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DE602005008218D1 - Verfahren zur verbesserung der fehlerreduktion in einem digital/analog-umsetzer und digital/analog-umsetzer, in dem dieses verfahren angewendet wird - Google Patents

Verfahren zur verbesserung der fehlerreduktion in einem digital/analog-umsetzer und digital/analog-umsetzer, in dem dieses verfahren angewendet wird

Info

Publication number
DE602005008218D1
DE602005008218D1 DE602005008218T DE602005008218T DE602005008218D1 DE 602005008218 D1 DE602005008218 D1 DE 602005008218D1 DE 602005008218 T DE602005008218 T DE 602005008218T DE 602005008218 T DE602005008218 T DE 602005008218T DE 602005008218 D1 DE602005008218 D1 DE 602005008218D1
Authority
DE
Germany
Prior art keywords
mapping
digital
signals
analog transfer
analog
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Expired - Lifetime
Application number
DE602005008218T
Other languages
English (en)
Inventor
Joseph Briaire
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
Renesas Electronics America Inc
Original Assignee
NXP BV
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by NXP BV filed Critical NXP BV
Publication of DE602005008218D1 publication Critical patent/DE602005008218D1/de
Anticipated expiration legal-status Critical
Expired - Lifetime legal-status Critical Current

Links

Classifications

    • H—ELECTRICITY
    • H03—ELECTRONIC CIRCUITRY
    • H03M—CODING; DECODING; CODE CONVERSION IN GENERAL
    • H03M1/00—Analogue/digital conversion; Digital/analogue conversion
    • H03M1/06—Continuously compensating for, or preventing, undesired influence of physical parameters
    • H—ELECTRICITY
    • H03—ELECTRONIC CIRCUITRY
    • H03M—CODING; DECODING; CODE CONVERSION IN GENERAL
    • H03M1/00—Analogue/digital conversion; Digital/analogue conversion
    • H03M1/06—Continuously compensating for, or preventing, undesired influence of physical parameters
    • H03M1/0617—Continuously compensating for, or preventing, undesired influence of physical parameters characterised by the use of methods or means not specific to a particular type of detrimental influence
    • H03M1/0634—Continuously compensating for, or preventing, undesired influence of physical parameters characterised by the use of methods or means not specific to a particular type of detrimental influence by averaging out the errors, e.g. using sliding scale
    • H03M1/0643—Continuously compensating for, or preventing, undesired influence of physical parameters characterised by the use of methods or means not specific to a particular type of detrimental influence by averaging out the errors, e.g. using sliding scale in the spatial domain
    • H03M1/0651—Continuously compensating for, or preventing, undesired influence of physical parameters characterised by the use of methods or means not specific to a particular type of detrimental influence by averaging out the errors, e.g. using sliding scale in the spatial domain by selecting the quantisation value generators in a non-sequential order, e.g. symmetrical
    • H03M1/0653—Continuously compensating for, or preventing, undesired influence of physical parameters characterised by the use of methods or means not specific to a particular type of detrimental influence by averaging out the errors, e.g. using sliding scale in the spatial domain by selecting the quantisation value generators in a non-sequential order, e.g. symmetrical the order being based on measuring the error
    • H—ELECTRICITY
    • H03—ELECTRONIC CIRCUITRY
    • H03M—CODING; DECODING; CODE CONVERSION IN GENERAL
    • H03M1/00—Analogue/digital conversion; Digital/analogue conversion
    • H03M1/66—Digital/analogue converters
    • H03M1/74—Simultaneous conversion
    • H—ELECTRICITY
    • H03—ELECTRONIC CIRCUITRY
    • H03M—CODING; DECODING; CODE CONVERSION IN GENERAL
    • H03M1/00—Analogue/digital conversion; Digital/analogue conversion
    • H03M1/66—Digital/analogue converters
    • H03M1/74—Simultaneous conversion
    • H03M1/742—Simultaneous conversion using current sources as quantisation value generators

Landscapes

  • Engineering & Computer Science (AREA)
  • Theoretical Computer Science (AREA)
  • Analogue/Digital Conversion (AREA)
  • Stabilization Of Oscillater, Synchronisation, Frequency Synthesizers (AREA)
  • Transmission Systems Not Characterized By The Medium Used For Transmission (AREA)
  • Detection And Prevention Of Errors In Transmission (AREA)
DE602005008218T 2004-04-20 2005-04-11 Verfahren zur verbesserung der fehlerreduktion in einem digital/analog-umsetzer und digital/analog-umsetzer, in dem dieses verfahren angewendet wird Expired - Lifetime DE602005008218D1 (de)

Applications Claiming Priority (2)

Application Number Priority Date Filing Date Title
EP04101625 2004-04-20
PCT/IB2005/051185 WO2005104376A1 (en) 2004-04-20 2005-04-11 Method to improve error reduction in a digital-to-analog converter and digital-to-analog converter in which this method is applied

Publications (1)

Publication Number Publication Date
DE602005008218D1 true DE602005008218D1 (de) 2008-08-28

Family

ID=34963764

Family Applications (1)

Application Number Title Priority Date Filing Date
DE602005008218T Expired - Lifetime DE602005008218D1 (de) 2004-04-20 2005-04-11 Verfahren zur verbesserung der fehlerreduktion in einem digital/analog-umsetzer und digital/analog-umsetzer, in dem dieses verfahren angewendet wird

Country Status (8)

Country Link
US (1) US7394414B2 (de)
EP (1) EP1741190B1 (de)
JP (1) JP2007534255A (de)
KR (1) KR20060135074A (de)
CN (1) CN1943116B (de)
AT (1) ATE401702T1 (de)
DE (1) DE602005008218D1 (de)
WO (1) WO2005104376A1 (de)

Families Citing this family (19)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JP5500072B2 (ja) * 2008-08-22 2014-05-21 日本電気株式会社 ディジタル・アナログ変換回路
EP2404415A4 (de) * 2009-03-02 2015-08-05 Mitsubishi Electric Res Lab Schaltkreise für weiche logikfunktionen
US8164495B2 (en) * 2009-11-12 2012-04-24 Intersil Americas Inc. Integrated non-linearity (INL) and differential non-linearity (DNL) correction techniques for digital-to-analog converters (DACS)
FR2967261B1 (fr) 2010-11-08 2013-08-16 Commissariat Energie Atomique Procédé et dispositif de configuration de circuits électriques et/ou électroniques
CN102522993B (zh) * 2011-12-30 2014-06-04 清华大学 非对称电流源阵列的开关序列的生成方法、装置及其应用
CN102522988B (zh) * 2011-12-30 2014-06-04 清华大学 对称电流源阵列的开关序列的生成方法、装置及其应用
US9344104B1 (en) * 2013-05-18 2016-05-17 S9Estre, Llc Digital to analog converter and analog to digital converter calibration techniques
EP2993845B1 (de) 2014-09-04 2018-02-28 Airbus Defence and Space GmbH Verbesserung von Spreizspektrum-GMSK-Signalen
US9491390B2 (en) * 2014-11-26 2016-11-08 Omnivision Technologies, Inc. Method and system for implementing correlated multi-sampling with improved analog-to-digital converter linearity
US9124287B1 (en) * 2014-12-22 2015-09-01 Pmc-Sierra Us, Inc. Scrambler with built in test capabilities for unary DAC
US9577657B1 (en) 2016-05-02 2017-02-21 Analog Devices, Inc. Delta sigma patterns for calibrating a digital-to-analog converter
FR3059455B1 (fr) * 2016-11-29 2020-09-25 Continental Automotive France Procede et dispositif de detection de presence pour vehicule automobile
EP3731415A4 (de) 2019-02-25 2021-11-24 Shenzhen Goodix Technology Co., Ltd. Datenkonverter, zugehöriger analog-digital-wandler und digital-analog-wandler und chips
CN111431528B (zh) * 2020-04-10 2023-11-28 上海安路信息科技股份有限公司 Dac误差补偿方法及误差补偿系统
TWI768973B (zh) 2021-06-17 2022-06-21 瑞昱半導體股份有限公司 校正輸出電流的方法、電流控制系統及電壓控制系統
CN115642912A (zh) * 2021-07-20 2023-01-24 瑞昱半导体股份有限公司 具有信号校正机制的数模转换电路及数模转换方法
KR20240052994A (ko) * 2021-11-12 2024-04-23 실리콘 스토리지 테크놀로지 인크 신경망에서 하나 이상의 메모리 셀에 인가할 바이어스 전압 결정
US11967968B2 (en) * 2022-01-28 2024-04-23 Texas Instruments Incorporated Apparatus and method of over-current limit for multi-channel digital-to-analog converters
US12401371B2 (en) 2022-02-28 2025-08-26 Analog Devices, Inc. Calibration of digital-to-analog converters

Family Cites Families (5)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPH04162830A (ja) * 1990-10-26 1992-06-08 Nec Corp Ｄ／ａコンバータ
US6118398A (en) 1998-09-08 2000-09-12 Intersil Corporation Digital-to-analog converter including current sources operable in a predetermined sequence and associated methods
JP2003529997A (ja) * 2000-04-04 2003-10-07 コーニンクレッカ フィリップス エレクトロニクス エヌ ヴィ デジタルアナログ変換器
WO2003021790A2 (en) 2001-09-01 2003-03-13 Technische Universiteit Eindhoven Error optimization in digital to analog conversion
DE60215560T2 (de) * 2002-05-27 2007-06-21 Nokia Corp. Verfahren zum kalibrieren eines digital/analog-umsetzers und digital/analog-umsetzer

Also Published As

Publication number Publication date
CN1943116A (zh) 2007-04-04
CN1943116B (zh) 2011-05-25
US7394414B2 (en) 2008-07-01
WO2005104376A1 (en) 2005-11-03
ATE401702T1 (de) 2008-08-15
US20070222653A1 (en) 2007-09-27
JP2007534255A (ja) 2007-11-22
EP1741190A1 (de) 2007-01-10
EP1741190B1 (de) 2008-07-16
KR20060135074A (ko) 2006-12-28

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