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DE60220053D1 - Schaltkreis - Google Patents

Schaltkreis

Info

Publication number
DE60220053D1
DE60220053D1 DE60220053T DE60220053T DE60220053D1 DE 60220053 D1 DE60220053 D1 DE 60220053D1 DE 60220053 T DE60220053 T DE 60220053T DE 60220053 T DE60220053 T DE 60220053T DE 60220053 D1 DE60220053 D1 DE 60220053D1
Authority
DE
Germany
Prior art keywords
circuit
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Expired - Lifetime
Application number
DE60220053T
Other languages
English (en)
Other versions
DE60220053T2 (de
Inventor
Ian Juso Dedic
Darren Walker
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
Fujitsu Semiconductor Ltd
Original Assignee
Fujitsu Ltd
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Fujitsu Ltd filed Critical Fujitsu Ltd
Publication of DE60220053D1 publication Critical patent/DE60220053D1/de
Application granted granted Critical
Publication of DE60220053T2 publication Critical patent/DE60220053T2/de
Anticipated expiration legal-status Critical
Expired - Lifetime legal-status Critical Current

Links

Classifications

    • H—ELECTRICITY
    • H03—ELECTRONIC CIRCUITRY
    • H03M—CODING; DECODING; CODE CONVERSION IN GENERAL
    • H03M1/00—Analogue/digital conversion; Digital/analogue conversion
    • H03M1/06—Continuously compensating for, or preventing, undesired influence of physical parameters
    • H03M1/08—Continuously compensating for, or preventing, undesired influence of physical parameters of noise
    • H03M1/0863—Continuously compensating for, or preventing, undesired influence of physical parameters of noise of switching transients, e.g. glitches
    • H03M1/0881—Continuously compensating for, or preventing, undesired influence of physical parameters of noise of switching transients, e.g. glitches by forcing a gradual change from one output level to the next, e.g. soft-start
    • H—ELECTRICITY
    • H03—ELECTRONIC CIRCUITRY
    • H03M—CODING; DECODING; CODE CONVERSION IN GENERAL
    • H03M1/00—Analogue/digital conversion; Digital/analogue conversion
    • H03M1/66—Digital/analogue converters
    • H03M1/74—Simultaneous conversion
    • H03M1/742—Simultaneous conversion using current sources as quantisation value generators
    • H03M1/747—Simultaneous conversion using current sources as quantisation value generators with equal currents which are switched by unary decoded digital signals

Landscapes

  • Engineering & Computer Science (AREA)
  • Theoretical Computer Science (AREA)
  • Analogue/Digital Conversion (AREA)
  • Electronic Switches (AREA)
DE60220053T 2001-08-24 2002-05-23 Schaltkreis Expired - Lifetime DE60220053T2 (de)

Applications Claiming Priority (2)

Application Number Priority Date Filing Date Title
GB0120714 2001-08-24
GB0120714A GB2379107A (en) 2001-08-24 2001-08-24 A DAC using clock-controlled current switches and exhibiting reduced dependence of errors on input data

Publications (2)

Publication Number Publication Date
DE60220053D1 true DE60220053D1 (de) 2007-06-21
DE60220053T2 DE60220053T2 (de) 2007-08-30

Family

ID=9921002

Family Applications (3)

Application Number Title Priority Date Filing Date
DE60220053T Expired - Lifetime DE60220053T2 (de) 2001-08-24 2002-05-23 Schaltkreis
DE60225492T Expired - Lifetime DE60225492T2 (de) 2001-08-24 2002-05-23 Segmentierte Schaltkreise für gemischte Signalen welche geschaltet werden mit Hilfe geformter Taktimpulsen
DE60215092T Expired - Lifetime DE60215092T2 (de) 2001-08-24 2002-05-23 Segmentierte Schaltkreise für gemischte Signale, welche geschaltet werden mit Hilfe geformter Taktimpulse

Family Applications After (2)

Application Number Title Priority Date Filing Date
DE60225492T Expired - Lifetime DE60225492T2 (de) 2001-08-24 2002-05-23 Segmentierte Schaltkreise für gemischte Signalen welche geschaltet werden mit Hilfe geformter Taktimpulsen
DE60215092T Expired - Lifetime DE60215092T2 (de) 2001-08-24 2002-05-23 Segmentierte Schaltkreise für gemischte Signale, welche geschaltet werden mit Hilfe geformter Taktimpulse

Country Status (5)

Country Link
US (1) US7034733B2 (de)
EP (3) EP1406391B1 (de)
JP (1) JP3866625B2 (de)
DE (3) DE60220053T2 (de)
GB (2) GB2390945B (de)

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US6621438B1 (en) * 2002-04-30 2003-09-16 Motorola, Inc. Digital-to-analog conversion with current path exchange during clock phases
US6768438B1 (en) 2003-01-24 2004-07-27 Analog Devices, Inc. Current DAC code independent switching
US6842132B2 (en) * 2003-01-24 2005-01-11 Analog Devices, Inc. Constant switching for signal processing
KR20060027821A (ko) * 2003-06-27 2006-03-28 코닌클리즈케 필립스 일렉트로닉스 엔.브이. 디지털-아날로그 변환기 및 변환 방법
US7363019B2 (en) * 2003-08-11 2008-04-22 Avago Technologies Wireless Ip Pte Ltd Shaping the drive signal of a mixing device
US6795008B1 (en) * 2003-09-22 2004-09-21 Broadcom Corporation System and method to substantially eliminate glitch in a digital to analog converter
KR100549872B1 (ko) * 2003-12-10 2006-02-06 삼성전자주식회사 차동 스위칭 회로 및 디지털 아날로그 변환기
KR100929082B1 (ko) * 2005-10-12 2009-11-30 삼성전자주식회사 역방향 데이터 전송을 위한 단말의 제어 정보 송수신 방법및 장치
KR100746563B1 (ko) 2005-12-07 2007-08-08 한국전자통신연구원 동적 선형화 디지털-아날로그 변환기
US7511647B2 (en) * 2006-04-06 2009-03-31 Texas Instruments Incorporated Dynamic element matching method and device
US7609186B1 (en) 2006-08-09 2009-10-27 Marvell International Ltd. Circuit for converting a voltage range of a logic signal
US7605608B1 (en) 2006-08-09 2009-10-20 Marvell International Ltd. Circuit for converting a voltage range of a logic signal
US7629909B1 (en) 2006-08-09 2009-12-08 Marvell International Ltd. Circuit for converting a voltage range of a logic signal
US7705635B1 (en) 2006-08-09 2010-04-27 Marvell International Ltd. Circuit for converting a voltage range of a logic signal
US7595745B1 (en) 2006-08-09 2009-09-29 Marvell International Ltd. Circuit for converting a voltage range of a logic signal
US7511649B1 (en) * 2006-08-29 2009-03-31 Marvell International Ltd. Circuit for converting a voltage range of a logic signal
US7375671B1 (en) * 2007-02-06 2008-05-20 Linear Technology Corporation Systems and methods for reducing transient errors on digital to analog converters (DACs) deglitcher
US7796971B2 (en) * 2007-03-15 2010-09-14 Analog Devices, Inc. Mixer/DAC chip and method
EP2023489B1 (de) 2007-07-27 2011-02-09 Fujitsu Semiconductor Limited Stromschaltungsanordnung
DE602007009217D1 (de) 2007-07-27 2010-10-28 Fujitsu Semiconductor Ltd Schaltung
EP2019487B1 (de) 2007-07-27 2013-05-01 Fujitsu Semiconductor Limited Schaltungsanordnung
US20090128199A1 (en) * 2007-11-20 2009-05-21 Honeywell International Inc. Biased clock generator
US7479915B1 (en) * 2007-12-19 2009-01-20 Texas Instruments Incorporated Comparator architecture
JPWO2009133658A1 (ja) * 2008-04-30 2011-08-25 パナソニック株式会社 多信号スイッチ回路、電流スイッチセル回路、ラッチ回路、電流加算型ｄａｃ、及び半導体集積回路、映像機器、通信機器
WO2010041353A1 (ja) * 2008-10-06 2010-04-15 パナソニック株式会社 差動スイッチ、d/aコンバータ、半導体集積回路、および通信機器
US8031098B1 (en) 2010-01-19 2011-10-04 National Semiconductor Corporation DAC circuit with pseudo-return-to-zero scheme and DAC calibration circuit and method
US8115663B2 (en) 2010-04-14 2012-02-14 Silicon Laboratories Inc. Mismatch-immune digital-to-analog converter
CN103427838B (zh) 2012-05-25 2017-04-12 联发科技（新加坡）私人有限公司 开关驱动电路及运用该电路的数模转换器
JP5813588B2 (ja) * 2012-07-11 2015-11-17 株式会社東芝 スイッチ制御回路、および、スイッチ装置
EP2849346B1 (de) 2013-09-12 2019-08-21 Socionext Inc. Schaltungen für gemischte Signalen
US9201813B2 (en) 2013-09-12 2015-12-01 Socionext Inc. Signal distribution circuitry
EP2849345B1 (de) 2013-09-12 2020-11-04 Socionext Inc. Schaltungen und Verfahren zur Verwendung in Schaltungen mit gemischten Signalen
EP2849021B1 (de) 2013-09-12 2020-01-01 Socionext Inc. Signalausrichtungsschaltungen und Verfahren
EP2849543B1 (de) 2013-09-12 2021-02-24 Socionext Inc. Bauelemente und Schaltungen zum Abschluss von Ausgängen
EP2849344B1 (de) 2013-09-12 2019-11-06 Socionext Inc. Schaltungen und Verfahren zur Verwendung in Schaltungen mit gemischten Signalen
US8976050B1 (en) 2013-09-12 2015-03-10 Fujitsu Semiconductor Limited Circuitry and methods for use in mixed-signal circuitry
EP3062189B1 (de) 2013-09-12 2020-06-24 Socionext Inc. Schaltungen, die zur takterzeugung und verteilung verwendbar sind
US9054722B2 (en) 2013-09-12 2015-06-09 Fujitsu Semiconductor Limited Circuitry and methods for use in mixed-signal circuitry
US8830101B1 (en) 2013-10-21 2014-09-09 Ion E. Opris Single phase clock D/A converter with built-in data combiner
US9584151B1 (en) * 2016-03-01 2017-02-28 Analog Devices, Inc. Randomized quad switching
TWI596860B (zh) 2016-10-03 2017-08-21 華碩電腦股份有限公司 數位電源裝置及其運作方法
CN106877872B (zh) * 2017-01-04 2020-11-27 思特威(深圳)电子科技有限公司 一种电流舵数模转换器的控制装置及编码方法
CN110192345B (zh) * 2017-01-18 2021-04-09 华为技术有限公司 具有两种编码方案的数模转换器电路
US10122372B1 (en) * 2017-12-22 2018-11-06 Keysight Technologies, Inc. Circuit including calibration for offset voltage compensation

Family Cites Families (21)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPS5926136B2 (ja) * 1975-01-25 1984-06-25 日本電気株式会社 クロツク再生回路
DE3303117A1 (de) * 1983-01-31 1984-08-02 Siemens AG, 1000 Berlin und 8000 München Integrierbarer digital/analog-wandler
US4920344A (en) * 1985-03-11 1990-04-24 Ncr Corporation Digitally compensated multiplying digital to analog converter
US4639619A (en) * 1985-11-20 1987-01-27 Hewlett-Packard Company Electronic sampler switch
US5057701A (en) * 1990-02-13 1991-10-15 Hewlett-Packard Company High speed low skew clock circuit
US5254994A (en) * 1991-03-06 1993-10-19 Kabushiki Kaisha Toshiba Current source cell use in current segment type D and A converter
US5257027A (en) * 1992-07-20 1993-10-26 Burr-Brown Corporation Modified sign-magnitude DAC and method
US5740201A (en) * 1993-12-10 1998-04-14 International Business Machines Corporation Dual differential and binary data transmission arrangement
JPH08149011A (ja) * 1994-11-18 1996-06-07 Mitsubishi Electric Corp 電流加算型ディジタル／アナログ変換器
JP2776285B2 (ja) * 1995-01-13 1998-07-16 日本電気株式会社 電流スイッチ回路
US5625360A (en) * 1995-09-05 1997-04-29 Motorola, Inc. Current source for reducing noise glitches generated in a digital to analog converter and method therefor
KR100202193B1 (ko) * 1995-12-30 1999-06-15 문정환 상보 클럭 발생 방법 및 클럭 발생기
US5852378A (en) * 1997-02-11 1998-12-22 Micron Technology, Inc. Low-skew differential signal converter
US5815104A (en) * 1997-03-20 1998-09-29 Sigmatel, Inc. Method and apparatus for digital to analog conversion
JPH10276093A (ja) * 1997-03-28 1998-10-13 Sony Corp Ｄ／ａ変換器
GB2333191A (en) 1998-01-08 1999-07-14 Fujitsu Microelectronics Ltd DAC current switch with reduced crossover noise
GB2364838B (en) * 1998-03-04 2002-03-20 Fujitsu Ltd Mixed-signal circuitry and integrated circuit devices
WO2000013382A1 (en) * 1998-08-31 2000-03-09 Kamilo Feher Feher keying (fk) modulation and transceivers including clock shaping processors
US6294940B1 (en) * 2000-06-21 2001-09-25 Infineon Technologies North America Corp. Symmetric clock receiver for differential input signals
US6842132B2 (en) 2003-01-24 2005-01-11 Analog Devices, Inc. Constant switching for signal processing
US6768438B1 (en) 2003-01-24 2004-07-27 Analog Devices, Inc. Current DAC code independent switching

Also Published As

Publication number Publication date
EP1406391A1 (de) 2004-04-07
DE60215092D1 (de) 2006-11-16
US20030043062A1 (en) 2003-03-06
GB2390945A (en) 2004-01-21
DE60225492D1 (de) 2008-04-17
US7034733B2 (en) 2006-04-25
EP1292035A2 (de) 2003-03-12
GB2390945B (en) 2004-03-10
JP2003069429A (ja) 2003-03-07
GB2379107A (en) 2003-02-26
DE60225492T2 (de) 2009-02-26
DE60220053T2 (de) 2007-08-30
EP1720258A1 (de) 2006-11-08
EP1720258B1 (de) 2008-03-05
GB0120714D0 (en) 2001-10-17
EP1292035B1 (de) 2006-10-04
EP1406391B1 (de) 2007-05-09
JP3866625B2 (ja) 2007-01-10
DE60215092T2 (de) 2007-01-11
GB0326426D0 (en) 2003-12-17
EP1292035A3 (de) 2004-04-21

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Legal Events

Date Code Title Description
8364 No opposition during term of opposition
8327 Change in the person/name/address of the patent owner

Owner name: FUJITSU MICROELECTRONICS LTD., TOKYO, JP

8327 Change in the person/name/address of the patent owner

Owner name: FUJITSU SEMICONDUCTOR LTD., YOKOHAMA, KANAGAWA, JP

8328 Change in the person/name/address of the agent

Representative=s name: SEEGER SEEGER LINDNER PARTNERSCHAFT PATENTANWAELTE