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DE60301305D1 - Verfahren und apparat zur temperaturkontrolle in einem focal plane array mit aktiven thermischen kontrollelementen - Google Patents

Verfahren und apparat zur temperaturkontrolle in einem focal plane array mit aktiven thermischen kontrollelementen

Info

Publication number
DE60301305D1
DE60301305D1 DE60301305T DE60301305T DE60301305D1 DE 60301305 D1 DE60301305 D1 DE 60301305D1 DE 60301305 T DE60301305 T DE 60301305T DE 60301305 T DE60301305 T DE 60301305T DE 60301305 D1 DE60301305 D1 DE 60301305D1
Authority
DE
Germany
Prior art keywords
focal plane
plane array
active thermal
temperature control
control elements
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Expired - Lifetime
Application number
DE60301305T
Other languages
English (en)
Other versions
DE60301305T2 (de
Inventor
M Kennedy
Michael Ray
H Wyles
K Wyles
A Radford
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
Raytheon Co
Original Assignee
Raytheon Co
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Raytheon Co filed Critical Raytheon Co
Application granted granted Critical
Publication of DE60301305D1 publication Critical patent/DE60301305D1/de
Publication of DE60301305T2 publication Critical patent/DE60301305T2/de
Anticipated expiration legal-status Critical
Expired - Lifetime legal-status Critical Current

Links

Classifications

    • GPHYSICS
    • G01MEASURING; TESTING
    • G01JMEASUREMENT OF INTENSITY, VELOCITY, SPECTRAL CONTENT, POLARISATION, PHASE OR PULSE CHARACTERISTICS OF INFRARED, VISIBLE OR ULTRAVIOLET LIGHT; COLORIMETRY; RADIATION PYROMETRY
    • G01J5/00Radiation pyrometry, e.g. infrared or optical thermometry
    • G01J5/02Constructional details
    • G01J5/06Arrangements for eliminating effects of disturbing radiation; Arrangements for compensating changes in sensitivity
    • G01J5/061Arrangements for eliminating effects of disturbing radiation; Arrangements for compensating changes in sensitivity by controlling the temperature of the apparatus or parts thereof, e.g. using cooling means or thermostats
    • GPHYSICS
    • G01MEASURING; TESTING
    • G01JMEASUREMENT OF INTENSITY, VELOCITY, SPECTRAL CONTENT, POLARISATION, PHASE OR PULSE CHARACTERISTICS OF INFRARED, VISIBLE OR ULTRAVIOLET LIGHT; COLORIMETRY; RADIATION PYROMETRY
    • G01J5/00Radiation pyrometry, e.g. infrared or optical thermometry
    • G01J5/10Radiation pyrometry, e.g. infrared or optical thermometry using electric radiation detectors
    • G01J5/20Radiation pyrometry, e.g. infrared or optical thermometry using electric radiation detectors using resistors, thermistors or semiconductors sensitive to radiation, e.g. photoconductive devices
    • HELECTRICITY
    • H04ELECTRIC COMMUNICATION TECHNIQUE
    • H04NPICTORIAL COMMUNICATION, e.g. TELEVISION
    • H04N25/00Circuitry of solid-state image sensors [SSIS]; Control thereof
    • H04N25/20Circuitry of solid-state image sensors [SSIS]; Control thereof for transforming only infrared radiation into image signals
    • H04N25/21Circuitry of solid-state image sensors [SSIS]; Control thereof for transforming only infrared radiation into image signals for transforming thermal infrared radiation into image signals

Landscapes

  • Physics & Mathematics (AREA)
  • General Physics & Mathematics (AREA)
  • Spectroscopy & Molecular Physics (AREA)
  • Photometry And Measurement Of Optical Pulse Characteristics (AREA)
DE60301305T 2002-02-26 2003-02-20 Verfahren und apparat zur temperaturkontrolle in einem focal plane array mit aktiven thermischen kontrollelementen Expired - Lifetime DE60301305T2 (de)

Applications Claiming Priority (3)

Application Number Priority Date Filing Date Title
US84687 2002-02-26
US10/084,687 US6649913B1 (en) 2002-02-26 2002-02-26 Method and apparatus providing focal plane array active thermal control elements
PCT/US2003/005286 WO2003073056A1 (en) 2002-02-26 2003-02-20 Method and apparatus providing focal plane array active thermal control elements

Publications (2)

Publication Number Publication Date
DE60301305D1 true DE60301305D1 (de) 2005-09-22
DE60301305T2 DE60301305T2 (de) 2006-06-08

Family

ID=27765327

Family Applications (1)

Application Number Title Priority Date Filing Date
DE60301305T Expired - Lifetime DE60301305T2 (de) 2002-02-26 2003-02-20 Verfahren und apparat zur temperaturkontrolle in einem focal plane array mit aktiven thermischen kontrollelementen

Country Status (5)

Country Link
US (1) US6649913B1 (de)
EP (1) EP1399721B1 (de)
DE (1) DE60301305T2 (de)
IL (1) IL159121A (de)
WO (1) WO2003073056A1 (de)

Families Citing this family (8)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US7910101B2 (en) 2004-10-25 2011-03-22 Centocor, Inc. Melanocortin receptor binding mimetibodies, compositions, methods and uses
WO2006122529A2 (de) * 2005-05-17 2006-11-23 Heimann Sensor Gmbh Thermopile infrarot sensorarray
DE102007039228B8 (de) * 2007-08-20 2009-12-17 Perkinelmer Optoelectronics Gmbh & Co.Kg Sensorkappenanordnung Sensor Schaltung
US9918023B2 (en) 2010-04-23 2018-03-13 Flir Systems, Inc. Segmented focal plane array architecture
US9635287B2 (en) 2011-10-11 2017-04-25 Raytheon Company Method and apparatus for integrated sensor to provide higher resolution, lower frame rate and lower resolution, higher frame rate imagery simultaneously
US9223037B2 (en) 2012-04-09 2015-12-29 Globalfoundries Inc. Structure and method to ensure correct operation of an integrated circuit in the presence of ionizing radiation
DE102012011886A1 (de) * 2012-06-15 2013-12-19 Connaught Electronics Ltd. Kamera mit einem durch Wärme beeinflussten Bildsensor
CN115843331A (zh) * 2020-08-18 2023-03-24 三菱电机株式会社 红外线传感器装置

Family Cites Families (8)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
GB8900688D0 (en) * 1989-01-12 1989-07-05 Thorn Emi Electronics Ltd Thermal imaging device
US6515285B1 (en) * 1995-10-24 2003-02-04 Lockheed-Martin Ir Imaging Systems, Inc. Method and apparatus for compensating a radiation sensor for ambient temperature variations
US5756999A (en) 1997-02-11 1998-05-26 Indigo Systems Corporation Methods and circuitry for correcting temperature-induced errors in microbolometer focal plane array
US6028309A (en) * 1997-02-11 2000-02-22 Indigo Systems Corporation Methods and circuitry for correcting temperature-induced errors in microbolometer focal plane array
DE19861126A1 (de) * 1998-09-23 2000-04-27 Dornier Gmbh Verfahren zur Messung einer äußeren Einflußgröße unter Ausnutzung eines hysteretischen Phasenübergangs
US6444983B1 (en) * 1999-10-07 2002-09-03 Infrared Solutions, Inc. Microbolometer focal plane array with controlled bias
US6576904B1 (en) * 1999-11-10 2003-06-10 Itt Manufacturing Enterprises, Inc. Transition edge detector technology for high performance IR focal plane arrays
US6465785B1 (en) * 2000-05-05 2002-10-15 Infrared Solutions, Inc. Apparatus and method for compensating for pixel non-uniformity in a bolometer

Also Published As

Publication number Publication date
DE60301305T2 (de) 2006-06-08
US6649913B1 (en) 2003-11-18
IL159121A0 (en) 2004-05-12
EP1399721A1 (de) 2004-03-24
IL159121A (en) 2007-02-11
EP1399721B1 (de) 2005-08-17
WO2003073056A1 (en) 2003-09-04

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Legal Events

Date Code Title Description
8364 No opposition during term of opposition
8328 Change in the person/name/address of the agent

Representative=s name: WITTE, WELLER & PARTNER, 70178 STUTTGART