357377A2 (de) | 2003-10-29 |
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Legal Events
| Date | Code | Title | Description |
|---|---|---|---|
| 8364 | No opposition during term of opposition |