DE60233774D1 - Lasermikroskop - Google Patents

Lasermikroskop

Info

Publication number: DE60233774D1
Authority: DE; Germany
Prior art keywords: laser microscope; microscope; laser
Prior art date: 2001-07-03
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.): Expired - Lifetime

Application number

DE60233774T

Other languages

English (en)

Inventor

Yoshihiro Shimada

Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)

Olympus Corp

Original Assignee

Olympus Corp

Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)

2001-07-03

Filing date

2002-07-02

Publication date

2009-11-05

2002-07-02 Application filed by Olympus Corp filed Critical Olympus Corp

2009-11-05 Application granted granted Critical

2009-11-05 Publication of DE60233774D1 publication Critical patent/DE60233774D1/de

2022-07-03 Anticipated expiration legal-status Critical

Status Expired - Lifetime legal-status Critical Current

Classifications

- G—PHYSICS
- G02—OPTICS
- G02B—OPTICAL ELEMENTS, SYSTEMS OR APPARATUS
- G02B21/00—Microscopes
- G02B21/0004—Microscopes specially adapted for specific applications
- G02B21/002—Scanning microscopes

Landscapes

Physics & Mathematics (AREA)
Chemical & Material Sciences (AREA)
Analytical Chemistry (AREA)
General Physics & Mathematics (AREA)
Optics & Photonics (AREA)
Investigating, Analyzing Materials By Fluorescence Or Luminescence (AREA)
Microscoopes, Condenser (AREA)

DE60233774T 2001-07-03 2002-07-02 Lasermikroskop Expired - Lifetime DE60233774D1 (de)

Applications Claiming Priority (1)

Application Number	Priority Date	Filing Date	Title
JP2001202584A JP4854878B2 (ja)	2001-07-03	2001-07-03	レーザー顕微鏡

Publications (1)

Publication Number	Publication Date
DE60233774D1 true DE60233774D1 (de)	2009-11-05

Family

ID=19039367

Family Applications (1)

Application Number	Title	Priority Date	Filing Date
DE60233774T Expired - Lifetime DE60233774D1 (de)	2001-07-03	2002-07-02	Lasermikroskop

Country Status (4)

Country	Link
US (1)	US6934020B2 (de)
EP (1)	EP1278092B1 (de)
JP (1)	JP4854878B2 (de)
DE (1)	DE60233774D1 (de)

Families Citing this family (27)

* Cited by examiner, † Cited by third party
Publication number	Priority date	Publication date	Assignee	Title
US7106436B1 (en) *	2002-12-04	2006-09-12	The United States Of America As Represented By The Secretary Of The Air Force	Triple-pump coherent anti-Stokes Raman scattering system
US7176428B2 (en) *	2004-03-12	2007-02-13	Olympus Corporation	Laser-based, multiphoton-excitation-type optical examination apparatus
US7919325B2 (en) *	2004-05-24	2011-04-05	Authentix, Inc.	Method and apparatus for monitoring liquid for the presence of an additive
US7289203B2 (en) *	2004-09-30	2007-10-30	Chromaplex, Inc.	Method and system for spectral analysis of biological materials using stimulated cars
EP1853885A4 (de) *	2005-01-21	2011-10-05	Harvard College	Abstimmbarer optischer parametrischer oszillator für die nichtlineare vibrations-spektroskopie
US7414729B2 (en) *	2005-10-13	2008-08-19	President And Fellows Of Harvard College	System and method for coherent anti-Stokes Raman scattering endoscopy
US7352458B2 (en) *	2005-10-26	2008-04-01	President And Fellows Of Harvard College	System and method for high sensitivity vibrational imaging with frequency modulation coherent anti-stokes Raman scattering analyses
US7659977B2 (en) *	2006-04-21	2010-02-09	Intel Corporation	Apparatus and method for imaging with surface enhanced coherent anti-stokes raman scattering (SECARS)
EP1959292A3 (de) *	2007-02-13	2009-06-17	Olympus Corporation	Laser-Mikroskop
JP5307439B2 (ja) *	2007-04-23	2013-10-02	オリンパス株式会社	レーザ顕微鏡
US7595873B1 (en) *	2008-02-11	2009-09-29	Thermo Electron Scientific Instruments Llc	Rapid spatial averaging over an extended sample in a Raman spectrometer
KR100929202B1 (ko) *	2008-02-27	2009-12-01	광주과학기술원	가간섭성 반스토크스 라만 산란을 이용한 영상 획득 장치및 방법
JP5185695B2 (ja) *	2008-05-23	2013-04-17	オリンパス株式会社	レーザ顕微鏡装置及び標本画像取得方法
JP5135066B2 (ja) *	2008-06-03	2013-01-30	ナノフォトン株式会社	光学顕微鏡、及び観察方法
ITMI20081448A1 (it) *	2008-08-01	2010-02-02	Milano Politecnico	Sistema di generazione di segnali di analisi vibrazionale raman
US8027032B2 (en) *	2008-08-22	2011-09-27	President & Fellows Of Harvard College	Microscopy imaging system and method employing stimulated raman spectroscopy as a contrast mechanism
JP5160352B2 (ja) *	2008-09-12	2013-03-13	オリンパス株式会社	レーザ顕微鏡装置
JP5160372B2 (ja) *	2008-10-17	2013-03-13	オリンパス株式会社	レーザ顕微鏡装置
GB0904739D0 (en) *	2009-03-19	2009-05-06	Univ Cardiff	Coherent anti-stokes raman spectroscopy
FR2955663B1 (fr) *	2010-01-22	2014-09-12	Ct Nat De La Rech C N R S	Methode pour la detection d'un signal optique non lineaire resonant et dispositif pour la mise en oeuvre de ladite methode
DE102010047578A1 (de)	2010-10-07	2012-04-12	Jenlab Gmbh	Verwendung einer Kombination von Auswertungsverfahren in einer Vorrichtung zur Detektion von Tumoren sowie Vorrichtung zur Detektion von Tumoren
JP5736325B2 (ja) *	2012-02-21	2015-06-17	株式会社日立製作所	光学装置
CN104390951B (zh) *	2014-11-20	2017-01-11	天津大学	一种高灵敏度全光纤反斯托克斯拉曼探测系统
EP3086156A1 (de) *	2015-04-20	2016-10-26	Canon Kabushiki Kaisha	Laserscan-mikroskopvorrichtung
EP3538941B1 (de)	2016-11-10	2025-04-23	The Trustees of Columbia University in the City of New York	Schnelles hochauflösendes bildgebungsverfahren für grosse proben
CN112858345B (zh) *	2021-01-22	2022-03-11	中国工程物理研究院激光聚变研究中心	一种随机移相的光学元件缺陷快速超分辨检测装置及检测方法
TWI829373B (zh) *	2022-09-30	2024-01-11	國立清華大學	同調拉曼顯微系統及其方法

Family Cites Families (11)

* Cited by examiner, † Cited by third party
Publication number	Priority date	Publication date	Assignee	Title
US4405237A (en) *	1981-02-04	1983-09-20	The United States Of America As Represented By The Secretary Of The Navy	Coherent anti-Stokes Raman device
US4512660A (en) *	1983-04-14	1985-04-23	The United States Of America As Represented By The Secretary Of The Navy	Picosecond broadband cars probe using the picosecond continuum
USRE34782E (en) *	1985-07-01	1994-11-08	Diatron Corporation	Fluorometer
JPS62255854A (ja) *	1986-04-28	1987-11-07	Natl Aerospace Lab	レ−ザ計測装置
JPS6325522A (ja) *	1986-07-18	1988-02-03	Hitachi Ltd	反ストクスラマン分光法による温度計測法
US5120961A (en) *	1990-03-16	1992-06-09	Infrared Fiber Systems, Inc.	High sensitivity acousto-optic tunable filter spectrometer
US5303710A (en) *	1992-11-03	1994-04-19	The United States Of America As Represented By The Secretary Of The Navy	Apparatus for imaging an object in or through a scattering medium using coherent anti-Stokes Raman scattering
US6166385A (en) *	1995-09-19	2000-12-26	Cornell Research Foundation, Inc.	Multi-photon laser microscopy
US6151522A (en) *	1998-03-16	2000-11-21	The Research Foundation Of Cuny	Method and system for examining biological materials using low power CW excitation raman spectroscopy
DE19829981C2 (de) *	1998-07-04	2002-10-17	Zeiss Carl Jena Gmbh	Verfahren und Anordnung zur konfokalen Mikroskopie
US6108081A (en) *	1998-07-20	2000-08-22	Battelle Memorial Institute	Nonlinear vibrational microscopy

2001
- 2001-07-03 JP JP2001202584A patent/JP4854878B2/ja not_active Expired - Fee Related
2002
- 2002-07-01 US US10/186,573 patent/US6934020B2/en not_active Expired - Lifetime
- 2002-07-02 EP EP02014099A patent/EP1278092B1/de not_active Expired - Lifetime
- 2002-07-02 DE DE60233774T patent/DE60233774D1/de not_active Expired - Lifetime

Also Published As

Publication number	Publication date
US6934020B2 (en)	2005-08-23
EP1278092A3 (de)	2004-06-30
JP2003015050A (ja)	2003-01-15
EP1278092B1 (de)	2009-09-23
JP4854878B2 (ja)	2012-01-18
US20030007145A1 (en)	2003-01-09
EP1278092A2 (de)	2003-01-22

Publication	Publication Date	Title
DE60233774D1 (de)	2009-11-05	Lasermikroskop
DE60222138D1 (de)	2007-10-11	Abstimmbarer laser
DE60239445D1 (de)	2011-04-28	Halbleiterlaserstruktur
DE60227232D1 (de)	2008-08-07	Halbleiterlaserstruktur
DE60203842D1 (de)	2005-06-02	Hauptträgerverbindung
DE60218012D1 (de)	2007-03-22	Optischer Verstärker
DE50111319D1 (de)	2006-12-07	Selbstnivellierender Baulaser
DE60120514D1 (de)	2006-07-20	Plektrum
DE60215451D1 (de)	2006-11-30	Laserausrichtungssystem
DE60205439D1 (de)	2005-09-15	Optischer Verstärker
NO20034503D0 (no)	2003-10-08	Speil fluorometer
DE60108044D1 (de)	2005-02-03	Laser Mikroskop
DE60222724D1 (de)	2007-11-15	Halbleiterlaserelement
DE60232196D1 (de)	2009-06-10	Hochstabiles optisches mikroskop
DE60202683D1 (de)	2005-02-24	Abstimmbarer laser
DE50210876D1 (de)	2007-10-25	Scanmikroskop
DE50207273D1 (de)	2006-08-03	Operations-Mikroskop
DE50208461D1 (de)	2006-11-30	Autofokus-Mikroskopsystem
DE60100100D1 (de)	2003-03-20	Laserdurchstimmung
DE50104634D1 (de)	2004-12-30	Halbleiter-laser
ITMI20010954A0 (it)	2001-05-10	Procedimento di iodurazione
DE60103725D1 (de)	2004-07-15	Laserquelle
NO20006447L (no)	2002-06-17	Bölgeleder-laserkilde
DE60211166D1 (de)	2006-06-08	Abstimmbarer laser
DE50202752D1 (de)	2005-05-19	Mikroskop

Legal Events

Date	Code	Title	Description
2010-10-14	8364	No opposition during term of opposition